JPH08288366A - Method and apparatus for recognizing chip - Google Patents

Method and apparatus for recognizing chip

Info

Publication number
JPH08288366A
JPH08288366A JP8441295A JP8441295A JPH08288366A JP H08288366 A JPH08288366 A JP H08288366A JP 8441295 A JP8441295 A JP 8441295A JP 8441295 A JP8441295 A JP 8441295A JP H08288366 A JPH08288366 A JP H08288366A
Authority
JP
Japan
Prior art keywords
chip
point
recognition
recognized
long size
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8441295A
Other languages
Japanese (ja)
Other versions
JP3169046B2 (en
Inventor
Motoharu Honda
素春 本多
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Machinery Inc
Original Assignee
Nichiden Machinery Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nichiden Machinery Ltd filed Critical Nichiden Machinery Ltd
Priority to JP8441295A priority Critical patent/JP3169046B2/en
Publication of JPH08288366A publication Critical patent/JPH08288366A/en
Application granted granted Critical
Publication of JP3169046B2 publication Critical patent/JP3169046B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Image Analysis (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
  • Die Bonding (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Control Of Position Or Direction (AREA)

Abstract

PURPOSE: To achieve high precision positioning of a long size chip without mis-recognition by imaging one end part of the long size chip and then imaging an intermediate part nearby and further imaging the other end of the chip on the basis of the inclination of the chip detected in accordance with the recognition of those two points, etc. CONSTITUTION: Both end parts of a long size chip 1, protruding from a visual field of a camera for image processing, are pattern-recognized. At that time, one end part of the long size chip 1 is imaged and recognized as a first point, then an intermediate part, located near to the first point, of the long size chip 1 is imaged and recognized as a second point. Then, the inclination of the long size chip 1 is detected in accordance with the recognition of those two points, and the other end of the long size chip 1 is imaged on the basis of the inclination of the long size chip 1 and recognized as a third point and its position is detected. Thus, by detecting the inclination of the long size chip, image pick-up and position detection of a desired long size chip can be carried out without mistaking an adjacent long size chip for it.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、チップの認識方法及び
その認識装置に関し、例えば半導体装置の製造における
ダイボンディング工程等で、半導体ウェーハを細分割し
た多数のチップをパターン認識する認識方法及び認識装
置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a chip recognizing method and a recognizing apparatus therefor, and for example, a recognizing method and a recognizing method for recognizing a large number of chips obtained by finely dividing a semiconductor wafer in a die bonding process or the like in manufacturing a semiconductor device. It relates to the device.

【0002】[0002]

【従来の技術】例えば半導体装置の製造工程におけるダ
イボンディング工程では、半導体ウェーハを細分割した
多数のチップを順次ピックアップし、所定のポジション
まで移送してリードフレーム上のダイボンディング位置
に位置決め載置する。
2. Description of the Related Art For example, in a die bonding process in a semiconductor device manufacturing process, a large number of chips obtained by finely dividing a semiconductor wafer are sequentially picked up, moved to a predetermined position, and positioned and mounted at a die bonding position on a lead frame. .

【0003】上記チップのピックアップ作業に際して
は、半導体ウェーハを各チップ単位で格子状に細分割
し、この分割されたチップをX、Y方向に位置調整して
所望のチップをピックアップポジションに位置決めした
上で、上記チップを適宜のピックアップ手段でピックア
ップする。
In picking up the above chips, the semiconductor wafer is subdivided into lattices for each chip, and the divided chips are adjusted in the X and Y directions to position the desired chip at the pickup position. Then, the chip is picked up by an appropriate pick-up means.

