JPH1038690A - Device for spectroscopic analysis avoiding temperature drift - Google Patents
Device for spectroscopic analysis avoiding temperature driftInfo
- Publication number
- JPH1038690A JPH1038690A JP21609396A JP21609396A JPH1038690A JP H1038690 A JPH1038690 A JP H1038690A JP 21609396 A JP21609396 A JP 21609396A JP 21609396 A JP21609396 A JP 21609396A JP H1038690 A JPH1038690 A JP H1038690A
- Authority
- JP
- Japan
- Prior art keywords
- frequency
- signal
- temperature
- birefringent crystal
- superposing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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- Spectrometry And Color Measurement (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
【０００１】[0001]
【発明の属する技術分野】本発明は、プラスチックをは
じめ、種々の有機化合物の材質の判別、素性の識別を行
うもので、生産過程における品質管理、廃棄物の再利用
のための分別・分離作業、あるいは環境査察、等の現場
にて用いる分光分析装置に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to discrimination of materials and identification of various organic compounds such as plastics, quality control in a production process, and separation / separation work for reusing waste. The present invention relates to a spectroscopic analyzer used in the field of environmental inspection or the like.
【０００２】[0002]
【従来の技術】一般に分光分析装置は振動、周囲温度、
等の使用環境条件が厳しく、生産現場、或いは廃棄物処
理現場、等では取り扱いにくい分析装置であるが、可動
部分の無い音響光学分光方式（ＡＯＴＦ方式：Acoust-O
ptic Tunable Filter ）にて耐震性の問題を解決し、強
力な冷却ファンにて分光波長の温度ドリフト源となる複
屈折結晶分光素子を冷却して恒温化することで対処し、
用途範囲の拡大が図られて居る。2. Description of the Related Art Generally, a spectroscopic analyzer is used for vibration, ambient temperature,
Although it is an analyzer that is difficult to use in production sites or waste disposal sites, etc. due to severe use environment conditions such as acousto-optical spectroscopy (AOTF: Acoust-O) without moving parts
Ptic Tunable Filter) solves the problem of seismic resistance, and uses a powerful cooling fan to cool the birefringent crystal spectroscopy element, which is the temperature drift source of the spectral wavelength, to keep it at a constant temperature.
The range of applications is being expanded.
【０００３】[0003]
【発明が解決しようとする課題】しかしながら、この冷
却方法では生産、或いは処理現場等の幅広く急激な周囲
温度変動に対応しきれずに分光波長変動を生じて測定誤
差、すなわち材質判別ミスが発生しやすく、本来の分光
分析装置の性能の発揮に限界がある。なお、始動時にウ
ォ−ミングアップ時間、あるいは、たびたび校正操作を
要し、また、強力な冷却ファンは装置の小型化、簡便性
を欠く、等の不都合があった。However, in this cooling method, it is difficult to cope with a wide and sudden change in ambient temperature in a production or processing site and the like, so that a spectral wavelength change occurs and a measurement error, that is, a material discrimination error easily occurs. However, the performance of the original spectroscopic analyzer is limited. In addition, a warming-up time at the time of starting or a calibration operation is frequently required, and a powerful cooling fan has disadvantages such as a reduction in size and simplicity of the device.
【０００４】本発明は上記問題点を解消し、温度変化に
よる分光波長の変動を回避し安定した分光光線を得るこ
とができ、使用環境に制約を受けない温度ドリフトを回
避した分光分析装置を提供することをその課題とする。The present invention solves the above-mentioned problems, and provides a spectroscopic analyzer which can avoid a fluctuation of a spectral wavelength due to a temperature change, obtain a stable spectral beam, and avoid a temperature drift which is not restricted by a use environment. Is the task.
【０００５】[0005]
【課題を解決するための手段】前記課題を解決するた
め、本発明に係る温度ドリフトを回避した分光分析装置
は、温度ドリフト源となる複屈折結晶分光素子の温度変
動を測定し、基準値との温度差を周波数制御補正信号と
して高周波発生装置に加え周波数補正を行い分光光線の
波長を安定化するものである。SUMMARY OF THE INVENTION In order to solve the above-mentioned problems, a spectroscopic analyzer which avoids temperature drift according to the present invention measures temperature fluctuation of a birefringent crystal spectroscopic element serving as a temperature drift source, and measures a reference value and a reference value. Is applied to a high-frequency generator as a frequency control correction signal to perform frequency correction to stabilize the wavelength of the spectral beam.
