JPH07302568A - Carbon for ion implantation device and its manufacture - Google Patents

Carbon for ion implantation device and its manufacture

Info

Publication number
JPH07302568A
JPH07302568A JP6095365A JP9536594A JPH07302568A JP H07302568 A JPH07302568 A JP H07302568A JP 6095365 A JP6095365 A JP 6095365A JP 9536594 A JP9536594 A JP 9536594A JP H07302568 A JPH07302568 A JP H07302568A
Authority
JP
Japan
Prior art keywords
carbon
ion implantation
graphite material
glassy carbon
apparent density
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6095365A
Other languages
Japanese (ja)
Inventor
Kojiro Ota
幸次郎 太田
Mitsuji Kamata
充志 鎌田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Showa Denko Materials Co Ltd
Original Assignee
Hitachi Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Chemical Co Ltd filed Critical Hitachi Chemical Co Ltd
Priority to JP6095365A priority Critical patent/JPH07302568A/en
Publication of JPH07302568A publication Critical patent/JPH07302568A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To provide carbon for an ion implantation device by which adverse influence exerting on a silicon wafer is extremely reduced in an ion implantation process and which can be stably used, and a manufacturing method. CONSTITUTION:A glassy carbon impregnating graphite material whose apparent density is 1.70 to 1.87g/cm<3> is used. Carbon 1 for an ion implantation device whose glassy carbon containing rate in an obtained product is 3.5 to 7.0weight% and apparent density is 1.85 to 1.95g/cm<3> and containing average porosity is 0.5 to 8% and the graphite material are impregnated with resin formable as glassy carbon. Afterwards, hardening, baking-carbonizing and graphitizing processing is performed, and after it is worked in a desired shape, heat treatment is performed, and high purity refining is performed.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は半導体を製造する工程で
使用されるイオン注入装置用カーボン及びその製造法に
関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to carbon for an ion implantation apparatus used in a semiconductor manufacturing process and a method for manufacturing the carbon.

【0002】[0002]

【従来の技術】半導体に不純物をイオンで注入する技術
は1970年代に工業化された技術であり、現在LSI
をはじめとして多くのシリコン半導体製品などに広く用
いられている。半導体デバイスにおけるイオン注入は、
シリコンウエハーに目的とする不純物元素をイオン化し
数十〜数百eVのエネルギーに加速して打ち込むため、
操作中に目的とする元素以外の成分が介在しているとシ
リコンウエハーに目的以外の不純物が打ち込まれ、初期
の性能が得られなくなる危険性が生じる。このため、構
成部品は半導体デバイスに対して悪影響を及ぼさない高
純度な材料が要求される。
2. Description of the Related Art The technique of implanting impurities into a semiconductor by ions is a technique industrialized in the 1970s, and is currently used in LSIs.
It is widely used in many silicon semiconductor products such as. Ion implantation in semiconductor devices
Since the target impurity element is ionized and implanted into the silicon wafer at an energy of several tens to several hundreds eV,
If a component other than the target element is present during the operation, impurities other than the target may be implanted into the silicon wafer, resulting in a risk that the initial performance cannot be obtained. For this reason, high-purity materials that do not adversely affect the semiconductor device are required for the component parts.

【0003】イオン注入装置は一般に次のような主要な
構成部からなっている。すなわち、目的とする不純物元
素を含んだ気体を高密度のプラズマ状態にし、プラズマ
によりイオンを発生させるイオン源、発生した正イオン
を電界により引き出すための引き出し部、引き出したイ
オンを目的のイオンに選別するイオン分析部、イオンを
所定のエネルギーにするため静電界でイオンを加速する
加速部、イオンビームを収束する収束部、イオンビーム
をシリコンウエハーの表面に均一に打ち込むために走査
する走査部及びシリコンウエハーにイオンを打ち込むイ
オン打ち込み室から構成されている。これらの各部は高
純度を保持し、かつ異物の混入を防止するために材質及
び構造上の工夫がなされているが、中でもイオン源及び
走査部は高エネルギーのイオンが衝突するため構成材料
からの不純物、異物等が混入し易く他の材料より配慮が
必要である。
An ion implanter generally comprises the following major components. That is, the gas containing the target impurity element is put into a high-density plasma state, an ion source that generates ions by the plasma, an extraction part for extracting the generated positive ions by an electric field, and the extracted ions are selected as the target ions. An ion analysis unit, an acceleration unit for accelerating the ions in an electrostatic field to bring the ions to a predetermined energy, a focusing unit for converging the ion beam, a scanning unit for scanning the ion beam uniformly on the surface of the silicon wafer, and silicon. It is composed of an ion implantation chamber that implants ions into the wafer. Each of these parts has been devised in terms of material and structure in order to maintain high purity and prevent contamination of foreign substances, but among them, the ion source and the scanning part are made from the constituent materials because high energy ions collide. Impurities, foreign substances, etc. are likely to be mixed in, so consideration is needed more than other materials.

