JPS5150789A - Jotainosokuteihoho oyobisochi - Google Patents

Jotainosokuteihoho oyobisochi

Info

Publication number
JPS5150789A
JPS5150789A JP10447275A JP10447275A JPS5150789A JP S5150789 A JPS5150789 A JP S5150789A JP 10447275 A JP10447275 A JP 10447275A JP 10447275 A JP10447275 A JP 10447275A JP S5150789 A JPS5150789 A JP S5150789A
Authority
JP
Japan
Prior art keywords
oyobisochi
jotainosokuteihoho
jotainosokuteihoho oyobisochi
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10447275A
Other languages
Japanese (ja)
Inventor
Gurasuman Hansukurisuchian
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Publication of JPS5150789A publication Critical patent/JPS5150789A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2688Measuring quality factor or dielectric loss, e.g. loss angle, or power factor
    • G01R27/2694Measuring dielectric loss, e.g. loss angle, loss factor or power factor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/08Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using capacitive means
    • G01B7/087Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using capacitive means for measuring of objects while moving
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/34Paper
    • G01N33/346Paper sheets
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2617Measuring dielectric properties, e.g. constants
    • G01R27/2635Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/22Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance
    • G01N27/223Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance for determining moisture content, e.g. humidity

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Medicinal Chemistry (AREA)
  • Food Science & Technology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Power Engineering (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
JP10447275A 1974-08-29 1975-08-28 Jotainosokuteihoho oyobisochi Pending JPS5150789A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19742441473 DE2441473C3 (en) 1974-08-29 1974-08-29 Method and device for measuring the moisture and / or filler content or the thickness of webs

Publications (1)

Publication Number Publication Date
JPS5150789A true JPS5150789A (en) 1976-05-04

Family

ID=5924428

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10447275A Pending JPS5150789A (en) 1974-08-29 1975-08-28 Jotainosokuteihoho oyobisochi

Country Status (2)

Country Link
JP (1) JPS5150789A (en)
DE (1) DE2441473C3 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54100795A (en) * 1978-01-25 1979-08-08 Nitsutoku Kanseikiyo Kk Wood moisture contents measuring device

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3934852A1 (en) * 1989-10-19 1991-04-25 Macon Gmbh Klebstoff Auftragsg Monitoring device for coating substrate with paste - using capacitive sensor in HF resonant circuit whose frequency change is measured as sensor moves parallel to surface
DE19949977B4 (en) * 1999-10-13 2005-01-20 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Method for determining the presence of inorganic, organic or oxide layers on metallic substrates or the measurement of surface temperatures of plastic substrates

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54100795A (en) * 1978-01-25 1979-08-08 Nitsutoku Kanseikiyo Kk Wood moisture contents measuring device

Also Published As

Publication number Publication date
DE2441473B2 (en) 1977-09-29
DE2441473C3 (en) 1978-05-24
DE2441473A1 (en) 1976-03-11

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