JPH0726383A - Chemical vapor phase growing method for silicon oxide film - Google Patents
Chemical vapor phase growing method for silicon oxide filmInfo
- Publication number
- JPH0726383A JPH0726383A JP22044193A JP22044193A JPH0726383A JP H0726383 A JPH0726383 A JP H0726383A JP 22044193 A JP22044193 A JP 22044193A JP 22044193 A JP22044193 A JP 22044193A JP H0726383 A JPH0726383 A JP H0726383A
- Authority
- JP
- Japan
- Prior art keywords
- oxide film
- silicon oxide
- silicon
- source
- film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Chemical Vapour Deposition (AREA)
- Formation Of Insulating Films (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、酸化珪素膜の形成方法
に関し、さらに詳しくは、たとえば絶縁膜、表面保護膜
として有用な酸化珪素膜を形成する方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for forming a silicon oxide film, and more particularly to a method for forming a silicon oxide film useful as an insulating film or a surface protective film.
【0002】[0002]
【従来の技術】化学気相成長(Chemical Va
por Deposition、CVD)法は、高性能
膜を量産できる方法として広く実用化されている。酸化
珪素膜の化学気相成長法のシリコン源としてシランやテ
トラエトキシシラン(TEOS)が用いられている。し
かし、シランは空気中で発火し、テトラエトキシシラン
は空気中の水分によって加水分解しやすい。また、テト
ラエトキシシラン−オゾン系で得られる膜はひび割れを
起こしやすい。2. Description of the Related Art Chemical Vapor Deposition (Chemical Vapor)
The Por Deposition (CVD) method has been widely put into practical use as a method capable of mass-producing high-performance films. Silane or tetraethoxysilane (TEOS) is used as a silicon source for a chemical vapor deposition method of a silicon oxide film. However, silane is ignited in air, and tetraethoxysilane is easily hydrolyzed by water in the air. Further, the film obtained by the tetraethoxysilane-ozone system is apt to crack.
【0003】[0003]
【発明が解決しようとする課題】本発明は、取り扱いや
すい原料を用いて、硬くひび割れを起こしにくく、絶縁
膜や表面保護膜として広い用途を持つ酸化珪素の膜を、
容易に合成し得る新たな化学気相成長法の提供にある。SUMMARY OF THE INVENTION The present invention provides a silicon oxide film that is hard and does not easily crack and has a wide range of uses as an insulating film or a surface protective film by using a raw material that is easy to handle.
It is to provide a new chemical vapor deposition method that can be easily synthesized.
【0004】[0004]
【課題を解決するための手段】テトラキスジエチルアミ
ノシランをシリコン源として用い、酸素源として、オゾ
ンを含んだ酸素ガスをシリコン源ガスに加えることによ
り、200℃以上の基板温度で、ガラス、金属、プラス
チックなどの被処理物表面に硬く緻密でひび割れを起こ
しにくい酸化珪素の膜を成長させることを特徴とする化
学気相成長方法。[Means for Solving the Problems] Tetrakisdiethylaminosilane is used as a silicon source, and an oxygen gas containing ozone is added to the silicon source gas as an oxygen source to obtain glass, metal, or plastic at a substrate temperature of 200 ° C. or higher. A chemical vapor deposition method characterized by growing a film of silicon oxide that is hard, dense, and is resistant to cracking on the surface of an object to be processed such as.
【0005】[0005]
【作用】本発明方法によるときは、取り扱い上も安全な
原料を用いて、少ない工程で、低温で、したがって、プ
ラスチックを含むの被処理物表面に、酸化珪素の膜を容
易に成長させることができる。According to the method of the present invention, it is possible to easily grow a film of silicon oxide on a surface of an object to be treated containing plastic, using a raw material which is safe in handling, in a small number of steps and at a low temperature. it can.
