JPH102883A - Eddy current flaw detection apparatus - Google Patents
Eddy current flaw detection apparatusInfo
- Publication number
- JPH102883A JPH102883A JP15683996A JP15683996A JPH102883A JP H102883 A JPH102883 A JP H102883A JP 15683996 A JP15683996 A JP 15683996A JP 15683996 A JP15683996 A JP 15683996A JP H102883 A JPH102883 A JP H102883A
- Authority
- JP
- Japan
- Prior art keywords
- defect
- flaw detector
- eddy current
- coil
- detection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、例えば金属平板等
の健全性を確認する渦電流探傷装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an eddy current testing device for checking the soundness of, for example, a flat metal plate.
【0002】[0002]
【従来の技術】一般に渦電流探傷装置は、金属平板等の
金属物体の表面近くの欠陥の有無を判定し、その健全性
の確認に使用されている。この従来の渦電流探傷装置
は、図5に示すように検出コイル101、ダミーコイル
102、励磁コイル103からなる探傷子と、表示画面
121を有する探傷器120及び両者間を接続する接続
ケーブル130により構成されている。2. Description of the Related Art Generally, an eddy current flaw detector is used to determine the presence or absence of a defect near the surface of a metal object such as a metal flat plate and to confirm its soundness. As shown in FIG. 5, this conventional eddy current flaw detector uses a flaw detector including a detection coil 101, a dummy coil 102, and an excitation coil 103, a flaw detector 120 having a display screen 121, and a connection cable 130 connecting between them. It is configured.
【0003】このような構成を有する渦電流探傷装置の
電気的な接続状態を図6に示す。本渦電流探傷装置は、
金属物体表面近くの欠陥の有無を判定し、この健全性の
確認に使用される。図5及び図6において、110は対
象とする被検体金属、111は被検体金属の表面近くに
ある欠陥、131は励磁コイル103が発生する磁界、
132は励磁コイル103が発生する磁界131によっ
て金属体中を流れる渦電流、133は渦電流132によ
って発生する磁界であり、141は探傷器120が内蔵
する発振器である。FIG. 6 shows an electrical connection state of the eddy current flaw detector having such a configuration. This eddy current flaw detector is
The presence or absence of a defect near the surface of the metal object is determined, and is used for confirming the soundness. 5 and 6, reference numeral 110 denotes a target metal to be tested, 111 denotes a defect near the surface of the target metal, 131 denotes a magnetic field generated by the exciting coil 103,
Reference numeral 132 denotes an eddy current flowing in the metal body due to a magnetic field 131 generated by the exciting coil 103, 133 denotes a magnetic field generated by the eddy current 132, and 141 denotes an oscillator built in the flaw detector 120.
【0004】励磁コイル103には接続ケーブル130
を通じて、発振器141から一定の振幅、一定周波数の
交流の電流が流される。励磁コイル103に交流の電流
が流れることによって、励磁コイル103から磁界13
1が発生する。この磁界131は、検出コイル101、
ダミーコイル102及び被検体金属110と鎖交し、被
検体金属110に渦電流132が発生する。この渦電流
132は被検体金属110が健全な場合、励磁コイル1
03と同心円状に発生する。この渦電流132によって
も磁界133が発生し、この磁界133も検出コイル1
01と鎖交する。A connection cable 130 is connected to the exciting coil 103.
, An alternating current having a constant amplitude and a constant frequency flows from the oscillator 141. When an alternating current flows through the exciting coil 103, the magnetic field 13
1 occurs. This magnetic field 131 is applied to the detection coil 101,
An eddy current 132 is generated in the test object metal 110 by interlinking with the dummy coil 102 and the test object metal 110. This eddy current 132 is generated when the metal 110 is healthy.
It occurs concentrically with 03. The eddy current 132 also generates a magnetic field 133, and this magnetic field 133 is also generated by the detection coil 1
Link with 01.
