JPH0622950A - X-ray tomograph - Google Patents
X-ray tomographInfo
- Publication number
- JPH0622950A JPH0622950A JP4181140A JP18114092A JPH0622950A JP H0622950 A JPH0622950 A JP H0622950A JP 4181140 A JP4181140 A JP 4181140A JP 18114092 A JP18114092 A JP 18114092A JP H0622950 A JPH0622950 A JP H0622950A
- Authority
- JP
- Japan
- Prior art keywords
- ray
- gantry rotating
- signal
- waveform
- ray high
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000008054 signal transmission Effects 0.000 claims abstract description 27
- 238000005259 measurement Methods 0.000 claims abstract description 18
- 238000003384 imaging method Methods 0.000 claims description 18
- 230000003287 optical effect Effects 0.000 claims description 9
- 238000012423 maintenance Methods 0.000 description 16
- 230000005540 biological transmission Effects 0.000 description 14
- 238000010586 diagram Methods 0.000 description 8
- 239000000523 sample Substances 0.000 description 6
- 238000007689 inspection Methods 0.000 description 4
- 238000012544 monitoring process Methods 0.000 description 4
- 230000002159 abnormal effect Effects 0.000 description 3
- 238000003745 diagnosis Methods 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 230000007935 neutral effect Effects 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- 230000005856 abnormality Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 238000003325 tomography Methods 0.000 description 1
Abstract
Description
【０００１】[0001]
【産業上の利用分野】本発明は架台回転部に搭載された
Ｘ線高電圧装置等の各部の信号波形等のモニタが可能な
Ｘ線断層像撮影装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an X-ray tomographic imaging apparatus capable of monitoring signal waveforms of various parts such as an X-ray high voltage apparatus mounted on a gantry rotating section.
【０００２】[0002]
【従来の技術】Ｘ線断層像撮影装置は、架台回転部と固
定部とから構成されている。従来のＸ線断層像撮影装置
において、Ｘ線高電圧装置を構成するすべての部品、例
えば、高圧トランス、インバータ及び入力回路部は前記
架台回転部以外の場所、例えば固定部に配置され、Ｘ線
管は架台回転部に配置されていて、前記Ｘ線高電圧装置
と前記Ｘ線管とが高圧ケーブル等のケーブルにより接続
されている。2. Description of the Related Art An X-ray tomography apparatus is composed of a gantry rotating part and a fixed part. In a conventional X-ray tomographic imaging apparatus, all the components that make up the X-ray high-voltage apparatus, for example, the high-voltage transformer, the inverter, and the input circuit unit are arranged in a place other than the gantry rotating unit, for example, a fixed unit, The tube is arranged on the gantry rotating part, and the X-ray high voltage device and the X-ray tube are connected by a cable such as a high voltage cable.
【０００３】上記のようにＸ線高電圧装置を構成するす
べての部品が架台回転部の外部に配置されている場合に
は、例えば、Ｘ線管の管電圧及び管電流等の波形はＸ線
高電圧装置の高圧トランス等の波形を測定器によって測
定することによって、架台回転部の回転の有無に拘らず
容易に測定することができる。また、Ｘ線高電圧装置を
構成する部品の各部の波形も測定器により容易に測定を
行うことができる。When all the parts constituting the X-ray high voltage apparatus are arranged outside the gantry rotating section as described above, for example, the waveforms of the tube voltage and tube current of the X-ray tube are X-ray. By measuring the waveform of the high-voltage transformer or the like of the high-voltage device with a measuring instrument, it is possible to easily measure whether or not the gantry rotating part is rotating. Further, the waveform of each part of the parts constituting the X-ray high voltage apparatus can be easily measured by the measuring instrument.
