JPS5435503B2 - - Google Patents

Info

Publication number
JPS5435503B2
JPS5435503B2 JP5710773A JP5710773A JPS5435503B2 JP S5435503 B2 JPS5435503 B2 JP S5435503B2 JP 5710773 A JP5710773 A JP 5710773A JP 5710773 A JP5710773 A JP 5710773A JP S5435503 B2 JPS5435503 B2 JP S5435503B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP5710773A
Other versions
JPS4943660A (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS4943660A publication Critical patent/JPS4943660A/ja
Publication of JPS5435503B2 publication Critical patent/JPS5435503B2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP5710773A 1972-05-22 1973-05-22 Expired JPS5435503B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US00255332A US3807870A (en) 1972-05-22 1972-05-22 Apparatus for measuring the distance between surfaces of transparent material

Publications (2)

Publication Number Publication Date
JPS4943660A JPS4943660A (ja) 1974-04-24
JPS5435503B2 true JPS5435503B2 (ja) 1979-11-02

Family

ID=22967840

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5710773A Expired JPS5435503B2 (ja) 1972-05-22 1973-05-22

Country Status (4)

Country Link
US (1) US3807870A (ja)
JP (1) JPS5435503B2 (ja)
DE (1) DE2325457C3 (ja)
GB (1) GB1430426A (ja)

