JPS5484785A - Surface inspecting system - Google Patents

Surface inspecting system

Info

Publication number
JPS5484785A
JPS5484785A JP15260377A JP15260377A JPS5484785A JP S5484785 A JPS5484785 A JP S5484785A JP 15260377 A JP15260377 A JP 15260377A JP 15260377 A JP15260377 A JP 15260377A JP S5484785 A JPS5484785 A JP S5484785A
Authority
JP
Japan
Prior art keywords
defect
signal
monitor unit
picture
detected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15260377A
Other languages
Japanese (ja)
Other versions
JPS6029895B2 (en
Inventor
Hideo Sato
Shigeru Suzuki
Yoshio Tomioka
Toyoji Maruyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Nippon Steel Corp
Original Assignee
Fujitsu Ltd
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd, Nippon Steel Corp filed Critical Fujitsu Ltd
Priority to JP15260377A priority Critical patent/JPS6029895B2/en
Publication of JPS5484785A publication Critical patent/JPS5484785A/en
Publication of JPS6029895B2 publication Critical patent/JPS6029895B2/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To read out the information of the picture including the defect when any defect is detected with a defect detection circuit and display this in preference in a monitor unit. CONSTITUTION:When any defect is detected and an AND gate 13 outputs a defect signal S4, a flip-flop 15 reads this at the fall of the signal and is reset, making its Q signal S5 0. This signal S5 changes over a changeover device 22 so that a memory 8a is connected to a monitor unit 9 and write and erase gates 24, 25 are closed. Hence, the video signal of the picture where the flaw detection has been made is read out and this is inputted to the monitor unit 9 through the changeover device 22. The flaw picture is then displayed with this monitor unit.
JP15260377A 1977-12-19 1977-12-19 surface inspection equipment Expired JPS6029895B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15260377A JPS6029895B2 (en) 1977-12-19 1977-12-19 surface inspection equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15260377A JPS6029895B2 (en) 1977-12-19 1977-12-19 surface inspection equipment

Publications (2)

Publication Number Publication Date
JPS5484785A true JPS5484785A (en) 1979-07-05
JPS6029895B2 JPS6029895B2 (en) 1985-07-13

Family

ID=15544010

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15260377A Expired JPS6029895B2 (en) 1977-12-19 1977-12-19 surface inspection equipment

Country Status (1)

Country Link
JP (1) JPS6029895B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04332856A (en) * 1991-05-07 1992-11-19 Nippon Steel Corp Inspecting apparatus of surface defect of strip

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02105479U (en) * 1988-09-30 1990-08-22
WO2020196369A1 (en) 2019-03-26 2020-10-01 株式会社フジミインコーポレーテッド Polishing composition

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04332856A (en) * 1991-05-07 1992-11-19 Nippon Steel Corp Inspecting apparatus of surface defect of strip

Also Published As

Publication number Publication date
JPS6029895B2 (en) 1985-07-13

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