Classifications

• • G—PHYSICS
  • G11—INFORMATION STORAGE
  • G11C—STATIC STORES
  • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
  • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
  • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
• • G—PHYSICS
  • G11—INFORMATION STORAGE
  • G11C—STATIC STORES
  • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
  • G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
  • G11C7/1006—Data managing, e.g. manipulating data before writing or reading out, data bus switches or control circuits therefor

Landscapes

• Static Random-Access Memory (AREA)
• Techniques For Improving Reliability Of Storages (AREA)
• For Increasing The Reliability Of Semiconductor Memories (AREA)

Priority Applications (1)

Applications Claiming Priority (1)

Publications (1)

Family

ID=14451093

Family Applications (1)

Country Status (1)

Cited By (4)

• 1976
  • 1976-09-07 JP JP10712476A patent/JPS5332636A/ja active Pending

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