JPH112502A - Measuring jig - Google Patents
Measuring jigInfo
- Publication number
- JPH112502A JPH112502A JP15626497A JP15626497A JPH112502A JP H112502 A JPH112502 A JP H112502A JP 15626497 A JP15626497 A JP 15626497A JP 15626497 A JP15626497 A JP 15626497A JP H112502 A JPH112502 A JP H112502A
- Authority
- JP
- Japan
- Prior art keywords
- plate
- graduated
- axis direction
- surface plate
- reference line
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length-Measuring Instruments Using Mechanical Means (AREA)
Abstract
Description
【０００１】[0001]
【発明の属する技術分野】本発明は、測定治具に関す
る。[0001] The present invention relates to a measuring jig.
【０００２】[0002]
【従来の技術】ワークの形状を測定する場合には、図８
に示すレイアウトマシン２０を用いて測定する方法が知
られている。この方法は、まず、レイアウトマシン２０
を備えた定盤２１上にあらかじめ置かれた固定治具２２
に被測定ワーク２３を取り付けて固定し、被測定ワーク
２３の測定部位にレイアウトマシン２０の先端をＸ軸方
向、Ｙ軸方向、Ｚ軸方向に移動させて、レイアウトマシ
ン２０に付けられている目盛りからＸ、Ｙ、Ｚ座標を読
み取る方法である。2. Description of the Related Art FIG.
Is known using a layout machine 20 shown in FIG. In this method, first, the layout machine 20
Fixing jig 22 previously placed on surface plate 21 provided with
The work 23 to be measured is attached to the work 23, and the tip of the layout machine 20 is moved in the X-axis direction, the Y-axis direction, and the Z-axis direction to the measurement site of the work 23 to be measured. This is a method of reading X, Y, and Z coordinates from the data.
【０００３】[0003]
【発明が解決しようとする課題】しかし、被測定ワーク
２３の測定箇所は一度に１箇所しか選択できず、一度に
複数箇所を測定することができないため、製品図面との
比較を瞬時に行うことができず、測定に手間がかる。本
発明の課題は、ワークの外形形状の精度の測定を容易に
行うことができる測定治具を提供することにある。However, since only one measurement point on the workpiece 23 can be selected at a time and a plurality of points cannot be measured at once, it is necessary to instantaneously compare with the product drawing. Measurement is troublesome. An object of the present invention is to provide a measuring jig that can easily measure the accuracy of the outer shape of a work.
【０００４】[0004]
【課題を解決するための手段】上記課題を達成する本発
明は、つぎの通りである。 （１） Ｘ軸方向、Ｙ軸方向に複数本の番線または溝か
らなる基準線が設けられた定盤と、該定盤のＸ軸方向の
基準線上の任意の位置および／またはＹ軸方向の基準線
上の任意の位置に位置し、下部と側部に目盛りが付けら
れている複数枚の目盛り付きプレートと、定盤に対して
垂直に延びＺ軸方向の目盛りを有する部材と、該部材の
Ｚ軸方向の任意の位置から前記定盤に対して水平方向に
延びる保持部とを有し、定盤上の任意の位置に配置され
るハイトゲージと、からなる測定治具。 （２） 前記定盤の基準線が溝からなり、前記目盛り付
きプレートが前記溝にはめられている、（１）の測定治
具。 （３） 前記定盤がＸ軸方向の基準線とＹ軸方向の基準
線の交点部分に孔部を有し、該孔部にピボットが挿入さ
れており、該ピボットは溝を有しており、前記目盛り付
きプレートが前記ピボットに形成された前記溝に摺動可
能に挿入されている、（１）の測定治具。 （４） 前記目盛り付きプレートがＯＮ−ＯＦＦ磁石に
よって前記定盤上に固定されている、（１）の測定治
具。 （５） 前記ハイトゲージが、前記目盛り付きプレート
に該目盛り付きプレートの側部の任意の位置から前記定
盤に対して水平方向に延びる保持部を形成したものから
なる、（１）の測定治具。The present invention to achieve the above object is as follows. (1) A surface plate provided with a plurality of reference lines or grooves in the X-axis direction and Y-axis direction, and an arbitrary position on the reference line in the X-axis direction of the surface plate and / or a Y-axis direction. A plurality of graduated plates located at arbitrary positions on a reference line and graduated at lower and side portions, a member extending perpendicular to the surface plate and having a graduation in the