JPS54128760A - Thickness matering method using radioactive rays - Google Patents
Thickness matering method using radioactive raysInfo
- Publication number
- JPS54128760A JPS54128760A JP3610678A JP3610678A JPS54128760A JP S54128760 A JPS54128760 A JP S54128760A JP 3610678 A JP3610678 A JP 3610678A JP 3610678 A JP3610678 A JP 3610678A JP S54128760 A JPS54128760 A JP S54128760A
- Authority
- JP
- Japan
- Prior art keywords
- thickness
- article
- amplifier
- value
- detector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
PURPOSE: To meter the thickness of an article at a high accuracy, while reducing the adjustment, by interchanging resistors in accordance with the thickness of the article to compare a reference value, which is given in advance with the use of a reference member, when it is intended to change the metering range, so that the gain compensation is performed with the difference is larger than the allowable range.
CONSTITUTION: A feedback resistor 36a to be used for metering a thin article is connected in parallel with an operational amplifier 34 through a change-over device 35 and is adjusted such that the output of the amplifier 34 becomes the maximum under the condition having no article to be metered. A reference member 45 having a known thickness is interposed between a radioactive ray source 30 and a detector 32 so that the reference value is stored in a constant presetter 41. A resistor 36b takes the part of the resistor 36a, and the reference member 45 is also interposed between the source 30 and the detector 32 so that the thickness of the plate is detected by means of an operational amplifier 38. The difference is deduced between the value thus obtained and the value stored in the presetter 41, and the gain value is compensated, when the difference is larger than the allowable range, and is stored in the amplifier 38. When the article 35 is carried between the source 30 and the detector 32, the resistors 36a and 36b are selectively connected by the amplifier 38 in accordance with the thickness so that the resultant thickness is displayed in a meter 44.
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3610678A JPS54128760A (en) | 1978-03-30 | 1978-03-30 | Thickness matering method using radioactive rays |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3610678A JPS54128760A (en) | 1978-03-30 | 1978-03-30 | Thickness matering method using radioactive rays |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS54128760A true JPS54128760A (en) | 1979-10-05 |
Family
ID=12460513
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3610678A Pending JPS54128760A (en) | 1978-03-30 | 1978-03-30 | Thickness matering method using radioactive rays |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS54128760A (en) |
-
1978
- 1978-03-30 JP JP3610678A patent/JPS54128760A/en active Pending
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