【０００４】しかし、Ｘ線高電圧装置を構成する部品の
少なくとも１つが架台回転部に実装（搭載）され、電力
がスリップリングによって架台回転部に実装されたＸ線
高電圧装置を構成する部品に供給されるタイプのＸ線断
層像撮影装置においては、架台回転部に搭載されたＸ線
高電圧装置を構成する部品の波形を測定することが困難
であり、特に、架台回転部が回転中では、架台回転部に
搭載されたＸ線高電圧装置を構成する部品の波形等を測
定することは困難である。However, at least one of the components constituting the X-ray high-voltage device is mounted (mounted) on the gantry rotating part, and the power is mounted on the gantry rotating part by the slip ring. In the supplied X-ray tomographic imaging apparatus, it is difficult to measure the waveforms of the components that make up the X-ray high-voltage device mounted on the gantry rotating unit, and especially when the gantry rotating unit is rotating. It is difficult to measure the waveforms and the like of the components that make up the X-ray high-voltage device mounted on the gantry rotating unit.
【０００５】[0005]
【発明が解決しようとする課題】上記のように、Ｘ線高
電圧装置を構成する部品の少なくとも１つを架台回転部
に実装し、スリップリングにより、電力を架台回転部に
搭載されたＸ線高電圧装置を構成する部品に供給するタ
イプのＸ線断層像撮影装置では、前記Ｘ線高電圧装置を
構成する部品の波形の測定、特に、架台回転部の回転中
における前記Ｘ線高電圧装置を構成する部品の波形等の
測定が困難である。As described above, at least one of the components constituting the X-ray high voltage apparatus is mounted on the gantry rotating part, and the slip ring is used to supply electric power to the gantry rotating part. In an X-ray tomographic imaging apparatus of a type that supplies components to a high-voltage device, a waveform of a component forming the X-ray high-voltage device is measured, and in particular, the X-ray high-voltage device during rotation of a gantry rotating unit. It is difficult to measure the waveforms of the parts that make up the.
【０００６】本発明は、上記の事情に基づいてなされた
もので、Ｘ線断層像撮影装置の駆動部分、特に架台回転
部に実装されたＸ線高電圧装置を構成する部品の信号及
び波形等が架台回転部の回転中であっても測定可能なＸ
線断層像撮影装置を提供することを目的とする。The present invention has been made based on the above-mentioned circumstances, and signals and waveforms of parts constituting the driving portion of the X-ray tomographic imaging apparatus, particularly the X-ray high voltage apparatus mounted on the gantry rotating portion, etc. X that can be measured even while the gantry rotating part is rotating
An object is to provide a line tomographic imaging apparatus.
【０００７】[0007]
【課題を解決するための手段】本発明は、上記の課題を
解決するために次のような手段を講じた。The present invention has taken the following means in order to solve the above problems.
【０００８】本発明のＸ線断層像撮影装置は、架台回転
部を有し、前記架台回転部にＸ線高電圧装置を構成する
部品の少なくとも１つが搭載されていて、前記架台回転
部と前記架台回転部の外部との間にＸ線高電圧装置の測
定信号の信号伝送手段を備え、前記架台回転部に搭載さ
れた前記Ｘ線高電圧装置と前記架台回転部の外部に配置
された機器との信号伝送を前記信号伝送手段により行う
ことを特徴とする。The X-ray tomographic imaging apparatus of the present invention has a gantry rotating unit, and at least one of the components constituting the X-ray high-voltage device is mounted on the gantry rotating unit, and the gantry rotating unit and the A device for transmitting a measurement signal of an X-ray high voltage device to the outside of the gantry rotating part, the X-ray high voltage device mounted on the gantry rotating part, and a device arranged outside the gantry rotating part. And the signal transmission is performed by the signal transmission means.
【０００９】更に、本発明のＸ線断層像撮影装置は、前
記架台回転部に前記Ｘ線高電圧装置の各部の信号を測定
する測定器を搭載するスペース、或いは、前記Ｘ線高電
圧装置の各部の信号を測定する測定器を搭載したことを
特徴とする。Further, in the X-ray tomographic imaging apparatus of the present invention, a space for mounting a measuring device for measuring signals of each part of the X-ray high-voltage apparatus on the gantry rotating section, or the X-ray high-voltage apparatus is provided. It is characterized in that it is equipped with a measuring device for measuring the signal of each part.
