JPS547160A - Method of testing connections in hybrid integrated circuit device - Google Patents

Method of testing connections in hybrid integrated circuit device

Info

Publication number
JPS547160A
JPS547160A JP7188677A JP7188677A JPS547160A JP S547160 A JPS547160 A JP S547160A JP 7188677 A JP7188677 A JP 7188677A JP 7188677 A JP7188677 A JP 7188677A JP S547160 A JPS547160 A JP S547160A
Authority
JP
Japan
Prior art keywords
integrated circuit
circuit device
hybrid integrated
testing connections
connections
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7188677A
Other languages
Japanese (ja)
Inventor
Kenichi Oono
Tadahisa Inoue
Hajime Sasaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP7188677A priority Critical patent/JPS547160A/en
Publication of JPS547160A publication Critical patent/JPS547160A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)
JP7188677A 1977-06-16 1977-06-16 Method of testing connections in hybrid integrated circuit device Pending JPS547160A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7188677A JPS547160A (en) 1977-06-16 1977-06-16 Method of testing connections in hybrid integrated circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7188677A JPS547160A (en) 1977-06-16 1977-06-16 Method of testing connections in hybrid integrated circuit device

Publications (1)

Publication Number Publication Date
JPS547160A true JPS547160A (en) 1979-01-19

Family

ID=13473453

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7188677A Pending JPS547160A (en) 1977-06-16 1977-06-16 Method of testing connections in hybrid integrated circuit device

Country Status (1)

Country Link
JP (1) JPS547160A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0514949U (en) * 1991-02-15 1993-02-26 株式会社アイシーテイ Semiconductor device inspection equipment
JPH05299150A (en) * 1992-04-21 1993-11-12 Hirakawa Hewtec Kk Judging method and judging device for bond strength of power supply cord and electric connecting terminal

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0514949U (en) * 1991-02-15 1993-02-26 株式会社アイシーテイ Semiconductor device inspection equipment
JPH05299150A (en) * 1992-04-21 1993-11-12 Hirakawa Hewtec Kk Judging method and judging device for bond strength of power supply cord and electric connecting terminal

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