JPS4952547A - - Google Patents
Info
- Publication number
- JPS4952547A JPS4952547A JP48051217A JP5121773A JPS4952547A JP S4952547 A JPS4952547 A JP S4952547A JP 48051217 A JP48051217 A JP 48051217A JP 5121773 A JP5121773 A JP 5121773A JP S4952547 A JPS4952547 A JP S4952547A
- Authority
- JP
- Japan
- Prior art keywords
- state
- sequence
- variables
- testing
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
- G01R31/318392—Generation of test inputs, e.g. test vectors, patterns or sequences for sequential circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318555—Control logic
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
1381413 Generating test patterns INTERNATIONAL BUSINESS MACHINES CORP 4 May 1973 [21 June 1972] 21222/73 Heading G4A A homing sequence for placing a sequential logic circuit in a predetermined state, compatible with testing by a testing sequence, is generated by data processing apparatus arranged to derive the sequence in reverse order from the total state (input variables and circuit state variables) corresponding to the desired set state. A sequence of total states is derived until a state having no circuit state variables is reached, this state defining the start of the homing sequence. Details of an algorithm for generating the homing sequence are described with reference to Fig. 5 (not shown). Specification 1,381,414 is referred to.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US26503572A | 1972-06-21 | 1972-06-21 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS4952547A true JPS4952547A (en) | 1974-05-22 |
Family
ID=23008681
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP48051217A Pending JPS4952547A (en) | 1972-06-21 | 1973-05-10 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JPS4952547A (en) |
CA (1) | CA990405A (en) |
GB (1) | GB1381413A (en) |
IT (1) | IT998133B (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4184630A (en) * | 1978-06-19 | 1980-01-22 | International Business Machines Corporation | Verifying circuit operation |
US4853928A (en) * | 1987-08-28 | 1989-08-01 | Hewlett-Packard Company | Automatic test generator for logic devices |
US5097468A (en) * | 1988-05-03 | 1992-03-17 | Digital Equipment Corporation | Testing asynchronous processes |
US5410552A (en) * | 1992-03-27 | 1995-04-25 | Matsushita Electric Industrial Co., Ltd. | Method and apparatus for generating test sequence |
-
1973
- 1973-05-04 GB GB2122273A patent/GB1381413A/en not_active Expired
- 1973-05-10 JP JP48051217A patent/JPS4952547A/ja active Pending
- 1973-05-15 CA CA171,632A patent/CA990405A/en not_active Expired
- 1973-06-12 IT IT2516773A patent/IT998133B/en active
Also Published As
Publication number | Publication date |
---|---|
CA990405A (en) | 1976-06-01 |
GB1381413A (en) | 1975-01-22 |
IT998133B (en) | 1976-01-20 |
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