JPH06317418A - Ultrasonic measuring instrument - Google Patents
Ultrasonic measuring instrumentInfo
- Publication number
- JPH06317418A JPH06317418A JP5108198A JP10819893A JPH06317418A JP H06317418 A JPH06317418 A JP H06317418A JP 5108198 A JP5108198 A JP 5108198A JP 10819893 A JP10819893 A JP 10819893A JP H06317418 A JPH06317418 A JP H06317418A
- Authority
- JP
- Japan
- Prior art keywords
- signal
- echo
- thickness
- propagation time
- surface echo
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/04—Analysing solids
- G01N29/07—Analysing solids by measuring propagation velocity or propagation time of acoustic waves
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/028—Material parameters
- G01N2291/02854—Length, thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/04—Wave modes and trajectories
- G01N2291/044—Internal reflections (echoes), e.g. on walls or defects
Abstract
Description
【０００１】[0001]
【産業上の利用分野】この発明は例えば鉄鋼製造ライン
において搬送されてくる鋼管のような被検査材の厚さを
超音波を利用して計測する水浸方式または水柱方式によ
る超音波計測装置に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a water immersion type or water column type ultrasonic measuring device for measuring the thickness of a material to be inspected such as a steel pipe conveyed in a steel manufacturing line by using ultrasonic waves. It is a thing.
【０００２】[0002]
【従来の技術】図６は、従来のこの種の超音波を利用し
た超音波計測装置を示す図である。図６において、１は
超音波計測装置、２は被検査材、３は超音波探触子、４
は上記超音波探触子３を保持する保持機構、５は接触媒
質、６は上記超音波探触子３に対する送信パルスを発生
するための送信部、７は上記送信部６で生じた送信信号
及び被検査材２から反射した受信信号の送受信信号、８
は上記送受信信号７を受信する受信部、３０は上記受信
部８にて受信された受信信号、９は上記受信信号３０の
表面反射エコーへのゲートパルスを発生させる表面ゲー
ト発生部、３１は上記表面ゲート発生部で発生された表
面ゲート信号、１０は上記受信信号３０の裏面反射エコ
ーへのゲートパルスを発生させる裏面ゲート発生部、３
２は上記裏面ゲート発生部で発生された裏面ゲート信
号、１１は上記受信信号３０と上記表面ゲート信号３１
により表面エコーの伝播時間を測定する表面エコー伝播
時間測定部、１２は上記受信信号３０と上記裏面ゲート
信号３２とにより裏面エコーの伝播時間を測定する裏面
エコー伝播時間測定部、３３は上記表面エコー伝播時間
測定部１１で測定された表面エコー伝播時間信号、３４
は上記裏面エコー伝播時間測定部１２で測定された裏面
エコー伝播時間信号、１３は上記超音波計測装置１の各
部に対する同期信号を発生する同期部、３５は上記同期
部１３にて発生された同期信号である。2. Description of the Related Art FIG. 6 is a diagram showing a conventional ultrasonic measuring device utilizing this kind of ultrasonic wave. In FIG. 6, 1 is an ultrasonic measuring device, 2 is a material to be inspected, 3 is an ultrasonic probe, 4
Is a holding mechanism for holding the ultrasonic probe 3, 5 is a contact medium, 6 is a transmitter for generating a transmission pulse for the ultrasonic probe 3, and 7 is a transmission signal generated by the transmitter 6. And a transmission / reception signal of a reception signal reflected from the inspection object 2, 8
Is a receiving unit that receives the transmission / reception signal 7, 30 is a received signal received by the receiving unit 8, 9 is a surface gate generation unit that generates a gate pulse to the surface reflection echo of the received signal 30, and 31 is the above The front surface gate signal generated by the front surface gate generator 10 is a rear surface gate generator 3 for generating a gate pulse to the rear surface reflection echo of the received signal 30.
2 is the back gate signal generated by the back gate generator, 11 is the received signal 30 and the front gate signal 31.
A surface echo propagation time measuring unit that measures the propagation time of the surface echo by means of 12; a back surface echo propagation time measuring unit that measures the propagation time of the back surface echo by means of the received signal 30 and the back surface gate signal 32; A surface echo propagation time signal measured by the propagation time measuring unit 11, 34
Is a back surface echo propagation time signal measured by the back surface echo propagation time measuring unit 12, 13 is a synchronizing unit that generates a synchronization signal for each unit of the ultrasonic measurement apparatus 1, and 35 is a synchronization unit that is generated by the synchronizing unit 13. It is a signal.
【０００３】図７は、従来のこの種の超音波を利用した
超音波計測装置の主要箇所のタイミングを示す図であ
る。図７において、３５は同期信号、７は送受信信号、
Ｔは送信パルス、Ｓは被検査材２の表面から反射された
表面エコー、Ｂは被検査材２の裏面から反射された裏面
エコー、３１は表面ゲート発生部９により発生された表
面ゲート信号、３２は裏面ゲート発生部１０により発生
された裏面ゲート信号、３３は表面エコー伝播時間測定
部１１にて測定された表面エコー伝播時間信号、３４は
裏面エコー伝播時間測定部１２にて測定された裏面エコ
ー伝播時間信号、τは表面ゲート信号３１の立ち上がり
から裏面ゲート信号３２の立ち上がりまでの時間であ
る。FIG. 7 is a diagram showing the timing of the main parts of a conventional ultrasonic measuring device using this type of ultrasonic wave. In FIG. 7, 35 is a synchronization signal, 7 is a transmission / reception signal,
T is a transmission pulse, S is a surface echo reflected from the surface of the material to be inspected 2, B is a back surface echo reflected from the back surface of the material to be inspected 2, 31 is a surface gate signal generated by the surface gate generator 9, Reference numeral 32 is a back surface gate signal generated by the back surface gate generator 10, 33 is a front surface echo propagation time signal measured by the front surface echo propagation time measuring section 11, and 34 is a back surface measured by the back surface echo propagation time measuring section 12. The echo propagation time signal, τ, is the time from the rising of the front surface gate signal 31 to the rising of the back surface gate signal 32.