【0004】[0004]

【発明が解決しようとする課題】現在、イオン源及び走
査部には容易に高純度が可能な黒鉛材料が用いられてい
る。しかしながら黒鉛材料はコークスなどの微粒子の集
合体であるため、イオンビームでスパッタリングされた
場合、微細な異物が混入し、シリコンウエハー上に付着
して結果的に製品の歩留りを悪くし、発展する半導体デ
バイスの要求に対応することができない。
At present, a graphite material that can be easily highly purified is used for the ion source and the scanning section. However, since the graphite material is an aggregate of fine particles such as coke, when sputtered with an ion beam, fine foreign matter is mixed and adheres to the silicon wafer, resulting in poor product yield and development of semiconductors. Unable to meet the demands of the device.

【0005】本発明はイオン注入工程においてシリコン
ウエハーに及ぼす悪影響が極めて少なく、安定して使用
が可能なイオン注入装置用カーボン及びその製造法を提
供するものである。
The present invention provides carbon for an ion implantation apparatus and a method for producing the same, which has a minimal adverse effect on a silicon wafer in the ion implantation step and can be stably used.

【0006】[0006]

【課題を解決するための手段】本発明者らはかかる現状
に鑑み、従来公知の黒鉛材料について種々検討した結
果、黒鉛材料はピッチなどの結合材とコークスなどの微
粉とを混練した後、粉砕、成形、焼成炭化、さらに黒鉛
化を行って得られるが、コークスなどの微粒子の集合体
は組織上極めて結合力が弱くイオンビームでスパッタし
た場合、比較的容易に異物が発生することが確認され
た。そこで本発明者らは該組織上弱い結合力を補う方法
を鋭意検討した結果、ガラス状炭素をコークスなどの微
粒子の集合体の組織中に含浸することにより結合力を向
上させることが出来ることを見いだし本発明を完成する
に至った。
In view of the present situation, the present inventors have made various studies on conventionally known graphite materials, and as a result, the graphite materials are kneaded with a binder such as pitch and a fine powder such as coke and then pulverized. It can be obtained by carrying out molding, firing carbonization, and graphitization, but the aggregate of fine particles such as coke has a very weak binding force on the structure and it is confirmed that foreign matter is relatively easily generated when sputtered with an ion beam. It was Therefore, as a result of intensive studies on the method for compensating for the weak bonding force on the tissue, the present inventors have found that the bonding force can be improved by impregnating the tissue of the aggregate of fine particles such as coke with glassy carbon. The present invention has been completed and the present invention has been completed.

【0007】本発明は見掛け密度が1.70〜1.87
g/cm3のガラス状炭素含浸用黒鉛材料を用い、ガラス
状炭素の含有率が3.5〜7.0重量%、見掛け密度が
1.85〜1.95g/cm3及び含有平均気孔率が0.
5〜8%であるイオン注入装置用カーボン並びに上記の
黒鉛材料にガラス状炭素となり得る樹脂を含浸した後、
硬化、焼成炭化、黒鉛化処理し、所望の形状に加工した
後熱処理して高純度精製を行うイオン注入装置用カーボ
ンの製造法に関する。
The present invention has an apparent density of 1.70 to 1.87.
Using a graphite material for impregnating glassy carbon of g / cm 3 , the content of glassy carbon is 3.5 to 7.0% by weight, the apparent density is 1.85 to 1.95 g / cm 3, and the average content porosity is Is 0.
After impregnating 5 to 8% of carbon for ion implantation equipment and the above graphite material with a resin that can become glassy carbon,
The present invention relates to a method for producing carbon for an ion implantation apparatus, in which carbon is hardened, calcined and carbonized, graphitized, processed into a desired shape, and then heat-treated for high purity purification.