【０００６】[0006]
【発明の実施の形態】以下、図面によって本発明の実施
の形態について説明する。図１は分光分析装置の一例を
示すブロック図である。Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a block diagram showing an example of the spectroscopic analyzer.
【０００７】この分光分析装置は高周波発生装置３で発
生させた高周波を高周波振動子２に印加して複屈折結晶
分光素子１に音響振動を加え、音響振動を加えた複屈折
結晶分光素子１に光源７からの光ｂ１を入射して得られ
る分光光線ｂ２を有機化合物である測定対象８に照射
し、反射光ｂ３を受光器９で受光し、受光した反射光の
吸光スペクトルをパターン化し、パターン化したデータ
を、予めデータファイルに保存されている有機化合物の
パターンと比較・照合し、測定対象である有機化合物の
材質を判別するものである。In this spectroscopic analyzer, a high frequency generated by a high frequency generator 3 is applied to a high frequency oscillator 2 to apply acoustic vibration to the birefringent crystal spectroscopic element 1, and to the birefringent crystal spectroscopic element 1 to which the acoustic vibration is applied. A light beam b1 from a light source 7 is incident on the object to be measured 8, which is an organic compound, and a reflected light b3 is received by a light receiver 9, and an absorption spectrum of the received reflected light is patterned. The converted data is compared and collated with the pattern of the organic compound stored in the data file in advance to determine the material of the organic compound to be measured.
【０００８】ところで、この分光分析装置には複屈折結
晶分光素子１の温度ドリフトを回避するために図２示す
ように複屈折結晶分光素子１の温度を測定する温度測定
素子４と、この温度測定素子４の計測結果に基づいて高
周波振動子２に印加する高周波を補正する周波数制御信
号重畳回路５が設けられている。なお、図２において、
符号１は分光を行う複屈折結晶分光素子、２は複屈折結
晶分光素子１に30 MHz〜80 MHzの振動を与える高周波振
動子（ピエゾ素子）、３は高周波発生装置、６は周波数
制御回路を示す。In this spectroscopic analyzer, a temperature measuring element 4 for measuring the temperature of the birefringent crystal spectroscopic element 1 as shown in FIG. A frequency control signal superimposing circuit 5 for correcting a high frequency applied to the high frequency oscillator 2 based on the measurement result of the element 4 is provided. In FIG. 2,
Reference numeral 1 denotes a birefringent crystal spectroscopic element for performing spectroscopy, 2 denotes a high-frequency vibrator (piezo element) that applies vibration of 30 MHz to 80 MHz to the birefringent crystal spectroscopic element 1, 3 denotes a high frequency generator, and 6 denotes a frequency control circuit. Show.
【０００９】また、矢印ａ１は分光分析計測のスペクト
ル採取する分光波長の切替のための周波数制御信号、矢
印ａ２は複屈折結晶分光素子１の温度に基づく周波数制
御補正信号、矢印ａ３は矢印ａ１と矢印ａ２の信号の重
畳された結果の周波数制御重畳信号が与えられることを
示す。An arrow a1 is a frequency control signal for switching a spectral wavelength for sampling a spectrum for spectroscopic measurement, an arrow a2 is a frequency control correction signal based on the temperature of the birefringent crystal spectroscopic element 1, and an arrow a3 is an arrow a1. This shows that a frequency control superimposed signal resulting from the superposition of the signal of arrow a2 is provided.