【0004】ところで、上記チップのピックアップ時に
は、所望のチップをピックアップポジションに位置決め
するため、そのチップを画像処理してパターン認識する
必要がある。そこで、上記チップのパターン認識方法の
従来例を図4を参照しながら説明する。図5に示すよう
に、半導体ウェーハを細分割した多数のチップ(1)
(1)…をXYテーブル(2)上に整列載置し、このX
Yテーブル(2)を駆動させて所望のチップ(1)をT
V用カメラ(3)の視野内に設定して撮像し、フレーム
メモリ(5)に記憶させて該フレームメモリ(5)のデ
ータに基づいてCPU(中央演算処理回路)(6)で画
像処理を行い、チップ(1)の対角線上に位置する2点
を検出してパターン認識している。そして、このパター
ン認識に基づいて上記CPU(6)からXYテーブル駆
動回路(7)に出力信号を送出して前記XYテーブル
(2)を駆動させることにより、チップ(1)を位置補
正してピックアップポジションに位置決めした後、適宜
のピックアップ手段によりそのチップ(1)をピックア
ップしている。以後、前記動作を繰り返すことにより、
XYテーブル(2)上のチップ(1)(1)…を順次パ
ターン認識してピックアップする。
By the way, at the time of picking up the chip, in order to position a desired chip at the pickup position, it is necessary to image-process the chip and recognize the pattern. Therefore, a conventional example of the chip pattern recognition method will be described with reference to FIG. As shown in FIG. 5, a large number of chips (1) obtained by subdividing a semiconductor wafer
(1) ... are aligned and placed on the XY table (2), and this X
Drive the Y table (2) to move the desired chip (1) to the T
The image is set in the field of view of the V camera (3), imaged, stored in the frame memory (5), and image processing is performed by the CPU (central processing unit) (6) based on the data in the frame memory (5). The pattern recognition is performed by detecting two points located on the diagonal line of the chip (1). Then, based on this pattern recognition, the CPU (6) sends an output signal to the XY table drive circuit (7) to drive the XY table (2) to correct the position of the chip (1) and pick it up. After being positioned at the position, the chip (1) is picked up by an appropriate pick-up means. After that, by repeating the above operation,
.. on the XY table (2) are sequentially pattern-recognized and picked up.

【0005】[0005]

【発明が解決しようとする課題】ところで、上述した従
来のパターン認識方法では、チップ(1)の対角線上に
位置する2点を検出してパターン認識するようにしてい
るため、縦辺と横辺の比率が例えば100対1程度と著
しく大きい長尺なチップ(1)をパターン認識する場
合、そのチップ(1)がTV用カメラ(3)の視野内か
ら食み出してしまい、対角線上に位置する2点を検出し
てパターン認識することが困難である。そのため、従来
は、図6に示すように、まず、TV用カメラ(3)でチ
ップ(1)の上端部をその視野内に設定して撮像し、こ
のチップ(1)の上端部を1点目として検出した後、X
Yテーブル(2)でチップ(1)を移動させて、TV用
カメラ(3)でチップ(1)の下端部をその視野内に設
定して撮像し、このチップ(1)の下端部の、前記1点
目となる上端部と対角線上に位置する部分を2点目とし
て検出するようにしている。しかし、このようにする
と、1点目と2点目とが離れ過ぎているとともに、隣接
するチップ(1)との間隔が狭いため、チップ(1)が
少しでも傾いていると、2点目が隣接するチップ(1)
のものと区別ができなくなり、2点目を間違って検出し
て認識ミスが発生する可能性がある。その結果、チップ
(1)の位置決め能力が著しく低く、ピックアップがで
きなくなるという問題があった。そこで、チップ(1)
がTV用カメラ(3)の視野内から食み出さないように
該TV用カメラ(3)の倍率を下げれば、チップ(1)
の対角線上に位置する2点目のパターン部を間違いなく
検出することが可能となるが、今度はパターンが小さく
撮像され過ぎて認識することが困難であるという問題が
あった。
By the way, in the above-mentioned conventional pattern recognition method, since the pattern recognition is performed by detecting two points located on the diagonal line of the chip (1), the vertical side and the horizontal side are detected. When pattern recognition is performed on a long chip (1) having a significantly large ratio of, for example, about 100: 1, the chip (1) protrudes from the field of view of the TV camera (3) and is located on a diagonal line. It is difficult to detect the two points and recognize the pattern. Therefore, conventionally, as shown in FIG. 6, first, the TV camera (3) first sets the upper end of the chip (1) within its field of view and takes an image. After detecting as an eye, X
The chip (1) is moved on the Y table (2), the lower end of the chip (1) is set within its field of view by the TV camera (3), and an image is taken. A portion located on the diagonal line with the upper end portion which is the first point is detected as the second point. However, in this case, since the first point and the second point are too far apart and the interval between the adjacent chips (1) is small, the second point if the chip (1) is slightly inclined. Chips adjacent to each other (1)
There is a possibility that it will be indistinguishable from the ones described above, and the second point will be erroneously detected, resulting in a recognition error. As a result, there is a problem that the positioning ability of the chip (1) is remarkably low and pickup cannot be performed. Then, chip (1)
If the magnification of the TV camera (3) is reduced so that the TV camera (3) does not protrude from the field of view of the TV camera (3), the chip (1)
Although it is possible to detect the second pattern portion located on the diagonal line of, without any doubt, this time there is a problem that the pattern is too small to be imaged and it is difficult to recognize.