【0005】これらの交流の磁界131及び133が検
出コイル101と鎖交することによって、検出コイル1
01に交流の電圧が誘起する。ダミーコイル102と交
流の磁界131が鎖交するので、ダミーコイル102に
も交流の電圧が誘起する。When the alternating magnetic fields 131 and 133 are linked to the detection coil 101, the detection coil 1
At 01, an AC voltage is induced. Since the alternating magnetic field 131 interlinks with the dummy coil 102, an alternating voltage is also induced in the dummy coil 102.
【0006】検出コイル101及びダミーコイル102
は、探傷器120の内部でブリッジ回路を構成し、探傷
子が被検体金属110の健全部にあるとき、検出コイル
101及びダミーコイル102に誘起する電圧が互いに
相殺され、出力が発生しないように調整される。[0006] Detection coil 101 and dummy coil 102
Constitutes a bridge circuit inside the flaw detector 120, so that when the flaw detector is in a healthy part of the subject metal 110, the voltages induced in the detection coil 101 and the dummy coil 102 cancel each other out so that no output is generated. Adjusted.
【0007】図5における矢印151は探傷子の走査方
向X、矢印152は探傷子の走査方向Yを示しており、
探傷子を被検体表面で、これらの矢印X,Yの方向に走
査して、被検体金属110を探傷する。The arrow 151 in FIG. 5 indicates the scanning direction X of the flaw detector, and the arrow 152 indicates the scanning direction Y of the flaw detector.
The flaw detector is scanned on the surface of the subject in the directions of these arrows X and Y to detect the flaw of the subject metal 110.
【0008】被検体金属110に欠陥111が存在する
場合、渦電流132の流れ方が欠陥の無い場合に比べて
変化する。このとき、渦電流132が発生する磁界13
3も欠陥の無い場合に比べて変化するため、検出コイル
101に誘起する電圧も変化し、この電圧の変化を探傷
器120にて処理し、探傷器120の画面121に表示
する。実際に適用される場合、探傷子を被検体金属11
0の表面上を矢印151及び152の方向に走査し、こ
のときの探傷器120の画面121に現われる信号波形
123、即ち、検出コイル101に誘起する電圧を処理
した信号波形123を観察する。探傷子が被検体金属1
10の健全部(欠陥の無い部分)にあるときは、検出コ
イル101及びダミーコイル102に誘起する電圧が相
殺されるように調整されているため、探傷器120の画
面121の信号波形123は点状となり、欠陥の無いこ
とが判定される。When the defect 111 exists in the metal 110 to be inspected, the flow of the eddy current 132 changes as compared with the case where there is no defect. At this time, the magnetic field 13 generated by the eddy current 132
3 also changes as compared with the case where there is no defect, the voltage induced in the detection coil 101 also changes, and this change in the voltage is processed by the flaw detector 120 and displayed on the screen 121 of the flaw detector 120. When actually applied, the flaw detector is connected to the object metal 11.
The surface 0 is scanned in the directions of arrows 151 and 152, and a signal waveform 123 appearing on the screen 121 of the flaw detector 120 at this time, that is, a signal waveform 123 obtained by processing a voltage induced in the detection coil 101 is observed. Flaw detector is object metal 1
10, the voltage induced in the detection coil 101 and the dummy coil 102 is adjusted so as to cancel each other out, so that the signal waveform 123 on the screen 121 of the flaw detector 120 has a dot. And it is determined that there is no defect.
【0009】従って、上記のように探傷子を被検体金属
110上で移動させながら、探傷器120の画面121
を観察することによって、欠陥の有無を判断でき、被検
体金属110の健全性を知ることができる。Therefore, the screen 121 of the flaw detector 120 is moved while the flaw detector is moved on the test object metal 110 as described above.
By observing, the presence or absence of a defect can be determined, and the soundness of the test metal 110 can be known.
【0010】[0010]
【発明が解決しようとする課題】しかし、上記の従来の
探傷子を用いた探傷装置では、被検金属中の渦電流が探
傷子の励磁コイルと同心円状に流れるため、欠陥による
信号が欠陥の方向とは無関係に発生し、欠陥の方向が分
からないというような問題があった。However, in the above-described flaw detector using the conventional flaw detector, since the eddy current in the metal to be tested flows concentrically with the exciting coil of the flaw detector, a signal due to the defect is not detected. There is a problem that the defect occurs regardless of the direction and the direction of the defect is not known.
