JPS5336411A - Test method for switch matrix driving circuit - Google Patents

Test method for switch matrix driving circuit

Info

Publication number
JPS5336411A
JPS5336411A JP11135276A JP11135276A JPS5336411A JP S5336411 A JPS5336411 A JP S5336411A JP 11135276 A JP11135276 A JP 11135276A JP 11135276 A JP11135276 A JP 11135276A JP S5336411 A JPS5336411 A JP S5336411A
Authority
JP
Japan
Prior art keywords
driving circuit
switch matrix
matrix driving
test method
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11135276A
Other languages
Japanese (ja)
Other versions
JPS5725104B2 (en
Inventor
Mitsuo Suzuki
Shinsuke Kadota
Masaro Takei
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP11135276A priority Critical patent/JPS5336411A/en
Publication of JPS5336411A publication Critical patent/JPS5336411A/en
Publication of JPS5725104B2 publication Critical patent/JPS5725104B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04Q—SELECTING
    • H04Q1/00—Details of selecting apparatus or arrangements
    • H04Q1/18—Electrical details
    • H04Q1/20—Testing circuits or apparatus; Circuits or apparatus for detecting, indicating, or signalling faults or troubles
    • H04Q1/22—Automatic arrangements
    • H04Q1/24—Automatic arrangements for connection devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Monitoring And Testing Of Exchanges (AREA)

Abstract

PURPOSE:To secure an automatic test for switch matrix driving circuit in a short time as well as to realize a compactness for the test unit.
JP11135276A 1976-09-17 1976-09-17 Test method for switch matrix driving circuit Granted JPS5336411A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11135276A JPS5336411A (en) 1976-09-17 1976-09-17 Test method for switch matrix driving circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11135276A JPS5336411A (en) 1976-09-17 1976-09-17 Test method for switch matrix driving circuit

Publications (2)

Publication Number Publication Date
JPS5336411A true JPS5336411A (en) 1978-04-04
JPS5725104B2 JPS5725104B2 (en) 1982-05-27

Family

ID=14559009

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11135276A Granted JPS5336411A (en) 1976-09-17 1976-09-17 Test method for switch matrix driving circuit

Country Status (1)

Country Link
JP (1) JPS5336411A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6235960A (en) * 1985-08-10 1987-02-16 Fujitsu Ltd Exclusive control information control system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6235960A (en) * 1985-08-10 1987-02-16 Fujitsu Ltd Exclusive control information control system

Also Published As

Publication number Publication date
JPS5725104B2 (en) 1982-05-27

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