【０００４】次に動作について説明する。従来の超音波
計測装置においては、送信部６により発生された電気信
号である送信パルスＴが超音波探触子３により超音波信
号に変換され、接触媒質５を伝播し、被検査材２の表面
にて反射された表面エコーＳ及び被検査材２の裏面にて
反射された裏面エコーＢの超音波信号が反射され、超音
波探触子３により超音波エコー信号を電気信号に変換さ
れ送受信信号７となり受信部８に受信される。受信部８
にて受信された送受信信号７は受信部８により増幅され
た受信信号３０となり、受信信号３０は表面ゲート発生
部９にて発生された表面ゲート信号３１と表面エコー伝
播時間測定部１１により表面エコー伝播時間信号３３と
なり、また、裏面ゲート発生部１０にて発生された裏面
ゲート信号３２と裏面エコー伝播時間測定部１２により
裏面エコー伝播時間信号３４として出力され、表面ゲー
ト信号３１の立ち上がりから裏面ゲート信号３２の立ち
上がりまでの時間であるτと表面エコー伝播時間信号３
３と裏面エコー伝播時間信号３４により被検査材２の厚
さ伝播時間を測定することができる。この場合、表面エ
コーＳ及び裏面エコーＢが被検査材２の表面性状の影響
や探触子保持機構４と被検査材２の表面とのならい機能
の影響により大きく変動し、厚さ伝播時間の測定誤差が
大きくなっていた。Next, the operation will be described. In the conventional ultrasonic measuring device, the transmission pulse T, which is an electric signal generated by the transmitting unit 6, is converted into an ultrasonic signal by the ultrasonic probe 3, propagates through the contact medium 5, and the inspection object 2 The ultrasonic signals of the surface echo S reflected on the surface and the back surface echo B reflected on the back surface of the inspection object 2 are reflected, and the ultrasonic probe 3 converts the ultrasonic echo signal into an electric signal and transmits / receives it. The signal 7 is received by the receiving unit 8. Receiver 8
The transmission / reception signal 7 received at becomes a reception signal 30 amplified by the receiving unit 8, and the reception signal 30 is the surface gate signal 31 generated at the surface gate generating unit 9 and the surface echo by the surface echo propagation time measuring unit 11. It becomes the propagation time signal 33, and is outputted as the back surface echo propagation time signal 34 by the back surface gate signal 32 generated by the back surface gate generating section 10 and the back surface echo propagation time measuring section 12, and from the rising of the front surface gate signal 31 to the back surface gate signal 31. Τ which is the time until the rise of the signal 32 and the surface echo propagation time signal 3
3 and the back surface echo propagation time signal 34, the thickness propagation time of the inspected material 2 can be measured. In this case, the front surface echo S and the back surface echo B fluctuate greatly due to the influence of the surface properties of the inspection target material 2 and the function of tracing between the probe holding mechanism 4 and the surface of the inspection target material 2, and the thickness propagation time The measurement error was large.
【０００５】また、表面エコー伝播時間信号３３と裏面
エコー伝播時間信号３４と表面ゲート信号３１の立ち上
がりから裏面ゲート信号３２の立ち上がりまでの時間で
あるτとにより厚さ伝播時間を計測するため処理時間が
長く必要となっていた。Further, the processing time for measuring the thickness propagation time is calculated by the surface echo propagation time signal 33, the back surface echo propagation time signal 34, and τ which is the time from the rising of the front surface gate signal 31 to the rising of the back surface gate signal 32. Has been needed for a long time.
【０００６】[0006]
【発明が解決しようとする課題】従来の超音波計測装置
は以上のように構成されているので、被検査材の表面性
状の影響や探触子保持機構と被検査材の表面とのならい
機能の影響により表面エコー及び裏面エコーが大きく変
動した場合、測定誤差が大きいという問題点がある。Since the conventional ultrasonic measuring device is constructed as described above, the influence of the surface texture of the material to be inspected and the function of tracing the probe holding mechanism and the surface of the material to be inspected. When the front surface echo and the back surface echo largely change due to the influence of 1, the measurement error is large.
【０００７】また、表面エコー伝播時間信号と裏面エコ
ー伝播時間信号と表面ゲート信号の立ち上がりから裏面
ゲート信号の立ち上がりまでの時間とにより厚さ伝播時
間を計測するため処理時間が長いという問題点がある。There is also a problem that the processing time is long because the thickness propagation time is measured by the surface echo propagation time signal, the back surface echo propagation time signal, and the time from the rise of the front surface gate signal to the rise of the back surface gate signal. .
【０００８】この発明は、上記のような問題点を解消す
るためになされたもので、表面エコーの変動及び裏面エ
コーの変動があっても厚さ伝播時間の測定誤差を小さく
することを目的とする。The present invention has been made in order to solve the above problems, and an object thereof is to reduce the measurement error of the thickness propagation time even if there are fluctuations in the front surface echo and the back surface echo. To do.
【０００９】さらに、厚さ伝播時間の測定のための処理
時間を短縮することを目的とする。Another object is to reduce the processing time for measuring the thickness propagation time.
【００１０】[0010]
【課題を解決するための手段】この発明に係わる超音波
計測装置は上記従来装置の構成に対し、表面エコー伝播
時間測定部により測定された表面エコー伝播時間信号と
裏面エコー伝播時間測定部により測定された裏面エコー
伝播時間信号とにより、厚さ伝播時間を測定する厚さ伝
播時間測定部と、あらかじめ定められた伝播時間範囲と
厚さ伝播時間とを比較し厚さ伝播時間範囲外のとき異常
トリガ信号を発生させる厚さ比較部と、厚さ比較部から
の異常トリガ信号によりデータ有効信号を発生する厚さ
データ有効信号発生部と、厚さデータ有効信号の発生時
のみの厚さ伝播時間信号を有効とし外部からの平均トリ
ガ信号により平均する厚さデータ平均測定部とを付加し
たものである。The ultrasonic measuring apparatus according to the present invention is different from the above-mentioned conventional apparatus in that the surface echo propagation time signal measured by the surface echo propagation time measuring section and the back surface echo propagation time measuring section are measured. Abnormality when outside the thickness propagation time range by comparing the thickness propagation time range with the thickness propagation time measurement unit that measures the thickness propagation time based on the back surface echo propagation time signal The thickness comparison part that generates the trigger signal, the thickness data valid signal generation part that generates the data valid signal by the abnormal trigger signal from the thickness comparison part, and the thickness propagation time only when the thickness data valid signal is generated A thickness data averaging unit for validating the signal and averaging it by an average trigger signal from the outside is added.
