JPH11271235A - Detecting method for defective part of inspection object - Google Patents
Detecting method for defective part of inspection objectInfo
- Publication number
- JPH11271235A JPH11271235A JP7206498A JP7206498A JPH11271235A JP H11271235 A JPH11271235 A JP H11271235A JP 7206498 A JP7206498 A JP 7206498A JP 7206498 A JP7206498 A JP 7206498A JP H11271235 A JPH11271235 A JP H11271235A
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- JP
- Japan
- Prior art keywords
- inspected
- inspection object
- image
- light
- camera
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
Description
【０００１】[0001]
【発明の属する技術分野】本発明は、被検査対象物の表
面に生じた欠陥部を識別し且つ欠陥部の位置を特定する
被検査対象物の欠陥部検出方法に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for detecting a defect on an object to be inspected, which identifies a defect on the surface of the object to be inspected and specifies the position of the defect.
【０００２】[0002]
【従来の技術】タンク等を建設もしくは補修した際に
は、溶接部に割れや腐食の欠陥部が存在しないよう点検
する必要がある。2. Description of the Related Art When a tank or the like is constructed or repaired, it is necessary to check that there is no crack or corrosion defect in the welded portion.
【０００３】従来、被検査対象物の溶接部に欠陥部が存
在しないように点検する方法は、多数知られているが、
その代表的なものを例示すれば次の通りである。Conventionally, there are many known methods for inspecting a welded portion of a test object so that a defect is not present.
A typical example is as follows.
【０００４】たとえば、カラーテストと呼ばれる浸透探
傷の方法は、カラースプレーを用いて被検査対象物であ
る溶接部にカラー塗料を噴霧して表面に塗布すると共に
欠陥部の割れや腐食に浸透させ、その後、溶接部の表面
に塗布されたカラー塗料を拭き取ると、欠陥部に浸透し
たカラー塗料のみが残留するので、目視により欠陥部を
識別して欠陥部の位置を特定することができるものであ
る。[0004] For example, in a penetrant inspection method called a color test, a color paint is sprayed on a welded portion to be inspected using a color spray and applied to the surface, and at the same time, is penetrated into cracks and corrosion of defective portions. After that, when the color paint applied to the surface of the weld is wiped off, only the color paint that has permeated the defect remains, so that the defect can be visually identified and the position of the defect can be identified. .
【０００５】また、カメラを用いる方法は、検査対象物
の溶接部を撮影して、大きな欠陥部を識別するものであ
り、高倍率のカメラを用いる方法の場合には、高倍率の
カメラにより検査対象物の溶接部を撮影し、撮影された
拡大写真を調べることにより微小な欠陥部を識別して欠
陥部の位置を特定するものである。In the method using a camera, a welded portion of an inspection object is photographed to identify a large defective portion. In the case of a method using a high-power camera, the inspection is performed using a high-power camera. By photographing a welded portion of the object and examining the photographed enlarged photograph, a minute defect is identified and the position of the defect is identified.
【０００６】[0006]
【発明が解決しようとする課題】しかしながら、上記の
浸透探傷の方法では、カラー塗料の塗布及び拭き取りの
作業が必要であるため多くの無駄と手間がかかると共
に、被検査対象物の欠陥部を目視で識別するため多くの
人件費を要するという問題があった。また、カメラを用
いる方法では、被検査対象物の大きな欠陥部のみしか識
別することができず、高倍率のカメラを用いる方法にお
いては、ごく限られた狭い範囲しか検査を行うことがで
きないため、被検査対象物の全体の検査に多くの時間を
要するという問題があった。However, the above-described penetrating inspection method requires a lot of work and waste because the work of applying and wiping the color paint is required, and the defective portion of the inspection object is visually observed. However, there is a problem that a large labor cost is required to identify the information. Further, in the method using a camera, only a large defective portion of the inspection object can be identified, and in the method using a high-magnification camera, inspection can be performed only in a very limited narrow range. There is a problem that much time is required for the entire inspection of the inspection object.