【００１０】つぎに、図３は複屈折結晶分光素子１の周
波数対分光波長の特性図を示す。この特性図は横軸に高
周波振動周波数、縦軸に分光波長を示し、曲線１は基準
温度における複屈折結晶分光素子の特性を示し、曲線
２、曲線３はそれぞれ複屈折結晶分光素子１の温度が基
準温度より高い場合と、低い場合との特性を示す。基準
温度との温度差が大きい程、曲線２、曲線３は曲線１と
の距離が拡大する。Next, FIG. 3 shows a characteristic diagram of frequency versus spectral wavelength of the birefringent crystal spectral element 1. In this characteristic diagram, the horizontal axis represents the high-frequency vibration frequency, the vertical axis represents the spectral wavelength, curve 1 represents the characteristic of the birefringent crystal spectral element at the reference temperature, and curves 2 and 3 represent the temperature of the birefringent crystal spectral element 1, respectively. Shows characteristics when the temperature is higher than the reference temperature and when the temperature is lower than the reference temperature. As the temperature difference from the reference temperature increases, the distance between the curves 2 and 3 and the curve 1 increases.
【００１１】図３において、基準温度時に複屈折結晶分
光素子１は縦線１の位置の高周波振動周波数ｆ１に対
し、縦線１と曲線１の交点で定まる分光波長ｗ１を出力
する。温度上昇時には同一の高周波振動周波数ｆ１にて
縦線１と曲線２との交点で定まる分光波長ｗ２は基準温
度時の分光波長ｗ１より低下し、低温時には同一の高周
波振動周波数ｆ１にて縦線１と曲線３との交点で定まる
分光波長ｗ３は基準温度時の分光波長ｗ１より増長する
ことを示している。In FIG. 3, at the reference temperature, the birefringent crystal spectroscopy element 1 outputs a spectral wavelength w1 determined by the intersection of the vertical line 1 and the curve 1 with respect to the high frequency vibration frequency f1 at the position of the vertical line 1. When the temperature rises, the spectral wavelength w2 determined by the intersection of the vertical line 1 and the curve 2 at the same high-frequency vibration frequency f1 is lower than the spectral wavelength w1 at the reference temperature, and the vertical line 1 at the same high-frequency vibration frequency f1 at a low temperature. This indicates that the spectral wavelength w3 determined by the intersection of the curve 3 and the curve 3 is longer than the spectral wavelength w1 at the reference temperature.
【００１２】次に、上述の分光分析装置の作動態様につ
いて説明する。図２において複屈折結晶分光素子１の温
度は温度測定素子４で計測され、この温度測定素子４は
計測結果から周波数制御補正信号ａ２を出力する。この
周波数制御補正信号ａ２は周波数制信号重畳回路５に入
力され、この周波数制信号重畳回路５は周波数制御信号
ａ１に周波数制御補正信号ａ２を重畳して周波数制御重
畳信号ａ３を出力する。この周波数制御重畳信号ａ３は
高周波発生装置３に入力され、高周波発生装置３は周波
数制御重畳信号ａ３に基づいて発生した高周波を高周波
振動子２に印加し、複屈折結晶分光素子１に音響振動を
加えるが、上記温度測定素子４が複屈折結晶分光素子１
の温度が基準温度より高いことを検出した場合は、周波
数制御信号ａ１は周波数制御補正信号ａ２’により補正
された周波数制御重畳信号ａ３’として高周波発生装置
３に入力され、高周波発生装置３が発生する高周波の周
波数はｆ２（図３参照）に補正されるので、縦線２と曲
線２との交点から定まる分光波長はｗ１となり、基準温
度における周波数ｆ１と同一の分光波長を得ることがで
きる。Next, the operation of the above-mentioned spectroscopic analyzer will be described. In FIG. 2, the temperature of the birefringent crystal spectroscopic element 1 is measured by a temperature measuring element 4, and the temperature measuring element 4 outputs a frequency control correction signal a2 from the measurement result. The frequency control correction signal a2 is input to the frequency control signal superimposing circuit 5, and the frequency control signal superimposition circuit 5 superimposes the frequency control correction signal a2 on the frequency control signal a1, and outputs a frequency control superimposition signal a3. This frequency control superimposed signal a3 is input to the high frequency generator 3, and the high frequency generator 3 applies the high frequency generated based on the frequency control superimposed signal a3 to the high frequency vibrator 2, and applies acoustic vibration to the birefringent crystal spectroscopic element 1. In addition, the temperature measuring element 4 is the birefringent crystal
Is higher than the reference temperature, the frequency control signal a1 is input to the high frequency generator 3 as the frequency control superimposed signal a3 'corrected by the frequency control correction signal a2', and the high frequency generator 3 Since the frequency of the high frequency is corrected to f2 (see FIG. 3), the spectral wavelength determined from the intersection of the vertical line 2 and the curve 2 is w1, and the same spectral wavelength as the frequency f1 at the reference temperature can be obtained.
