JPS5227380A - Measuring system of semiconductor breakdown voltage - Google Patents

Measuring system of semiconductor breakdown voltage

Info

Publication number
JPS5227380A
JPS5227380A JP10372475A JP10372475A JPS5227380A JP S5227380 A JPS5227380 A JP S5227380A JP 10372475 A JP10372475 A JP 10372475A JP 10372475 A JP10372475 A JP 10372475A JP S5227380 A JPS5227380 A JP S5227380A
Authority
JP
Japan
Prior art keywords
breakdown voltage
measuring system
semiconductor breakdown
semiconductor
destructive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10372475A
Other languages
Japanese (ja)
Inventor
Yasutami Tsukurida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP10372475A priority Critical patent/JPS5227380A/en
Publication of JPS5227380A publication Critical patent/JPS5227380A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE: To ensure a non-destructive and easy measurement of semiconductor breakdown voltage.
COPYRIGHT: (C)1977,JPO&Japio
JP10372475A 1975-08-27 1975-08-27 Measuring system of semiconductor breakdown voltage Pending JPS5227380A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10372475A JPS5227380A (en) 1975-08-27 1975-08-27 Measuring system of semiconductor breakdown voltage

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10372475A JPS5227380A (en) 1975-08-27 1975-08-27 Measuring system of semiconductor breakdown voltage

Publications (1)

Publication Number Publication Date
JPS5227380A true JPS5227380A (en) 1977-03-01

Family

ID=14361608

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10372475A Pending JPS5227380A (en) 1975-08-27 1975-08-27 Measuring system of semiconductor breakdown voltage

Country Status (1)

Country Link
JP (1) JPS5227380A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009069147A (en) * 2007-09-17 2009-04-02 Toppoly Optoelectronics Corp Measurement system and method
JP2013257320A (en) * 2012-06-08 2013-12-26 General Electric Co <Ge> Method and system for calibrating gain of gamma-ray detector

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009069147A (en) * 2007-09-17 2009-04-02 Toppoly Optoelectronics Corp Measurement system and method
JP2013257320A (en) * 2012-06-08 2013-12-26 General Electric Co <Ge> Method and system for calibrating gain of gamma-ray detector

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