JPH0886616A - Method and apparatus for measuring three-dimensional image - Google Patents
Method and apparatus for measuring three-dimensional imageInfo
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- JPH0886616A JPH0886616A JP6248680A JP24868094A JPH0886616A JP H0886616 A JPH0886616 A JP H0886616A JP 6248680 A JP6248680 A JP 6248680A JP 24868094 A JP24868094 A JP 24868094A JP H0886616 A JPH0886616 A JP H0886616A
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- slit light
- measurement object
- slit
- laser head
- image
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Abstract
Description
【０００１】[0001]
【産業上の利用分野】本発明は、画像処理により３次元
物体の位置及び形状を計測する３次元画像計測方法及び
装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a three-dimensional image measuring method and apparatus for measuring the position and shape of a three-dimensional object by image processing.
【０００２】[0002]
【従来の技術】従来、スリット光投影法を用いて３次元
物体の位置，形状等を計測する方法としては、図５，図
６模式図のような方法が知られており、図５はスリット
光源２０からの１本のスリット光２１を３次元の計測物
体１に照射する方法で、計測物体１の形状を識別するた
めにスリット光２１を一定間隔で左右に走査させるもの
であり、図６は＃１スリット光源２０ａ，＃２スリット
光源２０ｂの２つの光源を用いて２本の直交する＃１ス
リット光２１ａ，＃２スリット光２１ｂを照射する方法
で、この方法では２本のスリット光２１ａ，２１ｂは走
査させない。2. Description of the Related Art Conventionally, as a method for measuring the position, shape, etc. of a three-dimensional object using the slit light projection method, methods such as those shown in FIGS. 5 and 6 are known. A method of irradiating the one-dimensional slit light 21 from the light source 20 to the three-dimensional measurement object 1 is used to scan the slit light 21 left and right at regular intervals in order to identify the shape of the measurement object 1. Is a method of irradiating two orthogonal # 1 slit light 21a and # 2 slit light 21b by using two light sources of # 1 slit light source 20a and # 2 slit light source 20b. In this method, two slit light 21a are used. , 21b are not scanned.
【０００３】しかしながら、図５に示す方法では、１本
のスリット光２１を計測物体１に投影することで物体面
上の切断線像が得られ、この投影像を横方向に少しずつ
走査させることで３次元形状データを得て計測物体１の
形状を識別することができるが、あくまで１回の撮像で
物体面上の１本の切断線データしか得られないため、計
測物体１全体の形状データを得るにはかなりの処理時間
を要し、更に物体面の大きさにより撮像回数が変わるた
め、撮像回数の制御が必要になるとともに、スリット光
と同一方向の計測物体の輪郭線は、スリット光が走査時
に輪郭線上に来ないと検出できないためにスリット光と
同一方向の物体形状の識別精度が落ちる。また図６に示
す方法は、形状識別処理においてスリット光２１ａ，２
１ｂは後の明暗画像による物体面の輪郭の線分化（物体
面の識別）のための物体面付近の小領域切り出しに使用
しているのみであり、スリット光の切断線データを直接
形状識別処理に使用しているわけではない。従ってこの
方法では、物体面の識別つまり形状識別において予め物
体面の頂点数等の情報が必要であり、特定形状の計測物
体の識別しか行えず、更に２つのスリット光源２０ａ，
２０ｂを使用しているため、十字スリット光の投影位置
の位置合わせに光源が１つの場合に比べて手間がかか
る。However, in the method shown in FIG. 5, one slit light 21 is projected onto the measuring object 1 to obtain a cutting line image on the object plane, and this projected image is gradually scanned in the lateral direction. The shape of the measurement object 1 can be identified by obtaining the three-dimensional shape data, but since only one cutting line data on the object surface can be obtained by one imaging, the shape data of the entire measurement object 1 can be obtained. It takes a considerable amount of processing time to obtain, and since the number of times of imaging changes depending on the size of the object surface, it is necessary to control the number of times of imaging, and the contour line of the measurement object in the same direction as the slit light is the slit light. Cannot be detected unless it comes on the contour line during scanning, so that the accuracy of identifying the object shape in the same direction as the slit light decreases. In addition, the method shown in FIG.
1b is only used for cutting out a small area near the object plane for line segmentation of the contour of the object plane (identification of the object plane) by a bright and dark image, and the cutting line data of the slit light is directly subjected to the shape identification processing. Not used for. Therefore, in this method, information such as the number of vertices of the object surface is required in advance for the object surface identification, that is, the shape identification, and only the measurement object having the specific shape can be identified.
