JPS5238167A - Method and device for detecting shorting trouble in printed circuit or other subbassembly - Google Patents
Method and device for detecting shorting trouble in printed circuit or other subbassemblyInfo
- Publication number
- JPS5238167A JPS5238167A JP51105448A JP10544876A JPS5238167A JP S5238167 A JPS5238167 A JP S5238167A JP 51105448 A JP51105448 A JP 51105448A JP 10544876 A JP10544876 A JP 10544876A JP S5238167 A JPS5238167 A JP S5238167A
- Authority
- JP
- Japan
- Prior art keywords
- subbassembly
- trouble
- printed circuit
- detecting shorting
- shorting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/315—Contactless testing by inductive methods
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/07—Non contact-making probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU305175 | 1975-09-05 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5238167A true JPS5238167A (en) | 1977-03-24 |
Family
ID=3693533
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP51105448A Pending JPS5238167A (en) | 1975-09-05 | 1976-09-04 | Method and device for detecting shorting trouble in printed circuit or other subbassembly |
Country Status (6)
Country | Link |
---|---|
JP (1) | JPS5238167A (en) |
BE (1) | BE845841A (en) |
DE (1) | DE2639831A1 (en) |
FR (1) | FR2323155A1 (en) |
GB (1) | GB1537870A (en) |
NL (1) | NL7609845A (en) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4186338A (en) * | 1976-12-16 | 1980-01-29 | Genrad, Inc. | Phase change detection method of and apparatus for current-tracing the location of faults on printed circuit boards and similar systems |
DE3022279A1 (en) * | 1979-06-23 | 1981-01-08 | Membrain Ltd | METHOD AND DEVICE FOR LOCALIZING AN ERROR IN AN ELECTRONIC CIRCUIT |
DE3049286C2 (en) * | 1980-12-29 | 1983-11-10 | Vsesojuznyj naučno-issledovatel'skij institut elektroizmeritel'nych priborov, Leningrad | Device for contactless control of electrical impulse signals |
DE3327446C2 (en) * | 1983-07-29 | 1986-07-31 | Siemens AG, 1000 Berlin und 8000 München | Measuring method for locating faults in logic circuits and the circuit arrangement of a test transmitter for carrying out this method |
GB2166248B (en) * | 1984-10-30 | 1988-01-20 | British Gas Corp | Detecting resistance faults |
DE3729500A1 (en) * | 1987-09-03 | 1989-03-16 | Siemens Ag | Device for fault-finding in electronic circuits |
US4833396A (en) * | 1988-04-04 | 1989-05-23 | Hughes Aircraft Company | Lead frame short tester |
DE19742055C2 (en) | 1997-09-24 | 2000-02-24 | Ita Ingb Testaufgaben Gmbh | Device for testing circuit boards |
CN112946459A (en) * | 2021-02-26 | 2021-06-11 | 天津中德应用技术大学 | Device and method for detecting short-circuit fault point of finished printed circuit board |
-
1976
- 1976-09-02 GB GB36487/76A patent/GB1537870A/en not_active Expired
- 1976-09-03 DE DE19762639831 patent/DE2639831A1/en not_active Withdrawn
- 1976-09-03 FR FR7626637A patent/FR2323155A1/en not_active Withdrawn
- 1976-09-03 BE BE170342A patent/BE845841A/en unknown
- 1976-09-03 NL NL7609845A patent/NL7609845A/en not_active Application Discontinuation
- 1976-09-04 JP JP51105448A patent/JPS5238167A/en active Pending
Also Published As
Publication number | Publication date |
---|---|
FR2323155A1 (en) | 1977-04-01 |
NL7609845A (en) | 1977-03-08 |
BE845841A (en) | 1976-12-31 |
GB1537870A (en) | 1979-01-04 |
DE2639831A1 (en) | 1977-03-17 |
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