JPH07210636A - Bending test instrument for card - Google Patents
Bending test instrument for cardInfo
- Publication number
- JPH07210636A JPH07210636A JP6001373A JP137394A JPH07210636A JP H07210636 A JPH07210636 A JP H07210636A JP 6001373 A JP6001373 A JP 6001373A JP 137394 A JP137394 A JP 137394A JP H07210636 A JPH07210636 A JP H07210636A
- Authority
- JP
- Japan
- Prior art keywords
- card
- bending test
- memory card
- pressing tool
- memory
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、薄板状のICメモリカ
ード等の曲げ試験装置に関し、とくに曲げ試験に際し
て、カードの測定位置がずれることなく、かつカードの
所定位置においてカード表裏面の垂直方向に対し、表裏
両方向から荷重を付加して、曲げ試験を行うことができ
るカード用曲げ試験装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a bending test apparatus for thin IC memory cards and the like, and particularly in a bending test, the measurement position of the card is not displaced and the front and back surfaces of the card are perpendicular to each other at a predetermined position. On the other hand, the present invention relates to a bending test device for a card that can perform a bending test by applying loads from both front and back directions.
【0002】[0002]
【従来技術とその課題】従来、図5に斜視図で示すよう
に、この種カード用曲げ試験装置としては、カードXを
台座Yに固定した支持部Z,Z上に載置して、カードX
を押圧する押圧具Sにより、カードXを押圧して、曲げ
試験を行うものであった。2. Description of the Related Art Conventionally, as shown in a perspective view of FIG. 5, as a bending test apparatus for a card of this type, a card X is mounted on a support Z, Z fixed to a pedestal Y, and a card is mounted. X
The bending test is performed by pressing the card X with the pressing tool S that presses.
【0003】上記従来のものにおいては、曲げ試験中に
カードXが支持部Z,Zからずれたり、あるいはカード
Xが支持部Z,Zから落ちる等の問題点があった。The above-mentioned conventional device has a problem that the card X is displaced from the supporting portions Z and Z during the bending test, or the card X is dropped from the supporting portions Z and Z.
【0004】また、カードXを支持部Z,Zに載置する
ものであるので、カードXの上方のみから押圧具Sによ
り押圧して曲げ試験を行うことができ、同一位置におい
てカードXの下方から押圧して曲げ試験を行う場合に
は、カードXを裏返して再度位置合わせをする必要があ
り手間を要する等の問題点があった。Further, since the card X is placed on the supporting portions Z, Z, the bending test can be performed by pressing the card X only from above the card X with the pressing tool S, and below the card X at the same position. When the bending test is performed by pressing from above, there is a problem that it is necessary to turn over the card X and re-align it, which requires time and labor.
【0005】[0005]
【課題を解決するための手段】本発明は、上記課題を解
決するものであって、その要旨は、カードの曲げ試験装
置であって、カードの両端部を一対の把持具により把持
し、カードの表裏面を挟持する押圧具をカード表裏面に
対して平行方向に移動自在とすると共に、カードの所定
位置においてカード表裏面に対して垂直方向に移動自在
として、曲げ試験に際してカードの測定位置がずれるこ
となく、かつカードの所定位置においてカード表面の垂
直方向に対し、表裏両方向から荷重を付加して、曲げ試
験を簡便に行うことができるようにしたものである。DISCLOSURE OF THE INVENTION The present invention is to solve the above-mentioned problems, and its gist is a bending test apparatus for a card, in which both ends of the card are held by a pair of holding tools. The pressing tool that holds the front and back surfaces of the card can be moved in parallel with the front and back surfaces of the card, and can also be moved in the vertical direction with respect to the front and back surfaces of the card at a predetermined position of the card. The bending test can be easily performed by applying loads from both front and back directions to the vertical direction of the card surface at a predetermined position of the card without shifting.
