JPH09127013A - Non-woven cloth defect inspection device - Google Patents

Non-woven cloth defect inspection device

Info

Publication number
JPH09127013A
JPH09127013A JP28526495A JP28526495A JPH09127013A JP H09127013 A JPH09127013 A JP H09127013A JP 28526495 A JP28526495 A JP 28526495A JP 28526495 A JP28526495 A JP 28526495A JP H09127013 A JPH09127013 A JP H09127013A
Authority
JP
Japan
Prior art keywords
light
woven fabric
illumination device
amount
reflection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP28526495A
Other languages
Japanese (ja)
Inventor
Masatoshi Toda
正利 戸田
Shintaro Tashiro
慎太郎 田代
Tetsuo Takahashi
哲生 高橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Rayon Co Ltd
Original Assignee
Mitsubishi Rayon Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Rayon Co Ltd filed Critical Mitsubishi Rayon Co Ltd
Priority to JP28526495A priority Critical patent/JPH09127013A/en
Publication of JPH09127013A publication Critical patent/JPH09127013A/en
Pending legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To accurately detect a defect even in a color non-woven cloth. SOLUTION: Light is applied to a non-woven cloth 10 uniformly in its width direction oppositely to the side where a CCD image pick-up device 14 and a lighting device 12 for reflection are arranged and a lighting device 20 for transmission is arranged to obtain light which is transmitted through the non-woven cloth. The CCD image pick-up device 14 picks up the image of reflection light and transmission light from the lighting device 12 for reflection and the lighting device 20 for transmission and binarizes the obtained image signal according to a proper threshold, thus determining whether a defects exists on the surface of the non-woven cloth or not. An adjusting part 15 is provided to adjust so that the amount of transmission from the lighting device 20 for transmission is nearly equal to the amount of reflection at a normal part (a part which does not have holes) of the non-woven cloth 10.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】この発明は連続的に生産され
る不織布の表面に発生する異物、汚れ、他色繊維混入等
の欠陥を検出するための不織布欠陥検出装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a non-woven fabric defect detecting device for detecting defects such as foreign matter, stains, and fibers of other colors generated on the surface of non-woven fabrics produced continuously.

【0002】[0002]

【従来の技術】不織布をその上方より反射用ライン状照
明装置により照明し、一方不織布の下方には不織布とほ
ぼ同一の反射率を持つ白板を配置し、被検査不織布から
の反射光をラインCCDカメラにより撮像し、その画像
信号を適当なしきい値により2値化し不織布の表面の欠
陥の存否を決定する不織布欠陥検出装置が公知である。
この公知の装置は主として白色の不織布を被検査対象と
したものである。即ち、この欠陥検出装置の原理は異
物、汚れ等があるとその反射率が本来の値と相違してく
ることから反射率の変化を検出するものである。ところ
が、不織布は多孔性構造を持っており、孔の部分の反射
率は他の部分とは小さくなり、これを欠陥と誤検知する
可能性がある。不織布の下方に配置される白板は孔の部
分を透過した光による光量変化を補償し、精度のよい検
出を行うべく意図したものである。
2. Description of the Related Art A non-woven fabric is illuminated from above by a line illumination device for reflection, while a white plate having substantially the same reflectance as the non-woven fabric is arranged below the non-woven fabric to reflect the reflected light from the non-woven fabric to be inspected with a line CCD. A non-woven fabric defect detecting device is known in which an image is picked up by a camera and the image signal is binarized by an appropriate threshold value to determine the presence or absence of a defect on the surface of the non-woven fabric.
This known device mainly targets a white non-woven fabric. That is, the principle of this defect detection device is to detect a change in reflectance because the reflectance differs from the original value when foreign matter, dirt, etc. are present. However, since the non-woven fabric has a porous structure, the reflectance of the hole portion is smaller than that of other portions, and this may be erroneously detected as a defect. The white plate disposed below the non-woven fabric is intended to compensate for a change in the amount of light due to the light transmitted through the hole portion and perform accurate detection.