【0006】本発明は上記問題点に鑑みて提案されたも
ので、その目的とするところは、長尺なチップに対して
認識ミスなく、かつ、精度よく位置決めすることが可能
なチップの認識方法及びその認識装置を提供することに
ある。
The present invention has been proposed in view of the above problems, and an object of the present invention is to provide a chip recognition method capable of accurately positioning a long chip without misrecognition. And a recognition device therefor.

【0007】[0007]

【課題を解決するための手段】本発明は上記目的を達成
するため、画像処理するカメラの視野内から食み出す長
尺なチップの両端部をパターン認識するに際し、前記長
尺なチップの一端部を撮像して1点目として認識した
後、この1点目の近傍に位置する前記長尺なチップの中
間部を撮像して2点目として認識し、この2点の認識に
より前記長尺なチップの傾きを検出し、この長尺なチッ
プの傾きに基づいて該長尺なチップの他端部を撮像して
3点目として認識して位置検出するようにしたものであ
る。
In order to achieve the above-mentioned object, the present invention has one end of the long chip at the time of pattern recognition of both ends of the long chip protruding from the visual field of a camera for image processing. After imaging the part and recognizing it as the first point, the middle part of the long chip located in the vicinity of the first point is imaged and recognized as the second point. The tilt of the long chip is detected, the other end of the long chip is imaged based on the tilt of the long chip, and the position is detected by recognizing it as the third point.

【0008】また、細分割した多数の長尺なチップを整
列載置したXYテーブルと、このテーブルを駆動させて
前記チップの所望チップを視野内から食み出す状態で撮
像するカメラと、このカメラで撮像した映像信号を記憶
するフレームメモリと、フレームメモリのデータに基づ
いて画像処理し、前記チップの両端部をパターン認識す
るに際し、前記チップの一端部を前記カメラで撮像して
1点目として認識した後、この1点目の近傍に位置する
前記チップの中間部を撮像して2点目として認識し、こ
の2点の認識により前記チップの傾きを検出し、この傾
きに基づいて前記チップの他端部を撮像して3点目とし
て認識して位置検出するCPUと、このCPUからの出
力信号を送出して前記XYテーブルを駆動させる駆動回
路とを具備する。
Further, an XY table in which a large number of finely divided chips are aligned and mounted, a camera for driving the table to pick up an image of a desired chip of the chip in the field of view, and this camera When a frame memory that stores the video signal captured in step 1 and image processing is performed based on the data in the frame memory and pattern recognition of both ends of the chip is performed, one end of the chip is imaged by the camera as the first point. After the recognition, the middle part of the chip located near the first point is imaged and recognized as the second point, the inclination of the chip is detected by the recognition of these two points, and the chip is detected based on this inclination. And a drive circuit for driving the XY table by sending an output signal from the CPU to detect the position by recognizing the third end of the image as the third point.