Since 20b is used, alignment of the projection position of the cross slit light is more troublesome than in the case where there is one light source.
【０００４】[0004]
【発明が解決しようとする課題】本発明は、このような
事情に鑑みて提案されたもので、従来の１本のスリット
光を使用したスリット光投影法に比べてスリット光を照
射した計測物体の撮像回数が減り、識別処理時間の短縮
が図れるとともに、回転中心となる交差点が計測物体の
輪郭線上にのらない限り、スリット光の方向による形状
識別の精度低下が改善される３次元画像計測方法及び装
置を提供することを目的とする。SUMMARY OF THE INVENTION The present invention has been proposed in view of the above circumstances, and a measuring object irradiated with slit light as compared with the conventional slit light projection method using one slit light. 3D image measurement that can reduce the number of times of imaging, shorten the identification processing time, and improve the accuracy of shape identification depending on the slit light direction unless the intersection that is the center of rotation is on the contour line of the measurement object. It is an object to provide a method and a device.
【０００５】[0005]
【課題を解決するための手段】そのために本発明は、レ
ーザーによるスリット光を複数交差させ、これを３次元
の計測物体に照射するとともに次の照射では交差点付近
を中心に複数スリット光を回転させ、計測物体の前回と
は違う位置に照射していき、計測物体上に照射された複
数スリット光によりできる切断線をカメラで各回転毎に
撮像して切断線データにより計測物体の位置，形状を識
別することと、３次元の計測物体に交差する複数のスリ
ット光を照射するレーザーと、上記スリット光を発する
レーザーヘッドを交差点付近を中心の回転及び上下左右
の平行移動が可能に装架したレーザーヘッド架台と、上
記スリット光が照射されている計測物体を撮像するカメ
ラと、上記カメラで撮像された画像信号を処理する画像
処理部及び上記レーザーヘッドの作動を制御するレーザ
ーヘッド制御部を内蔵したコンピューターとを具えたこ
ととを、それぞれ特徴とする。To this end, according to the present invention, a plurality of slit light beams by a laser intersect each other, and the three-dimensional measurement object is irradiated with the slit light beams, and in the next irradiation, the plural slit light beams are rotated around the intersection. , Irradiating the position of the measurement object different from the last time, the cutting line made by the multiple slit light irradiated on the measurement object is imaged by the camera for each rotation, and the position and shape of the measurement object is determined by the cutting line data. Laser for identifying and irradiating a plurality of slit lights intersecting a three-dimensional measurement object, and a laser head for emitting the slit lights so that the laser head can be rotated around an intersection and moved up and down and left and right in parallel. A head frame, a camera that captures an image of the measurement object illuminated by the slit light, an image processing unit that processes an image signal captured by the camera, and the laser. And that comprises a computer with a built-in laser head controller for controlling the operation of Zaheddo, respectively characterized.
【０００６】[0006]
【作用】本発明３次元画像計測方法においては、３次元
の計測物体に交差する複数のスリット光を照射するので
１回の撮像で複数の切断線データを得られるため、全体
の形状データを得るのに１本のスリット光を投影する場
合に比べて少ない撮像回数ですむ。従って識別処理を行
う時間が大幅に短縮される。また走査方法が回転のた
め、スリット光の平行走査時のスリット光と同一方向の
識別精度低下の改善が得られる。なおスリット光の光源
が１つのため投影位置の設定が容易である。In the three-dimensional image measuring method of the present invention, since a plurality of slit lights intersecting a three-dimensional measuring object are radiated, a plurality of cutting line data can be obtained by one image pickup, so that the entire shape data is obtained. However, the number of times of imaging is small compared to the case of projecting one slit light. Therefore, the time for performing the identification process is significantly shortened. Further, since the scanning method is rotated, it is possible to improve the deterioration of the identification accuracy in the same direction as the slit light when the slit light is scanned in parallel. Since there is only one slit light source, it is easy to set the projection position.