【００１１】さらに、表面ゲート信号内に存在する受信
部からの受信信号の表面エコー高さを測定する表面エコ
ー高さ測定部と、表面エコー高さ測定部で測定された表
面エコー高さをあらかじめ定めた判定値と比較し、判定
値以下の表面エコー高さのとき表面エコー高さ異常トリ
ガ信号を発生させる表面エコー高さ比較部と、表面エコ
ー高さ比較部からの表面エコー高さ異常トリガ信号によ
り表面エコーデータマスク信号を発生する表面エコーデ
ータマスク発生部と、表面エコーデータマスク信号の非
発生時のみの厚さ伝播時間信号を有効とし外部からの平
均トリガ信号により平均する厚さデータ平均測定部とを
付加したものである。Further, the surface echo height measuring unit for measuring the surface echo height of the received signal from the receiving unit existing in the surface gate signal and the surface echo height measured by the surface echo height measuring unit are previously set. Surface echo height comparison unit that generates a surface echo height abnormality trigger signal when the surface echo height is less than or equal to the determined determination value, and a surface echo height abnormality trigger from the surface echo height comparison unit A surface echo data mask generator that generates a surface echo data mask signal by a signal, and a thickness data average that validates the thickness propagation time signal only when the surface echo data mask signal is not generated and averages by an external average trigger signal The measurement part is added.
【００１２】さらに、裏面ゲート信号内に存在する受信
部からの受信信号の裏面エコー高さを測定する裏面エコ
ー高さ測定部と、裏面エコー高さ測定部で測定された裏
面エコー高さをあらかじめ定めた判定値とを比較し、判
定値以下のエコー高さのとき裏面エコー高さ異常トリガ
信号を発生させる裏面エコー高さ比較部と、裏面エコー
高さ比較部からの裏面エコー高さ異常トリガ信号により
裏面エコーデータマスク信号を発生する裏面エコーデー
タマスク発生部と、裏面エコーデータマスク信号の非発
生時のみの厚さ伝播時間信号を有力とし外部からの平均
トリガ信号により平均する厚さデータ平均測定部とを付
加したものである。Further, the backside echo height measuring section for measuring the backside echo height of the received signal from the receiving section present in the backside gate signal and the backside echo height measured by the backside echo height measuring section are previously set. The backside echo height comparison unit that compares the specified judgment value and generates a backside echo height abnormality trigger signal when the echo height is less than the judgment value and the backside echo height abnormality trigger from the backside echo height comparison unit A back surface echo data mask generator that generates a back surface echo data mask signal based on the signal, and a thickness data average that uses the thickness propagation time signal only when the back surface echo data mask signal is not generated and is averaged by an external average trigger signal The measurement part is added.
【００１３】[0013]
【作用】この発明においては、表面エコー及び裏面エコ
ーの変動があっても厚さ伝播時間の測定誤差を小さくす
ることができる。According to the present invention, the measurement error of the thickness propagation time can be reduced even if there are variations in the front surface echo and the back surface echo.
【００１４】また、厚さ伝播時間測定のための処理時間
を短縮することができる。Further, the processing time for measuring the thickness propagation time can be shortened.
【００１５】[0015]
実施例１．図１はこの発明の一実施例である超音波計測
装置を示す図である。図１において、１は超音波計測装
置、２は被検査材、３は超音波探触子、４は超音波探触
子３を保持する保持機構、５は接触媒質、６は超音波探
触子３に対する送信パルスを発生するための送信部、７
は送信部６で生じた送信信号及び被検査材２からの送受
信信号、８は送受信信号７を受信する受信部、３０は受
信部８にて受信された受信信号、９は受信信号３０の表
面反射エコーへのゲートパルスを発生させる表面ゲート
発生部、３１は表面ゲート発生部で発生された表面ゲー
ト信号、１０は受信信号３０の裏面反射エコーへのゲー
トパルスを発生させる裏面ゲート発生部、３２は裏面ゲ
ート発生部１０で発生された裏面ゲート信号、１１は受
信信号３０と表面ゲート信号３１とにより表面エコーの
伝播時間を測定する表面エコー伝播時間測定部、１２は
受信信号３０と裏面ゲート信号３２とにより裏面エコー
の伝播時間を測定する裏面エコー伝播時間測定部、３３
は表面エコー伝播時間測定部１１で測定された表面エコ
ー伝播時間信号、３４は裏面エコー伝播時間測定部１２
で測定された裏面エコー伝播時間信号、１４は表面エコ
ー伝播時間信号３３と裏面エコー伝播時間信号３４とに
より厚さ測定を行う厚さ伝播時間測定部、３６は厚さ伝
播時間測定部により測定された厚さ伝播時間信号、３７
はあらかじめ定められた厚さ伝播時間範囲信号、１５は
厚さ伝播時間信号３６と厚さ伝播時間範囲信号３７とを
比較し厚さ伝播時間信号３６が厚さ伝播時間範囲信号３
７の範囲外のとき異常トリガ信号を発生する厚さ比較
部、３８は厚さ比較部１５より発生される異常トリガ信
号、１６は異常トリガ信号３８によりデータ有効信号を
発生する厚さデータ有効信号発生部、３９はデータ有効
信号発生部より発生されるデータ有効信号、４０は厚さ
平均を行う区間である外部からの平均トリガ信号、１７
は厚さ伝播時間信号３６とデータ有効信号３９と平均ト
リガ信号４０により厚さデータの平均を行う厚さデータ
平均測定部、４１は厚さデータ平均測定部１７より出力
される厚さデータ平均信号、１３は超音波計測装置１の
各部に対する同期信号を発生する同期部、３５は同期部
１３にて発生された同期信号である。Example 1. FIG. 1 is a diagram showing an ultrasonic measurement device according to an embodiment of the present invention. In FIG. 1, 1 is an ultrasonic measuring device, 2 is a material to be inspected, 3 is an ultrasonic probe, 4 is a holding mechanism for holding the ultrasonic probe 3, 5 is a contact medium, and 6 is an ultrasonic probe. A transmitter for generating a transmission pulse for the child 3, 7
Is a transmission signal generated by the transmission unit 6 and a transmission / reception signal from the inspected material 2, 8 is a reception unit that receives the transmission / reception signal 7, 30 is a reception signal received by the reception unit 8, and 9 is the surface of the reception signal 30. A front surface gate generation unit for generating a gate pulse to the reflection echo, 31 is a front surface gate signal generated by the front surface gate generation unit, 10 is a rear surface gate generation unit for generating a gate pulse of the reception signal 30 to the rear surface reflection echo, 32 Is a back surface gate signal generated by the back surface gate generation unit 10, 11 is a front surface echo propagation time measurement unit that measures the propagation time of the front surface echo by the reception signal 30 and the front surface gate signal 31, and 12 is the reception signal 30 and the back surface gate signal A backside echo propagation time measuring unit for measuring a backside echo propagation time by 32, 33
Is a surface echo propagation time signal measured by the surface echo propagation time measuring section 11, and 34 is a back surface echo propagation time measuring section 12
The back surface echo propagation time signal measured in step 14, 14 is a thickness propagation time measurement part that measures the thickness by the front surface echo propagation time signal 33 and the back surface echo propagation time signal 34, and 36 is a thickness propagation time measurement part. Thickness transit time signal, 37
Is a predetermined thickness propagation time range signal, 15 is a comparison between the thickness propagation time signal 36 and the thickness propagation time range signal 37, and the thickness propagation time signal 36 indicates the thickness propagation time range signal 3
A thickness comparing section that generates an abnormal trigger signal when the value is out of the range of 7, a 38 is an abnormal trigger signal generated by the thickness comparing section 15, and a 16 is a thickness data valid signal that generates a data valid signal by the abnormal trigger signal 38. Generator 39 is a data valid signal generated by the data valid signal generator 40 is an average trigger signal from the outside which is a section for averaging the thickness 17
Is a thickness data average measuring unit for averaging the thickness data by the thickness transit time signal 36, the data valid signal 39 and the average trigger signal 40, and 41 is the thickness data average signal output from the thickness data average measuring unit 17. Reference numerals 13 and 13 denote a synchronization unit that generates a synchronization signal for each unit of the ultrasonic measurement device 1, and a reference numeral 35 denotes a synchronization signal generated by the synchronization unit 13.