【0006】[0006]
【実施例】以下、本発明の実施例について説明する。図
1に成膜装置の模式図を示す。シリコン源としてテトラ
キスジエチルアミノシランを用い、これを60℃に保っ
た気化器内(7)で気化し、窒素ガス(流量300cm
3/min)(1)をキャリアガスとしてノズルに輸送
した。ノズル中で、酸素源としてオゾンを463ppm
を含んだ酸素ガス(流量100cm3/min)と混合
し、混合ガスを基板(8)上に吹き付け大気圧下で成膜
した。基板(8)として、硼珪酸ガラスを用いた。基板
温度200℃以上で反応させたところ、基板に対する密
着性の良い酸化珪素の透明膜が得られた。図2に成膜速
度のアレニウスプロットを示す。形成された酸化珪素膜
の評価は以下のようにして行なった。赤外吸収スペクト
ルは高速フーリエ変換赤外分光光度計により測定した。
図3に基板温度、200℃、300℃および400℃で
合成された薄膜の赤外吸収スペクトルを示す。波数10
80cm−1、800cm−1および460cm−1付
近の吸収ピークはSi−O結合に基づくものである。膜
の硬度は動的押し込み硬度は超微少硬度計により測定し
た。結果を図4に示す。膜のエッチング速度は、HF:
HNO3:H2Oを重量比で3:2:69で混合したエ
ッチング溶液を用いて測定した。結果を図5に示す。 比較例 テトラキスジエチルアミノシランの代わりにテトラエト
キシシランを用い、酸化珪素膜を形成した。成膜速度の
アレニウスプロットを図2に示す。基板温度200℃、
300℃、400℃で合成された薄膜の赤外吸収スペク
トルを図6示す。動的押し込み硬度を図4に示す。エッ
チング速度を図5に示す。図3と図6の赤外吸収スペク
トルから理解されるように、本発明の方法により形成さ
れた酸化珪素膜はテトラエトキシシランから形成された
酸化珪素膜と膜質が似ていることがわかる。図4の動的
押し込み硬度および図5のエッチング速度から理解され
るように、本発明の方法により形成された酸化珪素膜は
テトラエトキシシランより形成された酸化珪素膜より硬
く、エッチング速度が小さく、膜の緻密性に優れている
ことがわかる。以上本発明につき好適な実施例を挙げて
種々説明したが、本発明はこの実施例に限定されるもの
ではなく、発明の精神を逸脱しない範囲内で多くの改変
を施し得るのはもちろんのことである。EXAMPLES Examples of the present invention will be described below. FIG. 1 shows a schematic diagram of a film forming apparatus. Using tetrakisdiethylaminosilane as a silicon source, this was vaporized in a vaporizer (7) kept at 60 ° C., and nitrogen gas (flow rate 300 cm
3 / min) (1) was transported to the nozzle as a carrier gas. 463ppm of ozone as an oxygen source in the nozzle
Was mixed with an oxygen gas containing oxygen (flow rate 100 cm 3 / min), and the mixed gas was sprayed onto the substrate (8) to form a film under atmospheric pressure. Borosilicate glass was used as the substrate (8). When the reaction was carried out at a substrate temperature of 200 ° C. or higher, a transparent film of silicon oxide having good adhesion to the substrate was obtained. FIG. 2 shows an Arrhenius plot of the film formation rate. The formed silicon oxide film was evaluated as follows. The infrared absorption spectrum was measured by a fast Fourier transform infrared spectrophotometer.