【0011】本発明は上記の課題を解決するためになさ
れたもので、被検体金属に存在する欠陥の方向を容易に
感知でき、かつ、欠陥に関して多くの情報を得ることが
でき、正確な修理、期間の大幅短縮等を可能にする渦電
流探傷装置を提供することを目的とする。SUMMARY OF THE INVENTION The present invention has been made to solve the above-mentioned problems, and can easily detect the direction of a defect existing in a metal to be inspected, and can obtain a great deal of information on the defect, thereby enabling accurate repair. It is an object of the present invention to provide an eddy current flaw detector capable of greatly shortening the period.
【0012】[0012]
【課題を解決するための手段】本はに係る渦電流探傷装
置は、互いに直交して設けられた2個の検出コイルと、
その各々に対して、45°の角度となるように設けられ
た励磁コイルとを有する探傷子と、上記検出コイルの各
々が誘起する電圧の差を信号処理し、信号を発生する探
傷器とを備え、上記検出コイル及び励磁コイルが被検体
金属の健全部に置かれたとき、金属中の渦電流による影
響が上記2個の検出コイルに均等に作用して信号が発生
せず、欠陥の方向によって異なる信号が発生することで
欠陥の方向を知ることができることを特徴とする。An eddy current flaw detector according to the present invention comprises two detection coils provided orthogonally to each other;
A flaw detector having an excitation coil provided at an angle of 45 ° with respect to each of them, and a flaw detector that generates a signal by performing signal processing on a voltage difference induced by each of the detection coils. When the detection coil and the excitation coil are placed in a healthy part of the test object metal, the influence of the eddy current in the metal acts equally on the two detection coils and no signal is generated, and the direction of the defect is not detected. Therefore, the direction of the defect can be known by generating different signals.
【0013】(作用)上記のように互いに直交して設け
られた2個の検出コイルの各々に対して、45°の角度
となるように励磁コイルを設け、被検体金属中に励磁コ
イルによって発生する渦電流が2個の検出コイルに対し
て均等に発生し、欠陥が無い場合には、2個の検出コイ
ルの誘起電圧が等しくなり、欠陥が存在する場合、欠陥
の方向によって影響を受ける検出コイルが限定され、探
傷器で互いの検出コイルの差を出力するように構成され
ているため、信号の極性によって欠陥の方向を検知でき
ることになる。(Operation) An excitation coil is provided at an angle of 45 ° to each of the two detection coils provided orthogonal to each other as described above, and generated by the excitation coil in the subject metal. Eddy currents are generated equally in the two detection coils, and when there is no defect, the induced voltages of the two detection coils become equal. When there is a defect, the detection is affected by the direction of the defect. Since the coils are limited and the flaw detector is configured to output the difference between the detection coils, the direction of the defect can be detected by the polarity of the signal.
【0014】[0014]
【発明の実施の形態】以下、図面を参照して本発明の一
実施形態を説明する。図1は、本発明の一実施形態に係
る渦電流探傷装置の構成図である。図1において、10
3は例えば矩形状に形成された探傷子の励磁コイルで、
探傷器120からの交流電流によって交流の磁界を発生
する。上記励磁コイル103の外側には、例えば矩形状
に形成された第1の検出コイル2及び第2の検出コイル
3が直交するように配置される。この場合、励磁コイル
103は、第1の検出コイル2及び第2の検出コイル3
の各々に対して45°の角度となるように位置関係が設
定される。上記のように構成された探傷子は、ケーブル
130を介して探傷器120に接続される。上記第1の
検出コイル2及び第2の検出コイル3は、励磁コイル1
03の磁界及び被検体金属110中の渦電流の変化によ
る磁界等の変化によって、誘起する電圧が変化する。こ
の検出コイル2,3の誘起電圧の変化が探傷器120の
内部回路により従来のものと同様に処理され、探傷器1
20の画面121に信号波形52として表示される。ま
た、矢印151は探傷子の走査方向X、矢印152は探
傷子の走査方向Yである。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings. FIG. 1 is a configuration diagram of an eddy current inspection device according to an embodiment of the present invention. In FIG. 1, 10
Reference numeral 3 denotes an exciting coil of a flaw detector formed in a rectangular shape, for example.