【0008】本発明においてガラス状炭素となり得る樹
脂を含浸する前の黒鉛材料の見掛け密度は、1.70〜
1.87g/cm3、好ましくは1.75〜1.87g/c
m3、より好ましくは1.80〜1.87g/cm3の範囲
とされ、1.70g/cm3未満であると含浸回数を多く
しなければならないため時間を費やすと共に十分に含浸
されない部分が生じ異物の発生が増大する。また1.8
7g/cm3を越えると組織中の気孔径が小さいためガラ
ス状炭素が黒鉛材料の中心部まで含浸されず、使用中に
異物の発生が増大する。なお黒鉛材料としては特に制限
はなく従来公知のものが用いられる。
In the present invention, the apparent density of the graphite material before being impregnated with the resin capable of becoming glassy carbon is 1.70 to
1.87 g / cm 3 , preferably 1.75 to 1.87 g / c
m 3, more preferably in a range of 1.80~1.87g / cm 3, is sufficiently impregnated portion not with spend time because they must often impregnated number is less than 1.70 g / cm 3 Occurrence of foreign matter is increased. Also 1.8
When it exceeds 7 g / cm 3 , glassy carbon is not impregnated to the central portion of the graphite material because the pore diameter in the structure is small, and the generation of foreign substances increases during use. The graphite material is not particularly limited, and conventionally known materials can be used.

【0009】また得られる製品(イオン注入装置用カー
ボン)は、ガラス状炭素の含有率が3.5〜7.0重量
%、見掛け密度が1.85〜1.95g/cm3及び含有
平均気孔率が0.5〜8%の範囲とされ、ガラス状炭素
の含有率が7.0重量%を越えた場合、見掛け密度が
1.95g/cm3を越えた場合及び/又は含有平均気孔
率が0.5%未満であるといたずらに含浸回数を費やす
だけで手間がかかり、またガラス状炭素の含有率が3.
5重量%未満、見掛け密度が1.85g/cm3未満及び
/又は含有平均気孔率が8%を越えると含浸量が少な
く、気孔率が大であるため使用中に異物の発生が増大す
る。
The obtained product (carbon for ion implantation equipment) has a glassy carbon content of 3.5 to 7.0% by weight, an apparent density of 1.85 to 1.95 g / cm 3 and an average content of pores. The content of glassy carbon is more than 7.0% by weight, the apparent density is more than 1.95 g / cm 3 , and / or the average porosity of content is within the range of 0.5 to 8%. Is less than 0.5%, it is troublesome to spend the number of impregnations, and the glassy carbon content is 3.
If it is less than 5% by weight, the apparent density is less than 1.85 g / cm 3 and / or the content average porosity exceeds 8%, the impregnation amount is small and the porosity is large, so that the generation of foreign substances during use increases.

【0010】本発明におけるガラス状炭素の含有率とは
黒鉛材料に含浸されたガラス状炭素の量を重量%で示し
たものである。また含有平均気孔率とはJIS−R−7
212に準じる方法より求めた値である。さらに以下の
実施例に示される平均気孔径とは水銀ポロシメータによ
り1cm2中に含まれる気孔の平均径から求めた値であ
る。
The glassy carbon content in the present invention means the amount of glassy carbon impregnated in the graphite material, expressed in wt%. The average content porosity is JIS-R-7.
It is a value obtained by a method according to 212. Furthermore, the average pore diameter shown in the following examples is a value obtained from the average diameter of the pores contained in 1 cm 2 by a mercury porosimeter.

【0011】ガラス状炭素となり得る樹脂としては、フ
ェノール樹脂、フラン樹脂、エポキシ樹脂、不飽和ポリ
エステル樹脂、メラミン樹脂、アルキッド樹脂、キシレ
ン樹脂等の一種以上が用いられるが、本発明においては
フェノール樹脂を用いることが好ましい。
As the resin capable of forming glassy carbon, one or more of phenol resin, furan resin, epoxy resin, unsaturated polyester resin, melamine resin, alkyd resin, xylene resin and the like are used. In the present invention, phenol resin is used. It is preferable to use.