【００１３】また、複屈折結晶分光素子１の温度が基準
温度より低いことを温度測定素子４が検出した場合は、
周波数制御信号ａ１は周波数制御補正信号ａ２”により
補正された周波数制御重畳信号ａ３”として高周波発生
装置３に入力され、高周波発生装置３が発生する高周波
の周波数はｆ３に補正されるので、縦線３と曲線３との
交点から定まる分光波長はｗ１となり、基準温度におけ
る周波数ｆ１と同一の分光波長を得ることができる。When the temperature measuring element 4 detects that the temperature of the birefringent crystal spectroscopic element 1 is lower than the reference temperature,
The frequency control signal a1 is input to the high frequency generator 3 as a frequency control superimposed signal a3 "corrected by the frequency control correction signal a2", and the frequency of the high frequency generated by the high frequency generator 3 is corrected to f3. The spectral wavelength determined from the intersection of 3 and curve 3 is w1, and the same spectral wavelength as frequency f1 at the reference temperature can be obtained.
【００１４】なお、この分光波長の変動は分光素子とし
て近赤外領域（波長：0.9 μｍ〜2.5 μｍ）で用いられ
る複屈折結晶（例えば、二酸化テルル）の場合は温度変
動により結晶体の質量の変化を生じることから１℃につ
き0.0001μｍ程度の波長変動（温度上昇にて波長低下の
方向）を生ずるが、振動周波数を数キロヘルツ（2 KHz
〜3 KHz ）程度、補正制御（温度上昇に対し降下）する
ことによって波長変動を回避することができる。In the case of a birefringent crystal (for example, tellurium dioxide) used in the near-infrared region (wavelength: 0.9 μm to 2.5 μm) as a spectral element, the change in the spectral wavelength is caused by the change in mass of the crystal due to temperature fluctuation. Due to the change, a wavelength fluctuation of about 0.0001 μm per 1 ° C. (in a direction of decreasing the wavelength with an increase in temperature) occurs, but the vibration frequency is changed to several kilohertz (2 KHz).
変 動 3 KHz), wavelength fluctuation can be avoided by performing correction control (falling with temperature rise).
【００１５】以上説明したように、高周波振動周波数を
複屈折結晶分光素子の温度の関数として高周波振動周波
数を、高温時には高周波振動周波数を下げるように、低
温時には高周波振動周波数を上げるように補正制御を行
うことにより、縦線２と曲線２との交点、あるいは縦線
３と曲線３との交点が定まり、変動の無い分光波長を出
力することができ、この分光波長を測定対象に照射して
得られた吸光スペクトルを解析することにより、温度ド
リフトによる測定誤差を回避した測定結果を得る分光分
析装置を実現することができる。As described above, the correction control is performed so that the high-frequency vibration frequency is reduced as a function of the temperature of the birefringent crystal spectroscopic element, the high-frequency vibration frequency is reduced at a high temperature, and the high-frequency vibration frequency is increased at a low temperature. By doing so, the intersection of the vertical line 2 and the curve 2 or the intersection of the vertical line 3 and the curve 3 is determined, and a spectral wavelength that does not fluctuate can be output. By analyzing the obtained absorption spectrum, it is possible to realize a spectroscopic analyzer that obtains a measurement result avoiding a measurement error due to a temperature drift.
【００１６】[0016]
【発明の効果】本発明によれば、耐震性に優れた音響光
学分光方式の複屈折結晶分光素子に音響振動を与える高
周波発生装置において、温度ドリフトによる測定誤差を
解決したので、従来は振動、周囲温度の制約から分光分
析装置の使用が適さなかった種々の生産過程、プロセス
ライン、廃棄物処理等、の現場にても小型、簡便な装置
として分光分析技術を活用し、プラスチックをはじめ、
製薬・食品の材料および製品、環境汚染物質等、種々の
有機化合物を対象として材質の判別、素性の認識を行う
ことを可能とするものである。According to the present invention, in a high-frequency generator for applying acoustic vibration to a birefringent crystal spectroscopy element of an acousto-optic spectroscopic method excellent in earthquake resistance, a measurement error due to a temperature drift is solved. Utilizing spectral analysis technology as a compact and simple device even in various production processes, process lines, waste treatment, etc. where the use of spectroscopic analyzers was not suitable due to the restriction of ambient temperature, including plastics,
It is possible to discriminate the materials and recognize the characteristics of various organic compounds such as pharmaceutical and food materials and products, and environmental pollutants.