【0009】[0009]

【作用】本発明によれば、カメラ視野内から食み出す長
尺なチップの傾きを検出することにより、所望の長尺な
チップを隣接する長尺なチップと間違わずに撮像して位
置検出をすることが可能である。
According to the present invention, by detecting the inclination of a long chip protruding from the field of view of a camera, a desired long chip is imaged without being mistaken for an adjacent long chip to detect a position. It is possible to

【0010】[0010]

【実施例】本発明を半導体装置のチップマウント工程に
適用した一実施例を図1乃至図3に基づいて説明する。
図1は本発明における認識例を示す平面図、図2および
図3は認識を実行するフローチャートであり、図2は本
発明における1番目のチップ(1)を認識する場合に用
いる3点認識を示し、図3は本発明における2番目以降
のチップ(1)を認識する場合に用いる2点認識を示
す。尚、本発明における構成回路ブロック図は、従来に
よる図5に示したものと同一であり、これについては図
5を参照しながら説明する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment in which the present invention is applied to a chip mounting process of a semiconductor device will be described with reference to FIGS.
FIG. 1 is a plan view showing an example of recognition in the present invention, FIGS. 2 and 3 are flow charts for executing recognition, and FIG. 2 shows three-point recognition used when recognizing the first chip (1) in the present invention. FIG. 3 shows two-point recognition used when recognizing the second and subsequent chips (1) in the present invention. Incidentally, the block diagram of the constituent circuit in the present invention is the same as the conventional one shown in FIG. 5, which will be described with reference to FIG.

【0011】まず、図5に示すように、半導体ウェーハ
を細分割した多数のチップ(1)(1)…をXYテーブ
ル(2)上に整列載置し、このXYテーブル(2)を駆
動させて1番目のチップ(1)の上端部をTV用カメラ
(3)の視野内に設定する。本発明では、TV用カメラ
(3)はチップ(1)のパターンを十分に認識できる高
倍率に設定してあり、このテレビ用カメラ(3)でチッ
プ(1)の上端部を撮像し、フレームメモリ(5)に記
憶させて該フレームメモリ(5)のデータに基づいてC
PU(6)で画像処理を行い、これによりチップ(1)
の上端部を1点目として認識する。このようにしてチッ
プ(1)の上端部を1点目として認識すると、XYテー
ブル(2)を駆動させてチップ(1)を移動することに
より、このチップ(1)の上端部近傍に位置する中間部
をTV用カメラ(3)の視野内に設定し、このTV用カ
メラ(3)でチップ(1)の上端部近傍に位置する中間
部を撮像し、このチップ(1)の中間部の特徴あるパタ
ーンを2点目として認識する。この際、チップ(1)を
XYテーブル(2)によりTV用カメラ(3)が隣接す
るチップ(1)を間違って視野内に設定する可能性がな
い距離範囲で、かつ、下端部を隣接するチップ(1)と
間違わない認識精度が得られる距離だけ移動し、チップ
(1)の中間部のパターンを2点目として認識する。こ
のようにしてチップ(1)の中間部のパターンを2点目
として認識すると、この2点目と先の1点目との認識に
より得られたデータによりチップ(1)の位置と傾きを
検出し、このチップ(1)の傾きに基づいて該チップ
(1)の下端部の位置を計算し、この計算位置に基づい
てXYテーブル(2)を駆動させてチップ(1)を移動
することにより、このチップ(1)の下端部を隣接する
チップ(1)と間違わないようにTV用カメラ(3)の
視野内に設定し、このTV用カメラ(3)でチップ
(1)の下端部を撮像し、このチップ(1)の下端部
の、前記1点目となる上端部と対角線上に位置する部分
を3点目として認識する。このようにしてチップ(1)
の下端部を3点目として認識すると、この3点目と先の
1点目との認識により得られたデータによりチップ
(1)を位置検出し、この位置検出に基づいてチップ
(1)を位置補正してピックアップポジションに位置決
めする。このようにしてチップ(1)をピックアップポ
ジションに位置決めすると、チップ(1)の良・不良を
判定した後、適宜のピックアップ手段によりそのチップ
(1)をピックアップする。
First, as shown in FIG. 5, a large number of chips (1) (1), which are obtained by finely dividing a semiconductor wafer, are aligned and mounted on an XY table (2), and the XY table (2) is driven. The upper end of the first chip (1) is set within the field of view of the TV camera (3). In the present invention, the TV camera (3) is set to a high magnification so that the pattern of the chip (1) can be sufficiently recognized, and the TV camera (3) captures the upper end of the chip (1), The data is stored in the memory (5) and C based on the data in the frame memory (5)
Image processing is performed by the PU (6), and the chip (1) is
Recognize the upper end of the as the first point. In this way, when the upper end of the chip (1) is recognized as the first point, the XY table (2) is driven and the chip (1) is moved to be positioned near the upper end of the chip (1). The middle part is set within the field of view of the TV camera (3), the middle part located near the upper end of the chip (1) is imaged by the TV camera (3), and the middle part of the chip (1) is captured. The characteristic pattern is recognized as the second point. At this time, the chip (1) is adjacent to the TV camera (3) by the XY table (2) within a distance range in which the chip (1) cannot be mistakenly set in the visual field, and the lower end is adjacent. The chip is moved by a distance that provides recognition accuracy that is not mistaken for the chip (1), and the pattern in the middle part of the chip (1) is recognized as the second point. When the pattern in the middle part of the chip (1) is recognized as the second point in this way, the position and inclination of the chip (1) are detected from the data obtained by the recognition of the second point and the first point. Then, the position of the lower end of the tip (1) is calculated based on the inclination of the tip (1), and the XY table (2) is driven based on the calculated position to move the tip (1). , The lower end of the chip (1) is set within the field of view of the TV camera (3) so as not to be mistaken for the adjacent chip (1), and the lower end of the chip (1) is set by the TV camera (3). An image is taken, and the portion of the lower end of the chip (1) located on the diagonal line with the upper end which is the first point is recognized as the third point. In this way the chip (1)
When the lower end of the chip is recognized as the third point, the chip (1) is position-detected based on the data obtained by the recognition of the third point and the previous first point, and the chip (1) is detected based on this position detection. Correct the position and position to the pickup position. When the chip (1) is positioned at the pickup position in this manner, it is determined whether the chip (1) is good or bad, and then the chip (1) is picked up by an appropriate pickup means.