【０００７】[0007]
【実施例】本発明３次元画像計測方法及び装置の一実施
例を図面について説明すると、図１は本方法を実施する
装置の模式図、図２は本装置の動作の際に使用する三角
測量の原理図、図３は本装置の動作を説明する概念図、
図４は画像処理部のフローチャートである。図１におい
て、３次元の計測物体１に十字スリット光２を照射する
レーザー３のレーザーヘッド４は、十字スリット光２が
照射できるものを使用し、レーザーヘッド架台５に十字
の交点を中心に９０°程度の十字スリット光回転角θだ
け回転できるとともに、十字の交点が上下左右に適宜距
離移動できるように装架されている。このレーザーヘッ
ド架台５の傍には十字スリット光２が照射されている計
測物体１を撮像するＣＣＤカメラ６が設置されている。
更にレーザーヘッド架台５及びＣＣＤカメラ６に連結さ
れるコンピューター７が配置され、その内部には、ＣＣ
Ｄカメラ６から画像信号１０を受け計測物体１の位置や
形状を計測する画像処理部８と、レーザーヘッド架台５
へ一定角度の間隔で回転させるための回転制御信号１１
を送るレーザーヘッド制御部９が内蔵されている。DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of a three-dimensional image measuring method and device of the present invention will be described with reference to the drawings. FIG. 1 is a schematic diagram of a device for carrying out the method, and FIG. 2 is a triangulation used in the operation of the device. Fig. 3 is a conceptual diagram for explaining the operation of this device,
FIG. 4 is a flowchart of the image processing unit. In FIG. 1, a laser head 4 of a laser 3 for irradiating a three-dimensional measurement object 1 with a cross slit light 2 is a laser head capable of irradiating the cross slit light 2, and a laser head pedestal 5 is provided with a cross point 90 at the center. It is mounted so that it can be rotated by a cross slit light rotation angle θ of about °, and the intersection of the cross can be moved up, down, left and right as appropriate. A CCD camera 6 for picking up an image of the measurement object 1 irradiated with the cross slit light 2 is installed near the laser head mount 5.
Further, a computer 7 connected to the laser head base 5 and the CCD camera 6 is arranged, and inside the computer 7 is a CC.
The image processing unit 8 that receives the image signal 10 from the D camera 6 and measures the position and shape of the measurement object 1, and the laser head mount 5.
Rotation control signal 11 for rotating at a constant angle interval
The laser head control unit 9 for sending the
【０００８】このような装置において、レーザーヘッド
４から十字スリット光２を計測物体１に照射し最初の照
射位置を基準位置とし、レーザーヘッド制御部９によっ
て例えば５°おきのような一定角度の間隔で基準位置か
ら９０°までレーザーヘッド４を回転させ、各角度にお
いて十字スリット光２が照射されている計測物体１をＣ
ＣＤカメラ６で撮像し、画像信号１０を画像処理部８へ
送ると、画像処理部８はカメラパラメーター及び変換マ
トリックスを用いる３次元画像計測方法により計測物体
１の位置や形状を識別する。In such an apparatus, the laser head 4 irradiates the measuring object 1 with the cross slit light 2 and the first irradiation position is used as a reference position. The laser head 4 is rotated by 90 ° from the reference position, and the measuring object 1 irradiated with the cross slit light 2 at each angle is C
When the image is captured by the CD camera 6 and the image signal 10 is sent to the image processing unit 8, the image processing unit 8 identifies the position and shape of the measurement object 1 by a three-dimensional image measuring method using camera parameters and a conversion matrix.
【０００９】以下に図２〜図４により３次元画像計測の
動作を説明する。まず前提条件について述べると、一
部、三角測量の原理を用いて計測物体１の３次元座標位
置を求めるため、図２に示すように、ＣＣＤカメラ６の
レンズ１５とレーザーヘッド４の先端中心部が３次元絶
対座標系のｘ軸上にくるように設置する。更にＣＣＤカ
メラ６の撮像面１４は、図２のようにｘ−ｙ平面に平行
になるようにする。（設置したＣＣＤカメラ６のカメラ
パラメータを求めれば、実際に平行でなくても平行にな
るよう補正できる。）またレーザーヘッド４の角度θｂ
（レーザーの光軸のｘ−ｙ平面への投影とｘ軸のなす
角）の値は、ｙ軸方向を中心に回転させても常に分かる
ものとし、レーザーヘッド４から照射される十字スリッ
ト光２の初期状態は常に１本のスリット光（縦スリット
光）がｙ軸に平行とする。計測物体１は、構成する面に
曲面はないものに限定する。即ち計測物体１の輪郭線は
全て直線である。The operation of three-dimensional image measurement will be described below with reference to FIGS. First, to describe the preconditions, in order to obtain the three-dimensional coordinate position of the measurement object 1 in part using the principle of triangulation, as shown in FIG. 2, the lens 15 of the CCD camera 6 and the center of the tip of the laser head 4 are arranged. Is placed so that it is on the x-axis of the three-dimensional absolute coordinate system. Further, the image pickup surface 14 of the CCD camera 6 is made parallel to the xy plane as shown in FIG. (By obtaining the camera parameters of the installed CCD camera 6, it is possible to make corrections so that they are parallel even if they are not actually parallel.) Also, the angle θb of the laser head 4
The value of (projection of the optical axis of the laser on the xy plane and the angle formed by the x-axis) is always known even when rotated about the y-axis direction, and the cross slit light 2 emitted from the laser head 4 is used. In the initial state of, one slit light (longitudinal slit light) is always parallel to the y-axis. The measurement object 1 is limited to one having no curved surface. That is, the contour lines of the measurement object 1 are all straight lines.
