JPS51139382A - Device of automatically measuring the distribution of reflectance - Google Patents
Device of automatically measuring the distribution of reflectanceInfo
- Publication number
- JPS51139382A JPS51139382A JP6288775A JP6288775A JPS51139382A JP S51139382 A JPS51139382 A JP S51139382A JP 6288775 A JP6288775 A JP 6288775A JP 6288775 A JP6288775 A JP 6288775A JP S51139382 A JPS51139382 A JP S51139382A
- Authority
- JP
- Japan
- Prior art keywords
- distribution
- reflectance
- automatically measuring
- specimen
- measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
PURPOSE:To accurately and automatically measure the distribution of relfectance of a specimen by irradiating light to the specimen that is to be measured and that is being vibrated finely in the vertical direction and measuring the reflected light.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6288775A JPS51139382A (en) | 1975-05-28 | 1975-05-28 | Device of automatically measuring the distribution of reflectance |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6288775A JPS51139382A (en) | 1975-05-28 | 1975-05-28 | Device of automatically measuring the distribution of reflectance |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS51139382A true JPS51139382A (en) | 1976-12-01 |
Family
ID=13213203
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6288775A Pending JPS51139382A (en) | 1975-05-28 | 1975-05-28 | Device of automatically measuring the distribution of reflectance |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS51139382A (en) |
-
1975
- 1975-05-28 JP JP6288775A patent/JPS51139382A/en active Pending
Similar Documents
Publication | Publication Date | Title |
---|---|---|
ATE41055T1 (en) | APPARATUS FOR MEASURING A THICKNESS. | |
ES234148U (en) | Cuvette for automatic chemical testing apparatus | |
JPS51146882A (en) | Defoaming device-loaded throwing into type colorimeter | |
JPS5316652A (en) | Thickness measuring apparatus of plate form objects | |
JPS51139382A (en) | Device of automatically measuring the distribution of reflectance | |
JPS533260A (en) | Film thickness measuring device of transparent thin film | |
JPS5227395A (en) | Distance measuring device | |
JPS5271289A (en) | Surface inspection device | |
JPS522788A (en) | Granuler fineness distribution measuring device | |
JPS5213378A (en) | Automatic measuring device for reflexibility distribution | |
JPS5322787A (en) | Measuring apparatus for corpuscle | |
JPS52129545A (en) | Method and apparatus for measurement of uniformity in surface roughnes s | |
AT360780B (en) | MEASURING DEVICE FOR DENSITY MEASUREMENT OF A MIXTURE CONTAINED IN A PIPELINE | |
JPS542175A (en) | Measuring apparatus of laser beam diameters | |
JPS5267384A (en) | Reflectance and transmissivity meter | |
JPS5279988A (en) | Radiation type tire inspecting apparatus | |
JPS5276985A (en) | Flaw detector | |
JPS51123661A (en) | A method to measure the height of pile | |
JPS5248347A (en) | Non-contact method of measuring clearance or level difference by the u se of wave interference phenomena | |
JPS5392161A (en) | Measuring device | |
JPS5237482A (en) | Device for measuring suspended particulate matter using light scatteri ng | |
JPS53120552A (en) | Evaluation method of plating surface | |
JPS52110656A (en) | Dimension measuring method | |
JPS549689A (en) | Dryness detecting method | |
JPS543590A (en) | Photoelectric inspecting apparatus |