【０００７】本発明は上述の実情に鑑み、短時間で容易
に、被検査対象物の表面に生じた微小な欠陥部を識別し
且つ欠陥部の位置を特定する被検査対象物の欠陥部検出
方法を提供することを目的としたものである。SUMMARY OF THE INVENTION In view of the above circumstances, the present invention easily and quickly identifies a minute defect on the surface of an object to be inspected and detects a defect of the object to be inspected for identifying the position of the defect. It is intended to provide a method.
【０００８】[0008]
【課題を解決するための手段】本発明の被検査対象物の
欠陥部検出方法は、光源から被検査対象物に照射する光
の照射方向を変更するごとに前記被検査対象物をカメラ
により撮影し、それぞれ撮影された複数枚の被検査対象
物の画像を、該画像中の濃度の低い陰影部が取り除かれ
るよう白黒化し、続いて複数枚の画像の同一箇所に存在
する暗部を抽出し、前記暗部から被検査対象物の欠陥部
を識別し且つ欠陥部の位置を特定することを特徴とする
被検査対象物の欠陥部検出方法、に係るものである。According to a method of detecting a defective portion of an object to be inspected according to the present invention, the object to be inspected is photographed by a camera every time the direction of light emitted from a light source to the object to be inspected is changed. Then, the plurality of images of the inspected target object respectively taken into black and white so that low-density shading portions in the images are removed, and subsequently, a dark portion existing in the same portion of the plurality of images is extracted, The present invention relates to a method for detecting a defective portion of an object to be inspected, comprising: identifying a defective portion of the object to be inspected from the dark portion and specifying a position of the defective portion.
【０００９】このようにすれば、被検査対象物を直接目
視する必要がなく、また被検査対象物を広範囲に検査で
きるので、短時間で容易に、被検査対象物の表面に生じ
た微小な欠陥部を識別し且つ欠陥部の位置を特定でき
る。With this configuration, it is not necessary to directly observe the object to be inspected, and the object to be inspected can be inspected in a wide range. Therefore, the minute surface generated on the surface of the object to be inspected can be easily obtained in a short time. The defective part can be identified and the position of the defective part can be specified.
【００１０】[0010]
【発明の実施の形態】以下、本発明の実施の形態を図示
例と共に説明する。Embodiments of the present invention will be described below with reference to the drawings.
【００１１】図１〜図７は本発明を実施する形態の一例
とその形態例によって撮影処理された画像を示すもの
で、本形態例では、光源１，１’とカメラ２を用いる被
検査対象物の欠陥部検出方法の例を示している。FIGS. 1 to 7 show an example of an embodiment of the present invention and an image photographed by the embodiment. In this embodiment, an object to be inspected using light sources 1 and 1 'and a camera 2 is shown. 4 shows an example of a method for detecting a defective portion of an object.
【００１２】本形態例では、図３の割れや腐食等の欠陥
部３を含む被検査対象物の溶接部４から斜め上方に、図
１、図２に示すごとく、複数の光源１，１’が溶接部４
から一定間隔を有して配置されており（図１、図２では
それぞれ２個）、個々の光源１，１’は上側水平面から
見て、溶接部４を取り囲むよう溶接部４の周囲部にそれ
ぞれ所定距離を有して備えられている。また、光源１，
１’は、高輝度の光を照射するハロゲンランプであり、
複数の光源１，１’がそれぞれ異なる方向から溶接部４
に向けて光を照射するよう、光源１，１’の照射方向は
溶接部４に向けられている。In this embodiment, as shown in FIGS. 1 and 2, a plurality of light sources 1 and 1 'are disposed obliquely upward from a welded portion 4 of an inspection object including a defect 3 such as a crack or corrosion as shown in FIG. Is weld 4
And two light sources 1 and 1 ′ are arranged around the welded portion 4 so as to surround the welded portion 4 when viewed from the upper horizontal plane. Each is provided with a predetermined distance. Light source 1,
1 'is a halogen lamp for irradiating high-luminance light,
A plurality of light sources 1, 1 'are welded from different directions.
The irradiation direction of the light sources 1 and 1 ′ is directed to the welded portion 4 so as to irradiate light toward.