【００１０】次に図３により３次元画像計測処理の手順
を述べる。まず計測物体１の１面（図３の物体中心照射
面１−１）に十字スリット光を照射し、図２の三角測量
の原理を用いて十字光の中心点１２−１の３次元座標位
置を求める。３次元位置は、十字光中心点の撮像面上の
２次元座標位置（ｘ′，ｙ′）を求め、図２の式（１−
１）〜（１−５）により決定される。この後、十字光の
中心位置を３次元座標系のｘ−ｙ平面と平行を保ち移動
させる（図２θｂ方向の回転）。但し移動後の中心点も
必ず同一平面上にあるようにする。移動後、同様に三角
測量の原理を用いて、十字光の中心点１２−２及び縦ス
リット光と物体中心照射面１−１の輪郭線との交点１３
−１，１３−２の３次元座標位置を求める。更に物体中
心照射面１−１の上あるいは下に隣接する面（図３では
隣接面１−３）の他端輪郭線と縦スリット光との交点
（図３での１３−５）が撮像面上で識別できたら、同様
にこの点の３次元座標位置も求めておく。上記のように
物体中心照射面上の点（１２−１，１２−２，１３−
１，１３−２）の３次元座標位置が求められたので式
（２−１）を用いて、この平面の平面方程式を求める。 Ａｘ＋Ｂｙ＋Ｃｚ＋Ｄ＝０ ・・・式（２−１） これと同時に、横スリット光と物体中心照射面あるいは
隣接面（図２の１−２）の輪郭線との交点（図３の１３
−３，１３−４あるいは１３−６）の撮像面上の２次元
座標位置も後の処理のために格納しておく。次に十字ス
リット光の中心点を中心に一定角度θずつ回転させ、十
字スリット光と物体中心照射面及び全隣接面の輪郭線と
の交点の２次元座標位置（撮像面上）を格納し、回転角
の総和が９０°になるまでこの操作を繰り返す。Next, the procedure of the three-dimensional image measuring process will be described with reference to FIG. First, one surface of the measurement object 1 (object center irradiation surface 1-1 in FIG. 3) is irradiated with a cross slit light, and the three-dimensional coordinate position of the center point 12-1 of the cross light is irradiated using the principle of triangulation in FIG. Ask for. As for the three-dimensional position, the two-dimensional coordinate position (x ', y') on the image pickup surface of the center point of the cross beam is obtained, and the expression (1-
1) to (1-5). After that, the center position of the cross light is moved in parallel with the xy plane of the three-dimensional coordinate system (rotation in the θb direction in FIG. 2). However, make sure that the center point after movement is also on the same plane. After the movement, similarly using the principle of triangulation, the center point 12-2 of the cross beam and the intersection point 13 of the vertical slit beam and the contour line of the object center irradiation surface 1-1.
The three-dimensional coordinate positions of -1, 13-2 are obtained. Furthermore, the intersection (13-5 in FIG. 3) of the other end contour line of the adjacent surface (adjacent surface 1-3 in FIG. 3) above or below the object center irradiation surface 1-1 is the imaging surface. If the above can be identified, the three-dimensional coordinate position of this point is similarly obtained. As described above, the points (12-1, 12-2, 13-
Since the three-dimensional coordinate position of 1, 13-2) is obtained, the plane equation of this plane is obtained using the equation (2-1). Ax + By + Cz + D = 0 Equation (2-1) At the same time, the intersection point (13 in FIG. 3) between the lateral slit light and the contour line of the object center irradiation surface or the adjacent surface (1-2 in FIG. 2).