An alternating current from the flaw detector 120 generates an alternating magnetic field. Outside the excitation coil 103, for example, a first detection coil 2 and a second detection coil 3 formed in a rectangular shape are arranged so as to be orthogonal to each other. In this case, the excitation coil 103 includes the first detection coil 2 and the second detection coil 3
Are set to be at an angle of 45 ° with respect to each of. The flaw detector configured as described above is connected to the flaw detector 120 via the cable 130. The first detection coil 2 and the second detection coil 3 include an excitation coil 1
The induced voltage changes due to the change in the magnetic field and the like due to the change in the magnetic field 03 and the eddy current in the test object metal 110. The change in the induced voltage of the detection coils 2 and 3 is processed by the internal circuit of the flaw detector 120 in the same manner as the conventional one, and
The signal waveform 52 is displayed on the screen 121 of FIG. An arrow 151 indicates the scanning direction X of the flaw detector, and an arrow 152 indicates the scanning direction Y of the flaw detector.
【0015】次に上記実施形態の動作を図2、図3及び
図4を参照して説明する。図2は本発明に係る探傷子の
作用を説明するための図である。図3は本発明に係る探
傷子の欠陥が無い場合の信号波形を説明するための図
で、125は探傷器120の画面121で観察される欠
陥が無い場合の信号波形を示している。図4は欠陥の方
向と信号波形の方向を説明するための図で、同図(a)
の126は第1の検出コイル2が該コイル2と平行な方
向の欠陥を横切った場合の信号波形を示し、同図(b)
の127は第2の検出コイル3が該コイル3と平行な方
向の欠陥を横切った場合の信号波形を示している。Next, the operation of the above embodiment will be described with reference to FIGS. 2, 3 and 4. FIG. 2 is a diagram for explaining the operation of the flaw detector according to the present invention. FIG. 3 is a diagram for explaining a signal waveform when there is no defect of the flaw detector according to the present invention. Reference numeral 125 denotes a signal waveform when there is no defect observed on the screen 121 of the flaw detector 120. FIG. 4 is a diagram for explaining the direction of the defect and the direction of the signal waveform.
Reference numeral 126 denotes a signal waveform when the first detection coil 2 crosses a defect in a direction parallel to the coil 2 and FIG.
Reference numeral 127 indicates a signal waveform when the second detection coil 3 crosses a defect in a direction parallel to the coil 3.
【0016】上記図2は、被検体金属110中を流れる
渦電流132の流れ方が、欠陥111の方向によってど
のように変化するかを説明したものである。図2の
(a)は健全な(欠陥の無い)金属体上に探傷子がある
場合の渦電流の流れ方を説明している。健全な金属体上
に探傷子がある場合には、渦電流132は、励磁コイル
103の直下では励磁コイル103と平行して流れよう
とするため、図2(a)のように、探傷子の中心に対称
の形で流れる。励磁コイル103は、第1の検出コイル
2、第2の検出コイル3と各々45°になるように設け
られているため、渦電流132が発生する磁界は、第1
の検出コイル2及び第2の検出コイル3に同一に作用
し、同一の誘起電圧を発生する。一方、探傷器120の
内部では前述したように、2個の検出コイル2,3に誘
起する電圧の差を信号処理するため、探傷子が健全な金
属体上にある場合には、2個の検出コイル2,3が誘起
する電圧が同一であるため、探傷器120の出力として
は何も生じず、探傷器の画面121中に図3の信号波形
125のように振れが生じない。FIG. 2 explains how the flow of the eddy current 132 flowing in the test metal 110 changes depending on the direction of the defect 111. FIG. 2A illustrates how an eddy current flows when a flaw detector is present on a healthy (no defect) metal body. When the flaw detector is on a healthy metal body, the eddy current 132 tends to flow immediately below the excitation coil 103 in parallel with the excitation coil 103, and as shown in FIG. Flows symmetrically around the center. Since the exciting coil 103 is provided at 45 ° with the first detection coil 2 and the second detection coil 3, the magnetic field generated by the eddy current 132 is equal to the first detection coil 2 and the second detection coil 3.