【００１０】加えて、本発明のＸ線断層像撮影装置は、
Ｘ線高電圧装置の架台回転部への搭載の有無に限らず、
架台回転部に搭載された光学系機器、検出器及びデータ
収集システムの少なくとも１つの各部の信号を測定する
測定器を搭載するスペース、或いは、それらの各部の信
号を測定する測定器を搭載したことを特徴とする。In addition, the X-ray tomographic imaging apparatus of the present invention is
Whether or not the X-ray high voltage device is mounted on the gantry rotating part,
At least one of the optical system equipment mounted on the gantry rotating part, the detector, and the measuring device for measuring the signal of each part of the data acquisition system, or the mounting of the measuring device for measuring the signal of each part. Is characterized by.
【００１１】[0011]
【作用】上記手段を講じた結果、次のような作用が生じ
る。As a result of taking the above-mentioned means, the following effects occur.
【００１２】Ｘ線断層像撮影装置の架台回転部と架台回
転部の外部、例えば固定部との間にメンテナンス用信号
の波形信号及び制御信号等を伝達する手段を備えたの
で、架台回転部に搭載されたＸ線高電圧装置等の波形測
定が容易になり、メンテナンス、保守点検を実用的に行
うことができる。更に、前記Ｘ線高電圧装置等の波形測
定が容易であるので、故障原因の把握が容易になり、メ
ンテナンス、保守点検の時間が短くなる。また、メンテ
ナンス、保守点検が容易になるので、装置の信頼性が向
上する。Since the means for transmitting the waveform signal of the maintenance signal and the control signal are provided between the gantry rotating part of the X-ray tomographic imaging apparatus and the outside of the gantry rotating part, for example, the fixed part, the gantry rotating part is provided. Waveform measurement of the mounted X-ray high-voltage device becomes easy, and maintenance and maintenance inspection can be practically performed. Further, since it is easy to measure the waveform of the X-ray high voltage device and the like, the cause of the failure can be easily grasped, and the time for maintenance and maintenance inspection can be shortened. Further, since the maintenance and the inspection are facilitated, the reliability of the device is improved.
【００１３】[0013]
【実施例】図面を参照して本発明のＸ線断層像撮影装置
の実施例を説明する。図１は本発明の一実施例に係るＸ
線断層像撮影装置（以下、Ｘ線ＣＴスキャナと称する）
の概略構成を示す図である。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the X-ray tomographic imaging apparatus of the present invention will be described with reference to the drawings. FIG. 1 shows an X according to an embodiment of the present invention.
X-ray CT scanner (hereinafter referred to as X-ray CT scanner)
It is a figure which shows schematic structure of.
【００１４】Ｘ線ＣＴスキャナは架台回転部（駆動部）
と架台回転部以外の部分、例えば固定部により構成され
る。図１において、架台回転部１０は、図示しないＸ線
管、検出器等を搭載し、その中心に被診断物が挿入され
て、前記被診断物にＸ線を照射することによって、診断
を行うように構成されている。本発明のＸ線ＣＴスキャ
ナの架台回転部１０にはＸ線高電圧装置１１が搭載さ
れ、そのＸ線高電圧装置１１が信号伝送手段２０を介し
て架台回転部１０の外部に配置された波形モニタ３０及
び制御部３５に接続されている。Ｘ線高電圧装置１１
は、基本的に高圧トランス、インバータ及び入力回路部
により構成される。本実施例において、このＸ線高電圧
装置のすべての構成部品が架台回転部１０に搭載されて
いても良いし、その一部、例えば、高圧トランスのみ
が、架台回転部１０に搭載されていても良い。以下の説
明では、Ｘ線高電圧装置１１を構成するすべての部品が
架台回転部１０に搭載されているものと仮定する。The X-ray CT scanner is a gantry rotating unit (driving unit)
And a part other than the gantry rotating part, for example, a fixed part. In FIG. 1, the gantry rotating unit 10 is equipped with an X-ray tube, a detector, and the like (not shown), a diagnosis target is inserted in the center thereof, and the diagnosis is performed by irradiating the diagnosis target with X-rays. Is configured. An X-ray high-voltage device 11 is mounted on the gantry rotating part 10 of the X-ray CT scanner of the present invention, and the X-ray high-voltage device 11 is arranged outside the gantry rotating part 10 via the signal transmission means 20. It is connected to the monitor 30 and the control unit 35. X-ray high voltage device 11
Is basically composed of a high voltage transformer, an inverter and an input circuit section. In this embodiment, all the components of this X-ray high voltage apparatus may be mounted on the gantry rotating part 10, or only a part of them, for example, the high voltage transformer may be mounted on the gantry rotating part 10. Is also good. In the following description, it is assumed that all the components forming the X-ray high voltage apparatus 11 are mounted on the gantry rotating unit 10.
