JPS51127776A - Adjusting method of a slight amount of fine grain sample for x-ray dif eraction - Google Patents

Adjusting method of a slight amount of fine grain sample for x-ray dif eraction

Info

Publication number
JPS51127776A
JPS51127776A JP50052756A JP5275675A JPS51127776A JP S51127776 A JPS51127776 A JP S51127776A JP 50052756 A JP50052756 A JP 50052756A JP 5275675 A JP5275675 A JP 5275675A JP S51127776 A JPS51127776 A JP S51127776A
Authority
JP
Japan
Prior art keywords
eraction
fine grain
slight amount
adjusting method
grain sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP50052756A
Other languages
Japanese (ja)
Inventor
Takashi Hashimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hino Motors Ltd
Original Assignee
Hino Motors Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hino Motors Ltd filed Critical Hino Motors Ltd
Priority to JP50052756A priority Critical patent/JPS51127776A/en
Publication of JPS51127776A publication Critical patent/JPS51127776A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Sampling And Sample Adjustment (AREA)

Abstract

PURPOSE:To obtain the simple method of adjustment of sample to be able to measure the components by X-ray diffraction, even though the sample is a slight amount of fine grain.
JP50052756A 1975-04-30 1975-04-30 Adjusting method of a slight amount of fine grain sample for x-ray dif eraction Pending JPS51127776A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP50052756A JPS51127776A (en) 1975-04-30 1975-04-30 Adjusting method of a slight amount of fine grain sample for x-ray dif eraction

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50052756A JPS51127776A (en) 1975-04-30 1975-04-30 Adjusting method of a slight amount of fine grain sample for x-ray dif eraction

Publications (1)

Publication Number Publication Date
JPS51127776A true JPS51127776A (en) 1976-11-08

Family

ID=12923723

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50052756A Pending JPS51127776A (en) 1975-04-30 1975-04-30 Adjusting method of a slight amount of fine grain sample for x-ray dif eraction

Country Status (1)

Country Link
JP (1) JPS51127776A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5673441U (en) * 1979-11-08 1981-06-16
US11460360B2 (en) 2017-11-14 2022-10-04 Intuitive Surgical Operations, Inc. Split bridge circuit force sensor
US11571264B2 (en) 2007-12-18 2023-02-07 Intuitive Surgical Operations, Inc. Force sensor temperature compensation
US11650111B2 (en) 2007-12-18 2023-05-16 Intuitive Surgical Operations, Inc. Ribbed force sensor

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49126393A (en) * 1973-04-05 1974-12-03

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49126393A (en) * 1973-04-05 1974-12-03

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5673441U (en) * 1979-11-08 1981-06-16
JPS5724205Y2 (en) * 1979-11-08 1982-05-26
US11571264B2 (en) 2007-12-18 2023-02-07 Intuitive Surgical Operations, Inc. Force sensor temperature compensation
US11650111B2 (en) 2007-12-18 2023-05-16 Intuitive Surgical Operations, Inc. Ribbed force sensor
US11460360B2 (en) 2017-11-14 2022-10-04 Intuitive Surgical Operations, Inc. Split bridge circuit force sensor
US11965789B2 (en) 2017-11-14 2024-04-23 Intuitive Surgical Operations, Inc. Split bridge circuit force sensor

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