【００１６】図２及び図３は、この発明の超音波計測装
置の主要箇所のタイミングを示す図である。図２におい
て、３５は同期信号、７は送受信信号、Ｔは送信パル
ス、Ｓは被検査材２の表面から反射された表面エコー、
Ｂは被検査材２の裏面から反射された裏面エコー、３１
は表面ゲート発生部９により発生された表面ゲート信
号、３２は裏面ゲート発生部１０により発生された裏面
ゲート信号、３３は表面エコー伝播時間測定部１１にて
測定された表面エコー伝播時間信号、３４は裏面エコー
伝播時間測定部１２にて測定された裏面エコー伝播時間
信号、３６は厚さ伝播時間測定部１４により測定された
厚さ伝播時間信号である。図３において、４０は平均ト
リガ信号、３５は同期信号、３６は厚さ伝播時間信号で
３６ａから３６ｈまではそれぞれの同期信号３５により
測定された厚さ伝播時間信号、３７は厚さ伝播時間範囲
信号、３８は異常トリガ信号、３９は厚さデータ有効信
号である。2 and 3 are diagrams showing the timing of the main points of the ultrasonic measuring device of the present invention. In FIG. 2, 35 is a synchronization signal, 7 is a transmission / reception signal, T is a transmission pulse, S is a surface echo reflected from the surface of the material 2 to be inspected,
B is a back surface echo reflected from the back surface of the inspection object 2, 31
Is a front surface gate signal generated by the front surface gate generating unit 9, 32 is a rear surface gate signal generated by the rear surface gate generating unit 10, 33 is a front surface echo propagation time signal measured by the front surface echo propagation time measuring unit 11, and 34 Is a back surface echo propagation time signal measured by the back surface echo propagation time measuring section 12, and 36 is a thickness propagation time signal measured by the thickness propagation time measuring section 14. In FIG. 3, 40 is an average trigger signal, 35 is a synchronization signal, 36 is a thickness propagation time signal, and 36a to 36h are thickness propagation time signals measured by the respective synchronization signals 35, and 37 is a thickness propagation time range. A signal, 38 is an abnormal trigger signal, and 39 is a thickness data valid signal.
【００１７】前記のように構成された超音波計測装置に
おいては、被検査材２の表面性状の影響や探触子保持機
構４と被検査材２の表面とのならい機構の影響により表
面エコーＳおよび裏面エコーＢが大きく変動した場合、
厚さ伝播時間測定部１４で測定された厚さ伝播時間信号
３６が厚さ伝播時間信号３６ｂ及び厚さ伝播時間信号３
６ｇのとおり異常測定値となり、厚さ比較部１５により
厚さ伝播時間範囲信号３７と比較され異常トリガ信号３
８を発生し、厚さデータ有効信号発生部１６により厚さ
データ有効信号３９を発生し、厚さ伝播時間信号３６と
厚さデータ有効信号３９と平均トリガ信号４０とにより
厚さデータ平均測定部１７において異常測定値である厚
さ伝播時間信号３６ｂ及び厚さ伝播時間信号３６ｇとを
除いた厚さ伝播時間信号３６ａ、３６ｃ、３６ｄ、３６
ｅ、３６ｆ、３６ｈを有効とし平均し厚さデータ平均信
号４１を出力し、厚さ伝播時間の測定誤差を小さくす
る。In the ultrasonic measuring apparatus constructed as described above, the surface echo S is caused by the influence of the surface texture of the inspection object 2 and the influence of the tracing mechanism between the probe holding mechanism 4 and the surface of the inspection object 2. And when the back echo B changes greatly,
The thickness propagation time signal 36 measured by the thickness propagation time measuring unit 14 is the thickness propagation time signal 36b and the thickness propagation time signal 3
An abnormal measured value is obtained as 6 g, and the thickness comparing unit 15 compares the measured value with the thickness propagation time range signal 37, and the abnormal trigger signal 3
8 is generated, the thickness data valid signal generator 16 generates a thickness data valid signal 39, and the thickness propagation time signal 36, the thickness data valid signal 39, and the average trigger signal 40 generate the thickness data average measuring unit. In FIG. 17, the thickness propagation time signals 36a, 36c, 36d, 36 excluding the thickness propagation time signal 36b and the thickness propagation time signal 36g, which are abnormal measurement values, are excluded.
e, 36f, and 36h are validated and averaged, and the thickness data average signal 41 is output to reduce the measurement error of the thickness propagation time.
【００１８】また、超音波計測装置１から厚さデータ平
均信号４１が直接出力されるため、厚さ伝播時間測定の
ための処理時間が短縮される。Further, since the thickness data average signal 41 is directly output from the ultrasonic measuring device 1, the processing time for measuring the thickness propagation time is shortened.
【００１９】実施例２．図４は、この発明の実施例２で
ある超音波計測装置を示す図である。図４において１〜
１４、１７、３０〜３６、４０〜４１は図１の装置と全
く同様で、１８は受信信号３０と表面ゲート信号３１に
より表面エコー高さを測定する表面エコー高さ測定部、
４２は表面エコー高さ測定部１８から出力される表面エ
コー高さ信号、４３はあらかじめ定められた表面エコー
高さ判定信号、１９は表面エコー高さ信号４２と表面エ
コー高さ判定信号４３とを比較し表面エコー高さ信号４
２が表面エコー高さ判定信号４３以下のとき表面エコー
高さ異常トリガ信号を発生する表面エコー高さ比較部、
４４は表面エコー高さ比較部１９より発生される表面エ
コー高さ異常トリガ信号、２０は表面エコー高さ異常ト
リガ信号４４により表面エコーデータマスク信号を発生
する表面エコーデータマスク発生部、４５は表面エコー
データマスク発生部２０により発生される表面エコーデ
ータマスク信号、１７は厚さ伝播時間信号３６と表面エ
コーデータマスク信号４５と平均トリガ信号４０により
表面エコーデータマスク信号４５の非発生時のみの厚さ
伝播時間信号３６を有効とし平均トリガ信号４０により
平均する厚さデータ平均測定部、４１は厚さデータ平均
測定部１７より出力される厚さデータ平均信号である。Example 2. FIG. 4 is a diagram showing an ultrasonic measurement device that is Embodiment 2 of the present invention. 1 to 1 in FIG.