【0012】このようにして1番目のチップ(1)のピ
ックアップが完了すると、XYテーブル(2)を駆動さ
せて1番目のチップ(1)に隣接する2番目のチップ
(1)の上端部をTV用カメラ(3)の視野内に設定し
て撮像し、この2番目のチップ(1)の上端部を1点目
として認識する。このようにして2番目のチップ(1)
の上端部を1点目として認識すると、1番目のチップ
(1)の傾きのデータに基づいて2番目のチップ(1)
の下端部の位置を計算し、この計算位置に基づいてXY
テーブル(2)を駆動させて2番目のチップ(1)の下
端部をTV用カメラ(3)の視野内に設定して撮像し、
この2番目のチップ(1)の下端部の、2番目のチップ
(1)の上端部と対角線上に位置する部分を2点目とし
て認識する。このようにして2番目のチップ(1)の下
端部を2点目として認識すると、この2点目と先の1点
目との認識により得られたデータにより2番目のチップ
(1)を位置検出し、この位置検出に基づいて2番目の
チップ(1)を位置補正してピックアップポジションに
位置決めする。このようにして2番目のチップ(1)を
ピックアップポジションに位置決めすると、2番目のチ
ップ(1)の良・不良を判定した後、適宜のピックアッ
プ手段によりそのチップ(1)をピックアップする。
When the pickup of the first chip (1) is completed in this way, the XY table (2) is driven to move the upper end portion of the second chip (1) adjacent to the first chip (1). It is set within the field of view of the TV camera (3) and an image is taken, and the upper end of the second chip (1) is recognized as the first point. In this way the second chip (1)
If the upper end of the first chip (1) is recognized as the first point, the second chip (1) is calculated based on the inclination data of the first chip (1).
Calculate the position of the lower end of the
The table (2) is driven, the lower end of the second chip (1) is set within the field of view of the TV camera (3), and an image is taken.
The portion of the lower end of the second chip (1) located on the diagonal line with the upper end of the second chip (1) is recognized as the second point. In this way, when the lower end of the second chip (1) is recognized as the second point, the second chip (1) is positioned based on the data obtained by recognizing the second point and the previous first point. The second chip (1) is detected, and the second chip (1) is position-corrected based on this position detection to be positioned at the pickup position. When the second chip (1) is positioned at the pickup position in this way, the chip (1) is picked up by an appropriate pickup means after determining whether the second chip (1) is good or bad.

