JPH0845775A - Metallized film capacitor - Google Patents
Metallized film capacitorInfo
- Publication number
- JPH0845775A JPH0845775A JP6174979A JP17497994A JPH0845775A JP H0845775 A JPH0845775 A JP H0845775A JP 6174979 A JP6174979 A JP 6174979A JP 17497994 A JP17497994 A JP 17497994A JP H0845775 A JPH0845775 A JP H0845775A
- Authority
- JP
- Japan
- Prior art keywords
- film
- electrode
- metallized
- evaporated
- metallized film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000003990 capacitor Substances 0.000 title claims abstract description 48
- 239000011104 metalized film Substances 0.000 title claims abstract description 48
- 239000010408 film Substances 0.000 claims abstract description 84
- 238000009413 insulation Methods 0.000 claims abstract description 16
- 238000007740 vapor deposition Methods 0.000 claims description 35
- 229910052782 aluminium Inorganic materials 0.000 claims description 12
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 12
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 claims description 11
- 229910052725 zinc Inorganic materials 0.000 claims description 11
- 239000011701 zinc Substances 0.000 claims description 11
- 239000000203 mixture Substances 0.000 claims description 5
- 239000000463 material Substances 0.000 claims description 3
- 238000006243 chemical reaction Methods 0.000 claims 1
- 239000000126 substance Substances 0.000 claims 1
- 230000005684 electric field Effects 0.000 abstract description 5
- 230000007797 corrosion Effects 0.000 abstract description 4
- 238000005260 corrosion Methods 0.000 abstract description 4
- 230000006866 deterioration Effects 0.000 abstract description 4
- 230000008602 contraction Effects 0.000 abstract description 3
- 230000007423 decrease Effects 0.000 abstract description 2
- 230000008020 evaporation Effects 0.000 abstract 2
- 238000001704 evaporation Methods 0.000 abstract 2
- 239000003989 dielectric material Substances 0.000 abstract 1
- 230000000452 restraining effect Effects 0.000 abstract 1
- 230000000694 effects Effects 0.000 description 4
- 238000011156 evaluation Methods 0.000 description 4
- -1 polypropylene Polymers 0.000 description 3
- 239000004743 Polypropylene Substances 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 2
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229920001155 polypropylene Polymers 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 1
- 230000001595 contractor effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000005764 inhibitory process Effects 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 229920000139 polyethylene terephthalate Polymers 0.000 description 1
- 239000005020 polyethylene terephthalate Substances 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/005—Electrodes
- H01G4/015—Special provisions for self-healing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/018—Dielectrics
- H01G4/06—Solid dielectrics
- H01G4/14—Organic dielectrics
- H01G4/145—Organic dielectrics vapour deposited
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/018—Dielectrics
- H01G4/06—Solid dielectrics
- H01G4/14—Organic dielectrics
- H01G4/18—Organic dielectrics of synthetic material, e.g. derivatives of cellulose
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/32—Wound capacitors
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、金属化フィルムコンデ
ンサ(以下単にMFコンデンサという)の電気特性の改
良に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to improvement of electric characteristics of a metallized film capacitor (hereinafter simply referred to as MF capacitor).
【0002】[0002]
【従来の技術】MFコンデンサの蒸着膜電極は、通常ア
ルミニウムや亜鉛、あるいはその混合物などがこれまで
から用いられており、蒸着する金属の種類によって電気
的特性が異なるなどの特徴がある。これ等の金属で形成
される蒸着膜電極は通常蒸着膜厚さは均一であるが、最
近ではMFコンデンサの設計電界強度を上げて小形化を
図るために、蒸着膜電極の厚さを極力薄くしてコンデン
サの高耐電圧化する技術傾向にある。2. Description of the Related Art Generally, aluminum, zinc, or a mixture thereof has been used for vapor deposited film electrodes of MF capacitors up to now, and it is characterized in that the electrical characteristics differ depending on the type of vapor deposited metal. The vapor-deposited film electrodes formed of these metals usually have a uniform vapor-deposited film thickness, but recently, in order to increase the design electric field strength of the MF capacitor to achieve miniaturization, the vapor-deposited film electrode is made as thin as possible. There is a tendency for technology to increase the withstand voltage of capacitors.