Acts on the detection coil 2 and the second detection coil 3 in the same manner, and generates the same induced voltage. On the other hand, as described above, the inside of the flaw detector 120 performs signal processing on the difference between the voltages induced in the two detection coils 2 and 3. Therefore, when the flaw detector is on a healthy metal body, the two Since the voltages induced by the detection coils 2 and 3 are the same, nothing is generated as the output of the flaw detector 120, and no vibration occurs in the screen 121 of the flaw detector as shown by the signal waveform 125 in FIG.
【0017】図2(b)は第1の検出コイル2と欠陥1
11とが方向が一致する場合について示した図であり
(励磁コイルは省略)、探傷子が第1検出コイル2と平
行な方向の欠陥111の上にあるとき、金属体中の渦電
流132は、欠陥を横切って流れず、図のように、第1
の検出コイル2と平行に流れる成分が発生する。第1の
検出コイル2と平行に流れる渦電流が発生する磁界は該
検出コイル2にのみ作用し、第2の検出コイル3には作
用しない。このため、各検出コイル2,3が誘起する電
圧には差が生じ、第1の検出コイル2と平行な欠陥11
1の上を探傷子が走査される場合、探傷器120の中で
処理され、各検出コイル2,3の誘起電圧の差を出力す
るため、図4(a)のように探傷器の画面121中に振
れを持つ信号波形126が表示される。FIG. 2B shows the first detection coil 2 and the defect 1
11 is a diagram showing a case where the directions coincide with each other (excitation coil omitted), and when the flaw detector is on a defect 111 in a direction parallel to the first detection coil 2, the eddy current 132 in the metal body is , Does not flow across the defect, as shown
A component flowing in parallel with the detection coil 2 is generated. The magnetic field generated by the eddy current flowing in parallel with the first detection coil 2 acts only on the detection coil 2 and does not act on the second detection coil 3. For this reason, a difference occurs between the voltages induced by the respective detection coils 2 and 3, and a defect 11 parallel to the first detection coil 2 is generated.
When a flaw detector is scanned over the flaw detector 1, the flaw detector 120 processes the flaw detector 120 to output the difference between the induced voltages of the respective detection coils 2 and 3, and as shown in FIG. A signal waveform 126 having a shake therein is displayed.
【0018】図2(c)は第2の検出コイル3と欠陥1
11とが方向が一致する場合について示した図であるが
(励磁コイルは省略)、探傷子が第2の検出コイル3と
平行な方向の欠陥111の上にあるとき、金属体中の渦
電流132は欠陥111を横切って流れず、図のよう
に、第2の検出コイル3と平行に流れる成分が発生す
る。第2の検出コイル3と平行に流れる渦電流が発生す
る磁界は、図2(b)とは逆に、第2の検出コイル3に
のみ作用し、第1の検出コイル2には作用しない。つま
り、前に説明した図2(b)とは逆の現象で、各検出コ
イル2,3が誘起する電圧には差が生じる。第2の検出
コイル3と平行な欠陥111の上を探傷子が走査される
場合、各検出コイル2,3に誘起する電圧は、探傷器1
20で処理され、各検出コイル2,3の誘起電圧の差を
出力し、この誘起電圧の差は図2(b)とは逆の現象で
生じているため、図4(b)のように探傷器の画面12
1中に、図4(a)の場合とは逆極性の信号波形127
が表示される。FIG. 2C shows the second detection coil 3 and the defect 1
11 is a diagram showing a case where the directions coincide with each other (excitation coil is omitted), but when the flaw detector is on a defect 111 in a direction parallel to the second detection coil 3, eddy currents in the metal body The component 132 does not flow across the defect 111, but generates a component flowing in parallel with the second detection coil 3 as shown in the figure. The magnetic field generated by the eddy current flowing in parallel with the second detection coil 3 acts only on the second detection coil 3 and does not act on the first detection coil 2, contrary to FIG. That is, a difference occurs between the voltages induced by the respective detection coils 2 and 3 due to a phenomenon opposite to that of FIG. 2B described above. When the flaw detector scans over the defect 111 parallel to the second detection coil 3, the voltage induced on each of the detection coils 2 and 3 depends on the flaw detector 1.
