JPS5180173A - - Google Patents
Info
- Publication number
- JPS5180173A JPS5180173A JP50004394A JP439475A JPS5180173A JP S5180173 A JPS5180173 A JP S5180173A JP 50004394 A JP50004394 A JP 50004394A JP 439475 A JP439475 A JP 439475A JP S5180173 A JPS5180173 A JP S5180173A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP439475A JPS5346671B2 (en) | 1975-01-08 | 1975-01-08 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP439475A JPS5346671B2 (en) | 1975-01-08 | 1975-01-08 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5180173A true JPS5180173A (en) | 1976-07-13 |
| JPS5346671B2 JPS5346671B2 (en) | 1978-12-15 |
Family
ID=11583121
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP439475A Expired JPS5346671B2 (en) | 1975-01-08 | 1975-01-08 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5346671B2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012168153A (en) * | 2011-01-25 | 2012-09-06 | Institute Of National Colleges Of Technology Japan | Cmos logical ic package and an inspection method thereof |
| JP2016109577A (en) * | 2014-12-08 | 2016-06-20 | エスペック株式会社 | Power cycle testing device and method for power cycle test |
-
1975
- 1975-01-08 JP JP439475A patent/JPS5346671B2/ja not_active Expired
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012168153A (en) * | 2011-01-25 | 2012-09-06 | Institute Of National Colleges Of Technology Japan | Cmos logical ic package and an inspection method thereof |
| JP2016109577A (en) * | 2014-12-08 | 2016-06-20 | エスペック株式会社 | Power cycle testing device and method for power cycle test |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5346671B2 (en) | 1978-12-15 |