【0003】MFコンデンサに用いられる金属化フィル
ムの蒸着膜電極の厚さは極めて薄く数百オングストロー
ム以下で、通常この蒸着膜電極の厚さは面積電気抵抗に
代替される単位Ω/□が用いられており、亜鉛では3〜
20Ω/□、アルミニウムでは2〜10Ω/□の範囲が
最も汎用的であり、また亜鉛とアルミニウムの混合物
(アロイ)ではどちらかと言えば亜鉛に近い電気抵抗の
ものが多く用いられている。The thickness of the vapor-deposited film electrode of the metallized film used for the MF capacitor is extremely thin and is several hundred angstroms or less, and the thickness of the vapor-deposited film electrode is usually in the unit of Ω / □, which is substituted for the area electric resistance. And zinc is 3 ~
The range of 20 Ω / □ and the range of 2 to 10 Ω / □ for aluminum is the most general-purpose, and for the mixture (alloy) of zinc and aluminum, the one having an electric resistance rather close to that of zinc is often used.
【0004】また、MFコンデンサの蒸着膜電極の厚さ
を薄くして高電気抵抗化していくと、蒸着膜電極とメタ
リコン電極との接合部で電気的接触性が低下し、容量の
安定性が阻害されるなどの影響が出、特にアルミニウム
ではこれが顕著である。上記影響を防ぐために蒸着膜電
極のメタリコン接合部分の接触部を一定幅、他の部分の
蒸着膜電極より膜厚を厚くして電気抵抗を下げたヘビー
エッジ形の金属化フィルムも実用化されてきた。Further, when the thickness of the vapor deposition film electrode of the MF capacitor is reduced to increase the electric resistance, the electrical contact property is lowered at the joint between the vapor deposition film electrode and the metallikon electrode, and the stability of the capacitance is improved. There are effects such as inhibition, especially in aluminum. In order to prevent the above-mentioned influence, a heavy-edge metallized film in which the contact part of the metallikon joint part of the vapor deposition film electrode has a constant width and the electric resistance is reduced by making the film thickness thicker than the vapor deposition film electrode of other parts has also been put to practical use. It was
【0005】[0005]
【発明が解決しようとする課題】通常MFコンデンサの
誘電体内部における電界強度は、金属化フィルムの絶縁
マージン側の電極沿端とその対極電極部間で最も高くな
る。これは誘電体(絶縁体)を挟んだ電極の端部で生じ
るエッジ効果によるもので、MFコンデンサでは上記絶
縁マージン側の沿端部が高電界によってコロナ放電(部
分放電とも言う)し、該沿端部と対極側蒸着膜電極の沿
端部が電蝕消化し、また該部分近傍の誘電体フィルムが
劣化する。そして上記障害の影響は、誘電体フィルムが
薄ければ薄い程、また蒸着膜電極の厚さが薄ければ薄い
程増大されてMFコンデンサを短命化させる。Normally, the electric field strength inside the dielectric of the MF capacitor is the highest between the electrode edge on the insulating margin side of the metallized film and its counter electrode portion. This is due to the edge effect that occurs at the ends of the electrodes sandwiching the dielectric (insulator). In the MF capacitor, the high-electric field causes the corona discharge at the insulation margin side corona discharge (also called partial discharge), and The edge portion and the edge portion of the counter electrode side vapor deposition film electrode are digested by electrolytic corrosion, and the dielectric film near the portion is deteriorated. The influence of the above obstacles is increased as the dielectric film is thinner and the thickness of the vapor deposition film electrode is thinner, which shortens the life of the MF capacitor.