Reference numerals 14, 17, 30 to 36, 40 to 41 are exactly the same as those of the apparatus of FIG. 1, and 18 is a surface echo height measuring section for measuring the surface echo height by the received signal 30 and the surface gate signal 31.
42 is a surface echo height signal output from the surface echo height measuring unit 18, 43 is a predetermined surface echo height determination signal, and 19 is a surface echo height signal 42 and a surface echo height determination signal 43. Surface echo height signal 4 for comparison
A surface echo height comparison unit that generates a surface echo height abnormality trigger signal when 2 is less than or equal to the surface echo height determination signal 43,
Reference numeral 44 is a surface echo height abnormality trigger signal generated by the surface echo height comparing section 19, 20 is a surface echo data mask generating section for generating a surface echo data mask signal by the surface echo height abnormality trigger signal 44, and 45 is a surface The surface echo data mask signal generated by the echo data mask generation unit 20, 17 is the thickness only when the surface echo data mask signal 45 is not generated by the thickness propagation time signal 36, the surface echo data mask signal 45, and the average trigger signal 40. A thickness data averaging unit for validating the propagation time signal 36 and averaging by the average trigger signal 40, and 41 is a thickness data averaging signal output from the thickness data averaging unit 17.
【００２０】前記のように構成された超音波計測装置に
おいては、被検査材２の表面性状の影響や探触子保持機
構４と被検査２の表面とのならい機構の影響により表面
エコーＳが大きく変動した場合、表面エコー高さ測定部
１８で測定された表面エコー高さ信号４２が大きく変動
し、あらかじめ表面エコーＳが安定している状態の表面
エコー高さを基にあらかじめ定められた表面エコー高さ
判定信号４３以下の表面エコー高さ信号４２となり、表
面エコー高さ比較部１９で比較判定され表面エコー高さ
異常信号４４を発生し、表面エコーデータマスク発生部
２０により表面エコーデータマスク信号４５が発生し、
厚さ伝播時間信号３６と表面エコーデータマスク信号４
５と平均トリガ信号４０とにより厚さデータ平均測定部
１７において表面エコーデータマスク信号４５が発生し
ていない場合のみの厚さ伝播時間信号３６により厚さデ
ータ平均信号４１を出力し、厚さ伝播時間の測定誤差を
小さくする。In the ultrasonic measuring apparatus configured as described above, the surface echo S is generated due to the influence of the surface texture of the material 2 to be inspected and the influence of the tracing mechanism between the probe holding mechanism 4 and the surface of the inspection object 2. If the surface echo height signal 42 measured by the surface echo height measuring unit 18 largely fluctuates when the surface echo height is greatly changed, the surface predetermined in advance based on the surface echo height in a state where the surface echo S is stable in advance. The surface echo height signal 42 is equal to or lower than the echo height determination signal 43, and the surface echo height comparison unit 19 compares and determines the surface echo height abnormal signal 44, and the surface echo data mask generation unit 20 generates the surface echo data mask. Signal 45 is generated,
Thickness transit time signal 36 and surface echo data mask signal 4
5 and the average trigger signal 40, the thickness data average measuring unit 17 outputs the thickness data average signal 41 by the thickness propagation time signal 36 only when the surface echo data mask signal 45 is not generated, and the thickness propagation is performed. Reduce the time measurement error.
【００２１】実施例３．図５は、この発明の実施例３で
ある超音波計測装置を示す図である。図５において１〜
１４、１７、３０〜３６、４０〜４１は図１の装置と全
く同様で、２１は受信信号３０と裏面ゲート信号３２に
よる裏面エコー高さを測定する裏面エコー高さ測定部、
４６は裏面エコー高さ測定部２１から出力される裏面エ
コー高さ信号、４７はあらかじめ定められた裏面エコー
高さ判定信号、２２は裏面エコー高さ信号４６と裏面エ
コー高さ判定信号４７とを比較し、裏面エコー高さ信号
４６が裏面エコー高さ判定信号４７以下のとき裏面エコ
ー高さ異常トリガ信号を発生する裏面エコー高さ比較
部、４８は裏面エコー高さ比較部２２より発生される裏
面エコー高さ異常トリガ信号、２３は裏面エコー高さ異
常トリガ信号４８により裏面エコーデータマスク信号を
発生する裏面エコーデータマスク発生部、４９は裏面エ
コーデータマスク発生部２３により発生される裏面エコ
ーデータマスク信号、１７は厚さ伝播時間信号３６と裏
面エコーデータマスク信号４９と平均トリガ信号４０に
より裏面エコーデータマスク信号４９の非発生時のみの
厚さ伝播時間信号３６を有効とし平均トリガ信号４０に
より平均する厚さデータ平均測定部、４１は厚さデータ
平均測定部１７より出力される厚さデータ平均信号であ
る。Example 3. FIG. 5 is a diagram showing an ultrasonic measurement device according to a third embodiment of the present invention. 1 to 1 in FIG.
Reference numerals 14, 17, 30 to 36, and 40 to 41 are exactly the same as those of the apparatus shown in FIG. 1, and 21 is a back surface echo height measuring unit for measuring the back surface echo height by the reception signal 30 and the back surface gate signal 32.
Reference numeral 46 is a back surface echo height signal output from the back surface echo height measuring section 21, 47 is a predetermined back surface echo height determination signal, and 22 is a back surface echo height signal 46 and a back surface echo height determination signal 47. By comparison, when the back echo height signal 46 is less than or equal to the back echo height determination signal 47, a back echo height comparison unit that generates a back echo height abnormality trigger signal, and 48 is generated by the back echo height comparison unit 22. Backside echo height abnormality trigger signal, 23 is a backside echo data mask generating section for generating a backside echo data mask signal by the backside echo height abnormality trigger signal 48, and 49 is backside echo data generated by the backside echo data mask generating section 23. A mask signal, 17 is a back surface echo data by a thickness propagation time signal 36, a back surface echo data mask signal 49 and an average trigger signal 40. A thickness data average measuring unit that validates the thickness propagation time signal 36 only when the mask signal 49 is not generated and averages by the average trigger signal 40, 41 is a thickness data average signal output from the thickness data average measuring unit 17. Is.
