JPS54178545U - - Google Patents
Info
- Publication number
- JPS54178545U JPS54178545U JP7680478U JP7680478U JPS54178545U JP S54178545 U JPS54178545 U JP S54178545U JP 7680478 U JP7680478 U JP 7680478U JP 7680478 U JP7680478 U JP 7680478U JP S54178545 U JPS54178545 U JP S54178545U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7680478U JPS54178545U (en) | 1978-06-06 | 1978-06-06 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7680478U JPS54178545U (en) | 1978-06-06 | 1978-06-06 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS54178545U true JPS54178545U (en) | 1979-12-17 |
Family
ID=28992417
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7680478U Pending JPS54178545U (en) | 1978-06-06 | 1978-06-06 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS54178545U (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003057195A (en) * | 2001-08-09 | 2003-02-26 | X-Ray Precision Inc | Method and apparatus for analyzing three-dimensional structure |
JP2004251906A (en) * | 2003-02-21 | 2004-09-09 | Sikora Ag | Measurement method and measurement device of insulator thickness of flat ribbon cable in conducting path |
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1978
- 1978-06-06 JP JP7680478U patent/JPS54178545U/ja active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003057195A (en) * | 2001-08-09 | 2003-02-26 | X-Ray Precision Inc | Method and apparatus for analyzing three-dimensional structure |
JP4665222B2 (en) * | 2001-08-09 | 2011-04-06 | 株式会社エックスレイプレシジョン | 3D structure analysis method and 3D structure analysis apparatus |
JP2004251906A (en) * | 2003-02-21 | 2004-09-09 | Sikora Ag | Measurement method and measurement device of insulator thickness of flat ribbon cable in conducting path |