【0006】上記のことをもう少し詳しく説明すると、
MFコンデンサを長時間通電使用すると、金属化フィル
ムの蒸着膜電極の沿端部でコロナ放電が起こり、蒸着膜
電極が電蝕消化して次第に容量減少し、また誘電体フィ
ルムも絶縁劣化していく。さらにMFコンデンサでは、
通電のオン、オフ、サイクル毎に巻回された金属化フィ
ルムの相互間の電界収縮作用によって、金属化フィルム
の蒸着膜電極が伸縮疲労し、メタリコン電極との接合部
と、上記蒸着膜電極の沿端対極部で蒸着膜電極がクラッ
クなどで損傷し、MFコンデンサの容量減少を進展させ
るとともに、場合によっては絶縁破壊を招くなどの問題
点を生じていた。To explain the above in a little more detail,
When the MF capacitor is used for a long time, corona discharge occurs at the edge of the vapor deposition film electrode of the metallized film, the vapor deposition film electrode is digested by electrolytic corrosion, and the capacity gradually decreases, and the dielectric film also deteriorates in insulation. . Furthermore, with the MF capacitor,
On / off of energization, electric field contraction between the metallized films wound in each cycle causes expansion / contraction fatigue of the vaporized film electrode of the metallized film, a joint with the metallikon electrode, and the vaporized film electrode of the above. The vapor-deposited film electrode is damaged by cracks and the like at the side-to-side counter electrode, which promotes reduction of the capacitance of the MF capacitor and, in some cases, causes dielectric breakdown.
【0007】[0007]
【課題を解決するための手段】本発明においては、金属
化フィルムは蒸着膜電極の幅方向の両端部の厚さが他の
蒸着部の厚さより厚くなっている点である。すなわち、In the present invention, the metallized film has a thickness at both end portions in the width direction of the vapor deposition film electrode that is thicker than the thickness of other vapor deposition portions. That is,
【0008】(1)フィルムの長手方向の片端に連続し
た帯状の絶縁マージン3を形成した蒸着膜電極2を有す
る金属化フィルム1を、絶縁マージンが互いに反対側に
なるように重ね合せて巻回し、該巻回体の両端面にメタ
リコン電極5を形成し、ケース8に収容して絶縁油を含
浸充填したMFコンデンサにおいて、(1) A metallized film 1 having a vapor-deposited film electrode 2 in which a continuous strip-shaped insulating margin 3 is formed on one end in the longitudinal direction of the film is superposed and wound so that the insulating margins are opposite to each other. In the MF capacitor in which the metallikon electrodes 5 are formed on both end faces of the wound body and are housed in the case 8 and impregnated with insulating oil,
【0009】上記金属化フィルム1は、蒸着膜電極2の
幅方向の両端部2a、2bの蒸着膜厚さを他の蒸着膜部
より厚くするとともに、In the metallized film 1, both end portions 2a, 2b of the vapor-deposited film electrode 2 in the width direction are made thicker than the other vapor-deposited film portions, and
【0010】上記絶縁マージン側の蒸着膜電極部2b
が、対極側蒸着膜電極の端部2aの電極厚膜部と重なり
合うようにしたことを特徴とするMFコンデンサであ
る。Vapor-deposited film electrode portion 2b on the insulating margin side
However, the MF capacitor is characterized in that it overlaps with the electrode thick film portion of the end portion 2a of the counter electrode side vapor deposition film electrode.
【0011】(2)さらに、金属化フィルム1の蒸着膜
電極2の材質がアルミニウム、亜鉛、アルミニウムと亜
鉛の組合せまたは混合物である上記(1)の金属化フィ
ルムコンデンサであること。(2) The metallized film capacitor of the above (1), wherein the material of the vapor deposition film electrode 2 of the metallized film 1 is aluminum, zinc, or a combination or mixture of aluminum and zinc.
【0012】(3)および、対向する金属化フィルム1
の相互間に非蒸着フィルム4を介在した上記(1)およ
び(2)の金属化フィルムコンデンサである。(3) and opposing metallized film 1
The metallized film capacitors of (1) and (2) above, in which the non-evaporated film 4 is interposed between the two.