【００２２】前記のように構成された超音波計測装置に
おいては、被検材２の表面性状の影響や探触子保持機構
４と被検査材２の表面とのならい機構の影響及び被検査
材２の内部亀裂等の欠陥の影響により裏面エコーＢが大
きく変動した場合、裏面エコー高さ測定部２１で測定さ
れた裏面エコー高さ信号４６が大きく変動し、あらかじ
め裏面エコーＢが安定している状態の裏面エコー高さを
基にあらかじめ定められた裏面エコー高さ判定信号４７
以下の裏面エコー高さ信号４６となり、裏面エコー高さ
比較部２２で比較判定された裏面エコー高さ異常トリガ
信号４８を発生し、裏面エコーデータマスク発生部２３
により裏面エコーデータマスク信号４９が発生し、厚さ
伝播時間信号３６と裏面エコーデータマスク信号４９と
平均トリガ信号４０とにより厚さデータ平均測定部１７
において裏面エコーデータマスク信号４９が発生してい
ない場合のみの厚さ伝播時間信号３６により厚さデータ
平均信号４１を出力し、厚さ伝播時間の測定誤差を小さ
くする。In the ultrasonic measuring apparatus configured as described above, the influence of the surface properties of the material 2 to be inspected, the influence of the mechanism for tracing the probe holding mechanism 4 and the surface of the material 2 to be inspected, and the material to be inspected When the back surface echo B largely changes due to the influence of defects such as the internal crack 2 in FIG. 2, the back surface echo height signal 46 measured by the back surface echo height measuring unit 21 largely changes, and the back surface echo B is stable in advance. The backside echo height determination signal 47 that is predetermined based on the backside echo height of the state
The back echo height signal 46 below is generated, and the back echo height abnormality trigger signal 48, which is compared and determined by the back echo height comparison unit 22, is generated, and the back echo data mask generation unit 23 is generated.
Generates a back surface echo data mask signal 49, and the thickness data averaging unit 17 uses the thickness propagation time signal 36, the back surface echo data mask signal 49, and the average trigger signal 40.
In the case where the back surface echo data mask signal 49 is not generated, the thickness propagation time signal 36 outputs the thickness data average signal 41 to reduce the measurement error of the thickness propagation time.
【００２３】[0023]
【発明の効果】この発明は以上説明したように構成され
ているので、以下に記載されるような効果を奏する。Since the present invention is constructed as described above, it has the following effects.
【００２４】表面エコーと裏面エコーにより厚さ伝播時
間測定を行い、さらに、あらかじめ定められた厚さ伝播
時間範囲との比較判定をすることにより、厚さ伝播時間
の測定誤差を小さくできる。By measuring the thickness propagation time by the front surface echo and the back surface echo, and further comparing and determining with the predetermined thickness propagation time range, the measurement error of the thickness propagation time can be reduced.
【００２５】また、表面エコーと裏面エコーにより厚さ
伝播時間測定を行い、さらに、表面エコー高さをあらか
じめ定められた表面エコー高さ判定値と比較判定をする
ことにより、厚さ伝播時間の測定誤差を小さくできる。Further, the thickness propagation time is measured by measuring the thickness propagation time by the front surface echo and the back surface echo, and by comparing the surface echo height with a predetermined surface echo height judgment value. The error can be reduced.
【００２６】また、表面エコーと裏面エコーにより厚さ
伝播時間測定を行い、さらに、裏面エコー高さをあらか
じめ定められた裏面エコー高さ判定値と比較判定をする
ことにより、厚さ伝播時間の測定誤差を小さくできる。Further, the thickness propagation time is measured by the front surface echo and the back surface echo, and the back surface echo height is compared with a predetermined back surface echo height determination value to determine the thickness propagation time. The error can be reduced.
【００２７】また、表面エコーと裏面エコーにより厚さ
伝播時間測定を行うことにより厚さ伝播時間測定のため
の処理時間が短縮できる。Further, the processing time for measuring the thickness propagation time can be shortened by measuring the thickness propagation time by the front surface echo and the back surface echo.
【図面の簡単な説明】[Brief description of drawings]
【図１】この発明の実施例１を示す超音波計測装置の構
成図である。FIG. 1 is a configuration diagram of an ultrasonic measurement device showing a first embodiment of the present invention.
【図２】この発明の実施例１を示す超音波計測装置の主
要タイミングを示す図である。FIG. 2 is a diagram showing main timings of the ultrasonic measurement device according to the first embodiment of the present invention.
【図３】この発明の実施例１を示す超音波計測装置の主
要タイミングを示す図である。FIG. 3 is a diagram showing main timings of the ultrasonic measurement device according to the first embodiment of the present invention.
【図４】この発明の実施例２を示す超音波計測装置の構
成図である。FIG. 4 is a configuration diagram of an ultrasonic measurement device showing a second embodiment of the present invention.
【図５】この発明の実施例３を示す超音波計測装置の構
成図である。FIG. 5 is a configuration diagram of an ultrasonic measurement device showing a third embodiment of the present invention.
【図６】従来の超音波計測装置の構成図である。FIG. 6 is a configuration diagram of a conventional ultrasonic measurement device.
【図７】従来の超音波計測装置の主要タイミングを示す
図である。FIG. 7 is a diagram showing main timings of a conventional ultrasonic measurement device.
