JPS5354428A - Inspection method of semiconductor memory divice - Google Patents
Inspection method of semiconductor memory diviceInfo
- Publication number
- JPS5354428A JPS5354428A JP12991176A JP12991176A JPS5354428A JP S5354428 A JPS5354428 A JP S5354428A JP 12991176 A JP12991176 A JP 12991176A JP 12991176 A JP12991176 A JP 12991176A JP S5354428 A JPS5354428 A JP S5354428A
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor memory
- inspection method
- memory cell
- measured
- divice
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Static Random-Access Memory (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Abstract
PURPOSE: A signal selecting a measured memory cell is transmitted, in parallel, to the memory cell part which consists of the more number of memory cells than that of measured cells to obtain the corresponding mask instruction signal, so that the identification of whether the inspection result of the output signal from the measured memory cell is proper or not can be masked.
COPYRIGHT: (C)1978,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP51129911A JPS5816559B2 (en) | 1976-10-27 | 1976-10-27 | Testing device and method for semiconductor storage devices |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP51129911A JPS5816559B2 (en) | 1976-10-27 | 1976-10-27 | Testing device and method for semiconductor storage devices |
Related Child Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP59167341A Division JPS60167199A (en) | 1984-08-10 | 1984-08-10 | Inspection device for semiconductor memory |
JP59167342A Division JPS60167200A (en) | 1984-08-10 | 1984-08-10 | Method for inspecting semiconductor memory |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5354428A true JPS5354428A (en) | 1978-05-17 |
JPS5816559B2 JPS5816559B2 (en) | 1983-03-31 |
Family
ID=15021430
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP51129911A Expired JPS5816559B2 (en) | 1976-10-27 | 1976-10-27 | Testing device and method for semiconductor storage devices |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5816559B2 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5413231A (en) * | 1977-07-01 | 1979-01-31 | Takeda Riken Ind Co Ltd | Memory tester |
JPS57164500A (en) * | 1981-04-02 | 1982-10-09 | Nec Corp | Testing device of semiconductor memory |
EP0168246A2 (en) * | 1984-07-10 | 1986-01-15 | Nec Corporation | Improved active pull-up circuit |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5145948A (en) * | 1974-10-17 | 1976-04-19 | Tokyo Shibaura Electric Co |
-
1976
- 1976-10-27 JP JP51129911A patent/JPS5816559B2/en not_active Expired
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5145948A (en) * | 1974-10-17 | 1976-04-19 | Tokyo Shibaura Electric Co |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5413231A (en) * | 1977-07-01 | 1979-01-31 | Takeda Riken Ind Co Ltd | Memory tester |
JPS57164500A (en) * | 1981-04-02 | 1982-10-09 | Nec Corp | Testing device of semiconductor memory |
JPS6321999B2 (en) * | 1981-04-02 | 1988-05-10 | Nippon Electric Co | |
EP0168246A2 (en) * | 1984-07-10 | 1986-01-15 | Nec Corporation | Improved active pull-up circuit |
Also Published As
Publication number | Publication date |
---|---|
JPS5816559B2 (en) | 1983-03-31 |
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