【００１５】上記のような構成により、Ｘ線ＣＴスキャ
ナの架台回転部１０に搭載されたＸ線高電圧装置１１の
波形（或いは、信号。以下「波形」という）が信号伝送
手段２０により波形モニタ３０に出力されて、容易に波
形を観察することができる。そして、波形モニタ３０の
観察結果により、制御部３５により信号伝送手段２０を
介して信号をＸ線高電圧装置１１に伝送し、波形調整等
を行うことが可能になる。With the above-mentioned configuration, the waveform (or signal; hereinafter referred to as "waveform") of the X-ray high-voltage device 11 mounted on the gantry rotating part 10 of the X-ray CT scanner is monitored by the signal transmitting means 20. It is output to 30, and the waveform can be easily observed. Then, based on the observation result of the waveform monitor 30, the control unit 35 can transmit the signal to the X-ray high-voltage device 11 via the signal transmission unit 20 to adjust the waveform.
【００１６】従って、架台回転部１０とその外部との間
に信号伝送手段２０を設けることにより、架台回転部１
０が回転中であっても、架台回転部１０に搭載されたＸ
線高電圧装置１１の波形が容易に観察できると共に、そ
の波形に異常がみられた場合には、容易に波形調整を行
うことができる。特に、架台回転部１０にＸ線高電圧装
置が搭載されたＸ線ＣＴスキャナでは、架台回転部１０
が回転中のＸ線管の管電流、管電圧、更にはＸ線管の各
部の波形等を測定するのに有効である。Therefore, by providing the signal transmission means 20 between the gantry rotating unit 10 and the outside thereof, the gantry rotating unit 1
Even if 0 is rotating, X mounted on the gantry rotating unit 10
The waveform of the line high-voltage device 11 can be easily observed, and when the waveform is abnormal, the waveform can be easily adjusted. Particularly, in the X-ray CT scanner in which the X-ray high voltage device is mounted on the gantry rotating unit 10, the gantry rotating unit 10
Is effective for measuring the tube current and tube voltage of the rotating X-ray tube, and further the waveform of each part of the X-ray tube.
【００１７】図２は、図１において架台回転部１０に測
定器１２（例えば、オシロスコープ）及びＸ線高電圧装
置１１が搭載された場合の詳細図を示す。図２におい
て、図１と同じ部分には同じ符号を付し、詳細な説明は
省略する。図２の場合には、測定器１２が架台回転部１
０に搭載されているので、図１における波形モニタ３０
は必要でなく、単に、波形を表示するためのディスプレ
イでよい。 図２によれば、架台回転部１０には、測定
器１２等の搭載用スペース１５が設けられており、この
搭載用スペース１５に測定器１２が配置されていて、他
の場所にＸ線管１３、Ｘ線高電圧装置１１及び伝送用コ
ネクタ１６が配置されている。伝送用コネクタ１６に測
定器１２が信号伝送ライン１７により接続されている。
Ｘ線高電圧装置１１には、伝送用コネクタ１６と測定器
１２とが図示しない信号伝送ラインで接続されている。
また、Ｘ線高電圧装置１１とＸ線管１３とは図示しない
高電圧ケーブルで接続されている。更に、Ｘ線高電圧装
置１１には図示しない電源ケーブルにより電力が供給さ
れる。この電力は図示しないスリップリングにより供給
される。また、伝送用コネクタ１６は信号伝送手段２０
を介して架台回転部１０の外部の機器との信号伝送を行
う。上記のように構成された本発明装置について説明す
る。FIG. 2 is a detailed view showing a case in which the measuring device 12 (for example, an oscilloscope) and the X-ray high voltage device 11 are mounted on the gantry rotating part 10 in FIG. 2, the same parts as those in FIG. 1 are designated by the same reference numerals, and detailed description thereof will be omitted. In the case of FIG. 2, the measuring device 12 is the gantry rotating unit 1.