【0013】このようにして2番目のチップ(1)のピ
ックアップが完了すると、以後は前記2番目のチップ
(1)の動作を繰り返すことにより、XYテーブル
(2)上のチップ(1)(1)…を順次パターン認識し
てピックアップする。
When the pickup of the second chip (1) is completed in this way, the operation of the second chip (1) is repeated thereafter, so that the chips (1) (1) (1) on the XY table (2) are repeated. ) ... is sequentially recognized and picked up.

【0014】そして、所定数のチップ(1)のピックア
ップが完了するか、或いは、チップ(1)が次列に移行
すると、再び前記1番目のチップ(1)の動作に戻り、
1番目のチップ(1)をピックアップ後は、再び2番目
のチップ(1)の動作を繰り返すことにより、XYテー
ブル(2)上のチップ(1)(1)…のピックアップを
終了する。
When the pickup of a predetermined number of chips (1) is completed or when the chips (1) move to the next row, the operation of the first chip (1) is resumed,
After picking up the first chip (1), the operation of the second chip (1) is repeated again to complete the pickup of the chips (1) (1) ... On the XY table (2).

【0015】尚、上記実施例は半導体装置の製造におけ
るダイボンディング工程のチップをパターン認識に適用
しているが、本発明はこれ以外のパターン認識にも適用
可能であるのは勿論である。
Although the above embodiment applies the chip in the die bonding process in the manufacture of the semiconductor device to the pattern recognition, the present invention can of course be applied to other pattern recognition.

【0016】[0016]

【発明の効果】以上説明したように本発明は、カメラ視
野内から食み出す長尺なチップの傾きを検出することに
より、所望の長尺なチップを隣接する長尺なチップと間
違えることなく撮像して位置検出をすることができるの
で、長尺なチップに対して認識ミスなく、かつ、精度よ
く位置決めすることが可能である。
As described above, according to the present invention, the inclination of a long chip protruding from the field of view of the camera is detected so that a desired long chip is not mistaken for an adjacent long chip. Since the position can be detected by picking up an image, it is possible to accurately position the long chip without any recognition error.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明における認識例を示す平面図である。FIG. 1 is a plan view showing an example of recognition in the present invention.

【図2】本発明における3点認識を実行するフローチャ
ートである。
FIG. 2 is a flow chart for executing three-point recognition in the present invention.

【図3】本発明における2点認識を実行するフローチャ
ートである。
FIG. 3 is a flowchart for executing two-point recognition in the present invention.

【図4】従来におけるチップ認識を実行するフローチャ
ートである。
FIG. 4 is a flowchart for executing conventional chip recognition.

【図5】半導体装置製造におけるチップマウント工程で
のパターン認識を説明するための構成回路ブロック図で
ある。
FIG. 5 is a configuration circuit block diagram for explaining pattern recognition in a chip mounting step in manufacturing a semiconductor device.

【図6】従来の長尺チップの認識例を示す平面図であ
る。
FIG. 6 is a plan view showing an example of recognition of a conventional long chip.