Z-axis direction, A measuring jig comprising: a holding portion extending in a horizontal direction with respect to the surface plate from an arbitrary position in the Z-axis direction; and a height gauge arranged at an arbitrary position on the surface plate. (2) The measuring jig according to (1), wherein the reference line of the surface plate is formed of a groove, and the graduated plate is fitted in the groove. (3) The surface plate has a hole at an intersection of a reference line in the X-axis direction and a reference line in the Y-axis direction, and a pivot is inserted into the hole, and the pivot has a groove. The measuring jig according to (1), wherein the graduated plate is slidably inserted into the groove formed in the pivot. (4) The measuring jig according to (1), wherein the graduated plate is fixed on the surface plate by an ON-OFF magnet. (5) The measuring jig according to (1), wherein the height gauge is formed by forming a holding portion extending in a horizontal direction with respect to the surface plate from an arbitrary position on a side of the graduated plate on the graduated plate. .
【０００５】上記（１）〜（５）の測定治具では、Ｘ軸
方向の基準線上の任意の位置および／またはＹ軸方向の
基準線が設けられた定盤上の任意の位置に、下部と側部
に目盛りが付けられている複数枚の目盛り付きプレート
と、定盤に対して垂直に延びＺ軸方向の目盛りを有する
部材とその部材のＺ軸方向の任意の位置から定盤に対し
て水平方向に延びる保持部とを有するハイトゲージとを
位置させることができるため、目盛り付きプレートとハ
イトゲージを被測定ワークの製品図面上の状態とほぼ同
じ状態を形成するように位置させ、そこに被測定ワーク
を納めることによって、容易に製品図面上と被測定ワー
クとの差異を目視できる。また、製品図面と被測定ワー
クとの位置ずれおよびずれ量は、定盤の基準線および目
盛り付き測定プレートおよびハイトゲージの目盛りから
容易に判断できる。上記（２）の測定治具では、目盛り
付きプレートは溝状の基準線の溝にはめられ、基準線上
をスライドできるため、定盤の基準線上の任意の位置に
容易に移動可能である。上記（３）の測定治具では、定
盤のＸ軸方向の基準線とＹ軸方向の基準線の交点部分に
孔部を有し、その孔部に挿入されるピボットに形成され
た溝に摺動可能に目盛り付きプレートが挿入されるた
め、目盛り付きプレートはピボットの溝への挿入位置お
よび孔部へのピボットの挿入の向きによって、Ｘ軸方向
の基準線あるいはＹ軸方向の基準線上の任意の位置に容
易に位置させることができる。上記（４）の測定治具で
は、目盛り付きプレートの定盤上への固定はＯＮ−ＯＦ
Ｆ磁石（永久磁石ではなく、電磁石）によって行われる
ため、目盛り付きプレートを定盤のＸ軸方向の基準線あ
るいはＹ軸方向の基準線上の任意の位置に容易に位置さ
せることができる。上記（５）の測定治具では、ハイト
ゲージは、目盛り付きプレートの側部の任意の位置から
定盤に対して水平方向に延びる保持部を形成させたもの
からなるため、あらためてハイトゲージを設ける必要が
ない。In the measuring jigs (1) to (5), the lower part is located at an arbitrary position on the reference line in the X-axis direction and / or at an arbitrary position on the surface plate provided with the reference line in the Y-axis direction. And a plurality of graduated plates having graduations on the sides, a member extending perpendicular to the surface plate and having a scale in the Z-axis direction, and a member having an arbitrary position in the Z-axis direction with respect to the surface plate. And a height gauge having a holding portion extending in the horizontal direction, the graduated plate and the height gauge are positioned so as to form almost the same state as the state of the work to be measured on the product drawing, and the cover is placed there. By storing the work to be measured, the difference between the work on the product drawing and the work to be measured can be easily observed. Further, the positional deviation and the amount of deviation between the product drawing and the work to