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Hitachi Ltd
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Hitachi Ltd
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Application filed by Hitachi LtdfiledCriticalHitachi Ltd
Priority to JP4638175ApriorityCriticalpatent/JPS51122484A/en
Publication of JPS51122484ApublicationCriticalpatent/JPS51122484A/en
Investigating Or Analyzing Materials By The Use Of Magnetic Means
(AREA)
Abstract
PURPOSE: To obtain a magnetic axle defectscope with a high inspection efficiency which enables detection of axle defect with sufficient accuracy by means of a small magnetizing current.