【0006】[0006]
【実施例】以下、本発明の実施例を図面に基づき具体的
に説明する。図1は本発明のカード用曲げ試験装置を示
す分解斜視図、図2は本発明のカード用曲げ試験装置を
示す側面図、図3は本発明の別のカード用曲げ試験装置
を示す平面図、図4は図3のカード用曲げ試験装置に使
用する把持具を示す斜視図である。Embodiments of the present invention will be specifically described below with reference to the drawings. 1 is an exploded perspective view showing a bending test apparatus for a card of the present invention, FIG. 2 is a side view showing a bending test apparatus for a card of the present invention, and FIG. 3 is a plan view showing another bending test apparatus for a card of the present invention. 4 is a perspective view showing a gripping tool used in the bending test apparatus for a card shown in FIG.
【0007】図1に分解斜視図で示し、又図2に側面図
で示すように、10はICメモリカードであって、IC
メモリカード10は、ICメモリ11と、ICメモリ1
1に接続された外部接続端子12を有し、ICメモリ1
1はプリント配線(図示略)を介して、外部接続端子1
2と接続されている。20,20は一対の把持具であっ
て、ICメモリカード10の両端部を把持する溝21,
21を有する。As shown in an exploded perspective view in FIG. 1 and a side view in FIG. 2, 10 is an IC memory card,
The memory card 10 includes an IC memory 11 and an IC memory 1.
1 has an external connection terminal 12 connected to the IC memory 1
1 is an external connection terminal 1 via a printed wiring (not shown)
It is connected to 2. Reference numerals 20 and 20 denote a pair of grips, which are grooves 21 for gripping both ends of the IC memory card 10.
21.
【0008】把持具10,20は台座30に対して移動
自在としてあり、ICメモリカード10の両端部を把持
するよう調節した後、台座30に固定する。22は溝2
1,21内に設けられた導電性ゴム材であって、該導電
性ゴム材22を形成すると、導電性ゴム材22の有する
弾性力により、無理なく確実にICメモリカード10の
両端部を把持することができると共に、発生した静電気
を逃がすことができるので好適である。The gripping tools 10 and 20 are movable with respect to the base 30, and are adjusted to grip both ends of the IC memory card 10 and then fixed to the base 30. 22 is groove 2
When the conductive rubber material 22 is formed in the conductive rubber materials 22 and 21, the elastic force of the conductive rubber material 22 allows the both ends of the IC memory card 10 to be gripped without difficulty. This is preferable because it is possible to discharge the generated static electricity.
【0009】40は、ICメモリカード10の表裏面を
挟持する押圧具であって、押圧具40には溝41が形成
してある。押圧具40はICメモリカード10の表面に
対して平行に移動自在としてあり、ICメモリカード1
0の所定位置でICメモリカード10の表裏面を挟持す
ることができる。また、押圧具40はICメモリカード
10の表裏面の垂直方向に対し、移動自在としてあり、
ICメモリカード10の所定位置において表面の垂直方
向に対し、ICメモリカード10の表裏両方向から荷重
を付加して、曲げ試験をすることができる。Reference numeral 40 denotes a pressing tool that holds the front and back surfaces of the IC memory card 10, and a groove 41 is formed in the pressing tool 40. The pressing tool 40 is movable in parallel with the surface of the IC memory card 10.
The front and back surfaces of the IC memory card 10 can be held at a predetermined position of 0. The pressing tool 40 is movable in the vertical direction of the front and back surfaces of the IC memory card 10.
At a predetermined position of the IC memory card 10, a bending test can be performed by applying a load from both front and back directions of the IC memory card 10 to the vertical direction of the surface.