The two-dimensional coordinate position on the image pickup surface (-3, 13-4 or 13-6) is also stored for later processing. Next, the cross-slit light is rotated by a constant angle θ about the center point of the cross-slit light, and the two-dimensional coordinate position (on the imaging surface) of the intersection of the cross-slit light and the contour lines of the object center irradiation surface and all adjacent surfaces is stored. This operation is repeated until the total rotation angle reaches 90 °.
【００１１】上の操作が終わると、図３の１３−１及び
１３−２を除く物体中心照射面の輪郭線と十字光の交点
（格納した全交点）の３次元座標位置を下記のように求
めていく。三角測量の原理が初期状態の縦スリット光上
の点の位置を算出するときしか使用できないのは、式
（１−１）〜（１−３）のθｂが不明であるためであ
る。しかし、すでに算出してある物体中心照射面の平面
方程式（２−１）に式（１−１）〜式（１−３）を代入
し、更に交点の２次元座標位置（ｘ′ｐ，ｙ′ｐ）を代
入すればθｂが求まる。θｂを再び式（１−１）〜式
（１−３）に代入すれば、各交点の３次元座標位置が算
出される。（θａとφａは式（１−４）と式（１−５）
から求まる。）When the above operation is completed, the three-dimensional coordinate positions of the intersections (all the stored intersections) of the contour line of the object center irradiation surface and the cross light except for 13-1 and 13-2 in FIG. 3 are as follows. To seek. The principle of triangulation can be used only when calculating the position of a point on the vertical slit light in the initial state, because θb in equations (1-1) to (1-3) is unknown. However, the equations (1-1) to (1-3) are substituted into the already calculated plane equation (2-1) of the object center irradiation surface, and the two-dimensional coordinate position (x′p, y) of the intersection is further calculated. By substituting'p), θb can be obtained. By substituting θb into equations (1-1) to (1-3) again, the three-dimensional coordinate position of each intersection is calculated. (Θa and φa are equations (1-4) and (1-5)
Can be obtained from )
【００１２】交点の３次元位置の算出により、物体中心
照射面の輪郭線の３次元空間上の直線方程式を求める。
物体中心照射面（図３中１−１）の輪郭線の直線方程式
と、隣接面上の輪郭線（物体中心照射面と共有する輪郭
線以外）とスリット光の交点（例：図３中１３−６）の
２次元座標位置を用いて以下の方法により各交点の３次
元座標位置を算出する。求めた物体中心照射面の輪郭線
の直線方程式を （ｘ−ｘ０）／Ｌ＝（ｙ−ｙ０）／Ｍ＝（ｚ−ｚ０）／Ｎ ・・・式（２−２） （ｘ０，ｙ０，ｚ０，Ｌ，Ｍ，Ｎは計算済み） とする。また輪郭線上の交点（図３中１３−６）の座標
を（ｘ１，ｙ１，ｚ１）と仮定すると、隣接面の平面方
程式は下式のようにおける。 Ａ（ｘ−ｘ１）＋Ｂ（ｙ−ｙ１）＋Ｃ（ｚ−ｚ１）＝０ ・・・式（２−３） 式（２−２）は式（２−３）上にあるため、以下の２式
が得られる。 Ａ・Ｌ＋Ｂ・Ｍ＋Ｃ・Ｎ＝０ ・・・式（２−４） （∵直線の方向べクトル⊥平面の法線べクトル） Ａ（ｘ０−ｘ１）＋Ｂ（ｙ０−ｙ１）＋Ｃ（ｚ０−ｚ１）＝０ ・・・式（２−５） （∵直線上の点（ｘ０，ｙ０，ｚ０）は平面上にある） 式（２−３），式（２−４），式（２−５）の３式から
Ａ，Ｂ，Ｃを消去すると式（２−８）が得られる。 Ｆａ・ｘ＋Ｆｂ・ｙ＋Ｆｃ・ｚ＋Ｆｄ＝０ ・・・式（２−８） （Ｆａ，Ｆｂ，Ｆｃ，Ｆｄはｘ１，ｙ１，ｚ１の関数） ｘ１，ｙ１，ｚ１はまた式（１−１）〜（１−３）で表
わされるため、これらを式（２−８）に代入し、更に式
（２−２）の直線上の（ｘ０，ｙ０，ｚ０）以外の点を
代入すると式（２−８）はθｂのみの式で表わされるか
ら、θｂを解けばこの交点の３次元座標位置（ｘ１，ｙ
１，ｚ１）が求まる。同様にして隣接面上の全交点の３
次元座標が求まる。他の隣接面についても上記と同様の
方法で輪郭線とスリット光の交点の３次元座標位置が求
まり、計測物体の形状及び位置を識別することができ
る。By calculating the three-dimensional position of the intersection, a linear equation in the three-dimensional space of the contour line of the object center irradiation surface is obtained.
