JPS54160193A - Ct scanner - Google Patents
Ct scannerInfo
- Publication number
- JPS54160193A JPS54160193A JP6896678A JP6896678A JPS54160193A JP S54160193 A JPS54160193 A JP S54160193A JP 6896678 A JP6896678 A JP 6896678A JP 6896678 A JP6896678 A JP 6896678A JP S54160193 A JPS54160193 A JP S54160193A
- Authority
- JP
- Japan
- Prior art keywords
- collimator
- center part
- fringe
- center
- slit width
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003247 decreasing effect Effects 0.000 abstract 2
- 230000005855 radiation Effects 0.000 abstract 2
- 230000000694 effects Effects 0.000 abstract 1
Abstract
PURPOSE: To enable the radiation beam to carry out the even scanning within the slice width by decreasing the slit width of the collimator substantially from the center part toward fringe area.
CONSTITUTION: Fan beam 7 generated from radiation source 1 and shaped by collimator 6 transmits through tested object 2 and then enters the detector. In this case, the radiant rays of center part 8 of beam 7 pass through always the center part of the fault surface to contribute to the whole fault surface, but the radiant rays of fringe part 9 contribute only to the circumference area of the fault surface. As a result, the cross-section of the fault surface becomes thin at the center part and thick at the fringe part due to the radiant rays of the center part. This can be corrected by decreasing the slit width of the collimator from its center toward the fringe area. Also the same effect can be obtained by shifting substantially the slit position from the center to the fringe area along with narrowing the slit width although the slit width of the collimator is uniform originally.
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6896678A JPS54160193A (en) | 1978-06-09 | 1978-06-09 | Ct scanner |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6896678A JPS54160193A (en) | 1978-06-09 | 1978-06-09 | Ct scanner |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS54160193A true JPS54160193A (en) | 1979-12-18 |
JPS6233897B2 JPS6233897B2 (en) | 1987-07-23 |
Family
ID=13388915
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6896678A Granted JPS54160193A (en) | 1978-06-09 | 1978-06-09 | Ct scanner |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS54160193A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006351303A (en) * | 2005-06-15 | 2006-12-28 | Hitachi High-Technologies Corp | Pattern defect inspection method and apparatus thereof |
JP2011159636A (en) * | 2011-05-11 | 2011-08-18 | Hitachi High-Technologies Corp | Method and device for inspecting pattern defects |
-
1978
- 1978-06-09 JP JP6896678A patent/JPS54160193A/en active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006351303A (en) * | 2005-06-15 | 2006-12-28 | Hitachi High-Technologies Corp | Pattern defect inspection method and apparatus thereof |
JP2011159636A (en) * | 2011-05-11 | 2011-08-18 | Hitachi High-Technologies Corp | Method and device for inspecting pattern defects |
Also Published As
Publication number | Publication date |
---|---|
JPS6233897B2 (en) | 1987-07-23 |
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