be measured can be easily determined from the reference line of the surface plate, the measuring plate with the scale and the scale of the height gauge. In the measuring jig of (2), the plate with the scale is fitted in the groove of the groove-shaped reference line and can slide on the reference line, so that it can be easily moved to an arbitrary position on the reference line of the surface plate. In the measuring jig of the above (3), the surface plate has a hole at the intersection of the reference line in the X-axis direction and the reference line in the Y-axis direction, and the groove formed in the pivot inserted into the hole is Since the graduated plate is slidably inserted, the graduated plate may be positioned on the reference line in the X-axis direction or the reference line in the Y-axis direction depending on the position of the pivot in the groove and the direction of the pivot insertion in the hole. It can be easily located at any position. In the measuring jig of the above (4), fixing of the plate with the scale on the surface plate is ON-OF.
Since the adjustment is performed by an F magnet (not a permanent magnet, but an electromagnet), the scaled plate can be easily positioned at an arbitrary position on the reference line in the X-axis direction or the reference line in the Y-axis direction of the surface plate. In the measuring jig of the above (5), since the height gauge is formed by forming a holding portion extending horizontally from an arbitrary position on the side of the graduated plate with respect to the surface plate, it is necessary to provide the height gauge again. Absent.
【０００６】[0006]
【発明の実施の形態】図１、図２は本発明の第１実施例
の測定治具を示し、図３、図４は本発明の第２実施例の
測定治具を示し、図５、図６は本発明の第３実施例の測
定治具を示す。図７は本発明の全実施例に共通し、測定
治具によって測定する被測定ワークを示す。本発明の全
実施例にわたって共通する部分には本発明の全実施例に
わたって同じ符号が付してある。1 and 2 show a measuring jig according to a first embodiment of the present invention, and FIGS. 3 and 4 show a measuring jig according to a second embodiment of the present invention. FIG. 6 shows a measuring jig according to a third embodiment of the present invention. FIG. 7 shows a workpiece to be measured, which is common to all embodiments of the present invention and is measured by a measuring jig. Portions common to all embodiments of the present invention are denoted by the same reference numerals throughout all embodiments of the present invention.
【０００７】まず、本発明の全実施例にわたって共通す
る部分を、たとえば図１、図７を参照して、説明する。
本発明の何れの実施例の測定治具も、Ｘ軸方向、Ｙ軸方
向に複数本の番線または溝からなる基準線１ａが設けら
れた定盤１と、定盤１のＸ軸方向の基準線１ａ上の任意
の位置および／またはＹ軸方向の基準線上の任意の位置
（すなわち、Ｘ軸方向の基準線上の任意の位置とＹ軸方
向の基準線上の任意の位置との何れか少なくとも一方の
位置）に位置し、下部と側部に目盛りが付けられている
複数枚の目盛り付きプレート２と、定盤１に対して垂直
に延びＺ軸方向の目盛りを有する部材３ａと部材３ａの
Ｚ軸方向の任意の位置から前記定盤に対して水平方向に
延びる保持部３ｂとを有し定盤上の任意の位置に配置さ
れるハイトゲージ３と、を有する。ハイトゲージ３は、
被測定ワーク６を安定して保持するために、３つ設けら
れる（図示のイ、ロ、ハの位置、ただし、図１、図３で
はイの位置のハイトゲージ３のみを示してあるが、ロ、
ハの位置にも同様のハイトゲージが設けられる）。３点
支持により、３次元空間内にワークを一義的に位置決定
できる。ただし、３つ以上設けられてもよい。First, portions common to all embodiments of the present invention will be described with reference to, for example, FIGS.