【0012】イオン注入装置用カーボンの製造工程にお
ける硬化、焼成炭化、黒鉛化処理、加工、熱処理等につ
いては特に制限はなく、従来公知の方法で行われる。ま
た含浸については減圧下で行えば黒鉛材料中の空気など
を十分に取り除くことができ含浸効果に優れるので好ま
しい。なお減圧下における真空度については特に制限は
ない。本発明においては必要に応じ予備加熱して水分な
どを除去してもよい。
There are no particular restrictions on the curing, firing carbonization, graphitization treatment, processing, heat treatment, etc. in the manufacturing process of the carbon for the ion implantation apparatus, and any conventionally known method may be used. Further, the impregnation is preferably carried out under reduced pressure because air and the like in the graphite material can be sufficiently removed and the impregnation effect is excellent. The degree of vacuum under reduced pressure is not particularly limited. In the present invention, water etc. may be removed by preheating if necessary.

【0013】[0013]

【実施例】以下発明の実施例を説明する。 実施例1 見掛け密度が1.81g/cm3、電気比抵抗が12μΩ
m、曲げ強さが53MPa、含有平均気孔率が11%及び
平均気孔径が0.1μmの特性を有する人造黒鉛材料
(日立化成工業製、商品名PD−600)を所望の形状
に加工した後、デシケータに入れ真空度20Torr以下の
減圧下でメタノールを用いて樹脂分を55重量%に調整
したフェノール樹脂(日立化成工業製、商品名VP−1
1N)の含浸を10分間行った。該含浸品を乾燥機に入
れ160℃まで昇温し、12時間保持して硬化を行った
後、環状炉に入れ窒素気流中で1100℃まで昇温し、
5時間保持して焼成炭化を行った。さらに、2800℃
まで昇温し、6時間保持して黒鉛化処理を行った。含浸
から黒鉛化処理までの作業を3回繰り返し行った後、外
側の寸法が縦110×横80mm、内側の寸法が縦50×
横45mm及び厚さ(高さ)4mmに加工し、次いで250
0℃の温度で熱処理して高純度精製を行い図1に示すよ
うなガラス状炭素含浸カーボン製のイオン注入装置用カ
ーボン1を得た。
EXAMPLES Examples of the present invention will be described below. Example 1 Apparent density 1.81 g / cm 3 , electric resistivity 12 μΩ
m, a bending strength of 53 MPa, a content average porosity of 11%, and an average pore diameter of 0.1 μm, after processing an artificial graphite material (manufactured by Hitachi Chemical Co., Ltd., trade name PD-600) into a desired shape. Phenol resin (made by Hitachi Chemical Co., Ltd., trade name VP-1) whose resin content was adjusted to 55% by weight by using methanol under a reduced pressure of 20 Torr or less in a desiccator.
1N) was impregnated for 10 minutes. The impregnated product was placed in a drier and heated to 160 ° C., held for 12 hours to cure, then placed in a ring furnace and heated to 1100 ° C. in a nitrogen stream,
It was held for 5 hours to carry out calcination and carbonization. Furthermore, 2800 ° C
The temperature was raised up to and held for 6 hours for graphitization. After repeating the process from impregnation to graphitization three times, the outer dimensions are 110 x 80 mm, and the inner dimensions are 50 x.
Processed to a width of 45 mm and a thickness (height) of 4 mm, then 250
Heat treatment was performed at a temperature of 0 ° C. for high-purity purification to obtain carbon 1 for an ion implantation device made of glassy carbon-impregnated carbon as shown in FIG.

【0014】実施例2 実施例1の人造黒鉛材料に代えて見掛け密度が1.75
g/cm3、電気比抵抗が13μΩm、曲げ強さが40MP
a、含有平均気孔率が15%及び平均気孔径が2.6μ
mの特性を有する人造黒鉛材料(日立化成工業製、商品
名PD−620)を用いた以外は、実施例1と同様のフ
ェノール樹脂を用い、実施例1と同様の工程を経てイオ
ン注入装置用カーボンを得た。
Example 2 In place of the artificial graphite material of Example 1, the apparent density was 1.75.
g / cm 3 , electrical resistivity 13μΩm, bending strength 40MP
a, content average porosity is 15% and average pore diameter is 2.6μ
For an ion implanter, the same phenolic resin as in Example 1 was used, except that an artificial graphite material having a characteristic of m (Hitachi Chemical Co., Ltd., trade name PD-620) was used. Got carbon.

