JPS4814637B1 - - Google Patents
Info
- Publication number
- JPS4814637B1 JPS4814637B1 JP9346069A JP9346069A JPS4814637B1 JP S4814637 B1 JPS4814637 B1 JP S4814637B1 JP 9346069 A JP9346069 A JP 9346069A JP 9346069 A JP9346069 A JP 9346069A JP S4814637 B1 JPS4814637 B1 JP S4814637B1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measurement Of Unknown Time Intervals (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9346069A JPS4814637B1 (xx) | 1969-11-20 | 1969-11-20 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9346069A JPS4814637B1 (xx) | 1969-11-20 | 1969-11-20 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS4814637B1 true JPS4814637B1 (xx) | 1973-05-09 |
Family
ID=14082926
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9346069A Pending JPS4814637B1 (xx) | 1969-11-20 | 1969-11-20 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS4814637B1 (xx) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS569128Y2 (xx) * | 1976-09-29 | 1981-02-27 | ||
| JPS5815763Y2 (ja) * | 1976-02-26 | 1983-03-30 | 株式会社日立ホームテック | 高周波加熱装置 |
| JP2012198127A (ja) * | 2011-03-22 | 2012-10-18 | Shindengen Electric Mfg Co Ltd | 半導体デバイスの検査回路、半導体デバイスの検査方法、及び、その検査方法により検査された半導体デバイス |
-
1969
- 1969-11-20 JP JP9346069A patent/JPS4814637B1/ja active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5815763Y2 (ja) * | 1976-02-26 | 1983-03-30 | 株式会社日立ホームテック | 高周波加熱装置 |
| JPS569128Y2 (xx) * | 1976-09-29 | 1981-02-27 | ||
| JP2012198127A (ja) * | 2011-03-22 | 2012-10-18 | Shindengen Electric Mfg Co Ltd | 半導体デバイスの検査回路、半導体デバイスの検査方法、及び、その検査方法により検査された半導体デバイス |