0, so the waveform monitor 30 in FIG.
Is not necessary and may simply be a display for displaying the waveform. According to FIG. 2, the gantry rotating part 10 is provided with a mounting space 15 for the measuring device 12, etc., and the measuring device 12 is arranged in this mounting space 15, and the X-ray tube is arranged in another place. 13, an X-ray high voltage device 11 and a transmission connector 16 are arranged. The measuring device 12 is connected to the transmission connector 16 by a signal transmission line 17.
A transmission connector 16 and a measuring instrument 12 are connected to the X-ray high voltage device 11 by a signal transmission line (not shown).
Further, the X-ray high voltage device 11 and the X-ray tube 13 are connected by a high voltage cable (not shown). Further, power is supplied to the X-ray high voltage device 11 by a power cable (not shown). This electric power is supplied by a slip ring (not shown). Further, the transmission connector 16 is the signal transmission means 20.
Signals are transmitted to devices outside the gantry rotating unit 10 via the. The device of the present invention configured as described above will be described.
【００１８】まず、信号伝送手段２０（例えば、光伝送
による手段）を介して外部の制御部３５により測定器１
２の測定開始を行う。次に、架台回転部１０が回転を開
始して、Ｘ線管１３がＸ線を照射するとＸ線高電圧装置
１１の各部の信号が図示しない信号ケーブルを介して測
定器１２に入力する。測定器１２で測定された波形は、
伝送用コネクタ１６及び信号伝送手段２０を介して架台
回転部１０の外部の機器（例えば、波形モニタ３０）に
出力されて観察される。First, the measuring device 1 is controlled by the external control unit 35 via the signal transmission means 20 (for example, means by optical transmission).
2. Start measurement of 2. Next, when the gantry rotating unit 10 starts rotating and the X-ray tube 13 irradiates X-rays, the signals of the respective units of the X-ray high-voltage device 11 are input to the measuring device 12 via a signal cable (not shown). The waveform measured by the measuring device 12 is
It is output to an external device (for example, a waveform monitor 30) outside the gantry rotating section 10 via the transmission connector 16 and the signal transmission means 20 and observed.
【００１９】観察された波形に異常がある場合には、制
御部３５（例えば、パーソナルコンピュータ）から制御
信号を、信号伝送手段２０及び信号伝送用コネクタ１６
を介してＸ線高電圧装置１１に出力して、Ｘ線高電圧装
置１１の制御を行う。When the observed waveform is abnormal, a control signal is sent from the control unit 35 (for example, a personal computer) to the signal transmission means 20 and the signal transmission connector 16.
To the X-ray high voltage device 11 to control the X-ray high voltage device 11.
【００２０】更に、測定器１２から得られた波形を同様
に信号伝送手段２０を介して架台回転部１０の外部装置
に送り、波形モニタ３０による測定波形のモニタもしく
は測定結果のパソコンのモニタ等への表示、或いは、波
形モニタ用としての用途のみでなく、データの授受を行
うことも可能である。更に、波形等のモニタにより外部
からＸ線高電圧装置１１を制御することも可能である。Further, the waveform obtained from the measuring device 12 is similarly sent to an external device of the gantry rotating part 10 via the signal transmitting means 20, and is sent to the monitor of the measured waveform by the waveform monitor 30 or the monitor of the personal computer of the measurement result. It is also possible to send and receive data in addition to the display of or for use as a waveform monitor. Further, it is possible to control the X-ray high voltage device 11 from the outside by monitoring the waveform or the like.