【0010】42は溝41内に設けられた導電性ゴム材
であって、該導電性ゴム材42を形成すると、導電性ゴ
ム材42,42の有する弾性力により、無理なく確実に
ICメモリカード10の表裏面を挟持して、ICメモリ
カード10の表裏面の垂直方向に対し、両方向から荷重
を付加して、曲げ試験をすることができると共に、発生
した静電気を逃がすことができるので好適である。Reference numeral 42 denotes a conductive rubber material provided in the groove 41. When the conductive rubber material 42 is formed, the elastic force of the conductive rubber materials 42, 42 ensures that the IC memory card is reasonably and surely. The front and back surfaces of 10 are sandwiched, and a load can be applied from both directions with respect to the vertical direction of the front and back surfaces of the IC memory card 10 to perform a bending test, and the generated static electricity can be released, which is preferable. is there.
【0011】図3は本発明の別のカード用曲げ試験装置
を示す平面図であって、ICメモリカード10の対向す
る隅角部を把持具20,20により把持してある。把持
具20,20は図4に斜視図で示すように、三角形状の
溝21,21が形成してあり、ICメモリカード10の
対向する隅角部を把持する。FIG. 3 is a plan view showing another bending test apparatus for a card of the present invention, in which the corners of the IC memory card 10 facing each other are gripped by the grippers 20, 20. As shown in the perspective view of FIG. 4, the grippers 20, 20 are formed with triangular grooves 21, 21, and grip the corners of the IC memory card 10 facing each other.
【0012】[0012]
【発明の効果】以上の通り、本発明によれば、カードの
両端部を一対の把持具により把持し、カードの表裏面を
挟持する押圧具をカード表裏面に対して平行方向に移動
自在とすると共に、カードの所定位置においてカード表
裏面に対して垂直方向に移動自在としたので、曲げ試験
に際してカードの測定位置がずれることなく、かつカー
ドの所定位置においてカード表裏面の垂直方向に対し、
表裏両方向から荷重を付加して、曲げ試験を簡便に行う
ことができるなどの利点がある。As described above, according to the present invention, both ends of the card are held by the pair of holding tools, and the pressing tool for holding the front and back surfaces of the card can be moved in parallel with the front and back surfaces of the card. At the same time, since it is movable in the vertical direction with respect to the front and back of the card at a predetermined position of the card, the measurement position of the card does not shift during the bending test, and at the predetermined position of the card with respect to the vertical direction of the front and back of the card,
There is an advantage in that a bending test can be easily performed by applying loads from both front and back directions.
【図1】本発明のカード用曲げ試験装置を示す分解斜視
図FIG. 1 is an exploded perspective view showing a bending test apparatus for a card of the present invention.
【図2】本発明のカード用曲げ試験装置を示す側面図FIG. 2 is a side view showing a bending test apparatus for a card of the present invention.
【図3】本発明の別のカード用曲げ試験装置を示す平面
図FIG. 3 is a plan view showing another bending test apparatus for a card of the present invention.
【図4】図3のカード用曲げ試験装置に使用する把持具
を示す斜視図FIG. 4 is a perspective view showing a gripping tool used in the bending test apparatus for a card of FIG.
【図5】従来のカード用曲げ試験装置を示す斜視図FIG. 5 is a perspective view showing a conventional bending test apparatus for a card.