【0003】[0003]

【発明が解決しようとする課題】従来技術は不織布の孔
あき部分を通過する光を不織布下方に配置した白板によ
り補償する原理のものである。従って、目付量の少ない
カラー不織布、又はメッシュのカラー不織布を検査する
場合は白板のために孔あき部分が他の部分より反射率が
高くなってしまい、白色繊維混入等の正常部より反射率
の高い欠陥の検出はできなかった。
The prior art is based on the principle of compensating the light passing through the perforated portion of the non-woven fabric with a white plate disposed below the non-woven fabric. Therefore, when inspecting a colored non-woven fabric with a small basis weight or a colored non-woven fabric of mesh, the perforated part has a higher reflectance than other parts due to the white plate, and the reflectance is higher than the normal part where white fibers are mixed. No high defects could be detected.

【0004】本発明はカラー不織布においても精度の高
い欠陥の検出を可能とすることを目的とする。
An object of the present invention is to make it possible to detect defects with high accuracy even in a colored nonwoven fabric.

【0005】[0005]

【課題を解決するための手段】この発明による不織布の
表面の欠陥を検出するための装置においてはCCD撮像
装置及び反射用照明装置が配置された側と反対側に、不
織布をその幅方向に均一に照明し、不織布を透過した光
を得るべく配置された透過用照明装置が従来の白板の代
わりに配置される。CCD撮像装置は反射用照明装置及
び透過用照明装置からの反射光及び透過光を撮像し、得
られた画像信号を適当なしきい値により2値化し不織布
の表面の欠陥の存否を決定する。
In the apparatus for detecting defects on the surface of a non-woven fabric according to the present invention, the non-woven fabric is uniform in the width direction on the side opposite to the side where the CCD image pickup device and the reflection illuminating device are arranged. The transmissive illuminating device, which is arranged so as to illuminate the substrate and obtain the light transmitted through the non-woven fabric, is arranged in place of the conventional white plate. The CCD image pickup device images reflected light and transmitted light from the reflection illumination device and the transmission illumination device, binarizes the obtained image signal with an appropriate threshold value, and determines the presence or absence of defects on the surface of the nonwoven fabric.

【0006】[0006]

【発明の実施の形態】以下、図面を参照してこの発明の
不織布欠陥検査装置を説明すると、図1,2において、
10は検査すべき不織布(幅はw、長さはLで示す)を
示しており、図示しない適当なコンベヤ手段によって水
平方向(紙面に直交する方向)に搬送される。不織布1
0の上方に反射用ライン状照明装置12が配置され、不
織布10の幅方向に均等なライン状の検査光を不織布1
0に向け照射する。反射用ライン状照明装置12として
は高周波点灯蛍光灯等を採用することができる。反射用
ライン状照明装置12の上方にはラインCCDカメラ1
4が配置され、不織布10により反射された反射用ライ
ン状照明装置12からの検査光はラインCCDカメラ1
4によって一次元的に撮像され、画像処理装置15によ
り後述のように2値化処理され、欠陥の有無の判別を受
ける。
BEST MODE FOR CARRYING OUT THE INVENTION The nonwoven fabric defect inspection apparatus of the present invention will be described below with reference to the drawings.
Reference numeral 10 denotes a non-woven fabric to be inspected (width is w, length is L) and is conveyed in a horizontal direction (direction orthogonal to the paper surface) by an appropriate conveyor means (not shown). Non-woven fabric 1
The reflection line illumination device 12 is arranged above 0 to provide uniform line-shaped inspection light in the width direction of the non-woven fabric 10.
Irradiate toward 0. A high-frequency lighting fluorescent lamp or the like can be used as the reflection line illumination device 12. A line CCD camera 1 is provided above the reflection line illumination device 12.
4 is arranged and the inspection light from the reflection line-shaped illumination device 12 reflected by the nonwoven fabric 10 is the line CCD camera 1.
The image is imaged one-dimensionally by 4 and binarized by the image processing device 15 as described later, and the presence or absence of a defect is discriminated.