【0013】[0013]
【作用】金属化フィルムの蒸着膜電極2の幅方向の両端
部2a、2bの厚さを他の蒸着膜部より厚くして、これ
を1対として絶縁マージン3が互いに反対側になるよう
に重ね合せて巻回し、絶縁マージン3側の蒸着膜電極端
2bが対極側蒸着電極の端部2aの厚膜部に重なるよう
にしておけば、MFコンデンサの絶縁マージン3側蒸着
膜電極端2bと、これに対極する金属化フィルムの蒸着
膜電極のコロナ放電による電蝕作用と、上記近傍の誘電
体フィルムの熱劣化を抑制することができる。The thickness of both end portions 2a, 2b of the metallized film in the width direction of the vapor deposition film electrode 2 is made thicker than the other vapor deposition film portions so that the insulating margins 3 are opposite to each other by forming a pair of the thicknesses. By overlapping and winding so that the vapor deposition film electrode end 2b on the insulation margin 3 side overlaps with the thick film portion of the end 2a of the counter electrode side vapor deposition electrode, the vapor deposition film electrode end 2b on the insulation margin 3 side of the MF capacitor is formed. It is possible to suppress the electrolytic corrosion action of the vapor-deposited film electrode of the metallized film, which is the opposite of this, due to corona discharge, and the thermal deterioration of the dielectric film in the vicinity thereof.
【0014】[0014]
【実施例1】本発明のMFコンデンサの実施例1につい
て説明する。First Embodiment A first embodiment of the MF capacitor of the present invention will be described.
【0015】実施例1のMFコンデンサは図3の構造
で、図1に示す金属化フィルム1の構造と構成でこれを
巻回し、この巻回体の両端面にメタリコン電極5を施し
てコンデンサ素子6を形成し、これを外部端子に接続す
るリード線7を結線してケース8に収容して真空乾燥
し、絶縁油を含浸充填して、密封して試料コンデンサと
した。The MF capacitor of Example 1 has the structure shown in FIG. 3, and is wound with the structure and structure of the metallized film 1 shown in FIG. 1. Metallicon electrodes 5 are provided on both end faces of this wound body to form a capacitor element. 6 was formed, and a lead wire 7 connecting this to an external terminal was connected, housed in a case 8, vacuum dried, impregnated and filled with insulating oil, and sealed to obtain a sample capacitor.
【0016】試料コンデンサは、表1は亜鉛および亜鉛
とアルミニウムの混合(アロイ)蒸着したもの、また表
2はアルミニウム蒸着および亜鉛蒸着とアルミニウム蒸
着の組合せによる金属化フィルムで、各金属化フィルム
のフィルム材質は厚さ15μmのポリプロピレンであ
る。各試料の製作台数はそれぞれ20台、試料コンデン
サの定格は、単相、60Hz、760VAC、30.5
μFである。Sample capacitors are shown in Table 1 with zinc and a mixture of zinc and aluminum (alloy) vapor deposited, and in Table 2 with a metallized film by aluminum vapor deposition and a combination of zinc vapor deposition and aluminum vapor deposition. The material is polypropylene having a thickness of 15 μm. The number of each sample manufactured is 20, and the rating of the sample capacitor is single phase, 60Hz, 760VAC, 30.5
μF.
【0017】[0017]
【表1】 [Table 1]
【0018】[0018]
【表2】 [Table 2]
【0019】試料コンデンサの試験は、周囲温度20℃
で、試験電圧950VAC(定格電圧×1.25倍)、
3000時間を通電し連続耐用性試験を行った。各試料
コンデンサの評価は、試験前(0h)、1000、20
00、3000時間の各容量を測定し、試験前に対する
3000時間試験終了後の容量変化率(%)を比較し
た。The sample capacitor is tested at an ambient temperature of 20 ° C.
Then, test voltage 950VAC (rated voltage x 1.25 times),
A continuous durability test was conducted by energizing for 3000 hours. Evaluation of each sample capacitor was performed before the test (0h), 1000, 20
The respective capacities for 00 and 3000 hours were measured, and the capacity change rate (%) after the 3000-hour test was compared with that before the test was compared.
【0020】上記試験結果とその評価は表3に示す通り
である。The test results and their evaluations are shown in Table 3.
【0021】[0021]
【表3】 [Table 3]
【0022】[0022]
【実施例2】実施例2は、図2に示す対向する金属化フ
ィルム1の相互間に非蒸着フィルム4を介在させて実施
例1と同様にして試料コンデンサを製作した。Example 2 In Example 2, a sample capacitor was manufactured in the same manner as in Example 1 with the non-evaporated film 4 interposed between the opposed metallized films 1 shown in FIG.