【００１３】被検査対象物の溶接部４の上方には、一定
間隔を有してカメラ２が配置されており、カメラ２に
は、ケーブル５を介して画像処理装置６が接続されてい
る。A camera 2 is arranged above the welded portion 4 of the object to be inspected at regular intervals, and an image processing device 6 is connected to the camera 2 via a cable 5.
【００１４】以下、本発明の実施の形態例の作用を説明
する。The operation of the embodiment of the present invention will be described below.
【００１５】被検査対象物の溶接部４に対して、複数の
光源１，１’のうち一つの光源１から高輝度の光を照射
すると、図１に示すごとく溶接部４の凹凸及び欠陥部３
に伴う陰影を作り出す。When high-intensity light is emitted from one of the plurality of light sources 1 and 1 'to the welded portion 4 of the object to be inspected, as shown in FIG. 3
Creates the shadows associated with
【００１６】光源１により作り出された陰影は、カメラ
２により撮影されて画像となり、予め一定の陰影濃度で
設定されたしきい値により、画像中の濃度の低い陰影部
が取り除かれて画像は白黒化すなわち２値化されて、図
４に示す単純化したものになる。The shadow created by the light source 1 is photographed by the camera 2 to become an image, and a low density shading portion in the image is removed by a threshold value set at a predetermined shading density, so that the image becomes black and white. That is, the data is binarized to be simplified as shown in FIG.
【００１７】白黒化された画像は、カメラ２からケーブ
ル５を介して画像処理装置６にデータとして送られ蓄積
される。The black and white image is sent as data from the camera 2 to the image processing device 6 via the cable 5 and is stored.
【００１８】続いて、光源１から光の照射を停止し、図
２に示すごとく、溶接部４の周囲部で光源１の反対側に
位置する他の光源１’から溶接部４に高輝度の光を照射
すると、溶接部４の凹凸及び欠陥部３に伴う別の陰影を
作り出す。Subsequently, the irradiation of the light from the light source 1 is stopped, and as shown in FIG. Irradiation with light creates another shadow associated with the irregularities in the weld 4 and the defect 3.
【００１９】光源１’により作り出された陰影は、カメ
ラ２により撮影されて画像となり、最初の光照射で撮影
された場合と同様に、画像中の濃度の低い陰影部が取り
除かれて画像は白黒化されて、図５に示す単純化したも
のになる。The shadow produced by the light source 1 'is photographed by the camera 2 to form an image. As in the case where the image is photographed by the first light irradiation, a low-density shadow portion in the image is removed and the image becomes black and white. Into a simplified version as shown in FIG.
【００２０】白黒化された画像は、同様にカメラ２から
ケーブル５を介して画像処理装置６にデータとして送ら
れ蓄積される。The black and white image is similarly sent as data from the camera 2 to the image processing device 6 via the cable 5 and stored.
【００２１】さらに、光源１’から光の照射を停止し、
溶接部４の周囲部で光源１と光源１’の間に位置する光
源（図示せず）から溶接部４に対して高輝度の光を照射
し、溶接部４の凹凸及び欠陥部３に伴う新たな陰影を作
り出す。Further, the irradiation of light from the light source 1 'is stopped,
A light source (not shown) located between the light source 1 and the light source 1 ′ around the welded portion 4 irradiates the welded portion 4 with high-intensity light, and is accompanied by irregularities and defects 3 in the welded portion 4. Create new shades.
【００２２】光源（図示せず）により作り出された陰影
は、カメラ２により撮影して画像となり、上記と同様に
画像は白黒化されて、図６に示す単純化したものにな
る。続いて、白黒化された画像は、同様に画像処理装置
６にデータとして送られ蓄積される。The shadow created by the light source (not shown) is photographed by the camera 2 to form an image. The image is converted to a black and white image in the same manner as described above, and becomes a simplified image shown in FIG. Subsequently, the black-and-white image is sent to the image processing device 6 as data and stored.
