JPS53134469A - Calibration method of gauges indicating change in thickness of materials - Google Patents

Calibration method of gauges indicating change in thickness of materials

Info

Publication number
JPS53134469A
JPS53134469A JP3091378A JP3091378A JPS53134469A JP S53134469 A JPS53134469 A JP S53134469A JP 3091378 A JP3091378 A JP 3091378A JP 3091378 A JP3091378 A JP 3091378A JP S53134469 A JPS53134469 A JP S53134469A
Authority
JP
Japan
Prior art keywords
thickness
materials
calibration method
indicating change
gauges indicating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3091378A
Other languages
Japanese (ja)
Other versions
JPS6055764B2 (en
Inventor
Fuarage Kuroodo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Weston Instruments Inc
Original Assignee
Weston Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Weston Instruments Inc filed Critical Weston Instruments Inc
Publication of JPS53134469A publication Critical patent/JPS53134469A/en
Publication of JPS6055764B2 publication Critical patent/JPS6055764B2/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/16—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Electromagnetism (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP53030913A 1972-02-15 1978-03-17 thickness measuring device Expired JPS6055764B2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US22645772A 1972-02-15 1972-02-15
US226457 1972-02-15

Publications (2)

Publication Number Publication Date
JPS53134469A true JPS53134469A (en) 1978-11-24
JPS6055764B2 JPS6055764B2 (en) 1985-12-06

Family

ID=22848979

Family Applications (4)

Application Number Title Priority Date Filing Date
JP48018823A Expired JPS6055763B2 (en) 1972-02-15 1973-02-15 thickness measuring device
JP7389876A Pending JPS5284766A (en) 1972-02-15 1976-06-24 Method of and apparatus for calibrating thickness meter
JP53030913A Expired JPS6055764B2 (en) 1972-02-15 1978-03-17 thickness measuring device
JP60155873A Pending JPS61274211A (en) 1972-02-15 1985-07-15 Measuring device for thickness

Family Applications Before (2)

Application Number Title Priority Date Filing Date
JP48018823A Expired JPS6055763B2 (en) 1972-02-15 1973-02-15 thickness measuring device
JP7389876A Pending JPS5284766A (en) 1972-02-15 1976-06-24 Method of and apparatus for calibrating thickness meter

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP60155873A Pending JPS61274211A (en) 1972-02-15 1985-07-15 Measuring device for thickness

Country Status (5)

Country Link
JP (4) JPS6055763B2 (en)
CA (1) CA990417A (en)
DE (1) DE2307391A1 (en)
FR (1) FR2172254B1 (en)
GB (2) GB1427752A (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4119846A (en) * 1977-02-03 1978-10-10 Sangamo Weston, Inc. Non-contacting gage apparatus and method
US4328697A (en) * 1979-05-23 1982-05-11 Lucas Industries Limited Transducer calibration device
GB2088045B (en) * 1980-10-28 1984-09-26 Coal Industry Patents Ltd Signal processing systems
DE3206832A1 (en) * 1982-02-23 1983-09-01 Tokyo Shibaura Denki K.K., Kawasaki, Kanagawa Thickness measuring instrument measuring in a contactless fashion
JPS58150809A (en) * 1982-02-25 1983-09-07 Toshiba Corp Non-contact radiation thickness gauge
CN111016830B (en) * 2019-10-24 2023-06-27 惠州市德赛西威汽车电子股份有限公司 Voltage pulse error-proofing processing system and method

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3180985A (en) * 1962-05-14 1965-04-27 Electronic Automation Systems Standardization of radiation-absorption type density gages
US3524063A (en) * 1967-10-12 1970-08-11 Bethlehem Steel Corp Multirange radiation thickness gauge

Also Published As

Publication number Publication date
DE2307391A1 (en) 1973-08-23
JPS61274211A (en) 1986-12-04
CA990417A (en) 1976-06-01
GB1427751A (en) 1976-03-10
JPS6055764B2 (en) 1985-12-06
JPS6055763B2 (en) 1985-12-06
JPS5284766A (en) 1977-07-14
FR2172254B1 (en) 1976-04-09
GB1427752A (en) 1976-03-10
FR2172254A1 (en) 1973-09-28
JPS48104569A (en) 1973-12-27

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