【0023】試料コンデンサの誘電体フィルムは、金属
化フィルム1は12μm厚さのポリエチレンテレフタレ
ートフィルムにアルミニウムを蒸着したもの、非蒸着フ
ィルムは12μm厚さのポリプロピレンフィルムを各1
枚金属化フィルム1の相互間に介在させたものである。As the dielectric film of the sample capacitor, the metallized film 1 is a 12 μm thick polyethylene terephthalate film vapor-deposited with aluminum, and the non-evaporated film is a 12 μm thick polypropylene film 1 each.
It is interposed between the sheet metallized films 1.
【0024】試料コンデンサの定格は、単相、60H
z、1320VAC、15μFで、各試料につき20台
を製作し、周囲温度20℃、試験電圧1650VAC、
(定格電圧×1.25)通電時間3000時間の連続耐
用性試験を実施し、実施例1と同様の方法で評価比較し
た。試料コンデンサは表4に示すものである。The rating of the sample capacitor is single phase, 60H
z, 1320 VAC, 15 μF, 20 units were manufactured for each sample, ambient temperature was 20 ° C., test voltage was 1650 VAC,
(Rated voltage × 1.25) A continuous durability test was conducted for a current-flowing time of 3000 hours, and evaluation and comparison were performed in the same manner as in Example 1. The sample capacitors are shown in Table 4.
【0025】[0025]
【表4】 [Table 4]
【0026】上記試験結果とその評価は表5に示す通り
である。The test results and the evaluation are shown in Table 5.
【0027】[0027]
【表5】 [Table 5]
【0028】上記実施例1および実施例2の試験結果に
おいて、本発明のMFコンデンサである試料1、2、
4、5、7、8はそれぞれ容量変化率が-1.2〜-2.5%
で、従来のMFコンデンサの試料3、6、9の容量変化
率-7.6〜-12.4 %と比較すると本発明のMFコンデンサ
の容量変化率は従来のMFコンデンサの1/5〜1/6
であり極めて効果的な結果を得ることができた。In the test results of Examples 1 and 2 above, Samples 1 and 2 which are MF capacitors of the present invention,
Capacity change rate of each of 4, 5, 7, and 8 is -1.2 to -2.5%
Compared with the capacitance change rates of the conventional MF capacitors of Samples 3, 6, and -7.6 to -12.4%, the capacitance change rate of the MF capacitor of the present invention is 1/5 to 1/6 that of the conventional MF capacitor.
Therefore, extremely effective results could be obtained.
【0029】また、金属化フィルムの蒸着膜電極の幅方
向の両端部の蒸着膜厚さを他の蒸着膜部よりも厚くし、
絶縁マージン側の蒸着膜電極端部が、対極側蒸着膜電極
の端部の電極厚膜部と重なり合うようにした。この結
果、金属化フィルムの相互間の電界伸縮作用によって、
メタリコンと蒸着膜電極の接触部付近を軸に梃の原理に
より絶縁マージン側の蒸着膜電極端部と対向する位置の
蒸着膜電極が伸縮疲労して、金属化フィルムの長手方向
に沿ってクラックが発生し、これによるコロナ放電、お
よび容量減少と、誘電体が劣化に至る現象を抑制するこ
とができる。Further, the vapor deposition film thickness of the metallized film at both ends in the width direction of the vapor deposition film electrode is made thicker than other vapor deposition film parts,
The end of the vapor deposition film electrode on the insulation margin side overlaps with the electrode thick film portion at the end of the counter electrode side vapor deposition film electrode. As a result, due to the electric field expansion and contraction effect between the metallized films,
Due to the principle of leverage around the contact area between the metallikon and the vapor-deposited film electrode, the vapor-deposited film electrode at the position facing the end of the vapor-deposited film electrode on the insulation margin side expands and contracts, causing cracks along the longitudinal direction of the metallized film. It is possible to suppress the occurrence of corona discharge, the reduction in capacity, and the deterioration of the dielectric.