The measuring jig according to any of the embodiments of the present invention includes a surface plate 1 provided with a plurality of reference lines 1a formed of a plurality of number lines or grooves in the X-axis direction and the Y-axis direction, and a reference in the X-axis direction of the surface plate Any position on the line 1a and / or any position on the reference line in the Y-axis direction (that is, at least one of any position on the reference line in the X-axis direction and any position on the reference line in the Y-axis direction) ), A plurality of graduated plates 2 having graduations on the lower and side portions, a member 3a extending perpendicular to the surface plate 1 and having a graduation in the Z-axis direction, and a Z of the member 3a. A holding portion 3b extending in a horizontal direction with respect to the surface plate from an arbitrary position in the axial direction, and a height gauge 3 arranged at an arbitrary position on the surface plate. Height gauge 3
In order to stably hold the workpiece 6 to be measured, three are provided (positions A, B, and C shown in the drawings; however, FIGS. 1 and 3 show only the height gauge 3 at the position A). ,
A similar height gauge is also provided at position C). With the three-point support, the work can be uniquely determined in the three-dimensional space. However, three or more may be provided.
【０００８】上記の測定治具の作用を、上記測定治具を
用いて被測定ワークの外形形状を測定する方法を例にと
って説明する。まず、被測定ワーク６の平面外形６Ａ
を、図７に示すように、基準線１ａに対応する線１Ａを
引いた製品図面７上で確認する。そして、被測定ワーク
の平面外形６Ａの線１Ａ上の座標を複数読み取り、それ
ぞれの座標に相当する、定盤１の基準線１ａ上に目盛り
付きプレート２を配置する。また、被測定ワーク６のＺ
軸方向の位置決めのために、ハイトゲージ３の保持部３
ｂが被測定ワーク６を図面上の正寸位置に保持するよう
に、ハイトゲージ３を、定盤１上の少なくとも３点位置
に配置する。そして、被測定ワーク６を定盤１の上方に
運び、被測定ワーク６を、複数枚の目盛り付きプレート
２およびハイトゲージ３によって形づくられている定盤
上方に設けられた所定部位（被測定ワークの外形を模し
た空間）に納める。The operation of the above-mentioned measuring jig will be described with reference to an example of a method of measuring the outer shape of a workpiece to be measured using the above-mentioned measuring jig. First, the planar outer shape 6A of the work 6 to be measured
Is confirmed on the product drawing 7 in which a line 1A corresponding to the reference line 1a is drawn as shown in FIG. Then, a plurality of coordinates on the line 1A of the planar outer shape 6A of the workpiece to be measured are read, and the graduated plate 2 is arranged on the reference line 1a of the surface plate 1 corresponding to each coordinate. Also, the Z of the work 6 to be measured
Holder 3 of height gauge 3 for axial positioning
The height gauge 3 is arranged at at least three points on the surface plate 1 so that the workpiece b holds the work 6 to be measured at the exact position on the drawing. Then, the work 6 to be measured is carried above the surface plate 1, and the work 6 to be measured is provided at a predetermined portion (for the work to be measured) provided above the surface plate formed by the plurality of graduated plates 2 and the height gauge 3. In a space that mimics the outer shape).