【符号の説明】[Explanation of symbols]

1 チップ 2 XYテーブル 3 TV用カメラ 5 フレームメモリ 6 CPU(中央演算処理回路) 7 XYテーブル駆動回路 1 chip 2 XY table 3 TV camera 5 frame memory 6 CPU (central processing unit) 7 XY table drive circuit

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.6 識別記号 庁内整理番号 FI 技術表示箇所 H01L 21/52 9061−5H G06F 15/70 350B ─────────────────────────────────────────────────── ─── Continuation of the front page (51) Int.Cl. 6 Identification code Internal reference number FI Technical indication H01L 21/52 9061-5H G06F 15/70 350B

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 画像処理するカメラの視野内から食み出
す長尺なチップの両端部をパターン認識するに際し、前
記長尺なチップの一端部を撮像して1点目として認識し
た後、この1点目の近傍に位置する前記長尺なチップの
中間部を撮像して2点目として認識し、この2点の認識
により前記長尺なチップの傾きを検出し、この長尺なチ
ップの傾きに基づいて該長尺なチップの他端部を撮像し
て3点目として認識して位置検出するようにしたことを
特徴とするチップの認識方法。
1. When pattern recognition is performed on both ends of a long chip protruding from the field of view of a camera for image processing, one end of the long chip is imaged and recognized as a first point. The middle portion of the long chip located near the first point is imaged and recognized as the second point, and the inclination of the long chip is detected by the recognition of these two points. A chip recognition method, characterized in that the other end of the long chip is imaged based on the inclination and is recognized as a third point for position detection.
【請求項2】 細分割した多数の長尺なチップを整列載
置したXYテーブルと、このテーブルを駆動させて前記
チップの所望チップを視野内から食み出す状態で撮像す
るカメラと、このカメラで撮像した映像信号を記憶する
フレームメモリと、フレームメモリのデータに基づいて
画像処理し、前記チップの両端部をパターン認識するに
際し、前記チップの一端部を前記カメラで撮像して1点
目として認識した後、この1点目の近傍に位置する前記
チップの中間部を撮像して2点目として認識し、この2
点の認識により前記チップの傾きを検出し、この傾きに
基づいて前記チップの他端部を撮像して3点目として認
識して位置検出するCPUと、このCPUからの出力信
号を送出して前記XYテーブルを駆動させる駆動回路と
を具備するチップの認識装置。
2. An XY table in which a large number of subdivided long chips are aligned and mounted, a camera for driving the table to pick up an image of a desired chip of the chip in a field of view, and this camera. When a frame memory that stores the video signal captured in step 1 and image processing is performed based on the data in the frame memory and pattern recognition of both ends of the chip is performed, one end of the chip is imaged by the camera as the first point. After the recognition, the middle part of the chip located near the first point is imaged and recognized as the second point.
The CPU detects the tilt of the chip by recognizing a point, and based on the tilt, images the other end of the chip, recognizes it as a third point, and detects the position, and outputs an output signal from this CPU. A chip recognition device comprising a drive circuit for driving the XY table.
JP8441295A 1995-04-11 1995-04-11 Chip recognition method and chip recognition device Expired - Fee Related JP3169046B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8441295A JP3169046B2 (en) 1995-04-11 1995-04-11 Chip recognition method and chip recognition device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8441295A JP3169046B2 (en) 1995-04-11 1995-04-11 Chip recognition method and chip recognition device

Publications (2)

Publication Number Publication Date
JPH08288366A true JPH08288366A (en) 1996-11-01
JP3169046B2 JP3169046B2 (en) 2001-05-21

Family

ID=13829883

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8441295A Expired - Fee Related JP3169046B2 (en) 1995-04-11 1995-04-11 Chip recognition method and chip recognition device

Country Status (1)

Country Link
JP (1) JP3169046B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112786509A (en) * 2021-01-26 2021-05-11 湖南大学 Positioning system, positioning method and computing equipment

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112786509A (en) * 2021-01-26 2021-05-11 湖南大学 Positioning system, positioning method and computing equipment
CN112786509B (en) * 2021-01-26 2024-02-23 江苏优普纳科技有限公司 Positioning system, positioning method and computing equipment

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