【００２３】上記のごとく、少なくとも２箇所以上の異
なる位置に配置された光源１，１’から高輝度の光を照
射して上記作業を繰り返し、画像処理装置６にデータと
して画像が蓄積されると、画像処理装置６は、ぞれぞれ
の画像の暗部を比較し、図７に示すごとく全ての画像に
おいて常に暗部となる部分のみを自動的に抽出する。As described above, the above operation is repeated by irradiating high-intensity light from the light sources 1, 1 'arranged at least at two or more different positions, and an image is stored in the image processing device 6 as data. The image processing device 6 compares the dark portions of the respective images and automatically extracts only the portions that are always dark portions in all the images as shown in FIG.
【００２４】全ての画像から抽出により常に暗部となっ
た部分は、光がどの様な入射角度であっても欠陥部３が
光を散乱して常に暗部となることから、割れや腐食等の
欠陥部３を識別し且つ欠陥部３の位置を特定できる。The part which is always dark due to the extraction from all images is always dark because the defective part 3 scatters light at any angle of light, so that defects such as cracks and corrosion are generated. The part 3 can be identified and the position of the defective part 3 can be specified.
【００２５】このため、この作業を被検査対象物の溶接
部４に沿って繰り返し行えば、被検査対象物を、高倍率
のカメラを用いた場合のごとく狭い範囲でなく、広範囲
に検査できるので、短時間で容易に、被検査対象物の表
面に生じた微小な欠陥部３を識別し且つ欠陥部３の位置
を特定できる。For this reason, if this operation is repeated along the welded portion 4 of the object to be inspected, the object to be inspected can be inspected not only in a narrow area as in the case of using a high magnification camera, but in a wide area. In addition, it is possible to easily and easily identify the minute defective portion 3 generated on the surface of the inspection target object and specify the position of the defective portion 3.
【００２６】欠陥部３が識別されると共に位置の特定が
なされた後には、欠陥部３を再度溶接により補修して、
溶接部４に欠陥部３が存在しないようにする。After the defect 3 is identified and its position is specified, the defect 3 is repaired again by welding.
The defect 3 is not present in the weld 4.
【００２７】なお、本発明の被検査対象物の欠陥部検出
方法は、上述の形態例にのみ限定されるものではなく、
被検査対象物は溶接部４以外に光沢ある金属表面等でも
良いこと、又、光源１，１’は被検査対象物に光を照射
するのであれば、どのような位置に設置してもよいし、
１個の光源１を移動させて様々な位置から光を照射する
ようにしてもよいこと、更に、カメラ２及び光源１，
１’を駆動装置に取付けて、被検査対象物の検査部分に
沿ってカメラ２及び光源１，１’が自動的に移動するよ
うにしてもよいこと、更に又、被検査対象物に照射する
光の方向は少なくとも２方向以上であればよいが、方向
が多くなればなるほど、被検査対象物の欠陥部３の識別
及び位置の特定の精度が向上すること、その他、本発明
の要旨を逸脱しない範囲内において種々変更を加え得る
ことは勿論である。It should be noted that the method for detecting a defective portion of an object to be inspected according to the present invention is not limited to the above-described embodiment.
The object to be inspected may be a glossy metal surface or the like other than the welded portion 4, and the light sources 1 and 1 ′ may be installed at any position as long as the object to be inspected is irradiated with light. And
One light source 1 may be moved to emit light from various positions.
The camera 2 and the light source 1, 1 ′ may be automatically moved along the inspection portion of the inspection object by attaching the 1 ′ to the driving device. The direction of the light may be at least two directions, but as the number of directions increases, the accuracy of identification of the defective portion 3 of the inspection object and the specification of the position are improved. Of course, various changes can be made within a range not to be performed.
【００２８】[0028]
【発明の効果】上記した本発明の被検査対象物の欠陥部
検出方法によれば、被検査対象物を直接目視する必要が
なく、また被検査対象物を広範囲に検査できるので、短
時間で容易に、被検査対象物の表面に生じた微小な欠陥
部を識別し且つ欠陥部の位置を特定できるという優れた
効果を奏し得る。According to the method for detecting a defective portion of an object to be inspected according to the present invention described above, it is not necessary to directly observe the object to be inspected, and the object to be inspected can be inspected over a wide range. It is possible to obtain an excellent effect that a minute defect generated on the surface of the inspection object can be easily identified and the position of the defect can be specified.