【0007】検査中の不織布10の下方には透過用ライ
ン状照明装置20が配置される。この透過用ライン状照
明装置20は従来技術において不織布10の下方に設け
られていた白板の代わりに設置されるものである。透過
用ライン状照明装置20は不織布10が目付量の小さい
ものであったり、メッシュ状であるため孔あき部分が存
在するため、反射用ライン状照明装置12からの検査光
の反射量が低下した場合にその低下とほぼ同程度の光量
の透過光をラインCCDカメラ14に導くことにより誤
検査の防止を図るものである。透過用ライン状照明装置
20からは不織布10の幅方向の全体にわたって均一な
ライン状の透過光が発生され、その透過光の透過量は不
織布10の正常部(孔あき部分ではない部分)における
反射量とほぼ同程度となるように調節される。そのた
め、画像処理装置15はこのような調節を行う調節部2
2を具える。このような調節部22を設けることにより
不織布10のように孔あき部で検査光の反射が消失又は
弱まっても、それを補償する透過光をラインCCDカメ
ラ14に導入することができるため、孔あき部による誤
検知を防止することができる。
A transmission line illumination device 20 is arranged below the nonwoven fabric 10 under inspection. The transmission linear illumination device 20 is installed in place of the white plate provided below the non-woven fabric 10 in the prior art. Since the non-woven fabric 10 of the transmission linear illumination device 20 has a small basis weight, or has a perforated portion because it is a mesh, the reflection amount of the inspection light from the reflection linear illumination device 12 is reduced. In this case, an erroneous inspection is prevented by guiding the transmitted light having a light amount almost equal to the decrease to the line CCD camera 14. A uniform linear transmission light is generated from the transmission linear illumination device 20 over the entire width direction of the non-woven fabric 10. The amount of the transmitted light is reflected by the normal portion (non-perforated portion) of the non-woven fabric 10. The amount is adjusted to be almost the same. Therefore, the image processing device 15 uses the adjustment unit 2 that performs such adjustment.
Two. By providing the adjusting portion 22 as described above, even if the reflection of the inspection light disappears or weakens in the perforated portion like the non-woven fabric 10, the transmitted light that compensates for it can be introduced into the line CCD camera 14. It is possible to prevent erroneous detection due to the perforated portion.