【０００９】目盛り付きプレート２に被測定ワークが干
渉してしまう場合は、被測定ワークが製品図面より大き
くなっていることがわかる。また、目盛り付きプレート
２と被測定ワークの間に隙間がある場合は、被測定ワー
クが製品図面より小さいことが分かる。いずれの場合
も、図面上の正寸位置を０点としておくことにより、被
測定ワークに接触する位置まで目盛り付きプレート２を
移動させて、その移動量、移動後の目盛り付きプレート
の位置から、製品図面との位置ずれおよびずれ量を、瞬
時に、知ることができる。従来のレイアウトマシンの測
定値は絶対値で表示されているため、図面との差が直に
読み取れないが、本発明実施例ではそのような不具合が
解消される。また、目盛り付きプレート２は、あらかじ
め、定盤の基準線上の所定分控えた位置におき、被測定
ワークをまずハイトゲージ３によって保持したあとに、
控えている分を正確な位置に戻すようにすることによ
り、被測定ワークが製品図面より大きい場合に、被測定
ワークと目盛り付きプレートが干渉することを防止でき
る。When the work to be measured interferes with the graduated plate 2, it can be seen that the work to be measured is larger than the product drawing. When there is a gap between the plate 2 with the scale and the work to be measured, it is understood that the work to be measured is smaller than the product drawing. In any case, by setting the exact position on the drawing to 0 point, the scaled plate 2 is moved to a position where the scaled plate 2 comes into contact with the work to be measured. The positional deviation and the amount of deviation from the product drawing can be instantaneously known. Since the measured value of the conventional layout machine is displayed as an absolute value, the difference from the drawing cannot be read directly. However, in the embodiment of the present invention, such a problem is solved. Further, the plate 2 with the scale is previously placed at a predetermined position on the reference line of the platen, and after the work to be measured is first held by the height gauge 3,
By returning the reserved portion to an accurate position, it is possible to prevent the measured workpiece and the graduated plate from interfering with each other when the measured workpiece is larger than the product drawing.
【００１０】Ｚ方向についても、本発明実施例の測定治
具では、被測定ワークの保持点をハイトゲージ３の基準
点としておくことにより、被測定ワークの製品図面とず
れている部分、およびずれ量を瞬時に容易に判断でき
る。また、目盛り付きプレート２およびハイドゲージ３
は複数の位置に位置させるので、一度の測定でワークの
複数点の測定を容易に実行することができる。[0010] In the measuring jig of the embodiment of the present invention, the holding point of the work to be measured is also set as the reference point of the height gauge 3 in the Z direction, so that the part of the work to be measured is shifted from the product drawing and the shift amount. Can be instantly and easily determined. In addition, plate 2 with scale and hide gauge 3
Are located at a plurality of positions, so that measurement of a plurality of points on the work can be easily performed by one measurement.
【００１１】つぎに、本発明の各実施例に特有な構成を
説明する。本発明の第１実施例では、図１に示すよう
に、定盤１の基準線１ａが溝からなり、目盛り付きプレ
ート２がその溝に摺動可能にはめられている。また、ハ
イトゲージ３は定盤上の任意の箇所に取り付けられ、図
２に示すように、定盤１に対して垂直に延びＺ軸方向の
目盛りを有する部材３ａと、部材３ａに上下方向に摺動
可能に装着され定盤１に対して水平方向に延びる保持部
３ｂと、を有している。目盛り付きプレート２が溝には
められた状態で番線１ａ上を自由に移動できるため、目
盛り付きプレート２を番線１ａ上の所望の位置に容易に
位置せしめることができる。Next, a configuration specific to each embodiment of the present invention will be described. In the first embodiment of the present invention, as shown in FIG. 1, the reference line 1a of the surface plate 1 is formed of a groove, and the graduated plate 2 is slidably fitted in the groove. The height gauge 3 is attached to an arbitrary position on the surface plate. As shown in FIG. 2, the height gauge 3 extends vertically to the surface plate 1 and has a scale in the Z-axis direction. And a holding portion 3b movably mounted and extending in the horizontal direction with respect to the surface plate 1. Since the graduated plate 2 can be freely moved on the track 1a while being fitted in the groove, the graduated plate 2 can be easily positioned at a desired position on the track 1a.