１ 超音波計測装置 ２ 超音波探触子 ６ 送信部 ８ 受信部 ９ 表面ゲート発生部 １０ 裏面ゲート発生部 １１ 表面エコー伝播時間測定部 １２ 裏面エコー伝播時間測定部 １３ 同期部 １４ 厚さ伝播時間測定部 １５ 厚さ比較部 １６ 厚さデータ有効信号発生部 １７ 厚さデータ平均測定部 １８ 表面エコー高さ測定部 １９ 表面エコー高さ比較部 ２０ 表面エコーデータマスク発生部 ２１ 裏面エコー高さ測定部 ２２ 裏面エコー高さ比較部 ２３ 裏面エコーデータマスク発生部 DESCRIPTION OF SYMBOLS 1 Ultrasonic measuring device 2 Ultrasonic probe 6 Transmitting section 8 Receiving section 9 Surface gate generating section 10 Backside gate generating section 11 Surface echo propagation time measuring section 12 Backside echo propagation time measuring section 13 Synchronizing section 14 Thickness propagation time measurement Part 15 Thickness comparison unit 16 Thickness data valid signal generation unit 17 Thickness data average measurement unit 18 Surface echo height measurement unit 19 Surface echo height comparison unit 20 Surface echo data mask generation unit 21 Back surface echo height measurement unit 22 Backside echo height comparison section 23 Backside echo data mask generation section
Claims (3)
測装置において、送信信号を発生する送信部と、上記送
信部から生じる送信信号を超音波信号に変換して被検査
材に超音波を入射させるとともに、上記被検査材から反
射した超音波エコー信号を電気信号に変換する超音波探
触子と、上記超音波探触子で電気信号に変換された超音
波エコー信号を入力する受信部と、上記受信部からの出
力で被検査材表面からの表面エコー信号に設定するゲー
トを発生する表面ゲート発生部と、上記受信部からの出
力で被検査材裏面からの裏面エコー信号に設定するゲー
トを発生する裏面ゲート発生部と、上記表面ゲートの開
始点から上記表面エコーまでの伝播時間を測定する表面
エコー伝播時間測定部と、上記裏面ゲートの開始点から
上記裏面エコーまでの伝播時間を測定する裏面エコー伝
播時間測定部と、上記表面エコー伝播時間測定部と上記
裏面エコー伝播時間測定部の測定値により上記表面エコ
ーから上記裏面エコーまでの伝播時間を測定する厚さ伝
播時間測定部と、上記厚さ伝播時間測定部で測定した厚
さ伝播時間をあらかじめ定めた厚さ伝播時間範囲信号と
比較し、厚さ伝播時間範囲外のとき異常トリガ信号を発
生させる厚さ比較部と、上記厚さ比較部からの異常トリ
ガ信号によりデータ有効信号を発生する厚さデータ有効
信号発生部と、上記送信部、上記受信部、上記表面ゲー
ト発生部、上記裏面ゲート発生部、上記表面伝播時間測
定部、上記裏面伝播時間測定部、上記厚さ伝播時間測定
部、上記厚さ比較部、上記厚さデータ有効信号発生部に
それぞれトリガ信号を発生させる同期部と、上記厚さデ
ータ有効信号の発生時のみの上記厚さ伝播時間測定部の
出力を有効とし外部からの平均トリガ信号により平均す
る厚さデータ平均測定部とを備えたことを特徴とする超
音波計測装置。1. An ultrasonic measuring device using a water immersion method or a water column method, wherein a transmission section for generating a transmission signal and a transmission signal generated from the transmission section are converted into an ultrasonic signal and the ultrasonic wave is incident on a material to be inspected. Along with, an ultrasonic probe that converts the ultrasonic echo signal reflected from the material to be inspected into an electric signal, and a receiving unit that inputs the ultrasonic echo signal converted into an electric signal by the ultrasonic probe A surface gate generation unit that generates a gate for setting a surface echo signal from the surface of the material to be inspected by the output from the receiving unit, and a gate that sets a back surface echo signal from the back surface of the material to be inspected by the output from the receiving unit From the start point of the front surface gate to the front surface echo propagation time measurement section that measures the propagation time from the start point of the front surface gate to the front surface echo The back surface echo propagation time measuring section for measuring the propagation time of the, the thickness propagation for measuring the propagation time from the front surface echo to the back surface echo by the measurement values of the front surface echo propagation time measuring section and the back surface echo propagation time measuring section A thickness comparison that compares the thickness propagation time measured by the time measurement unit and the thickness propagation time measurement unit with a predetermined thickness propagation time range signal, and generates an abnormal trigger signal when the thickness propagation time range is out of the range. Section, a thickness data valid signal generating section for generating a data valid signal by an abnormal trigger signal from the thickness comparing section, the transmitting section, the receiving section, the front surface gate generating section, the back surface gate generating section, the Synchronization for generating a trigger signal in the front surface transit time measuring unit, the back surface transit time measuring unit, the thickness transit time measuring unit, the thickness comparing unit, and the thickness data valid signal generating unit, respectively. And a thickness data average measuring unit for averaging the output of the thickness transit time measuring unit only when the thickness data valid signal is generated and averaging by an average trigger signal from the outside. Sound wave measuring device.
測装置において、送信信号を発生する送信部と、上記送
信部から生じる送信信号を超音波信号に変換して被検査
材に超音波を入射させるとともに、上記被検査材から反
射した超音波エコー信号を電気信号に変換する超音波探
触子と、上記超音波探触子で電気信号に変換された超音
波エコー信号を入力する受信部と、上記受信部からの出
力で被検査材表面からの表面エコー信号に設定するゲー
トを発生する表面ゲート発生部と、上記受信部からの出
力で被検査材裏面からの裏面エコー信号に設定するゲー
トを発生する裏面ゲート発生部と、上記表面ゲートの開
始点から上記表面エコーまでの伝播時間を測定する表面
エコー伝播時間測定部と、上記裏面ゲートの開始点から
上記裏面エコーまでの伝播時間を測定する裏面エコー伝
播時間測定部と、上記表面エコー伝播時間測定部と上記
裏面エコー伝播時間測定部の測定値により上記表面エコ
ーから上記裏面エコーまでの伝播時間を測定する厚さ伝
播時間測定部と、上記表面ゲート内に存在する上記受信
部からの出力で被検査材表面からの表面エコー信号のエ
コー高さを測定する表面エコー高さ測定部と、上記表面
エコー高さ測定部で測定された表面エコー高さをあらか
じめ定めた判定値と比較し、判定値以下の表面エコー高
さのとき表面エコー高さ異常トリガ信号を発生させる表
面エコー高さ比較部と、上記表面エコー高さ比較部から
の表面エコー高さ異常トリガ信号により表面エコーデー
タマスク信号を発生する表面エコーデータマスク発生部
と、上記表面エコーデータマスク信号の非発生時のみの
上記厚さ伝播時間測定部の出力を有効とし外部からの平
均トリガ信号により平均する厚さデータ平均測定部とを
備えたことを特徴とする超音波計測装置。2. An ultrasonic measuring device using a water immersion method or a water column method, wherein a transmitting section for generating a transmitting signal and a transmitting signal generated from the transmitting section are converted into an ultrasonic signal and the ultrasonic wave is incident on a material to be inspected. Along with, an ultrasonic probe that converts the ultrasonic echo signal reflected from the material to be inspected into an electric signal, and a receiving unit that inputs the ultrasonic echo signal converted into an electric signal by the ultrasonic probe A surface gate generation unit that generates a gate for setting a surface echo signal from the surface of the material to be inspected by the output from the receiving unit, and a gate that sets a back surface echo signal from the back surface of the material to be inspected by the output from the receiving unit From the start point of the front surface gate to the front surface echo propagation time measurement section that measures the propagation time from the start point of the front surface gate to the front surface echo The back surface echo propagation time measuring section for measuring the propagation time of the, the thickness propagation for measuring the propagation time from the front surface echo to the back surface echo by the measurement values of the front surface echo propagation time measuring section and the back surface echo propagation time measuring section A time measuring unit, a surface echo height measuring unit for measuring the echo height of a surface echo signal from the surface of the material to be inspected by the output from the receiving unit existing in the surface gate, and the surface echo height measuring unit. Compare the surface echo height measured in step 3 with a predetermined judgment value, and if the surface echo height is less than the judgment value, generate a surface echo height abnormality trigger signal. A surface echo data mask generation unit for generating a surface echo data mask signal in response to a surface echo height abnormality trigger signal from the comparison unit, and the surface echo data mask signal Enable output of the thickness of the propagation time measuring unit of the non-generation time of only ultrasonic measuring apparatus characterized by comprising a thickness data measured average unit that averages the average trigger signal from the outside.