At step 20, the difference between the induced voltages of the detection coils 2 and 3 is output. Since the difference between the induced voltages is caused by a phenomenon opposite to that of FIG. 2B, as shown in FIG. Flaw detector screen 12
1, a signal waveform 127 having a polarity opposite to that of the case of FIG.
Is displayed.
【0019】このように、本発明によれば、欠陥の方向
によって、得られる信号の波形が異なり、信号の方向に
よって、欠陥の方向を知ることができる。本実施の形態
では、矩形のコイルにて説明したが、本方法は、コイル
の形に限定されず、コイルは円形であっても、三角形で
あっても、同様の効果が得られる。As described above, according to the present invention, the waveform of the obtained signal differs depending on the direction of the defect, and the direction of the defect can be known from the direction of the signal. Although the present embodiment has been described using a rectangular coil, the present method is not limited to the coil shape, and the same effect can be obtained regardless of whether the coil is circular or triangular.
【0020】[0020]
【発明の効果】以上説明したように、本発明によれば、
被検体金属に存在する欠陥の方向を容易に感知すること
が可能となり、次のステップで必要な修理等に対しての
情報が多くなり、修理等の正確さ期間等の点で大幅に改
善されることになる。As described above, according to the present invention,
It is possible to easily detect the direction of the defect existing in the test object metal, and the information on the repairs required in the next step is increased, and the accuracy of the repairs etc. is greatly improved in terms of the accuracy period etc. Will be.
【図1】本発明の一実施形態に係る渦電流探傷装置の説
明図。FIG. 1 is an explanatory diagram of an eddy current inspection device according to an embodiment of the present invention.
【図2】同実施形態における探傷子の作用を説明するた
めの図。FIG. 2 is a view for explaining the operation of the flaw detector in the embodiment.
【図3】同実施形態における探傷子の信号波形を説明す
るための図。FIG. 3 is an exemplary view for explaining a signal waveform of the flaw detector in the embodiment.
【図4】同実施形態における欠陥の方向と信号波形の方
向を説明するための図。FIG. 4 is a view for explaining a direction of a defect and a direction of a signal waveform in the embodiment.
【図5】従来の探傷子及び渦電流探傷器を示す説明図。FIG. 5 is an explanatory view showing a conventional flaw detector and an eddy current flaw detector.
【図6】従来の探傷子及び探傷器の電気的接続状態を説
明する図。FIG. 6 is a diagram illustrating an electrical connection state of a conventional flaw detector and flaw detector.