【００１２】本発明の第２実施例では、図３に示すよう
に、定盤１のＸ軸方向の番線とＹ軸方向の番線の交点部
分に孔部１ｂが設けられており、孔部１ｂには、図４に
示す、ピボット４が挿入されている。ピボット４は溝４
ａを有し、この溝４ａに目盛り付きプレート２がはめら
れる。目盛り付きプレート２は溝４ａに対して摺動可能
であり、任意の位置でピボット４に保持される。ピボッ
ト４の溝４ａをＸ軸方向の番線に平行にして孔部１ｂに
挿入することにより、そのピボット４に挿入されている
目盛り付きプレート２はＸ軸方向の番線上に位置する。
また、ピボット４の溝４ａをＹ軸方向の番線に平行にし
て孔部１ｂに挿入することにより、そのピボット４に挿
入されている目盛り付きプレート２はＹ軸方向の番線上
に位置する。ピボット４の溝４ａにはめられた目盛り付
きプレート２の位置およびピボット４の溝部４ａの向き
を変えることによって、目盛り付きプレート２を基準線
上の任意の位置に容易に位置決めすることができる。In the second embodiment of the present invention, as shown in FIG. 3, a hole 1b is provided at the intersection of a number line in the X-axis direction and a number line in the Y-axis direction of the platen 1. The pivot 4 shown in FIG. Pivot 4 is groove 4
a, and the graduated plate 2 is fitted in the groove 4a. The graduated plate 2 is slidable with respect to the groove 4a, and is held by the pivot 4 at an arbitrary position. By inserting the groove 4a of the pivot 4 into the hole 1b with the groove 4a being parallel to the number line in the X-axis direction, the graduated plate 2 inserted in the pivot 4 is positioned on the number line in the X-axis direction.
When the groove 4a of the pivot 4 is inserted into the hole 1b with the groove 4a being parallel to the number line in the Y-axis direction, the graduated plate 2 inserted in the pivot 4 is positioned on the number line in the Y-axis direction. By changing the position of the graduated plate 2 fitted in the groove 4a of the pivot 4 and the direction of the groove 4a of the pivot 4, the graduated plate 2 can be easily positioned at any position on the reference line.
【００１３】本発明の第３実施例では、図５に示すよう
に、目盛り付き測定プレート２がハイトゲージ３の役割
も兼ねている。すなわち、図６に示すように、目盛り付
き測定プレート２の側部に保持部１３ｂがＺ軸方向に摺
動可能に取り付けられている。また、目盛り付きプレー
ト２にはＯＮ−ＯＦＦ磁石（電磁石）５が取り付けられ
ている。目盛り付き測定プレート２を利用してハイトゲ
ージ３を用意できるため、あらたにハイトゲージでワー
クを保持する手間がかからない。また、目盛り付きプレ
ート２はＯＮ−ＯＦＦ磁石５によって定盤上の任意の位
置に用意に取り付け固定することができ、定盤に溝や孔
部などを形成しなくてもよい。In the third embodiment of the present invention, as shown in FIG. 5, the scaled measuring plate 2 also functions as a height gauge 3. That is, as shown in FIG. 6, the holding portion 13b is attached to the side of the graduated measurement plate 2 so as to be slidable in the Z-axis direction. An ON-OFF magnet (electromagnet) 5 is attached to the plate 2 with the scale. Since the height gauge 3 can be prepared by using the measurement plate 2 with the scale, it is not necessary to newly hold the work with the height gauge. In addition, the graduated plate 2 can be easily attached and fixed at an arbitrary position on the surface plate by the ON-OFF magnet 5, and it is not necessary to form a groove, a hole, or the like in the surface plate.
