JPS5238167A - Method and device for detecting shorting trouble in printed circuit or other subbassembly - Google Patents

Method and device for detecting shorting trouble in printed circuit or other subbassembly

Info

Publication number
JPS5238167A
JPS5238167A JP51105448A JP10544876A JPS5238167A JP S5238167 A JPS5238167 A JP S5238167A JP 51105448 A JP51105448 A JP 51105448A JP 10544876 A JP10544876 A JP 10544876A JP S5238167 A JPS5238167 A JP S5238167A
Authority
JP
Japan
Prior art keywords
subbassembly
trouble
printed circuit
detecting shorting
shorting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP51105448A
Other languages
Japanese (ja)
Inventor
Haafuton Toomasu Jieemusu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ericsson Australia Pty Ltd
Original Assignee
LM Ericsson Pty Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by LM Ericsson Pty Ltd filed Critical LM Ericsson Pty Ltd
Publication of JPS5238167A publication Critical patent/JPS5238167A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302Contactless testing
    • G01R31/315Contactless testing by inductive methods
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/07Non contact-making probes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52Testing for short-circuits, leakage current or ground faults

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP51105448A 1975-09-05 1976-09-04 Method and device for detecting shorting trouble in printed circuit or other subbassembly Pending JPS5238167A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
AU305175 1975-09-05

Publications (1)

Publication Number Publication Date
JPS5238167A true JPS5238167A (en) 1977-03-24

Family

ID=3693533

Family Applications (1)

Application Number Title Priority Date Filing Date
JP51105448A Pending JPS5238167A (en) 1975-09-05 1976-09-04 Method and device for detecting shorting trouble in printed circuit or other subbassembly

Country Status (6)

Country Link
JP (1) JPS5238167A (en)
BE (1) BE845841A (en)
DE (1) DE2639831A1 (en)
FR (1) FR2323155A1 (en)
GB (1) GB1537870A (en)
NL (1) NL7609845A (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4186338A (en) * 1976-12-16 1980-01-29 Genrad, Inc. Phase change detection method of and apparatus for current-tracing the location of faults on printed circuit boards and similar systems
DE3022279A1 (en) * 1979-06-23 1981-01-08 Membrain Ltd METHOD AND DEVICE FOR LOCALIZING AN ERROR IN AN ELECTRONIC CIRCUIT
DE3049286C2 (en) * 1980-12-29 1983-11-10 Vsesojuznyj naučno-issledovatel'skij institut elektroizmeritel'nych priborov, Leningrad Device for contactless control of electrical impulse signals
DE3327446C2 (en) * 1983-07-29 1986-07-31 Siemens AG, 1000 Berlin und 8000 München Measuring method for locating faults in logic circuits and the circuit arrangement of a test transmitter for carrying out this method
GB2166248B (en) * 1984-10-30 1988-01-20 British Gas Corp Detecting resistance faults
DE3729500A1 (en) * 1987-09-03 1989-03-16 Siemens Ag Device for fault-finding in electronic circuits
US4833396A (en) * 1988-04-04 1989-05-23 Hughes Aircraft Company Lead frame short tester
DE19742055C2 (en) 1997-09-24 2000-02-24 Ita Ingb Testaufgaben Gmbh Device for testing circuit boards
CN112946459A (en) * 2021-02-26 2021-06-11 天津中德应用技术大学 Device and method for detecting short-circuit fault point of finished printed circuit board

Also Published As

Publication number Publication date
FR2323155A1 (en) 1977-04-01
NL7609845A (en) 1977-03-08
BE845841A (en) 1976-12-31
GB1537870A (en) 1979-01-04
DE2639831A1 (en) 1977-03-17

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