【0008】調節部22による孔あき部での透過率と正
常部での反射率とを同程度になるように調節する補償装
置22の構成としては次のものがある。第1の構成とし
て、カメラ14の視野において、不織布10から外れて
いる領域(b) の光量が不織布10を見ている領域(a) の
光量と同一となるように調節する方法があげられる。即
ち、図3の(イ) において、反射用ライン状照明装置12
を点灯し、透過用ライン状照明装置20を点灯した状態
で、画像処理装置15はラインCCDカメラ14の視野
において、不織布10を見ている領域(a) における出力
電圧の平均値を算出し、予め記憶された上限値、下限値
の範囲に納まっているか否か判断する。上限値、下限値
から外れている場合には、画像処理装置15は反射用ラ
イン状照明装置12の光量を調節し、不織布10を見て
いる領域(a) における出力電圧の平均値が予め記憶され
た上限値、下限値の範囲に納まるように調節を行う。次
に、画像処理装置15はラインCCDカメラ14の視野
において、不織布10からはずれている領域(b) におけ
る出力電圧の平均値を算出し、予め記憶された上限値、
下限値の範囲に納まっているか否か判断する。上限値、
下限値から外れている場合には、画像処理装置15は透
過用ライン状照明装置20の光量を調節し、不織布10
から外れている領域(b) における出力電圧の平均値が予
め記憶された上限値、下限値の範囲に納まるように調節
を行う。このような調節により不織布10からの反射光
量と透過光量とをほぼ均衡するように補償することがで
きる。即ち、図3の(ロ) に示すように無調整の状態にお
いて不織布10を見ている領域(a) においては検出光に
は変動があり、その反射光を発生する通常部分の光量が
最大(Lmax)となり、反射が起こらない孔あきの部分では
光量が最小(Lmin)となり、また不織布10を見ている領
域(a) と不織布10から外れている領域(b) とでは光量
に差がある。反射用ライン状照明装置12及び透過用ラ
イン状照明装置20の光量の調節を上述のように行うこ
とにより、図3の(ハ) に示すようにラインCCDカメラ
14が最終的に検出する反射光及び透過光を含めたトー
タルの光量は均衡化され、誤検知のおそれを解消するこ
とができる。
There is the following configuration of the compensator 22 for adjusting the transmittance of the perforated portion and the reflectance of the normal portion by the adjusting portion 22 to be approximately the same. As a first configuration, there is a method of adjusting the amount of light in the region (b) outside the nonwoven fabric 10 in the field of view of the camera 14 to be the same as the amount of light in the region (a) looking at the nonwoven fabric 10. That is, in FIG. 3A, the line illumination device 12 for reflection is used.
And the transmission line illumination device 20 is turned on, the image processing device 15 calculates the average value of the output voltage in the region (a) looking at the nonwoven fabric 10 in the field of view of the line CCD camera 14, It is determined whether or not it is within the range of the upper limit value and the lower limit value stored in advance. If the upper limit value and the lower limit value are not satisfied, the image processing device 15 adjusts the light amount of the reflection linear illumination device 12, and the average value of the output voltage in the area (a) looking at the nonwoven fabric 10 is stored in advance. Adjust the value so that it falls within the range of the upper and lower limits. Next, the image processing device 15 calculates the average value of the output voltage in the region (b) deviated from the nonwoven fabric 10 in the field of view of the line CCD camera 14, and stores the upper limit value stored in advance,
Judge whether it is within the range of the lower limit. upper limit,
When the value is out of the lower limit, the image processing device 15 adjusts the light amount of the transmissive line-shaped illumination device 20, and the non-woven fabric 10 is adjusted.
Adjustment is performed so that the average value of the output voltage in the region (b) outside the range falls within the range of the upper limit value and the lower limit value stored in advance. By such adjustment, the amount of reflected light from the nonwoven fabric 10 and the amount of transmitted light can be compensated so as to be approximately balanced. That is, as shown in FIG. 3B, in the area (a) where the non-woven fabric 10 is viewed in the unadjusted state, the detected light varies, and the amount of light in the normal portion that generates the reflected light is maximum ( Lmax), the amount of light is minimum (Lmin) in the perforated portion where reflection does not occur, and there is a difference in the amount of light between the region (a) looking at the nonwoven fabric 10 and the region (b) outside the nonwoven fabric 10. By adjusting the light amounts of the reflection line-shaped illumination device 12 and the transmission line-shaped illumination device 20 as described above, the reflected light finally detected by the line CCD camera 14 as shown in FIG. 3C. Also, the total amount of light including the transmitted light is balanced, and the risk of erroneous detection can be eliminated.

【0009】孔あき部での透過率と正常部での反射率と
を同程度になるように調節する第2の構成としては不織
布10を見ている領域(a) の光量の最小値と最大値との
差が最小となるように(即ち光量の変動が解消するよう
に)調節するものがあげられる。即ち、反射用ライン状
照明装置12を点灯し、透過用ライン状照明装置20を
消灯した状態で、反射用ライン状照明装置12の光量を
出力電圧が予め定められている最大値と最小値との間に
納まるように制御することにより不織布10を見ている
領域(a) の出力電圧の平均値を調整することは第1の構
成と同様である。次に、透過用ライン状照明装置20を
点灯し、ラインCCDカメラ14からの出力電圧の変動
が評価され、領域(a) での変動が最小となるように透過
用ライン状照明装置20の光量が調節される。出力電圧
の変動の評価方法としては、不織布10を見ている領域
(a) の出力電圧の最大値と最小値との差分値で評価する
方法や、同領域(a) における隣接する画素の出力電圧の
差分値で評価する方法等がある。図4の(ロ) に示すよう
に無調整では光量に変動があるが、このような調節を行
うことによりラインCCDカメラ14が最終的に検出す
る光量を図4の(ハ)に示すように均衡化し、誤検知のお
それを解消することができる。
As a second structure for adjusting the transmittance at the perforated portion and the reflectance at the normal portion to be approximately the same, the minimum and maximum values of the amount of light in the region (a) looking at the nonwoven fabric 10 are set. There is one that is adjusted so that the difference from the value is minimized (that is, the fluctuation of the light amount is eliminated). That is, in a state in which the reflection line illumination device 12 is turned on and the transmission line illumination device 20 is turned off, the light amount of the reflection line illumination device 12 has a maximum value and a minimum value at which the output voltage is predetermined. The average value of the output voltage of the region (a) looking at the nonwoven fabric 10 is adjusted by controlling so as to be set between the same as in the first configuration. Next, the transmission linear illumination device 20 is turned on, the fluctuation of the output voltage from the line CCD camera 14 is evaluated, and the light amount of the transmission linear illumination device 20 is minimized so that the fluctuation in the area (a) is minimized. Is adjusted. As the evaluation method of the fluctuation of the output voltage, the area where the nonwoven fabric 10 is viewed
There are a method of evaluating the difference value between the maximum value and the minimum value of the output voltage in (a), a method of evaluating the difference value between the output voltages of the adjacent pixels in the same area (a), and the like. As shown in (b) of FIG. 4, the amount of light varies without adjustment, but the amount of light finally detected by the line CCD camera 14 by such adjustment is shown in (c) of FIG. It is possible to balance and eliminate the risk of false detection.