10 ICメモリカード 11 ICメモリ 12 外部接続端子 20 把持具 21 溝 22 導電性ゴム材 30 台座 40 押圧具 41 溝 42 導電性ゴム材 10 IC Memory Card 11 IC Memory 12 External Connection Terminal 20 Gripping Tool 21 Groove 22 Conductive Rubber Material 30 Pedestal 40 Pressing Tool 41 Groove 42 Conductive Rubber Material
Claims (1)
両端部を一対の把持具により把持し、カードの表裏面を
挟持する押圧具をカード表裏面に対して平行方向に移動
自在とすると共に、カードの所定位置においてカード表
裏面に対して垂直方向に移動自在としたことを特徴とす
るカード用曲げ試験装置。1. A bending test apparatus for a card, wherein both ends of the card are held by a pair of holding tools, and a pressing tool for holding the front and back surfaces of the card is movable in a direction parallel to the front and back surfaces of the card. At the same time, a bending test device for a card is characterized in that the card can be moved in a direction perpendicular to the front and back surfaces of the card at a predetermined position.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6001373A JPH07210636A (en) | 1994-01-11 | 1994-01-11 | Bending test instrument for card |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6001373A JPH07210636A (en) | 1994-01-11 | 1994-01-11 | Bending test instrument for card |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH07210636A true JPH07210636A (en) | 1995-08-11 |
Family
ID=11499698
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6001373A Pending JPH07210636A (en) | 1994-01-11 | 1994-01-11 | Bending test instrument for card |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH07210636A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2007037154A1 (en) * | 2005-09-28 | 2007-04-05 | Nidec Sankyo Corporation | Ic card processor |
JP2010237179A (en) * | 2009-03-31 | 2010-10-21 | Dainippon Printing Co Ltd | Test sample mounting device, bending testing apparatus, bending test method, bending test program, and test sample |
JP2016540227A (en) * | 2013-12-18 | 2016-12-22 | クンシャン ニュー フラット パネル ディスプレイ テクノロジー センター カンパニー リミテッド | Flexible screen bending test method and system |
-
1994
- 1994-01-11 JP JP6001373A patent/JPH07210636A/en active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2007037154A1 (en) * | 2005-09-28 | 2007-04-05 | Nidec Sankyo Corporation | Ic card processor |
KR100820512B1 (en) * | 2005-09-28 | 2008-04-11 | 니혼 덴산 산쿄 가부시키가이샤 | Ic card processing apparatus |
JP2010237179A (en) * | 2009-03-31 | 2010-10-21 | Dainippon Printing Co Ltd | Test sample mounting device, bending testing apparatus, bending test method, bending test program, and test sample |
JP2016540227A (en) * | 2013-12-18 | 2016-12-22 | クンシャン ニュー フラット パネル ディスプレイ テクノロジー センター カンパニー リミテッド | Flexible screen bending test method and system |
US10197482B2 (en) | 2013-12-18 | 2019-02-05 | Kunshan New Flat Panel Display Technology Center Co., Ltd. | Method and system for bending test of flexible screen |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US3854712A (en) | Ski vise | |
EP0344506A3 (en) | Spring wire gripper jaw | |
EP0412348A3 (en) | Specimen clamping device exerting no bending moment, in particular for ceramic test piece | |
EP0214785B1 (en) | Improved work bench and clamping device for a work bench top | |
KR950033507A (en) | IC measurement test apparatus and IC measurement test method using the same | |
JPH07210636A (en) | Bending test instrument for card | |
FR2650965B1 (en) | APPARATUS FOR HANDLING AND CLAMPING SHEET-LIKE WORKPIECES FOR BENDING MACHINES | |
JP3983938B2 (en) | Sample length setting jig for tensile measurement of thermomechanical measuring apparatus and thermomechanical measuring apparatus provided with the same | |
US6131895A (en) | Holding device for holding a printed circuit panel | |
JPH09203699A (en) | Holding device for plate-shaped test piece | |
JPS5865329U (en) | Cutting device for sheet glass, etc. | |
JPH1085903A (en) | Holding device | |
CN219285060U (en) | Novel positioning device for optical inspection machine | |
JP2003071668A (en) | Longitudinal side grinding tool | |
CN215072985U (en) | Earphone testing device | |
CN213457227U (en) | Fixing jig capable of assisting flying probe test | |
JPH0726714Y2 (en) | IC socket | |
JP4544832B2 (en) | Optical fiber connection tool | |
JP2003331666A (en) | Sheathing auxiliary tool, manufacturing device and manufacturing method for flat harness | |
JP2782314B2 (en) | Vice | |
JPS6221924Y2 (en) | ||
JPH081462A (en) | Workpiece holder | |
JP3626481B2 (en) | Strain processing method using laser and workpiece holder | |
JP2753961B2 (en) | Polishing device and polishing method for seal stamping surface | |
JPH07202080A (en) | Mounter for ic package to ic socket |