【符号の説明】 2 第1の検出コイル 3 第2の検出コイル 52 信号波形 103 励磁コイル 110 被検体金属 111 金属体中に存在する欠陥 120 探傷器 121 探傷器の画面 125 欠陥が無い場合の信号波形 126 第1の検出コイルが欠陥を横切った場合の信号
波形 127 第2の検出コイルが欠陥を横切った場合の信号
波形 130 接続ケーブル 132 金属体中を流れる渦電流 133 渦電流が発生する磁界 151 探傷の走査方向X 152 探傷子の走査方向Y[Explanation of Symbols] 2 First detection coil 3 Second detection coil 52 Signal waveform 103 Excitation coil 110 Metal to be tested 111 Defects existing in metal body 120 Flaw detector 121 Flaw detector screen 125 Signal without defect Waveform 126 Signal waveform when the first detection coil crosses the defect 127 Signal waveform when the second detection coil crosses the defect 130 Connection cable 132 Eddy current flowing through the metal body 133 Magnetic field where eddy current is generated 151 Flaw detection scanning direction X 152 Flaw detector scanning direction Y
───────────────────────────────────────────────────── フロントページの続き (72)発明者 荒木 直巳 兵庫県高砂市荒井町新浜2丁目1番1号 三菱重工業株式会社高砂研究所内 (72)発明者 谷口 優 兵庫県神戸市兵庫区和田崎町一丁目1番1 号 三菱重工業株式会社神戸造船所内 ──────────────────────────────────────────────────続 き Continued on the front page (72) Inventor Naomi Araki 2-1-1, Shinhama, Arai-machi, Takasago City, Hyogo Prefecture Inside the Takasago Research Laboratory, Mitsubishi Heavy Industries, Ltd. No. 1-1, Mitsubishi Heavy Industries, Ltd., Kobe Shipyard
Claims (1)
イルと、その各々に対して、45°の角度となるように
設けられた励磁コイルとを有する探傷子と、上記検出コ
イルの各々が誘起する電圧の差を信号処理し、信号を発
生する探傷器とを備え、上記検出コイル及び励磁コイル
が被検体金属の健全部に置かれたとき、金属中の渦電流
による影響が上記2個の検出コイルに均等に作用して信
号が発生せず、欠陥の方向によって異なる信号が発生す
ることで欠陥の方向を知ることができることを特徴とす
る渦電流探傷装置。1. A flaw detector having two detection coils provided at right angles to each other, an excitation coil provided at an angle of 45 ° to each of the detection coils, and each of the detection coils A signal detector for processing the difference in voltage induced by the sensor and generating a signal. When the detection coil and the excitation coil are placed in a healthy part of the test object metal, the influence of the eddy current in the metal is reduced to 2 above. An eddy current flaw detection device characterized in that a signal is not generated by acting evenly on the detection coils, and a different signal is generated depending on the direction of the defect so that the direction of the defect can be known.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15683996A JP3245057B2 (en) | 1996-06-18 | 1996-06-18 | Eddy current flaw detector |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15683996A JP3245057B2 (en) | 1996-06-18 | 1996-06-18 | Eddy current flaw detector |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH102883A true JPH102883A (en) | 1998-01-06 |
JP3245057B2 JP3245057B2 (en) | 2002-01-07 |
Family
ID=15636505
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15683996A Expired - Fee Related JP3245057B2 (en) | 1996-06-18 | 1996-06-18 | Eddy current flaw detector |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3245057B2 (en) |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2000008458A1 (en) * | 1998-08-06 | 2000-02-17 | Mitsubishi Heavy Industries, Ltd. | Eddy-current flaw detector probe |
JP2002257506A (en) * | 2001-02-27 | 2002-09-11 | Toppan Printing Co Ltd | Non-contact coating thickness measuring device |
JP2003050234A (en) * | 2001-08-07 | 2003-02-21 | Marktec Corp | Eddy-current flaw detection testing device |
JP2003050233A (en) * | 2001-08-07 | 2003-02-21 | Marktec Corp | Eddy-current flaw detection testing method and eddy- current flaw detection testing device |
JP2013242205A (en) * | 2012-05-18 | 2013-12-05 | Toshiba Corp | Method and device for eddy current flaw detection |
CN108120764A (en) * | 2017-12-21 | 2018-06-05 | 爱德森(厦门)电子有限公司 | A kind of orthogonal Eddy Current Testing Transducer |
CN108872368A (en) * | 2018-07-24 | 2018-11-23 | 爱德森(厦门)电子有限公司 | A kind of non-directional orthogonal eddy current testing device of modified |