【0015】実施例3 実施例1で用いたフェノール樹脂にアセトンとメタノー
ルの混合溶媒(重量比でアセトン50:メタノール5
0)を加えて樹脂分を30重量%とした以外は実施例1
と同様の人造黒鉛材料を用い、実施例1と同様の工程を
経てイオン注入装置用カーボンを得た。
Example 3 The phenol resin used in Example 1 was mixed with a mixed solvent of acetone and methanol (acetone 50: methanol 5 by weight ratio).
Example 1 except that 0) was added to make the resin content 30% by weight.
Using an artificial graphite material similar to that described above, the same steps as in Example 1 were performed to obtain carbon for an ion implantation device.

【0016】実施例4 実施例1で用いたフェノール樹脂を撹拌機を備えた容器
に入れ、この容器を30℃に保持したウォーターバス中
に入れ撹拌しながら溶媒を蒸発させて樹脂分を65重量
%とした以外は実施例1と同様の人造黒鉛材料を用い、
実施例1と同様の工程を経てイオン注入装置用カーボン
を得た。
Example 4 The phenol resin used in Example 1 was placed in a container equipped with a stirrer, and the container was placed in a water bath kept at 30 ° C. to evaporate the solvent while stirring to evaporate the resin content to 65% by weight. Using the same artificial graphite material as in Example 1 except that the percentage was
Carbon for an ion implantation apparatus was obtained through the same steps as in Example 1.

【0017】実施例5 平均粒径が10μmのコークス粉100重量部と結合材
ピッチ45重量部とを混練した混練物を粉砕機で平均粒
径が20μmになるよう粉砕し、次いで100MPaの
圧力で成形した後、焼成炉に入れ1000℃まで昇温
し、5時間保持して焼成し、さらに2800℃まで昇温
し、6時間保持して黒鉛化を行い黒鉛材料を得た。得ら
れた黒鉛材料は見掛け密度が1.87g/cm3、電気比
抵抗が11μΩm、曲げ強さが52MPa、含有平均気孔
率が10.6%及び平均気孔径が1.0μmであった。
Example 5 A kneaded material obtained by kneading 100 parts by weight of coke powder having an average particle size of 10 μm and 45 parts by weight of a binder pitch was pulverized by a pulverizer so that the average particle size was 20 μm, and then at a pressure of 100 MPa. After forming, the mixture was put into a firing furnace, heated to 1000 ° C., held for 5 hours to be fired, further heated to 2800 ° C., held for 6 hours to be graphitized to obtain a graphite material. The obtained graphite material had an apparent density of 1.87 g / cm 3 , an electric resistivity of 11 μΩm, a bending strength of 52 MPa, a contained average porosity of 10.6% and an average pore diameter of 1.0 μm.

【0018】次に上記で得た黒鉛材料を所望の形状に加
工した後、デシケータに入れ、真空度20Torr以下の減
圧下で実施例1と同様のフェノール樹脂を用いて含浸を
行った。以下実施例1と同様の工程を経てイオン注入装
置用カーボンを得た。
Next, the graphite material obtained above was processed into a desired shape, put into a desiccator, and impregnated with the same phenol resin as in Example 1 under a reduced pressure of a vacuum degree of 20 Torr or less. Then, carbon for an ion implantation apparatus was obtained through the same steps as in Example 1.

