JPS54133396A - Method and apparatus for nondestructive measuring - Google Patents
Method and apparatus for nondestructive measuringInfo
- Publication number
- JPS54133396A JPS54133396A JP4153778A JP4153778A JPS54133396A JP S54133396 A JPS54133396 A JP S54133396A JP 4153778 A JP4153778 A JP 4153778A JP 4153778 A JP4153778 A JP 4153778A JP S54133396 A JPS54133396 A JP S54133396A
- Authority
- JP
- Japan
- Prior art keywords
- radiation source
- radiation
- inspection
- letting
- truck
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/18—Investigating the presence of flaws defects or foreign matter
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
PURPOSE:To make possible quantitative non-destructive inspection rapidly and easily, reduce the inspection manhours and achieve the higher reliability of products by letting a radiation source and a detector oppose by way of a thick-wall part in- between while letting a hollow rotator form object rotate. CONSTITUTION:The position of a guide 8 is so determined that the center in the axial direction of a cylindrical object 1 under inspection becomes the center of a swivelling mechanism 18. An object 1 is then placed on a roller 2 and the radiation source 4 and detecting pipe 6, truck 16, rods 15 and 14 are respectively positioned. After the guide 8 is freed from the object under inspection, suitable quantity of radiation is performed from the radiation source 4 by a control panel 5 and the radiation dose having passed is detected 6 and is supplied to a recorder 7. Next, the object 1 is rotated by the roller 2 and the detection signals corresponding to the sizes of the internal defects thereof are recorded. Further the truck 16 is moved in the axial direction at a constant speed, whereby nondestructive measurement of the object 1 may be continuously performed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4153778A JPS54133396A (en) | 1978-04-08 | 1978-04-08 | Method and apparatus for nondestructive measuring |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4153778A JPS54133396A (en) | 1978-04-08 | 1978-04-08 | Method and apparatus for nondestructive measuring |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS54133396A true JPS54133396A (en) | 1979-10-17 |
JPS6253769B2 JPS6253769B2 (en) | 1987-11-12 |
Family
ID=12611156
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4153778A Granted JPS54133396A (en) | 1978-04-08 | 1978-04-08 | Method and apparatus for nondestructive measuring |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS54133396A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108519395A (en) * | 2018-03-08 | 2018-09-11 | 芜湖泰领信息科技有限公司 | pipeline inspection robot control system and method |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2023042402A (en) | 2021-09-14 | 2023-03-27 | 三菱電機株式会社 | Semiconductor device |
-
1978
- 1978-04-08 JP JP4153778A patent/JPS54133396A/en active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108519395A (en) * | 2018-03-08 | 2018-09-11 | 芜湖泰领信息科技有限公司 | pipeline inspection robot control system and method |
Also Published As
Publication number | Publication date |
---|---|
JPS6253769B2 (en) | 1987-11-12 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
SE8303874L (en) | DEVICE FOR CRACKET DETECTION | |
IL85381A (en) | Method of and apparatus for inspecting workpieces traveling along a production line | |
JPS5757246A (en) | Detecting and measuring apparatus for flaw | |
JPH0358478B2 (en) | ||
CA959937A (en) | Non-destructive testing apparatus for detecting both transverse and longitudinal weld defects with a single inspection | |
JPS54133396A (en) | Method and apparatus for nondestructive measuring | |
JPS5524646A (en) | Ultrasonic automatic flaw detector of surface flaw in steel strip | |
JPS61502563A (en) | Eddy current flaw detection method and device | |
JPS5767852A (en) | Method and apparatus for flaw detection | |
FR2504704A1 (en) | METHOD AND DEVICE FOR NON-CONTACT GUIDING OF NON-DESTRUCTIVE TUBE CONTROL APPARATUS | |
JPS53106087A (en) | Method and apparatus of eddy current ultrasonic flaw detection | |
JPS6124930Y2 (en) | ||
JPS55116255A (en) | Method and apparatus for detecting void in synthetic resin coating material | |
JPS57120858A (en) | Detector for position of ultrasonic probe | |
JPS5740646A (en) | Processing method for continuous signal for surface inspection of cylindrical object | |
JPS5213342A (en) | Process for detecting jam and device therefor | |
JPS5661645A (en) | Thin-steel plate flaw detector using magnetism | |
JPS6227875Y2 (en) | ||
JPS62225935A (en) | Radiation inspector | |
JPH05126760A (en) | Optical flaw detecting apparatus | |
Takenaka et al. | Inspection System for Cold Strip Products | |
SU616572A1 (en) | Once-through eddy-current transducer to flaw detector | |
JPS5412885A (en) | Function inspecting method and device for eddy current flaw detecting machine | |
PEKARSKII | Neutron absorption radiometric inspection of multilayer components with metal shells of varying thickness and with local inhomogeneities | |
JPS56150349A (en) | Probe for eddy current flaw detection and flaw detecting method |