【図１】本発明の被検査対象物の欠陥部検出方法におい
て１つの光源から被検査対象物に光を照射したときの状
態図である。FIG. 1 is a state diagram when light is irradiated from one light source to an object to be inspected in the method for detecting a defective portion of the object to be inspected according to the present invention.
【図２】本発明の被検査対象物の欠陥部検出方法におい
て他の光源から被検査対象物に光を照射したときの状態
図である。FIG. 2 is a state diagram when light is emitted from another light source to the object to be inspected in the method for detecting a defective portion of the object to be inspected according to the present invention.
【図３】被検査対象物である溶接部を目視した平面図で
ある。FIG. 3 is a plan view of a welded portion, which is an object to be inspected, when viewed visually.
【図４】被検査対象物である溶接部に左方向から光を照
射して生じる陰影を撮影処理した画像図である。FIG. 4 is an image diagram in which a shadow generated by irradiating light from a left direction to a welded portion to be inspected is photographed.
【図５】被検査対象物である溶接部に右方向から光を照
射して生じる陰影を撮影処理した画像図である。FIG. 5 is an image diagram in which a shadow generated by irradiating light from a right direction to a weld portion to be inspected is photographed.
【図６】被検査対象物である溶接部に上方向から光を照
射して生じる陰影を撮影処理した画像図である。FIG. 6 is an image diagram in which a shadow generated by irradiating light from above to a welded portion as an inspection target is photographed;
【図７】各画像より同一箇所の暗部を抽出した画像図で
ある。FIG. 7 is an image diagram in which the same dark portion is extracted from each image.
１ 光源 １’ 光源 ２ カメラ ３ 欠陥部 Reference Signs List 1 light source 1 'light source 2 camera 3 defective part
Claims (1)
射方向を変更するごとに前記被検査対象物をカメラによ
り撮影し、それぞれ撮影された複数枚の被検査対象物の
画像を、該画像中の濃度の低い陰影部が取り除かれるよ
う白黒化し、続いて複数枚の画像の同一箇所に存在する
暗部を抽出し、前記暗部から被検査対象物の欠陥部を識
別し且つ欠陥部の位置を特定することを特徴とする被検
査対象物の欠陥部検出方法。Each time the direction of light emitted from a light source to an object to be inspected is changed, the object to be inspected is photographed by a camera, and images of a plurality of photographed objects to be inspected are respectively obtained. The image is black-and-whitened so that low-density shading in the image is removed, and then a dark portion existing in the same portion of the plurality of images is extracted, a defective portion of the inspection object is identified from the dark portion, and a position of the defective portion is identified. A method for detecting a defective portion of an object to be inspected, comprising:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7206498A JPH11271235A (en) | 1998-03-20 | 1998-03-20 | Detecting method for defective part of inspection object |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7206498A JPH11271235A (en) | 1998-03-20 | 1998-03-20 | Detecting method for defective part of inspection object |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH11271235A true JPH11271235A (en) | 1999-10-05 |
Family
ID=13478604
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7206498A Pending JPH11271235A (en) | 1998-03-20 | 1998-03-20 | Detecting method for defective part of inspection object |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH11271235A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011117788A (en) * | 2009-12-02 | 2011-06-16 | Sumitomo Mitsui Construction Co Ltd | Concrete surface inspection device |
| JP2012063291A (en) * | 2010-09-17 | 2012-03-29 | Sekisui Chem Co Ltd | Quality inspection method of weld bead |
-
1998
- 1998-03-20 JP JP7206498A patent/JPH11271235A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011117788A (en) * | 2009-12-02 | 2011-06-16 | Sumitomo Mitsui Construction Co Ltd | Concrete surface inspection device |
| JP2012063291A (en) * | 2010-09-17 | 2012-03-29 | Sekisui Chem Co Ltd | Quality inspection method of weld bead |
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