A straight line equation of the contour line of the object-center-irradiated surface (1-1 in FIG. 3) and an intersection of the contour line on the adjacent surface (other than the contour line shared with the object-center-irradiated surface) and the slit light (example: 13 in FIG. 3) The three-dimensional coordinate position of each intersection is calculated by the following method using the two-dimensional coordinate position of -6). The linear equation of the contour line of the object center irradiation surface obtained is (x−x0) / L = (y−y0) / M = (z−z0) / N (2-2) (x0, y0, z0, L, M and N have been calculated). Further, assuming that the coordinates of the intersection (13-6 in FIG. 3) on the contour line are (x1, y1, z1), the plane equation of the adjacent surface is as in the following equation. A (x−x1) + B (y−y1) + C (z−z1) = 0 Formula (2-3) Since Formula (2-2) is on Formula (2-3), the following 2 The formula is obtained. A ・ L + B ・ M + C ・ N = 0 equation (2-4) (∵ straight line direction vector ⊥ plane normal vector) A (x0-x1) + B (y0-y1) + C (z0-z1 ) = 0 Equation (2-5) (Point (x0, y0, z0) on the ∵ straight line is on the plane) Equation (2-3), Equation (2-4), Equation (2-5) (2-8) is obtained by eliminating A, B, and C from the three expressions in (1). Fa · x + Fb · y + Fc · z + Fd = 0 Equation (2-8) (Fa, Fb, Fc, Fd are functions of x1, y1, z1) x1, y1, z1 are also equations (1-1) to ( 1-3), these are substituted into equation (2-8), and if points other than (x0, y0, z0) on the straight line of equation (2-2) are substituted, equation (2-8) ) Is expressed only by θb, so if θb is solved, the three-dimensional coordinate position (x1, y) of this intersection is obtained.
1, z1) is obtained. Similarly, 3 of all intersections on the adjacent surface
Dimensional coordinates are obtained. With respect to the other adjacent surfaces, the three-dimensional coordinate position of the intersection of the contour line and the slit light can be obtained by the same method as above, and the shape and position of the measurement object can be identified.
【００１３】[0013]
【発明の効果】要するに本発明によれば、レーザーによ
るスリット光を複数交差させ、これを３次元の計測物体
に照射するとともに次の照射では交差点付近を中心に複
数スリット光を回転させ、計測物体の前回とは違う位置
に照射していき、計測物体上に照射された複数スリット
光によりできる切断線をカメラで各回転毎に撮像して切
断線データにより計測物体の位置，形状を識別すること
と、３次元の計測物体に交差する複数のスリット光を照
射するレーザーと、上記スリット光を発するレーザーヘ
ッドを交差点付近を中心の回転及び上下左右の平行移動
が可能に装架したレーザーヘッド架台と、上記スリット
光が照射されている計測物体を撮像するカメラと、上記
カメラで撮像された画像信号を処理する画像処理部及び
上記レーザーヘッドの作動を制御するレーザーヘッド制
御部を内蔵したコンピューターとを具えたこととによ
り、従来の１本のスリット光を使用したスリット光投影
法に比べてスリット光を照射した計測物体の撮像回数が
減り、識別処理時間の短縮が図れるとともに、回転中心
となる交差点が計測物体の輪郭線上にのらない限り、ス
リット光の方向による形状識別の精度低下が改善される
３次元画像計測方法及び装置を得るから、本発明は産業
上極めて有益なものである。In summary, according to the present invention, a plurality of slit light beams by a laser are crossed, and the three-dimensional measurement object is irradiated with this, and in the next irradiation, a plurality of slit light beams are rotated around the intersection to measure the measurement object. Irradiate a position different from the previous one, and take a picture of the cutting line formed by the multiple slit light irradiated on the measurement object for each rotation with the camera, and identify the position and shape of the measurement object from the cutting line data. A laser for irradiating a three-dimensional measurement object with a plurality of slit light beams, and a laser head mount on which a laser head for emitting the slit light beams is mounted so as to be capable of rotating around an intersection and moving vertically and horizontally. A camera for capturing an image of the measurement object illuminated by the slit light, an image processing unit for processing an image signal captured by the camera, and the laser head. Since it has a computer with a built-in laser head control unit to control the operation of the, the number of imaging of the measurement object irradiated with slit light is reduced compared with the conventional slit light projection method using one slit light. A three-dimensional image measuring method and apparatus that can shorten the identification processing time and can improve the accuracy of shape identification depending on the direction of the slit light is improved unless the intersection serving as the center of rotation lies on the contour line of the measurement object. Therefore, the present invention is extremely useful in industry.
