JPS5217892A - Method of detecting impurities in liquid - Google Patents

Method of detecting impurities in liquid

Info

Publication number
JPS5217892A
JPS5217892A JP50093147A JP9314775A JPS5217892A JP S5217892 A JPS5217892 A JP S5217892A JP 50093147 A JP50093147 A JP 50093147A JP 9314775 A JP9314775 A JP 9314775A JP S5217892 A JPS5217892 A JP S5217892A
Authority
JP
Japan
Prior art keywords
liquid
impurities
detecting impurities
detecting
deposit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP50093147A
Other languages
Japanese (ja)
Other versions
JPS5736538B2 (en
Inventor
Haruichiro Sakaguchi
Naoki Sakurama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP50093147A priority Critical patent/JPS5217892A/en
Publication of JPS5217892A publication Critical patent/JPS5217892A/en
Publication of JPS5736538B2 publication Critical patent/JPS5736538B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analyzing Non-Biological Materials By The Use Of Chemical Means (AREA)
  • Monitoring And Testing Of Nuclear Reactors (AREA)

Abstract

PURPOSE:A method of detecting individually at one time impurities of varying kinds by cooling the liquid to allow the impurities dissolved therein to deposit, emitting radiation to the deposited impurities then making waveform analysis of the reflected radiation.
JP50093147A 1975-08-01 1975-08-01 Method of detecting impurities in liquid Granted JPS5217892A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP50093147A JPS5217892A (en) 1975-08-01 1975-08-01 Method of detecting impurities in liquid

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50093147A JPS5217892A (en) 1975-08-01 1975-08-01 Method of detecting impurities in liquid

Publications (2)

Publication Number Publication Date
JPS5217892A true JPS5217892A (en) 1977-02-10
JPS5736538B2 JPS5736538B2 (en) 1982-08-04

Family

ID=14074410

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50093147A Granted JPS5217892A (en) 1975-08-01 1975-08-01 Method of detecting impurities in liquid

Country Status (1)

Country Link
JP (1) JPS5217892A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60140105A (en) * 1983-12-27 1985-07-25 Shimadzu Corp Apparatus for analysis of multi-layered film
JPS60142205A (en) * 1983-12-29 1985-07-27 Shimadzu Corp Multilayer film analyzing device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5017695A (en) * 1973-06-14 1975-02-25

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5017695A (en) * 1973-06-14 1975-02-25

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60140105A (en) * 1983-12-27 1985-07-25 Shimadzu Corp Apparatus for analysis of multi-layered film
JPH0514843B2 (en) * 1983-12-27 1993-02-26 Shimadzu Corp
JPS60142205A (en) * 1983-12-29 1985-07-27 Shimadzu Corp Multilayer film analyzing device
JPH0514842B2 (en) * 1983-12-29 1993-02-26 Shimadzu Corp

Also Published As

Publication number Publication date
JPS5736538B2 (en) 1982-08-04

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