JPS52150916A - Automatic testing system - Google Patents

Automatic testing system

Info

Publication number
JPS52150916A
JPS52150916A JP6766276A JP6766276A JPS52150916A JP S52150916 A JPS52150916 A JP S52150916A JP 6766276 A JP6766276 A JP 6766276A JP 6766276 A JP6766276 A JP 6766276A JP S52150916 A JPS52150916 A JP S52150916A
Authority
JP
Japan
Prior art keywords
testing system
automatic testing
dial
simplify
facilitate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6766276A
Other languages
Japanese (ja)
Inventor
Masahiko Fujita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP6766276A priority Critical patent/JPS52150916A/en
Publication of JPS52150916A publication Critical patent/JPS52150916A/en
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/22—Arrangements for supervision, monitoring or testing
    • H04M3/26—Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring
    • H04M3/28—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor
    • H04M3/32—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for lines between exchanges
    • H04M3/323—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for lines between exchanges for the arrangements providing the connection (test connection, test call, call simulation)

Landscapes

  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Monitoring And Testing Of Exchanges (AREA)

Abstract

PURPOSE:To simplify the figure setting part such as the dial, etc. which is equipped to the operation surface of the test equipment, and thus to facilitate the memory test for the storage circuit.
JP6766276A 1976-06-11 1976-06-11 Automatic testing system Pending JPS52150916A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6766276A JPS52150916A (en) 1976-06-11 1976-06-11 Automatic testing system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6766276A JPS52150916A (en) 1976-06-11 1976-06-11 Automatic testing system

Publications (1)

Publication Number Publication Date
JPS52150916A true JPS52150916A (en) 1977-12-15

Family

ID=13351432

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6766276A Pending JPS52150916A (en) 1976-06-11 1976-06-11 Automatic testing system

Country Status (1)

Country Link
JP (1) JPS52150916A (en)

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