【0030】[0030]
【発明の効果】金属化フィルムの蒸着膜電極の幅方向の
両端部の厚さを他の蒸着部より厚くし、これを1対とし
て絶縁マージンが互いに反対側になるように重ね合せて
巻回し、絶縁マージン側の蒸着膜電極端が対極側蒸着電
極の端部の厚膜部に重なるように構成すれば、MFコン
デンサの絶縁マージン側電極端部、および対極側蒸着膜
電極の端部付近で生じるコロナ放電による金属化フィル
ムの劣化を抑制することができ、容量変化が小さく、長
寿命かつ高信頼性のMFコンデンサを提供でき、特に交
流回路で使用する電力用コンデンサの分野で優れた効果
を発揮することができる。EFFECTS OF THE INVENTION The thickness of both ends of the metallized film of the vapor deposition film electrode in the width direction is made thicker than that of the other vapor deposition parts, and these are paired and wound so that the insulation margins are opposite to each other. If the vapor deposition film electrode end on the insulation margin side overlaps the thick film portion on the end of the counter electrode side vapor deposition electrode, the insulation margin side electrode end of the MF capacitor and the end of the counter electrode side vapor deposition film electrode are near Deterioration of the metallized film due to corona discharge can be suppressed, small change in capacitance, long life and highly reliable MF capacitor can be provided, and particularly excellent effect in the field of power capacitor used in AC circuit Can be demonstrated.
【図1】本発明の実施例1における金属化フィルムコン
デンサの金属化フィルム構成の断面図である。FIG. 1 is a cross-sectional view of a metallized film structure of a metallized film capacitor according to a first embodiment of the present invention.
【図2】本発明の実施例2における金属化フィルムの相
互間に非蒸着フィルムを介在させた金属化フィルムコン
デンサの断面構成図である。FIG. 2 is a cross-sectional configuration diagram of a metallized film capacitor in which a non-evaporated film is interposed between metallized films in Example 2 of the present invention.
【図3】本発明の実施例における完成した金属化フィル
ムコンデンサの縦断面図である。FIG. 3 is a vertical sectional view of a completed metallized film capacitor according to an embodiment of the present invention.
1 金属化フィルム 2 金属化フィルムに形成した蒸着膜電極 2a 蒸着膜電極の片端に設けた電極厚膜部 2b 蒸着膜電極の絶縁マージン側端に設けた電極厚膜
部 3 金属化フィルムに設けた絶縁マージン 4 非蒸着フィルム 5 メタリコン電極 6 コンデンサ素子 7 リード線 8 ケース1 Metallized Film 2 Vapor Deposition Film Electrode Formed on Metallized Film 2a Electrode Thick Film Part Provided at One End of Vapor Deposition Film Electrode 2b Electrode Thick Film Part Provided at End of Insulation Margin of Vapor Deposition Film Electrode 3 Provided on Metallized Film Insulation margin 4 Non-evaporated film 5 Metallicon electrode 6 Capacitor element 7 Lead wire 8 Case
Claims (3)
状の絶縁マージン(3)を形成した蒸着膜電極(2)を
有する金属化フィルム(1)を、絶縁マージン(3)が
互いに反対側になるように重ね合せて巻回し、該巻回体
の両端面にメタリコン電極(5)を形成し、ケース
(8)に収容して絶縁油を含浸充填した金属化フィルム
コンデンサであって、 上記金属化フィルム(1)は、蒸着膜電極(2)の幅方
向の両端部(2a),(2b)の蒸着膜厚さを他の蒸着
膜部より厚くするとともに、 上記絶縁マージン(3)側の蒸着膜電極端部(2b)
が、対極側蒸着膜電極の端部(2a)の電極厚膜部と重
なり合うようにした金属化フィルムコンデンサ。1. A metallized film (1) having a vapor-deposited film electrode (2) having a continuous strip-shaped insulating margin (3) formed at one end in the longitudinal direction of the film, wherein the insulating margins (3) are provided on opposite sides of each other. A metallized film capacitor in which the metallicone electrodes (5) are formed on both end faces of the wound body and housed in a case (8) and impregnated and filled with insulating oil. The chemical conversion film (1) has the vapor-deposited film thickness of both end portions (2a), (2b) in the width direction of the vapor-deposited film electrode (2) thicker than the other vapor-deposited film portions, and the insulation margin (3) side Evaporated film electrode end (2b)
However, the metallized film capacitor is configured so as to overlap the electrode thick film portion of the end portion (2a) of the counter electrode side vapor deposition film electrode.