【００１４】[0014]
【発明の効果】請求項１の測定治具によれば、定盤の複
数の位置に目盛り付きプレートとハイトゲージを位置さ
せることができるため、製品図面上の被測定ワークの外
形形状とほぼ同じ位置に目盛り付きプレートとハイトゲ
ージとを位置させ、そこに、被測定ワークを置くだけ
で、一度に複数箇所の測定が可能であり、測定が容易で
ある。しかも、製品図面と形状の違いを即座に判断でき
る。請求項２の測定治具によれば、目盛り付きプレート
が溝状の基準線を自由にスライドできるため、定盤の基
準線上の所望の位置に容易に目盛り付きプレートを位置
させることができる。請求項３の測定治具によれば、目
盛り付きプレートが定盤に形成された孔部に挿入される
ピボットの溝部に保持されるため、ピボットの溝部の向
きおよびピボットの溝部に挿入される目盛り付きプレー
トの位置を変えることにより、定盤上に所望の位置、向
きに目盛り付きプレートを位置させることができる。請
求項４の測定治具によれば、目盛り付きプレートがＯＮ
−ＯＦＦ磁石によって定盤上に固定されるため、定盤上
の任意の位置に容易に目盛り付きプレートを位置させる
ことができる。請求項５の測定治具によれば、目盛り付
きプレートの側部の任意の位置に保持部を形成したもの
をハイトゲージとしているため、特別にハイトゲージを
用意しなくてもよい。According to the measuring jig of the first aspect, since the plate with the scale and the height gauge can be located at a plurality of positions on the surface plate, the positions are substantially the same as the external shape of the workpiece to be measured on the product drawing. By simply placing a graduated plate and a height gauge and placing a work to be measured thereon, measurement at a plurality of locations at once is possible, and measurement is easy. Moreover, the difference between the product drawing and the shape can be immediately determined. According to the measuring jig of the second aspect, since the graduated plate can slide freely on the groove-shaped reference line, the graduated plate can be easily positioned at a desired position on the reference line of the surface plate. According to the measuring jig of claim 3, since the plate with the scale is held in the groove of the pivot inserted into the hole formed in the surface plate, the orientation of the groove of the pivot and the scale inserted into the groove of the pivot By changing the position of the graduated plate, the graduated plate can be positioned at a desired position and orientation on the surface plate. According to the measuring jig of claim 4, the plate with the scale is ON.
Since it is fixed on the surface plate by the -OFF magnet, the plate with the scale can be easily positioned at an arbitrary position on the surface plate. According to the measuring jig of the fifth aspect, since the height gauge is provided with the holding portion formed at an arbitrary position on the side of the scaled plate, it is not necessary to prepare a special height gauge.
【図１】本発明の第１実施例の測定治具の斜視図であ
る。FIG. 1 is a perspective view of a measuring jig according to a first embodiment of the present invention.
【図２】本発明の第１実施例の測定治具のハイトゲージ
の斜視図である。FIG. 2 is a perspective view of a height gauge of the measuring jig according to the first embodiment of the present invention.
【図３】本発明の第２実施例の測定治具の斜視図であ
る。FIG. 3 is a perspective view of a measuring jig according to a second embodiment of the present invention.
【図４】本発明の第２実施例のピボットに目盛り付きプ
レート挿入する様子を示す図である。FIG. 4 is a diagram showing a state where a graduated plate is inserted into a pivot according to a second embodiment of the present invention.
【図５】本発明の第３実施例の測定治具の斜視図であ
る。FIG. 5 is a perspective view of a measuring jig according to a third embodiment of the present invention.
【図６】本発明の第３実施例の測定治具のハイトゲージ
を備える目盛り付きプレートの斜視図である。FIG. 6 is a perspective view of a graduated plate provided with a height gauge of a measuring jig according to a third embodiment of the present invention.
【図７】本発明の被測定ワークの製品図面を示す図であ
る。FIG. 7 is a diagram showing a product drawing of a work to be measured according to the present invention.
【図８】従来のスケールマシーンによってワークを測定
する様子を示す図である。FIG. 8 is a diagram showing how a work is measured by a conventional scale machine.