【0019】比較例1 平均粒径が10μmのコークス粉100重量部と結合材
ピッチ45重量部とを混練した混練物を粉砕機で平均粒
径が20μmになるよう粉砕し、次いで70MPaの圧力
で成形した後、焼成炉に入れ1000℃まで昇温し、5
時間保持して焼成し、さらに2800℃まで昇温し、6
時間保持して黒鉛化を行い黒鉛材料を得た。得られた黒
鉛材料は見掛け密度が1.68g/cm3、電気比抵抗が
21μΩm、曲げ強さが32MPa、含有平均気孔率が2
6%及び平均気孔径が3.1μmであった。
Comparative Example 1 100 parts by weight of coke powder having an average particle size of 10 μm and 45 parts by weight of a binder pitch were kneaded to obtain a compound having a mean particle size of 20 μm, which was then crushed with a pressure of 70 MPa. After molding, put in a firing furnace and raise the temperature to 1000 ° C.
Hold for a period of time to bake, further raise the temperature to 2800 ° C., and
Graphite was obtained by holding for a time to obtain a graphite material. The obtained graphite material has an apparent density of 1.68 g / cm 3 , an electric resistivity of 21 μΩm, a bending strength of 32 MPa, and an average porosity of 2 contained.
6% and the average pore diameter was 3.1 μm.

【0020】次に上記で得た黒鉛材料を所望の形状に加
工した後、デシケータに入れ、真空度20Torr以下の減
圧下で実施例1と同様のフェノール樹脂を用いて含浸を
行った。以下実施例1と同様の工程を経てイオン注入装
置用カーボンを得た。
Next, the graphite material obtained above was processed into a desired shape, put into a desiccator, and impregnated with the same phenol resin as in Example 1 under reduced pressure at a vacuum degree of 20 Torr or less. Then, carbon for an ion implantation apparatus was obtained through the same steps as in Example 1.

【0021】比較例2 平均粒径が10μmのコークス粉100重量部と結合材
ピッチ60重量部とを混練した混練物を粉砕機で平均粒
径が20μmになるよう粉砕し、次いで110MPaの圧
力で成形した後、焼成炉に入れ1000℃まで昇温し、
5時間保持して焼成し、さらに2800℃まで昇温し、
6時間保持して黒鉛化を行い黒鉛材料を得た。得られた
黒鉛材料は見掛け密度が1.89g/cm3、電気比抵抗
が10μΩm、曲げ強さが47MPa、含有平均気孔率が
8%及び平均気孔径が1.1μmであった。
Comparative Example 2 A kneaded product obtained by kneading 100 parts by weight of coke powder having an average particle size of 10 μm and 60 parts by weight of a binder pitch was pulverized by a pulverizer to an average particle size of 20 μm, and then at a pressure of 110 MPa. After molding, put in a firing furnace and raise the temperature to 1000 ° C.
Hold for 5 hours to bake, then raise the temperature to 2800 ° C,
Graphite was obtained by holding for 6 hours to obtain a graphite material. The obtained graphite material had an apparent density of 1.89 g / cm 3 , an electric resistivity of 10 μΩm, a bending strength of 47 MPa, a contained average porosity of 8% and an average pore diameter of 1.1 μm.

【0022】次に上記で得た黒鉛材料を所望の形状に加
工した後、デシケータに入れ、真空度20Torr以下の減
圧下で実施例1と同様のフェノール樹脂を用いて含浸を
行った。以下実施例1と同様の工程を経てイオン注入装
置用カーボンを得た。
Next, the graphite material obtained above was processed into a desired shape, placed in a desiccator, and impregnated with the same phenol resin as in Example 1 under reduced pressure at a vacuum degree of 20 Torr or less. Then, carbon for an ion implantation apparatus was obtained through the same steps as in Example 1.

【0023】次いで各実施例及び各比較例で得たイオン
注入装置用カーボンを大電流イオン注入装置の走査部に
取付け、その中央部をイオンビームが通過するようにし
た。その後シリコンウエハーへのイオン注入を行い、L
SIを製造してイオン注入装置用カーボンの性状を従来
品と共に比較した。その比較データを表1に示す。表1
において素材見掛け密度とはガラス状炭素となり得る樹
脂を含浸する前の黒鉛材料の見掛け密度のことである。
Next, the carbon for ion implantation apparatus obtained in each of the examples and each comparative example was attached to the scanning portion of the high current ion implantation apparatus, and the ion beam was allowed to pass through the central portion thereof. After that, ion implantation into the silicon wafer is performed and L
SI was manufactured to compare the properties of carbon for ion implanters with conventional products. The comparison data is shown in Table 1. Table 1
In the above, the material apparent density is the apparent density of the graphite material before being impregnated with a resin that can become glassy carbon.