(2)の材質がアルミニウム、亜鉛、アルミニウムと亜
鉛の組合せまたは混合物である請求項1記載の金属化フ
ィルムコンデンサ。2. The metallized film capacitor according to claim 1, wherein the material of the vapor deposition film electrode (2) of the metallized film (1) is aluminum, zinc, or a combination or mixture of aluminum and zinc.
に非蒸着フィルム(4)を介在した請求項1および請求
項2記載の金属化フィルムコンデンサ。3. The metallized film capacitor according to claim 1, wherein a non-evaporated film (4) is interposed between the opposed metallized films (1).
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17497994A JP3392525B2 (en) | 1994-07-27 | 1994-07-27 | Metallized film capacitors |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17497994A JP3392525B2 (en) | 1994-07-27 | 1994-07-27 | Metallized film capacitors |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0845775A true JPH0845775A (en) | 1996-02-16 |
JP3392525B2 JP3392525B2 (en) | 2003-03-31 |
Family
ID=15988103
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17497994A Expired - Fee Related JP3392525B2 (en) | 1994-07-27 | 1994-07-27 | Metallized film capacitors |
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0813213A1 (en) * | 1996-06-10 | 1997-12-17 | Aerovox Incorporated | Electrode patterning in metallized film capacitors |
JP2000100646A (en) * | 1998-09-25 | 2000-04-07 | Nissin Electric Co Ltd | Capacitor element |
JP2008103451A (en) * | 2006-10-18 | 2008-05-01 | Matsushita Electric Ind Co Ltd | Metallized film capacitor |
JP2012191045A (en) * | 2011-03-11 | 2012-10-04 | Nichicon Corp | High voltage power capacitor element and high voltage power capacitor using the element |
WO2017188327A1 (en) * | 2016-04-27 | 2017-11-02 | 京セラ株式会社 | Film capacitor, connected-type capacitor, inverter using same, and electric vehicle |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS508050A (en) * | 1973-04-13 | 1975-01-28 | ||
JPS5860522A (en) * | 1981-10-05 | 1983-04-11 | ニチコン株式会社 | Metallized plastic film condenser |
-
1994
- 1994-07-27 JP JP17497994A patent/JP3392525B2/en not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS508050A (en) * | 1973-04-13 | 1975-01-28 | ||
JPS5860522A (en) * | 1981-10-05 | 1983-04-11 | ニチコン株式会社 | Metallized plastic film condenser |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0813213A1 (en) * | 1996-06-10 | 1997-12-17 | Aerovox Incorporated | Electrode patterning in metallized film capacitors |
JP2000100646A (en) * | 1998-09-25 | 2000-04-07 | Nissin Electric Co Ltd | Capacitor element |
JP2008103451A (en) * | 2006-10-18 | 2008-05-01 | Matsushita Electric Ind Co Ltd | Metallized film capacitor |
JP2012191045A (en) * | 2011-03-11 | 2012-10-04 | Nichicon Corp | High voltage power capacitor element and high voltage power capacitor using the element |
WO2017188327A1 (en) * | 2016-04-27 | 2017-11-02 | 京セラ株式会社 | Film capacitor, connected-type capacitor, inverter using same, and electric vehicle |
CN109074955A (en) * | 2016-04-27 | 2018-12-21 | 京瓷株式会社 | Thin film capacitor, even junction capacitor and converter and electric vehicle using it |
US20190115152A1 (en) * | 2016-04-27 | 2019-04-18 | Kyocera Corporation | Film capacitor, combination type capacitor, and inverter and electric vehicle using the same |
US10650965B2 (en) | 2016-04-27 | 2020-05-12 | Kyocera Corporation | Film capacitor, combination type capacitor, and inverter and electric vehicle using the same |
Also Published As
Publication number | Publication date |
---|---|
JP3392525B2 (en) | 2003-03-31 |
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