【図１】本発明３次元画像計測方法の一実施例における
実施装置の模式図である。FIG. 1 is a schematic diagram of an implementation device in an embodiment of a three-dimensional image measuring method of the present invention.
【図２】本装置の動作の際に使用する三角測量の原理図
である。FIG. 2 is a principle diagram of triangulation used when the apparatus operates.
【図３】本装置の動作を説明する概念図である。FIG. 3 is a conceptual diagram illustrating the operation of the present apparatus.
【図４】画像処理部のフローチャートである。FIG. 4 is a flowchart of an image processing unit.
【図５】従来のスリット光投影法の模式図である。FIG. 5 is a schematic diagram of a conventional slit light projection method.
【図６】従来の他のスリット光投影法の模式図である。FIG. 6 is a schematic view of another conventional slit light projection method.
１ 計測物体 ２ 十字スリット光 ３ レーザー ４ レーザーヘッド ５ レーザーヘッド架台 ６ ＣＣＤカメラ ７ コンピューター ８ 画像処理部 ９ レーザーヘッド制御部 10 画像信号 11 回転制御信号 1 Measurement object 2 Cross slit light 3 Laser 4 Laser head 5 Laser head mount 6 CCD camera 7 Computer 8 Image processing unit 9 Laser head control unit 10 Image signal 11 Rotation control signal
フロントページの続き (51)Int.Cl.6 識別記号 庁内整理番号 ＦＩ 技術表示箇所 Ｇ０６Ｔ 1/00 (72)発明者 大林 和明 名古屋市港区大江町６番地19号 ＭＨＩエ アロスペースシステムズ株式会社内Continuation of front page (51) Int.Cl. 6 Identification number Reference number within the agency FI Technical indication location G06T 1/00 (72) Inventor Kazuaki Obayashi 6-19 Oemachi, Minato-ku, Nagoya MHI Aerospace Systems Stocks In the company
Claims (2)
せ、これを３次元の計測物体に照射するとともに次の照
射では交差点付近を中心に複数スリット光を回転させ、
計測物体の前回とは違う位置に照射していき、計測物体
上に照射された複数スリット光によりできる切断線をカ
メラで各回転毎に撮像して切断線データにより計測物体
の位置，形状を識別することを特徴とする３次元画像計
測方法。1. A plurality of slit lights by a laser are crossed, and the three-dimensional measurement object is irradiated with the slit lights, and in the next irradiation, the slit lights are rotated around the intersection,
Irradiate the measurement object at a position different from the previous time, image the cutting line formed by the multiple slit light irradiated on the measurement object with each camera with each rotation, and identify the position and shape of the measurement object from the cutting line data. A three-dimensional image measuring method characterized by:
ット光を照射するレーザーと、上記スリット光を発する
レーザーヘッドを交差点付近を中心の回転及び上下左右
の平行移動が可能に装架したレーザーヘッド架台と、上
記スリット光が照射されている計測物体を撮像するカメ
ラと、上記カメラで撮像された画像信号を処理する画像
処理部及び上記レーザーヘッドの作動を制御するレーザ
ーヘッド制御部を内蔵したコンピューターとを具えたこ
とを特徴とする３次元画像計測装置。2. A laser for irradiating a three-dimensional measurement object with a plurality of slit light beams intersecting with each other, and a laser head for emitting the slit light beams mounted such that the laser head can rotate about an intersection and move in parallel vertically and horizontally. A head frame, a camera for capturing an image of a measurement object illuminated by the slit light, an image processing unit for processing an image signal captured by the camera, and a laser head control unit for controlling the operation of the laser head are incorporated. A three-dimensional image measuring device characterized by having a computer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6248680A JPH0886616A (en) | 1994-09-16 | 1994-09-16 | Method and apparatus for measuring three-dimensional image |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6248680A JPH0886616A (en) | 1994-09-16 | 1994-09-16 | Method and apparatus for measuring three-dimensional image |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0886616A true JPH0886616A (en) | 1996-04-02 |
Family
ID=17181740