１ 定盤 ２ 目盛り付き測定プレート ３ ハイトゲージ ３ａ Ｚ軸方向の目盛りを有する部材 ３ｂ 保持部 ４ ピボット ５ ＯＮ−ＯＦＦ磁石 Reference Signs List 1 surface plate 2 measurement plate with scale 3 height gauge 3a member with scale in Z-axis direction 3b holder 4 pivot 5 ON-OFF magnet
Claims (5)
は溝からなる基準線が設けられた定盤と、 該定盤のＸ軸方向の基準線上の任意の位置および／また
はＹ軸方向の基準線上の任意の位置に位置し、下部と側
部に目盛りが付けられている複数枚の目盛り付きプレー
トと、 定盤に対して垂直に延びＺ軸方向の目盛りを有する部材
と、該部材のＺ軸方向の任意の位置から前記定盤に対し
て水平方向に延びる保持部とを有し、定盤上の任意の位
置に配置されるハイトゲージと、からなる測定治具。A surface plate provided with a plurality of reference lines or grooves in the X-axis direction and the Y-axis direction; and an arbitrary position on the reference line in the X-axis direction of the surface plate and / or the Y-axis. A plurality of graduated plates located at arbitrary positions on a reference line in the direction and graduated at lower and side portions, a member extending perpendicular to the surface plate and having graduations in the Z-axis direction, A holding jig that extends horizontally from an arbitrary position of the member in the Z-axis direction to the surface plate, and a height gauge that is disposed at an arbitrary position on the surface plate.
盛り付きプレートが前記溝にはめられている、請求項１
の測定治具。2. The reference plate of the surface plate comprises a groove, and the graduated plate is fitted in the groove.
Measuring jig.
の基準線の交点部分に孔部を有し、該孔部にピボットが
挿入されており、該ピボットは溝を有しており、前記目
盛り付きプレートが前記ピボットに形成された前記溝に
摺動可能に挿入されている、請求項１の測定治具。3. The surface plate has a hole at an intersection of a reference line in the X-axis direction and a reference line in the Y-axis direction, and a pivot is inserted into the hole, and the pivot has a groove. The measuring jig according to claim 1, wherein the graduated plate is slidably inserted into the groove formed in the pivot.
磁石によって前記定盤上に固定されている、請求項１の
測定治具。4. The graduated plate is ON-OFF.
The measuring jig according to claim 1, wherein the measuring jig is fixed on the surface plate by a magnet.
レートに該目盛り付きプレートの側部の任意の位置から
前記定盤に対して水平方向に延びる保持部を形成したも
のからなる、請求項１の測定治具。5. The measurement according to claim 1, wherein the height gauge is formed by forming a holding portion extending in a horizontal direction with respect to the surface plate from an arbitrary position on a side of the graduated plate on the graduated plate. jig.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15626497A JPH112502A (en) | 1997-06-13 | 1997-06-13 | Measuring jig |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15626497A JPH112502A (en) | 1997-06-13 | 1997-06-13 | Measuring jig |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH112502A true JPH112502A (en) | 1999-01-06 |
Family
ID=15624014
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15626497A Pending JPH112502A (en) | 1997-06-13 | 1997-06-13 | Measuring jig |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH112502A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009103599A (en) * | 2007-10-24 | 2009-05-14 | Mitsutoyo Corp | Measurement standard |
| JP2009179126A (en) * | 2008-01-30 | 2009-08-13 | Kanto Auto Works Ltd | Inspection tool structure of side mudguard |
| JP5364860B1 (en) * | 2013-04-24 | 2013-12-11 | グリーン フィクス株式会社 | measuring device |
-
1997
- 1997-06-13 JP JP15626497A patent/JPH112502A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009103599A (en) * | 2007-10-24 | 2009-05-14 | Mitsutoyo Corp | Measurement standard |
| JP2009179126A (en) * | 2008-01-30 | 2009-08-13 | Kanto Auto Works Ltd | Inspection tool structure of side mudguard |
| JP5364860B1 (en) * | 2013-04-24 | 2013-12-11 | グリーン フィクス株式会社 | measuring device |
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