【0010】透過用ライン状照明装置20の光量を上述
の方法のように調節することにより目付量の小さい不織
布あるいはメッシュのような不織布の孔あき部分の反射
光の低下あるいは上昇を押さえ、均衡化を図ることがで
きるため、汚れ、異物、反射率の低い他色繊維混入等の
暗い欠陥も、反射率の高い他色繊維混入等の明るい欠陥
も安定して検出することができる。
By adjusting the amount of light of the transmission linear illumination device 20 as in the above-described method, it is possible to suppress the decrease or increase of the reflected light at the perforated portion of the non-woven fabric or the non-woven fabric such as a mesh having a small basis weight so as to be balanced. Therefore, it is possible to stably detect dark defects such as dirt, foreign matter, and other color fibers with low reflectance mixed with other colors, and bright defects with other reflectance fibers mixed with other colors.

【0011】次に、この発明の装置による不織布の欠陥
検査のための作動を説明すると、反射用ライン状照明装
置12は、コンベヤ上を走行する不織布を上方から均一
に幅方向に照明し、一方、透過用ライン状照明装置20
は不織布を下方から均一に幅方向を照明する。ラインC
CDカメラ14は照明された不織布の一次元的な撮像を
行う。不織布に欠陥がなければ、ラインCCDカメラ1
4の出力波形状は図3の(ハ) 又は図4の(ハ) に示すよう
に不織布の幅方向に均一となる。一方、不織布上に異
物、汚れ、他色繊維混入等の欠陥が発生するとその欠陥
部分で反射率が低下し、ラインCCDカメラの出力波形
状は欠陥部分で落ち込みが発生する。画像処理装置15
はラインCCDカメラの出力を2値化することにより落
ち込みを検出する欠陥検知部24(図1)を備えてい
る。この欠陥検知部24は模式的には比較器として構成
され、比較器の一方の入力はラインCCDカメラの出力
が接続され、他方の入力は許容される最大の欠陥の濃度
に対応した所定レベルVに設定される。排除すべき欠陥
がない場合はラインCCDカメラの出力は所定レベルを
越え、比較器の出力24-1からは信号"1" が出力される。
排除すべき欠陥が存在する場合はラインCCDカメラの
出力は所定レベル以下となり、比較器の出力24-1からは
信号"0" が出力される。即ち、図5において、欠陥が存
在しないときは検出レベルの変化は小さく判定レベルを
下回らないが、欠陥の存在により検出レベルは破線Xの
ように降下し、判定レベルを下回り、欠陥信号が得られ
る。
Next, the operation of the apparatus of the present invention for inspecting a non-woven fabric for defects will be described. The reflection line illumination device 12 uniformly illuminates the non-woven fabric running on the conveyor from above in the width direction. , Transmission line illumination device 20
Illuminates the non-woven fabric evenly in the width direction from below. Line C
The CD camera 14 takes a one-dimensional image of the illuminated nonwoven fabric. If the non-woven fabric is not defective, line CCD camera 1
The output wave shape of No. 4 becomes uniform in the width direction of the nonwoven fabric as shown in FIG. 3C or FIG. 4C. On the other hand, when defects such as foreign matter, dirt, and fibers of other colors are generated on the non-woven fabric, the reflectance is lowered at the defective portions, and the output wave shape of the line CCD camera is lowered at the defective portions. Image processing device 15
Is equipped with a defect detection unit 24 (FIG. 1) for detecting a drop by binarizing the output of the line CCD camera. The defect detection unit 24 is typically configured as a comparator. One input of the comparator is connected to the output of the line CCD camera, and the other input is a predetermined level V corresponding to the maximum allowable defect density. Is set to. If there is no defect to be eliminated, the output of the line CCD camera exceeds a predetermined level, and the signal "1" is output from the output 24-1 of the comparator.
If there is a defect to be eliminated, the output of the line CCD camera is below a predetermined level, and the signal "0" is output from the output 24-1 of the comparator. That is, in FIG. 5, when there is no defect, the change of the detection level is small and does not fall below the judgment level, but due to the presence of the defect, the detection level drops as shown by the broken line X and falls below the judgment level, and a defect signal is obtained. .