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6248680A Withdrawn JPH0886616A (en) | 1994-09-16 | 1994-09-16 | Method and apparatus for measuring three-dimensional image |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0886616A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6243124B1 (en) | 1997-06-25 | 2001-06-05 | Ricoh Company, Ltd. | Method of evaluating characteristics of a light beam, apparatus for evaluating the characteristics, and apparatus for adjusting a write unit by employing the evaluation method |
| JP2004077410A (en) * | 2002-08-22 | 2004-03-11 | Ishikawajima Harima Heavy Ind Co Ltd | Target projection type three-dimensional geometry measuring method and target projection type three-dimensional geometry measuring apparatus |
| WO2006013635A1 (en) * | 2004-08-03 | 2006-02-09 | Techno Dream 21 Co., Ltd. | Three-dimensional shape measuring method and apparatus for the same |
| CN100388127C (en) * | 1998-06-23 | 2008-05-14 | 株式会社理光 | Apparatus for adjusting a write unit by employing the method of evaluating characteristics of a light beam |
| JP2012527611A (en) * | 2009-05-21 | 2012-11-08 | サムスン ヘヴィ インダストリーズ カンパニー リミテッド | Flatbed scan module, flatbed scan system, jig for measuring alignment error of flatbed scan module, and method of measuring alignment error of flatbed scan module using the same |
-
1994
- 1994-09-16 JP JP6248680A patent/JPH0886616A/en not_active Withdrawn
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6243124B1 (en) | 1997-06-25 | 2001-06-05 | Ricoh Company, Ltd. | Method of evaluating characteristics of a light beam, apparatus for evaluating the characteristics, and apparatus for adjusting a write unit by employing the evaluation method |
| US6268876B1 (en) | 1997-06-25 | 2001-07-31 | Ricoh Company, Ltd. | Method of evaluating characteristics of a light beam apparatus for evaluating the characteristics and apparatus for adjusting a write unit by employing the evaluation method |
| US6275249B1 (en) | 1997-06-25 | 2001-08-14 | Ricoh Company, Ltd. | Method of evaluating characteristics of a light beam, apparatus for evaluating the characteristics, and apparatus for adjusting a write unit by employing the evaluation method |
| US6353455B1 (en) | 1997-06-25 | 2002-03-05 | Ricoh Company, Ltd. | Method of evaluating characteristics of a light beam, apparatus for evaluating the characteristics, and apparatus for adjusting a write unit by employing the evaluating method |
| CN100388127C (en) * | 1998-06-23 | 2008-05-14 | 株式会社理光 | Apparatus for adjusting a write unit by employing the method of evaluating characteristics of a light beam |
| JP2004077410A (en) * | 2002-08-22 | 2004-03-11 | Ishikawajima Harima Heavy Ind Co Ltd | Target projection type three-dimensional geometry measuring method and target projection type three-dimensional geometry measuring apparatus |
| WO2006013635A1 (en) * | 2004-08-03 | 2006-02-09 | Techno Dream 21 Co., Ltd. | Three-dimensional shape measuring method and apparatus for the same |
| EP1777485A1 (en) * | 2004-08-03 | 2007-04-25 | Techno Dream 21 Co., Ltd. | Three-dimensional shape measuring method and apparatus for the same |
| US7876455B2 (en) | 2004-08-03 | 2011-01-25 | TechnoDream21 Co., Ltd. | Three-dimensional shape measuring method and apparatus for the same |
| EP1777485A4 (en) * | 2004-08-03 | 2012-09-19 | Techno Dream 21 Co Ltd | Three-dimensional shape measuring method and apparatus for the same |
| JP2012527611A (en) * | 2009-05-21 | 2012-11-08 | サムスン ヘヴィ インダストリーズ カンパニー リミテッド | Flatbed scan module, flatbed scan system, jig for measuring alignment error of flatbed scan module, and method of measuring alignment error of flatbed scan module using the same |
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