CN108872366A (en) * | 2018-07-23 | 2018-11-23 | 爱德森(厦门)电子有限公司 | A kind of adaptive quadrature Eddy Current Testing Transducer |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6888347B2 (en) * | 2003-09-12 | 2005-05-03 | General Electric Company | Omnidirectional eddy current probes, array probes, and inspection systems |
-
1996
- 1996-06-18 JP JP15683996A patent/JP3245057B2/en not_active Expired - Fee Related
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2000008458A1 (en) * | 1998-08-06 | 2000-02-17 | Mitsubishi Heavy Industries, Ltd. | Eddy-current flaw detector probe |
US6501267B1 (en) | 1998-08-06 | 2002-12-31 | Mitsubishi Heavy Industries, Ltd. | Eddy-current flaw detector probe |
JP2002257506A (en) * | 2001-02-27 | 2002-09-11 | Toppan Printing Co Ltd | Non-contact coating thickness measuring device |
JP2003050234A (en) * | 2001-08-07 | 2003-02-21 | Marktec Corp | Eddy-current flaw detection testing device |
JP2003050233A (en) * | 2001-08-07 | 2003-02-21 | Marktec Corp | Eddy-current flaw detection testing method and eddy- current flaw detection testing device |
JP4681770B2 (en) * | 2001-08-07 | 2011-05-11 | マークテック株式会社 | Eddy current testing equipment |
JP2013242205A (en) * | 2012-05-18 | 2013-12-05 | Toshiba Corp | Method and device for eddy current flaw detection |
CN108120764A (en) * | 2017-12-21 | 2018-06-05 | 爱德森(厦门)电子有限公司 | A kind of orthogonal Eddy Current Testing Transducer |
CN108872366A (en) * | 2018-07-23 | 2018-11-23 | 爱德森(厦门)电子有限公司 | A kind of adaptive quadrature Eddy Current Testing Transducer |
CN108872366B (en) * | 2018-07-23 | 2021-12-21 | 爱德森(厦门)电子有限公司 | Self-adaptive orthogonal eddy current detection sensor |
CN108872368A (en) * | 2018-07-24 | 2018-11-23 | 爱德森(厦门)电子有限公司 | A kind of non-directional orthogonal eddy current testing device of modified |
Also Published As
Publication number | Publication date |
---|---|
JP3245057B2 (en) | 2002-01-07 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP3572460B2 (en) | Eddy current probe | |
Nair et al. | A GMR-based eddy current system for NDE of aircraft structures | |
JPS5877653A (en) | Nondestructive testing device | |
WO2000008458A1 (en) | Eddy-current flaw detector probe | |
JPH0854375A (en) | Electromagnetic induction-type inspecting apparatus | |
JP3245057B2 (en) | Eddy current flaw detector | |
WO2008072508A1 (en) | Nondestructive test instrument and nondestructive test method | |
JP2018124154A (en) | C-scope imaging system of eddy current flaw detection result for fatigue crack of steel bridge welded edge | |
JPH10197493A (en) | Eddy-current flow detecting probe | |
JP2011069623A (en) | Eddy current flaw detection method | |
JP3572452B2 (en) | Eddy current probe | |
JPH09178710A (en) | Flaw detecting element for eddy current flaw detection device | |
JP2007163263A (en) | Eddy current flaw detection sensor | |
JP2798199B2 (en) | Noise Removal Method in Eddy Current Testing | |
JP3979606B2 (en) | Eddy current flaw detection probe and eddy current flaw detection device using the probe | |
JP2001349875A (en) | Eddy-current flaw detection probe | |
JPH0599901A (en) | Eddy-current flaw detecting apparatus | |
JPH04551B2 (en) | ||
WO2009093070A1 (en) | Eddy current inspection system and method of eddy current flaw detection | |
JPH06242076A (en) | Electromagnetic flaw detecting equipment | |
JPH0815229A (en) | High resolution eddy current flaw detector | |
JPS612065A (en) | Flaw detector using eddy current | |
JPS60125560A (en) | Method for inspecting metal surface | |
RU2813477C1 (en) | Eddy current transducer for flaw detection | |
JP2575425Y2 (en) | Eddy current flaw detector |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20011002 |
|
LAPS | Cancellation because of no payment of annual fees |