【0012】[0012]

【発明の効果】この発明によれば、不織布の裏面より透
過光による照明を行うことにより、検査を受ける不織布
の色に影響を受けることなく欠陥の正確な検出が実現す
る。従来技術の場合、この発明の透過用ライン状照明装
置20の代わりに白板を使用しており、図5に示す検出
原理は基本的には相違ないが、目付け量の少ないカラー
不織布やメッシュのカラー不織布の場合は白板によりか
えって反射率が高くなってしまい、白色繊維混入等の正
常部より反射率の高い欠陥を検出することができなかっ
たが、この発明はこの欠点を解消するものである。
According to the present invention, by illuminating the back surface of the nonwoven fabric with transmitted light, it is possible to accurately detect defects without being influenced by the color of the nonwoven fabric to be inspected. In the case of the prior art, a white plate is used instead of the transmissive linear illumination device 20 of the present invention, and the detection principle shown in FIG. In the case of a non-woven fabric, the white plate rather increases the reflectance, and a defect having a reflectance higher than that of a normal portion such as white fibers cannot be detected. However, the present invention solves this drawback.

【図面の簡単な説明】[Brief description of the drawings]

【図1】図1はこの発明の装置の概略的に正面図であ
る。
FIG. 1 is a schematic front view of the device of the present invention.

【図2】図2はこの発明の装置の概略的側面図である。FIG. 2 is a schematic side view of the device of the present invention.

【図3】図3は反射光及び透過光の調整の第1の方法を
説明する図である。
FIG. 3 is a diagram illustrating a first method of adjusting reflected light and transmitted light.

【図4】図4は反射光及び透過光の調整の第2の方法を
説明する図である。
FIG. 4 is a diagram illustrating a second method of adjusting reflected light and transmitted light.

【図5】図5はこの発明における欠陥検知の2値化方法
を説明する図である。
FIG. 5 is a diagram for explaining a binarization method for defect detection according to the present invention.

【符号の説明】[Explanation of symbols]

10…不織布 12…反射用ライン状照明装置 14…ラインCCDカメラ 15…画像処理装置 20…透過用ライン状照明装置 DESCRIPTION OF SYMBOLS 10 ... Nonwoven fabric 12 ... Line illumination device for reflection 14 ... Line CCD camera 15 ... Image processing device 20 ... Line illumination device for transmission