【００２１】従って、本発明によれば、架台回転部１０
が回転中であっても架台回転部１０に搭載されたＸ線高
電圧装置１１の各部の波形等のメンテナンス情報を架台
回転部１０の波形モニタ３０等の外部の機器に容易に出
力することができ、かつ、容易に制御部３５等の外部機
器からＸ線高電圧装置１１の制御を行うことができる。Therefore, according to the present invention, the gantry rotating unit 10
Even while rotating, the maintenance information such as the waveform of each part of the X-ray high-voltage device 11 mounted on the gantry rotating unit 10 can be easily output to an external device such as the waveform monitor 30 of the gantry rotating unit 10. In addition, the X-ray high voltage apparatus 11 can be controlled easily from an external device such as the control unit 35.
【００２２】上記のような構成により、架台回転部１０
が回転中であっても波形観測が可能となり、あたかも、
Ｘ線高電圧装置１１等が架台回転部１０以外の場所に配
置された別置きの固定システムとほぼ同様の測定が可能
となる。With the above structure, the gantry rotating unit 10
It is possible to observe the waveform even when the is rotating, as if
The X-ray high-voltage device 11 and the like can perform almost the same measurement as a separately-installed fixed system arranged in a place other than the gantry rotating unit 10.
【００２３】更に、Ｘ線の曝射中であっても、信号伝送
手段２０の信号伝送用ラインをスキャナ室（操作室）ま
で延長することにより、作業者が被ばくすることなく架
台回転部１０に搭載された各Ｘ線高電圧装置１１の信号
測定が可能となる。また、信号伝送手段２０の信号伝送
用ラインをＸ線ＣＴスキャナのコンソール（操作盤）に
接続することにより、コンソールのキーボード、モニタ
等を利用して信号伝送を行うことができる。Further, even during X-ray exposure, by extending the signal transmission line of the signal transmission means 20 to the scanner room (operation room), the gantry rotating section 10 can be exposed without being exposed to an operator. It becomes possible to measure the signal of each mounted X-ray high voltage device 11. Also, by connecting the signal transmission line of the signal transmission means 20 to the console (operation panel) of the X-ray CT scanner, signal transmission can be performed using the keyboard, monitor, etc. of the console.
【００２４】上記より、本発明による機能はＸ線高電圧
装置１１（或いはＸ線制御部４０）を架台回転部１０に
実装するタイプのＸ線ＣＴ装置において特に有効であ
る。従って、本発明のＸ線ＣＴスキャナにより、架台回
転部１０に搭載されたＸ線高電圧装置１１、特にＸ線高
電圧装置１１の各部の波形を架台回転部１０の回転の有
無、Ｘ線曝射の有無に拘らず安全にモニタしたり、各部
の電圧及び電流を確認したりすることができる。From the above, the function according to the present invention is particularly effective in the X-ray CT apparatus of the type in which the X-ray high voltage apparatus 11 (or the X-ray control section 40) is mounted on the gantry rotating section 10. Therefore, with the X-ray CT scanner of the present invention, the waveforms of the X-ray high-voltage device 11 mounted on the gantry rotating unit 10, especially the waveforms of each part of the X-ray high-voltage device 11, are checked for the presence or absence of rotation of the gantry rotating unit 10 and the X-ray exposure. It is possible to safely monitor and check the voltage and current of each part regardless of the presence or absence of radiation.
【００２５】上記の実施例は、Ｘ線高電圧装置１１を架
台回転部１０へ実装した場合について述べたが、Ｘ線高
電圧装置１１を架台回転部１０への実装の有無に拘らず
適用可能であり、架台回転部１０に搭載されたコリメー
タ、ウェッジ等のＸ線光学系の機器の制御信号の送受
信、或いは、その他の機器の外部波形のモニタにも応用
できる。The above embodiment has been described with respect to the case where the X-ray high voltage apparatus 11 is mounted on the gantry rotating section 10, but the X-ray high voltage apparatus 11 can be applied regardless of whether the X-ray high voltage apparatus 11 is mounted on the gantry rotating section 10. The present invention can also be applied to transmission / reception of control signals of X-ray optical system devices such as collimators and wedges mounted on the gantry rotating unit 10, or monitoring of external waveforms of other devices.
