JPS5227380A - Measuring system of semiconductor breakdown voltage - Google Patents
Measuring system of semiconductor breakdown voltageInfo
- Publication number
- JPS5227380A JPS5227380A JP10372475A JP10372475A JPS5227380A JP S5227380 A JPS5227380 A JP S5227380A JP 10372475 A JP10372475 A JP 10372475A JP 10372475 A JP10372475 A JP 10372475A JP S5227380 A JPS5227380 A JP S5227380A
- Authority
- JP
- Japan
- Prior art keywords
- breakdown voltage
- measuring system
- semiconductor breakdown
- semiconductor
- destructive
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE: To ensure a non-destructive and easy measurement of semiconductor breakdown voltage.
COPYRIGHT: (C)1977,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10372475A JPS5227380A (en) | 1975-08-27 | 1975-08-27 | Measuring system of semiconductor breakdown voltage |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10372475A JPS5227380A (en) | 1975-08-27 | 1975-08-27 | Measuring system of semiconductor breakdown voltage |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5227380A true JPS5227380A (en) | 1977-03-01 |
Family
ID=14361608
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10372475A Pending JPS5227380A (en) | 1975-08-27 | 1975-08-27 | Measuring system of semiconductor breakdown voltage |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5227380A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009069147A (en) * | 2007-09-17 | 2009-04-02 | Toppoly Optoelectronics Corp | Measurement system and method |
JP2013257320A (en) * | 2012-06-08 | 2013-12-26 | General Electric Co <Ge> | Method and system for calibrating gain of gamma-ray detector |
-
1975
- 1975-08-27 JP JP10372475A patent/JPS5227380A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009069147A (en) * | 2007-09-17 | 2009-04-02 | Toppoly Optoelectronics Corp | Measurement system and method |
JP2013257320A (en) * | 2012-06-08 | 2013-12-26 | General Electric Co <Ge> | Method and system for calibrating gain of gamma-ray detector |
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