FIG. 3 shows infrared absorption spectra of the thin films synthesized at the substrate temperature, 200 ° C., 300 ° C. and 400 ° C. Wave number 10
80 cm -1, the absorption peak around 800 cm -1 and 460 cm -1 is based on Si-O bonds. The hardness of the film was measured by dynamic indentation hardness using an ultra-fine hardness meter. The results are shown in Fig. 4. The etching rate of the film is HF:
The measurement was performed using an etching solution in which HNO 3 : H 2 O was mixed in a weight ratio of 3: 2: 69. Results are shown in FIG. Comparative Example A silicon oxide film was formed by using tetraethoxysilane instead of tetrakisdiethylaminosilane. An Arrhenius plot of the film formation rate is shown in FIG. Substrate temperature 200 ℃,
The infrared absorption spectrum of the thin film synthesized at 300 ° C. and 400 ° C. is shown in FIG. The dynamic indentation hardness is shown in FIG. The etching rate is shown in FIG. As can be understood from the infrared absorption spectra of FIGS. 3 and 6, it can be seen that the silicon oxide film formed by the method of the present invention is similar in film quality to the silicon oxide film formed of tetraethoxysilane. As understood from the dynamic indentation hardness of FIG. 4 and the etching rate of FIG. 5, the silicon oxide film formed by the method of the present invention is harder than the silicon oxide film formed of tetraethoxysilane and has a smaller etching rate. It can be seen that the denseness of the film is excellent. Although the present invention has been variously described with reference to the preferred embodiments, the present invention is not limited to the embodiments and many modifications can be made without departing from the spirit of the invention. Is.
【図1】装置の概略図である。FIG. 1 is a schematic diagram of an apparatus.
【図2】成膜速度のアレニウスプロットを示す図であ
る。FIG. 2 is a diagram showing an Arrhenius plot of film formation rate.
【図3】テトラキスジエチルアミノシランを用いて3種
類の基板温度で合成された膜の赤外線透過スペクトルの
例を示す図である。FIG. 3 is a diagram showing an example of an infrared transmission spectrum of a film synthesized using tetrakisdiethylaminosilane at three kinds of substrate temperatures.
【図4】膜の動的押し込み硬度を示す図である。FIG. 4 is a diagram showing the dynamic indentation hardness of a film.
【図5】膜のエッチング速度を示す図である。FIG. 5 is a diagram showing an etching rate of a film.
【図6】テトラエトキシシランを用いて3種類の基板温
度で合成された膜の赤外線透過スペクトルの例を示す図
である。FIG. 6 is a diagram showing an example of infrared transmission spectra of a film synthesized using tetraethoxysilane at three kinds of substrate temperatures.
1 キャリアガスボンベ 2 酸素ガスボンベ 3 オゾン発生器 4 ガス流量制御器 5 温度検出器 6 電気炉 7 シリコン源原料 8 基板(被処理物) 1 Carrier Gas Cylinder 2 Oxygen Gas Cylinder 3 Ozone Generator 4 Gas Flow Controller 5 Temperature Detector 6 Electric Furnace 7 Silicon Source Material 8 Substrate (Workpiece)
Claims (2)
コン源として用い、シリコン源に酸素源を加えることに
より、被処理物表面に酸化珪素の膜を成長させることを
特徴とする化学気相成長方法。1. A chemical vapor deposition method characterized in that tetrakisdiethylaminosilane is used as a silicon source, and an oxygen source is added to the silicon source to grow a film of silicon oxide on the surface of the object to be treated.
許請求範囲第1項記載の化学気相成長方法。2. The chemical vapor deposition method according to claim 1, wherein the oxygen source is oxygen gas containing ozone.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22044193A JPH0726383A (en) | 1993-07-07 | 1993-07-07 | Chemical vapor phase growing method for silicon oxide film |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22044193A JPH0726383A (en) | 1993-07-07 | 1993-07-07 | Chemical vapor phase growing method for silicon oxide film |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0726383A true JPH0726383A (en) | 1995-01-27 |
Family
ID=16751165
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP22044193A Pending JPH0726383A (en) | 1993-07-07 | 1993-07-07 | Chemical vapor phase growing method for silicon oxide film |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0726383A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1327496C (en) * | 2002-07-09 | 2007-07-18 | 三星电子株式会社 | Method for manufacturing semiconductor device with duoble space walls |
-
1993
- 1993-07-07 JP JP22044193A patent/JPH0726383A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1327496C (en) * | 2002-07-09 | 2007-07-18 | 三星电子株式会社 | Method for manufacturing semiconductor device with duoble space walls |
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