【図１】本発明に係る分光分析装置の一例を示すブロッ
ク図FIG. 1 is a block diagram showing an example of a spectroscopic analyzer according to the present invention.
【図２】上記分光分析装置の温度補正を説明するブロッ
ク図FIG. 2 is a block diagram illustrating temperature correction of the spectroscopic analyzer.
【図３】複屈折結晶分光素子の周波数対分光波長の温度
特性図FIG. 3 is a temperature characteristic diagram of frequency versus spectral wavelength of a birefringent crystal spectroscopic element.
１ 複屈折結晶分光素子 ２ 高周波振動子 ３ 高周波発生装置 ４ 温度測定素子 ５ 周波数制御信号重畳回路 ａ１ 周波数制御信号 ａ２ 周波数制御補正信号 ａ３ 周波数制御重畳信号 DESCRIPTION OF SYMBOLS 1 Birefringence crystal spectroscopy element 2 High frequency oscillator 3 High frequency generator 4 Temperature measuring element 5 Frequency control signal superimposing circuit a1 Frequency control signal a2 Frequency control correction signal a3 Frequency control superimposing signal
Claims (1)
に音響振動を与える高周波発生装置において、分光波長
を可変制御する周波数制御信号に複屈折結晶分光素子の
温度変動を関数とする周波数制御補正信号を重畳するこ
とを特徴とする温度ドリフトを回避した分光分析装置。1. A high-frequency generator for applying acoustic vibration to an acousto-optic spectroscopic birefringent crystal spectroscopic element, wherein a frequency control signal for variably controlling a spectral wavelength has a frequency control correction functioning as a function of temperature fluctuation of the birefringent crystal spectroscopic element. A spectrometer that avoids temperature drift characterized by superimposing a signal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP21609396A JPH1038690A (en) | 1996-07-29 | 1996-07-29 | Device for spectroscopic analysis avoiding temperature drift |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP21609396A JPH1038690A (en) | 1996-07-29 | 1996-07-29 | Device for spectroscopic analysis avoiding temperature drift |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH1038690A true JPH1038690A (en) | 1998-02-13 |
Family
ID=16683145
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP21609396A Pending JPH1038690A (en) | 1996-07-29 | 1996-07-29 | Device for spectroscopic analysis avoiding temperature drift |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH1038690A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008524628A (en) * | 2004-12-20 | 2008-07-10 | ハネウェル・インターナショナル・インコーポレーテッド | Sensor and method for measuring selected components in a sheet manufacturing system |
| WO2018056208A1 (en) * | 2016-09-20 | 2018-03-29 | 長野計器株式会社 | Light wavelength measurement device |
| CN108042148A (en) * | 2017-11-30 | 2018-05-18 | 江苏赛诺格兰医疗科技有限公司 | The method of the real time correction of pet detector spectrum drift and spectrum drift correction system |
-
1996
- 1996-07-29 JP JP21609396A patent/JPH1038690A/en active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008524628A (en) * | 2004-12-20 | 2008-07-10 | ハネウェル・インターナショナル・インコーポレーテッド | Sensor and method for measuring selected components in a sheet manufacturing system |
| WO2018056208A1 (en) * | 2016-09-20 | 2018-03-29 | 長野計器株式会社 | Light wavelength measurement device |
| CN108042148A (en) * | 2017-11-30 | 2018-05-18 | 江苏赛诺格兰医疗科技有限公司 | The method of the real time correction of pet detector spectrum drift and spectrum drift correction system |
| CN108042148B (en) * | 2017-11-30 | 2020-11-10 | 江苏赛诺格兰医疗科技有限公司 | Real-time correction method and system for PET detector spectrum drift |
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