【0024】[0024]

【表1】 [Table 1]

【0025】表1に示されるように、本発明の実施例に
なるイオン注入装置用カーボンの性状は、比較例のイオ
ン注入装置用カーボン及び従来の黒鉛材料の性状に比較
してLSIの歩留りが優れていることが示される。
As shown in Table 1, the properties of the carbon for ion implanters according to the examples of the present invention are higher in the yield of LSI than the properties of the carbon for ion implanters of the comparative example and the properties of conventional graphite materials. It is shown to be excellent.

【0026】[0026]

【発明の効果】本発明によればイオン注入を行う工程に
おいてシリコンウエハーに及ぼす悪影響が極めて少なく
安定して使用が可能なイオン注入装置用カーボンを得る
ことが可能となり、半導体デバイスの生産を効率よく行
うことが出来本発明は工業上極めて有益である。
According to the present invention, it is possible to obtain carbon for an ion implantation apparatus, which has a minimal adverse effect on a silicon wafer in the step of performing ion implantation and can be stably used, and to efficiently produce semiconductor devices. It can be carried out, and the present invention is extremely useful industrially.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施例になるイオン注入装置用カーボ
ンの斜視図である。
FIG. 1 is a perspective view of carbon for an ion implantation apparatus according to an embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1 イオン注入装置用カーボン 1 Carbon for ion implantation equipment

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.6 識別記号 庁内整理番号 FI 技術表示箇所 H01L 21/265 ─────────────────────────────────────────────────── ─── Continuation of the front page (51) Int.Cl. 6 Identification code Internal reference number FI technical indication H01L 21/265

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 見掛け密度が1.70〜1.87g/cm
3のガラス状炭素含浸用黒鉛材料を用い、ガラス状炭素
の含有率が3.5〜7.0重量%、見掛け密度が1.8
5〜1.95g/cm3及び含有平均気孔率が0.5〜8
%であるイオン注入装置用カーボン。
1. An apparent density of 1.70 to 1.87 g / cm.
Using the graphite material for glassy carbon impregnation of 3, the glassy carbon content is 3.5 to 7.0% by weight and the apparent density is 1.8.
5 to 1.95 g / cm 3 and contained average porosity of 0.5 to 8
% Carbon for ion implanters.
【請求項2】 請求項1の黒鉛材料にガラス状炭素とな
り得る樹脂を含浸した後、硬化、焼成炭化、黒鉛化処理
し、所望の形状に加工した後熱処理して高純度精製を行
うことを特徴とするイオン注入装置用カーボンの製造
法。
2. The high purity purification is performed by impregnating the graphite material according to claim 1 with a resin capable of becoming glassy carbon, followed by curing, firing carbonization, graphitization, processing into a desired shape and heat treatment. A characteristic method for producing carbon for ion implantation equipment.
JP6095365A 1994-05-10 1994-05-10 Carbon for ion implantation device and its manufacture Pending JPH07302568A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6095365A JPH07302568A (en) 1994-05-10 1994-05-10 Carbon for ion implantation device and its manufacture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6095365A JPH07302568A (en) 1994-05-10 1994-05-10 Carbon for ion implantation device and its manufacture

Publications (1)

Publication Number Publication Date
JPH07302568A true JPH07302568A (en) 1995-11-14

Family

ID=14135607

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6095365A Pending JPH07302568A (en) 1994-05-10 1994-05-10 Carbon for ion implantation device and its manufacture

Country Status (1)

Country Link
JP (1) JPH07302568A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005055271A1 (en) * 2003-12-04 2005-06-16 Nissin Ion Equipment Co., Ltd. Ion beam device
US8673450B2 (en) 2005-10-28 2014-03-18 Toyo Tanso Co., Ltd. Graphite member for beam-line internal member of ion implantation apparatus

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005055271A1 (en) * 2003-12-04 2005-06-16 Nissin Ion Equipment Co., Ltd. Ion beam device
US7435976B2 (en) 2003-12-04 2008-10-14 Nissin Ion Equipment Co., Ltd. Ion beam device
US8673450B2 (en) 2005-10-28 2014-03-18 Toyo Tanso Co., Ltd. Graphite member for beam-line internal member of ion implantation apparatus

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