Families Citing this family (56)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1498811A (en) * 1974-03-01 1978-01-25 Crosfield Electronics Ltd Preparation of gravure printing cylinders
LU73607A1 (ja) * 1974-10-24 1976-06-11
US4018638A (en) * 1975-08-22 1977-04-19 North American Philips Corporation Method of reducing the thickness of a wafer of fragile material
JPS52104256A (en) * 1976-02-27 1977-09-01 Iwatsu Electric Co Ltd Thickness measuring device
US4120590A (en) * 1977-06-03 1978-10-17 Owens-Illinois, Inc. Method for measuring the thickness of transparent articles
DE2906641A1 (de) * 1979-02-21 1980-08-28 Freudenberg Carl Fa Verfahren zur optisch-elektrischen messung des abstandes zwischen einer messeinrichtung und einem pruefling
US4285745A (en) * 1979-08-01 1981-08-25 Ppg Industries, Inc. Method of determining optical quality of a laminated article
US4371482A (en) * 1979-08-01 1983-02-01 Ppg Industries, Inc. Method of determining optical quality of a shaped article
FR2481445A1 (fr) * 1980-04-23 1981-10-30 Thomson Csf Procede et dispositif de mesure de caracteristiques geometriques d'un element en materiau refringent, notamment d'un tube
US4622462A (en) * 1981-06-11 1986-11-11 Mts Vektronics Corporation Method and apparatus for three-dimensional scanning
DE3216053A1 (de) * 1982-04-29 1983-11-03 Karl Mengele & Söhne Maschinenfabrik und Eisengießerei GmbH & Co, 8870 Günzburg Optoelektronisches messverfahren und vorrichtung zur durchfuehrung des verfahrens
JPS58216903A (ja) * 1982-06-11 1983-12-16 Toshiba Corp 厚さ測定装置
US4645351A (en) * 1983-06-01 1987-02-24 Fuji Photo Film Co., Ltd. Methods and apparatus for discriminating between the front and back surfaces of films
DE3503086C1 (de) * 1985-01-30 1986-06-19 Dipl.-Ing. Bruno Richter GmbH & Co. Elektronische Betriebskontroll-Geräte KG, 8602 Stegaurach Verfahren bzw.Vorrichtung zur Messung der Wanddicke von transparenten Gegenstaenden
JPS621105U (ja) * 1985-06-20 1987-01-07
FR2591341B1 (fr) * 1985-12-10 1988-02-19 Saint Gobain Vitrage Technique de detection de defauts optiques sur ligne de production de verre
JPH0690149B2 (ja) * 1986-01-31 1994-11-14 東洋ガラス株式会社 透光度検査装置
GB8611728D0 (en) * 1986-05-14 1986-06-25 Tole W R Determining thickness of glass plates & tubes
JPS6319506A (ja) * 1986-07-14 1988-01-27 Power Reactor & Nuclear Fuel Dev Corp 滴下液滴の検出方法
JPS643503A (en) * 1987-06-25 1989-01-09 Fujitsu Ltd Method for measuring thickness of crystal layer
US4849643A (en) * 1987-09-18 1989-07-18 Eaton Leonard Technologies Optical probe with overlapping detection fields
US4883061A (en) * 1988-02-29 1989-11-28 The Board Of Trustees Of The University Of Illinois Method and apparatus for measuring the thickness of eye components
US5008555A (en) * 1988-04-08 1991-04-16 Eaton Leonard Technologies, Inc. Optical probe with overlapping detection fields
US4837449A (en) * 1988-05-16 1989-06-06 Maltby Jr Robert E Inspecting for matching of paired sheets of transparent material
US5144151A (en) * 1991-03-20 1992-09-01 Thorne Brent A Apparatus and method for detecting the presence of a discontinuity on a glass surface
TW257898B (ja) * 1991-04-11 1995-09-21 Sumitomo Electric Industries
DE4143186A1 (de) * 1991-12-30 1993-07-01 Vma Ges Fuer Visuelle Messtech Vorrichtung zur beruehrungslosen messung der wanddicke
US5291271A (en) * 1992-08-19 1994-03-01 Owens-Brockway Glass Container Inc. Measurement of transparent container wall thickness
US5682449A (en) * 1995-12-22 1997-10-28 Packard Hughes Interconnect Company Sharp angle fiber optic interconnection system
US5748091A (en) * 1996-10-04 1998-05-05 Mcdonnell Douglas Corporation Fiber optic ice detector
US5717490A (en) * 1996-10-17 1998-02-10 Lsi Logic Corporation Method for identifying order skipping in spectroreflective film measurement equipment
US6166808A (en) * 1996-12-24 2000-12-26 U.S. Philips Corporation Optical height meter, surface-inspection device provided with such a height meter, and lithographic apparatus provided with the inspection device
ATE289406T1 (de) * 1997-01-21 2005-03-15 Neil Colin Hamilton Dickenmessapparat
FR2762083B1 (fr) * 1997-04-11 1999-07-02 Verreries Souchon Neuvesel Procede optique de mesure de l'epaisseur de la paroi et/ou de l'ovalisation d'un recipient et dispositif en faisant application
DE19818190B4 (de) * 1998-04-23 2004-02-19 VMA Gesellschaft für visuelle Meßtechnik und Automatisierung mbH Verfahren und Vorrichtung zur berührungslosen Messung der Wanddicke
US6285451B1 (en) * 1999-04-30 2001-09-04 John M. Herron Noncontacting optical method for determining thickness and related apparatus
DE19928171B4 (de) * 1999-06-19 2011-01-05 Leybold Optics Gmbh Verfahren zur kontinuierlichen Bestimmung der optischen Schichtdicke von Beschichtungen
US6683695B1 (en) 1999-07-21 2004-01-27 Electronic Design To Market, Inc. Method and apparatus for detecting properties of reflective transparent surface coatings on a sheet of transparent material
AT410257B (de) * 2000-10-23 2003-03-25 Mte Innovative Measurement Sol Vorrichtung zur überprüfung und kontrolle einer einzel-glasscheibe oder eines isolierglas-elements
US6975410B1 (en) * 2002-04-15 2005-12-13 Sturgill Dennis T Measuring device
DE10225488A1 (de) * 2002-06-10 2003-12-18 Bild Und Signalverarbeitung Mb Verfahren und eine Vorrichtung zur berührungslosen Dickenmessung von transparenten Messobjekten
US20040061873A1 (en) * 2002-09-26 2004-04-01 Davis Brett L. Method and apparatus for detecting media thickness
US7417749B1 (en) * 2004-09-01 2008-08-26 Electric Design To Market, Inc. Method and apparatus for protecting an optical transmission measurement when sensing transparent materials
US20060054843A1 (en) * 2004-09-13 2006-03-16 Electronic Design To Market, Inc. Method and apparatus of improving optical reflection images of a laser on a changing surface location
US7516628B2 (en) * 2005-01-11 2009-04-14 Corning Incorporated On-line thickness gauge and method for measuring the thickness of a moving glass substrate
DE102005050795A1 (de) * 2005-10-24 2007-04-26 Leopold Kostal Gmbh & Co. Kg Meßvorrichtung zur Bestimmung der Dicke und/oder der optischen Transmissionseigenschaften einer Scheibe, vorzugsweise einer Fahrzeugscheibe
DE102005052044A1 (de) * 2005-10-31 2007-05-03 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren und Vorrichtung zur Vermessung eines transparenten Objekts
US7583368B1 (en) 2006-04-05 2009-09-01 Electronic Design To Market, Inc. Method of enhancing measurement of stress in glass
US7652760B1 (en) 2006-04-05 2010-01-26 Electronic Design To Market, Inc. System for detecting coatings on transparent or semi-transparent materials
DE102008009280A1 (de) 2008-02-15 2009-08-27 VMA Gesellschaft für visuelle Meßtechnik und Automatisierung mbH Vorrichtung und Verfahren zur berührungslosen Messung einer Wanddickeverteilung
DE102008018844A1 (de) 2008-04-15 2009-10-29 VMA Gesellschaft für visuelle Meßtechnik und Automatisierung mbH Vorrichtung und Verfahren zur berührungslosen Messung einer Wanddickeverteilung
DE102009009272B4 (de) * 2009-02-17 2013-02-28 Siemens Aktiengesellschaft Qualitätsprüfung für Rotorblätter einer Windenergieanlage
FR2971847B1 (fr) * 2011-02-18 2013-07-19 Tiama Procede et dispositif pour detecter des defauts de repartition de matiere dans des recipients transparents
US9593939B1 (en) * 2013-12-30 2017-03-14 Flextronics Ap, Llc Glue thickness inspection (GTI)
DE102014216227B4 (de) * 2014-08-14 2020-06-18 Carl Zeiss Microscopy Gmbh Verfahren und Vorrichtung zum Bestimmen eines Abstandes zweier voneinander entlang einer ersten Richtung beabstandeter optischer Grenzflächen
JP6956673B2 (ja) * 2018-04-09 2021-11-02 三菱電機株式会社 膜厚測定装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3307446A (en) * 1962-07-11 1967-03-07 Owens Illinois Inc Gauging wall thickness of glass tubing
US3259022A (en) * 1963-12-17 1966-07-05 Ibm Object scanning techniques
US3428817A (en) * 1964-11-27 1969-02-18 Jones & Laughlin Steel Corp Length measurer with plurality of photocells which are sequentially gated
GB1207976A (en) * 1967-12-12 1970-10-07 Gen Electric & English Elect Improvements in or relating to apparatus for determining the spacing between substantially parallel rays of radiation
US3690774A (en) * 1971-02-26 1972-09-12 Dow Chemical Co Continuous optical quality control monitor

Also Published As

Publication number Publication date
GB1430426A (en) 1976-03-31
US3807870A (en) 1974-04-30
DE2325457B2 (de) 1975-01-30
JPS4943660A (ja) 1974-04-24
DE2325457C3 (de) 1975-09-11
DE2325457A1 (de) 1973-11-29

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