JPS547487Y2 - - Google Patents
Info
- Publication number
- JPS547487Y2 JPS547487Y2 JP1974044980U JP4498074U JPS547487Y2 JP S547487 Y2 JPS547487 Y2 JP S547487Y2 JP 1974044980 U JP1974044980 U JP 1974044980U JP 4498074 U JP4498074 U JP 4498074U JP S547487 Y2 JPS547487 Y2 JP S547487Y2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2608—Circuits therefor for testing bipolar transistors
- G01R31/2614—Circuits therefor for testing bipolar transistors for measuring gain factor thereof
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1974044980U JPS547487Y2 (fr) | 1974-04-21 | 1974-04-21 | |
| GB3581874A GB1482137A (en) | 1974-04-21 | 1974-08-14 | Test leads for use with multimeters in testing the current amplification factor of transistors |
| HK35879A HK35879A (en) | 1974-04-21 | 1979-06-07 | Improvements in or relating to test leads for use with multimeters in testing the current amplification factor of transistors |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1974044980U JPS547487Y2 (fr) | 1974-04-21 | 1974-04-21 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS50135069U JPS50135069U (fr) | 1975-11-07 |
| JPS547487Y2 true JPS547487Y2 (fr) | 1979-04-07 |
Family
ID=12706604
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1974044980U Expired JPS547487Y2 (fr) | 1974-04-21 | 1974-04-21 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JPS547487Y2 (fr) |
| GB (1) | GB1482137A (fr) |
| HK (1) | HK35879A (fr) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2535850A1 (fr) * | 1982-11-10 | 1984-05-11 | Chauvin Arnoux Sa | Accessoire pouvant etre connecte a un multimetre pour la mesure de resistances de terre |
| CN114236336B (zh) * | 2021-12-08 | 2024-02-13 | 成都海光微电子技术有限公司 | 一种三极管放大倍数检测电路、方法及传感器 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4866375A (fr) * | 1971-12-14 | 1973-09-11 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4828370U (fr) * | 1971-08-11 | 1973-04-06 |
-
1974
- 1974-04-21 JP JP1974044980U patent/JPS547487Y2/ja not_active Expired
- 1974-08-14 GB GB3581874A patent/GB1482137A/en not_active Expired
-
1979
- 1979-06-07 HK HK35879A patent/HK35879A/xx unknown
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4866375A (fr) * | 1971-12-14 | 1973-09-11 |
Also Published As
| Publication number | Publication date |
|---|---|
| GB1482137A (en) | 1977-08-03 |
| HK35879A (en) | 1979-06-15 |
| JPS50135069U (fr) | 1975-11-07 |