JPS51121388A - Apparatus for adjusting a specimen for x-ray diffration camera - Google Patents

Apparatus for adjusting a specimen for x-ray diffration camera

Info

Publication number
JPS51121388A
JPS51121388A JP50046144A JP4614475A JPS51121388A JP S51121388 A JPS51121388 A JP S51121388A JP 50046144 A JP50046144 A JP 50046144A JP 4614475 A JP4614475 A JP 4614475A JP S51121388 A JPS51121388 A JP S51121388A
Authority
JP
Japan
Prior art keywords
specimen
camera
adjusting
ray diffration
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP50046144A
Other languages
Japanese (ja)
Inventor
Tsutomu Kawamura
Fumio Shimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP50046144A priority Critical patent/JPS51121388A/en
Publication of JPS51121388A publication Critical patent/JPS51121388A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Sampling And Sample Adjustment (AREA)

Abstract

PURPOSE:To carry out centering without removing a crystal to be tested from X-ray irradiating system, by providing a reflecting mirror.
JP50046144A 1975-04-16 1975-04-16 Apparatus for adjusting a specimen for x-ray diffration camera Pending JPS51121388A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP50046144A JPS51121388A (en) 1975-04-16 1975-04-16 Apparatus for adjusting a specimen for x-ray diffration camera

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50046144A JPS51121388A (en) 1975-04-16 1975-04-16 Apparatus for adjusting a specimen for x-ray diffration camera

Publications (1)

Publication Number Publication Date
JPS51121388A true JPS51121388A (en) 1976-10-23

Family

ID=12738763

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50046144A Pending JPS51121388A (en) 1975-04-16 1975-04-16 Apparatus for adjusting a specimen for x-ray diffration camera

Country Status (1)

Country Link
JP (1) JPS51121388A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5798846A (en) * 1980-12-11 1982-06-19 Nec Corp X-ray diffractometer
JPS57197454A (en) * 1981-05-29 1982-12-03 Rigaku Denki Kogyo Kk X-ray analysing apparatus
JPS5975109A (en) * 1982-10-23 1984-04-27 ヘルミユ−ト・フイツシヤ−・ゲ−エムベ−ハ−・ウント・コンパニ−・インステイテユ−ト・フユア・エレクトロニ−ク・ウント・メステヒニ−ク Measuring device for thickness of thin layer
JPS6354057U (en) * 1986-09-27 1988-04-11
WO2014076974A1 (en) * 2012-11-16 2014-05-22 パルステック工業株式会社 Diffraction ring forming device and diffraction ring forming system
JP5967394B2 (en) * 2013-02-21 2016-08-10 パルステック工業株式会社 Diffraction ring forming device and X-ray diffraction measuring device

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5798846A (en) * 1980-12-11 1982-06-19 Nec Corp X-ray diffractometer
JPS57197454A (en) * 1981-05-29 1982-12-03 Rigaku Denki Kogyo Kk X-ray analysing apparatus
JPS5975109A (en) * 1982-10-23 1984-04-27 ヘルミユ−ト・フイツシヤ−・ゲ−エムベ−ハ−・ウント・コンパニ−・インステイテユ−ト・フユア・エレクトロニ−ク・ウント・メステヒニ−ク Measuring device for thickness of thin layer
JPH0244363B2 (en) * 1982-10-23 1990-10-03 Fischer Gmbh & Co Helmut
JPS6354057U (en) * 1986-09-27 1988-04-11
WO2014076974A1 (en) * 2012-11-16 2014-05-22 パルステック工業株式会社 Diffraction ring forming device and diffraction ring forming system
JP2014098677A (en) * 2012-11-16 2014-05-29 Pulstec Industrial Co Ltd Diffraction ring formation device, and diffraction ring formation system
JP5967394B2 (en) * 2013-02-21 2016-08-10 パルステック工業株式会社 Diffraction ring forming device and X-ray diffraction measuring device

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