測装置において、送信信号を発生する送信部と、上記送
信部から生じる送信信号を超音波信号に変換して被検査
材に超音波を入射させるとともに、上記被検査材から反
射した超音波エコー信号を電気信号に変換する超音波探
触子と、上記超音波探触子で電気信号に変換された超音
波エコー信号を入力する受信部と、上記受信部からの出
力で被検査材表面からの表面エコー信号に設定するゲー
トを発生する表面ゲート発生部と、上記受信部からの出
力で被検査材裏面からの裏面エコー信号に設定するゲー
トを発生する裏面ゲート発生部と、上記表面ゲートの開
始点から上記表面エコーまでの伝播時間を測定する表面
エコー伝播時間測定部と、上記裏面ゲートの開始点から
上記裏面エコーまでの伝播時間を測定する裏面エコー伝
播時間測定部と、上記表面エコー伝播時間測定部と上記
裏面エコー伝播時間測定部の測定値により上記表面エコ
ーから上記裏面エコーまでの伝播時間を測定する厚さ伝
播時間測定部と、上記裏面ゲート内に存在する上記受信
部からの出力で被検査材裏面からの裏面エコー信号のエ
コー高さを測定する裏面エコー高さ測定部と、上記裏面
エコー高さ測定部で測定された裏面エコー高さをあらか
じめ定めた判定値と比較し、判定値以下の裏面エコー高
さのとき裏面エコー高さ異常トリガ信号を発生させる裏
面エコー高さ比較部と、上記裏面エコー高さ比較部から
の裏面エコー高さ異常トリガ信号により裏面エコーデー
タマスク信号を発生する裏面エコーデータマスク発生部
と、上記裏面エコーデータマスク信号の非発生時のみの
上記厚さ伝播時間測定部の出力を有効とし外部からの平
均トリガ信号により平均する厚さデータ平均測定部とを
備えたことを特徴とする超音波計測装置。3. An ultrasonic measuring device using a water immersion method or a water column method, wherein a transmission section for generating a transmission signal and a transmission signal generated from the transmission section are converted into an ultrasonic signal and the ultrasonic wave is incident on a material to be inspected. Along with, an ultrasonic probe that converts the ultrasonic echo signal reflected from the material to be inspected into an electric signal, and a receiving unit that inputs the ultrasonic echo signal converted into an electric signal by the ultrasonic probe A surface gate generation unit that generates a gate for setting a surface echo signal from the surface of the material to be inspected by the output from the receiving unit, and a gate that sets a back surface echo signal from the back surface of the material to be inspected by the output from the receiving unit From the start point of the front surface gate to the front surface echo propagation time measurement section that measures the propagation time from the start point of the front surface gate to the front surface echo The back surface echo propagation time measuring section for measuring the propagation time of the, the thickness propagation for measuring the propagation time from the front surface echo to the back surface echo by the measurement values of the front surface echo propagation time measuring section and the back surface echo propagation time measuring section A time measuring unit, a back surface echo height measuring unit that measures the echo height of a back surface echo signal from the back surface of the material to be inspected by the output from the receiving unit existing in the back surface gate, and the back surface echo height measuring unit. Compare the back echo height measured in step 3 with a predetermined judgment value, and if the back echo height is less than the judgment value, generate a back echo height abnormal trigger signal. The back surface echo data mask generation unit for generating a back surface echo data mask signal by the back surface echo height abnormality trigger signal from the comparison unit and the back surface echo data mask signal Enable output of the thickness of the propagation time measuring unit of the non-generation time of only ultrasonic measuring apparatus characterized by comprising a thickness data measured average unit that averages the average trigger signal from the outside.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5108198A JPH06317418A (en) | 1993-05-10 | 1993-05-10 | Ultrasonic measuring instrument |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5108198A JPH06317418A (en) | 1993-05-10 | 1993-05-10 | Ultrasonic measuring instrument |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH06317418A true JPH06317418A (en) | 1994-11-15 |
Family
ID=14478508
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5108198A Pending JPH06317418A (en) | 1993-05-10 | 1993-05-10 | Ultrasonic measuring instrument |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH06317418A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009156648A (en) * | 2007-12-26 | 2009-07-16 | Jfe Steel Corp | Measuring gap adjusting method and apparatus in ultrasonic flaw detection |
| WO2013114639A1 (en) * | 2012-01-31 | 2013-08-08 | Ｊｆｅスチール株式会社 | Ultrasonic flaw-detection method, ultrasonic flaw-detection device, and method for producing pipe material |
| CN114674257A (en) * | 2022-03-31 | 2022-06-28 | 中国空气动力研究与发展中心计算空气动力研究所 | High-precision thickness measuring method and device based on ultrasonic transverse wave detection |
-
1993
- 1993-05-10 JP JP5108198A patent/JPH06317418A/en active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009156648A (en) * | 2007-12-26 | 2009-07-16 | Jfe Steel Corp | Measuring gap adjusting method and apparatus in ultrasonic flaw detection |
| WO2013114639A1 (en) * | 2012-01-31 | 2013-08-08 | Ｊｆｅスチール株式会社 | Ultrasonic flaw-detection method, ultrasonic flaw-detection device, and method for producing pipe material |
| US9341599B2 (en) | 2012-01-31 | 2016-05-17 | Jfe Steel Corporation | Ultrasonic flaw detection method, ultrasonic flaw detection apparatus, and pipe manufacturing method |
| CN114674257A (en) * | 2022-03-31 | 2022-06-28 | 中国空气动力研究与发展中心计算空气动力研究所 | High-precision thickness measuring method and device based on ultrasonic transverse wave detection |
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