JPS5210793A - Fault detector - Google Patents

Fault detector

Info

Publication number
JPS5210793A
JPS5210793A JP8745775A JP8745775A JPS5210793A JP S5210793 A JPS5210793 A JP S5210793A JP 8745775 A JP8745775 A JP 8745775A JP 8745775 A JP8745775 A JP 8745775A JP S5210793 A JPS5210793 A JP S5210793A
Authority
JP
Japan
Prior art keywords
light
indicate
fault detector
sensitive
reflection rays
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8745775A
Other languages
Japanese (ja)
Inventor
Kenji Tanaka
Hisayasu Tamura
Hideharu Shimokawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yaskawa Electric Corp
Original Assignee
Yaskawa Electric Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yaskawa Electric Manufacturing Co Ltd filed Critical Yaskawa Electric Manufacturing Co Ltd
Priority to JP8745775A priority Critical patent/JPS5210793A/en
Publication of JPS5210793A publication Critical patent/JPS5210793A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:Separate detection of the falult of sheet material by using a light treceiver sensitive only to the regular reflection rays to indicate the discoloration of material characterized by the light absorbability and another sensitive only to the irregular reflection rays to indicate the deformation of amterial characterized by the light scattering effect.
JP8745775A 1975-07-15 1975-07-15 Fault detector Pending JPS5210793A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8745775A JPS5210793A (en) 1975-07-15 1975-07-15 Fault detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8745775A JPS5210793A (en) 1975-07-15 1975-07-15 Fault detector

Publications (1)

Publication Number Publication Date
JPS5210793A true JPS5210793A (en) 1977-01-27

Family

ID=13915384

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8745775A Pending JPS5210793A (en) 1975-07-15 1975-07-15 Fault detector

Country Status (1)

Country Link
JP (1) JPS5210793A (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5433660U (en) * 1977-08-10 1979-03-05
JPS54105587U (en) * 1978-01-09 1979-07-25
JPS5497475A (en) * 1978-01-04 1979-08-01 Sick Optik Elektronik Erwin Rays radiation angle detecting optical device from beltlike body scanned by rays
JPS556293A (en) * 1978-06-23 1980-01-17 Sick Optik Elektronik Erwin Detector for surface scratches on strip type element
JPS59168311A (en) * 1983-03-15 1984-09-22 Hamamatsu Photonics Kk Device for detecting deformation of surface of body
JPS6188863A (en) * 1984-10-08 1986-05-07 Noriyuki Furukawa Detector of damaged laver
US5458744A (en) * 1990-05-14 1995-10-17 Materials-Concepts-Research Limited Process to produce hydrogen and/or hemihydrate calcium sulphate from calcium sulphite
JP2011214982A (en) * 2010-03-31 2011-10-27 Sumitomo Chemical Co Ltd Die unevenness inspection device and die unevenness inspection method

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4857689A (en) * 1971-11-19 1973-08-13

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4857689A (en) * 1971-11-19 1973-08-13

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5433660U (en) * 1977-08-10 1979-03-05
JPS5497475A (en) * 1978-01-04 1979-08-01 Sick Optik Elektronik Erwin Rays radiation angle detecting optical device from beltlike body scanned by rays
JPS638420B2 (en) * 1978-01-04 1988-02-23 Erubin Jitsuku Gmbh Oputeiku Erekutoroniku
JPS54105587U (en) * 1978-01-09 1979-07-25
JPS556293A (en) * 1978-06-23 1980-01-17 Sick Optik Elektronik Erwin Detector for surface scratches on strip type element
JPS6223250B2 (en) * 1978-06-23 1987-05-22 Erubin Jitsuku Oputeiku Erekutoroniku
JPS59168311A (en) * 1983-03-15 1984-09-22 Hamamatsu Photonics Kk Device for detecting deformation of surface of body
JPS6188863A (en) * 1984-10-08 1986-05-07 Noriyuki Furukawa Detector of damaged laver
US5458744A (en) * 1990-05-14 1995-10-17 Materials-Concepts-Research Limited Process to produce hydrogen and/or hemihydrate calcium sulphate from calcium sulphite
JP2011214982A (en) * 2010-03-31 2011-10-27 Sumitomo Chemical Co Ltd Die unevenness inspection device and die unevenness inspection method

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