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 不織布の表面の欠陥を検出するための装
置であって、 不織布の片側面に対向して配置され、不織布をその幅方
向に均一に照明し、不織布からの反射光を得るべく配置
された反射用照明装置と、 不織布の反対側面に対向して配置され、不織布をその幅
方向に均一に照明し、不織布を透過した光を得るべく配
置された透過用照明装置と、 前記反射用照明装置及び透過光用照明装置により照明さ
れた不織布をその幅方向に沿って一次元的に撮像するべ
く配置されたCCD撮像装置と、 前記CCD撮像装置からの画像信号を適当なしきい値に
より2値化し不織布の表面の欠陥の存否を決定する画像
処理装置と、を具備したことを特徴とする不織布欠陥検
査装置。
1. A device for detecting defects on the surface of a non-woven fabric, which is arranged so as to face one side surface of the non-woven fabric and uniformly illuminates the non-woven fabric in the width direction thereof to obtain reflected light from the non-woven fabric. A reflection illuminating device that is disposed, and a transmission illuminating device that is disposed so as to face the opposite side surface of the non-woven fabric, uniformly illuminates the non-woven fabric in its width direction, and obtains light transmitted through the non-woven fabric; Image pickup device arranged to take a one-dimensional image along the width direction of the nonwoven fabric illuminated by the illumination device for transmitted light and the illumination device for transmitted light, and an image signal from the CCD image pickup device by an appropriate threshold value. An image processing device which binarizes and determines the presence or absence of defects on the surface of the non-woven fabric.
【請求項2】 正常な不織布からの反射光量と不織布を
透過する光量とを均等化するように照明装置からの光量
の調節を行う調節手段を更に具備したことを特徴とする
請求項1に記載の不織布欠陥検査装置。
2. The adjusting means for adjusting the quantity of light from the lighting device so as to equalize the quantity of light reflected from a normal non-woven cloth and the quantity of light transmitted through the non-woven cloth. Non-woven fabric defect inspection device.
【請求項3】 前記調節手段は、CCD撮像装置の視野
において、不織布から外れている領域の光量が不織布を
見ている領域の光量とほぼ同一となるように照明装置か
らの光量の調節を行うことを特徴とする請求項2に記載
の不織布欠陥検査装置。
3. The adjusting means adjusts the amount of light from the illumination device so that the amount of light in a region outside the non-woven fabric is substantially the same as the amount of light in the region looking at the non-woven fabric in the field of view of the CCD image pickup device. The non-woven fabric defect inspection device according to claim 2, wherein
【請求項4】 前記調節手段は、CCD撮像装置の視野
において、不織布を見ている領域の光量変動が実質的に
解消するように照明装置からの光量の調節を行うことを
特徴とする請求項2に記載の不織布欠陥検査装置。
4. The adjusting means adjusts the quantity of light from the illumination device so that the fluctuation of the quantity of light in the area where the nonwoven fabric is viewed is substantially eliminated in the field of view of the CCD image pickup device. The nonwoven fabric defect inspection device according to 2.
JP28526495A 1995-11-01 1995-11-01 Non-woven cloth defect inspection device Pending JPH09127013A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP28526495A JPH09127013A (en) 1995-11-01 1995-11-01 Non-woven cloth defect inspection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP28526495A JPH09127013A (en) 1995-11-01 1995-11-01 Non-woven cloth defect inspection device

Publications (1)

Publication Number Publication Date
JPH09127013A true JPH09127013A (en) 1997-05-16

Family

ID=17689257

Family Applications (1)

Application Number Title Priority Date Filing Date
JP28526495A Pending JPH09127013A (en) 1995-11-01 1995-11-01 Non-woven cloth defect inspection device

Country Status (1)

Country Link
JP (1) JPH09127013A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006054545A1 (en) * 2004-11-19 2006-05-26 Daicel Chemical Industries, Ltd. Automatic judging device and automatic judging method
JP4777359B2 (en) * 2005-11-16 2011-09-21 日本たばこ産業株式会社 Mixture identification system
CN103119424A (en) * 2010-11-16 2013-05-22 东洋钢钣株式会社 Method for inspecting porous plate surface and apparatus for inspecting porous plate surface

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006054545A1 (en) * 2004-11-19 2006-05-26 Daicel Chemical Industries, Ltd. Automatic judging device and automatic judging method
GB2435325A (en) * 2004-11-19 2007-08-22 Daicel Chem Automatic judging device and automatic judging method
JP4777359B2 (en) * 2005-11-16 2011-09-21 日本たばこ産業株式会社 Mixture identification system
CN103119424A (en) * 2010-11-16 2013-05-22 东洋钢钣株式会社 Method for inspecting porous plate surface and apparatus for inspecting porous plate surface

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