JPS54105908A - Measurement system for circuit delay time - Google Patents
Measurement system for circuit delay timeInfo
- Publication number
- JPS54105908A JPS54105908A JP1259978A JP1259978A JPS54105908A JP S54105908 A JPS54105908 A JP S54105908A JP 1259978 A JP1259978 A JP 1259978A JP 1259978 A JP1259978 A JP 1259978A JP S54105908 A JPS54105908 A JP S54105908A
- Authority
- JP
- Japan
- Prior art keywords
- station
- delay time
- test signal
- wired circuit
- radiated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B3/00—Line transmission systems
- H04B3/02—Details
- H04B3/46—Monitoring; Testing
- H04B3/462—Testing group delay or phase shift, e.g. timing jitter
Landscapes
- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- Measurement Of Unknown Time Intervals (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Monitoring And Testing Of Transmission In General (AREA)
Abstract
PURPOSE:To obtain the accurate delay time in a simple way by receiving and demodulating at the central station the test signal radiated from the satellite station in the form of the electromagnetic wave to be compared with the test signal at the central station with regard to the phase and thus measuring the delay time of the wired circuit. CONSTITUTION:The data is transmitted to satellite station 2 from the signal transmission part of central station 1 via the wired circuit and then radiated as the electromagnetic wave. In this case, the test signal is transmitted to station 2 from station 2 from station 1 via the wired circuit, and the test signal radiated from station 2 as the electromagnetic is received and modulated at station 1 to give phase comparison 29 to the test signal at station 1. And then the delay time is measured for the wired circuit, thus obtaining the accurate delay time in a simple way.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1259978A JPS54105908A (en) | 1978-02-07 | 1978-02-07 | Measurement system for circuit delay time |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1259978A JPS54105908A (en) | 1978-02-07 | 1978-02-07 | Measurement system for circuit delay time |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS54105908A true JPS54105908A (en) | 1979-08-20 |
JPS6117380B2 JPS6117380B2 (en) | 1986-05-07 |
Family
ID=11809811
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1259978A Granted JPS54105908A (en) | 1978-02-07 | 1978-02-07 | Measurement system for circuit delay time |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS54105908A (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20220225736A1 (en) * | 2019-06-13 | 2022-07-21 | Asics Corporation | Shoe |
-
1978
- 1978-02-07 JP JP1259978A patent/JPS54105908A/en active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS6117380B2 (en) | 1986-05-07 |
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