【００２６】従って、本発明は、検出器、データ収集シ
ステム（ＤＡＳ）の信号、波形のモニタにも応用可能で
あり、従来、確認できなかった異常も容易に確認できる
ようになり、メンテナンス時間の短縮並びに装置の信頼
性の向上に寄与する。図３は、図１のように構成された
装置におけるＸ線高電圧装置１１の測定手順を示すフロ
ーチャートである。Therefore, the present invention can be applied to the detector, the signal of the data acquisition system (DAS), and the monitor of the waveform, and it becomes possible to easily confirm the abnormality which could not be confirmed in the past, and the maintenance time is reduced. It contributes to shortening and improvement of device reliability. FIG. 3 is a flowchart showing a measurement procedure of the X-ray high voltage device 11 in the device configured as shown in FIG.
【００２７】まず、制御部１０で測定器を設定し、測定
の開始信号を伝送する（ステップＳ１）。次に、スキャ
ン等の動作を開始し（ステップＳ２）、動作中の測定結
果（例えば、波形データ等）を波形モニタ３０に伝送す
る。そして、図示しない計算機等で所定の処理（例え
ば、データの表示・記録等）を行う（ステップＳ３）。
すべての操作が終了したら、本操作は終了する（ステッ
プＳ４）。First, the control unit 10 sets a measuring instrument and transmits a measurement start signal (step S1). Next, an operation such as scanning is started (step S2), and the measurement result during operation (for example, waveform data etc.) is transmitted to the waveform monitor 30. Then, predetermined processing (for example, display / recording of data) is performed by a computer (not shown) or the like (step S3).
When all the operations are completed, this operation is completed (step S4).
【００２８】上記のようにして、架台回転部１０に搭載
されたＸ線高電圧装置１１の特性（例えば、電流、電圧
等）の測定が可能である。また、図３のステップＳ３に
おいて、架台回転部１０に搭載されたＸ線高電圧装置１
１に信号を出力してＸ線高電圧装置１１の制御を行うこ
ともできる。As described above, the characteristics (for example, current, voltage, etc.) of the X-ray high voltage device 11 mounted on the gantry rotating part 10 can be measured. Moreover, in step S3 of FIG. 3, the X-ray high-voltage apparatus 1 mounted on the gantry rotating unit 10
It is also possible to output a signal to control the X-ray high voltage device 11.
【００２９】次に、図４及び図５を参照して、具体的に
信号を取り出して波形観察を行う場合の例について説明
する。図４は、Ｘ線管１３に高電圧を加える場合に波形
を観察する部分を示す回路図、図５は、図４の回路図か
ら取り出した波形を示す図である。ここで、図４の回路
がすべて回転架台部１０に搭載されているものと仮定す
る。Next, with reference to FIGS. 4 and 5, an example will be described in which a signal is specifically taken out and waveform observation is performed. FIG. 4 is a circuit diagram showing a portion for observing a waveform when a high voltage is applied to the X-ray tube 13, and FIG. 5 is a diagram showing a waveform extracted from the circuit diagram of FIG. Here, it is assumed that all the circuits in FIG. 4 are mounted on the rotary mount 10.
【００３０】図４の回路において、Ｘ線制御部４０から
出力された電圧は高圧トランス４１により電圧変換され
て、整流器４２で整流されてＸ線管１３に加えられる。
この電圧によりＸ線管１３がＸ線を発生する。In the circuit of FIG. 4, the voltage output from the X-ray controller 40 is converted into a voltage by the high-voltage transformer 41, rectified by the rectifier 42, and applied to the X-ray tube 13.
This voltage causes the X-ray tube 13 to generate X-rays.
【００３１】ここで、Ｘ線高電圧装置１１の測定は、例
えば、Ｘ線管１３の管電圧及び管電流をモニタする場合
には、図４のようなブリーダ出力及び中性点電流の検出
点にテストポイントを予め設けておけば、オシロスコー
プのプローブをこれらの各点に接続することにより測定
できる。この測定結果を信号伝送手段２０により架台回
転部１０の外部装置へ出力することにより回路の所望の
部分の波形が容易に観察できる。Here, in the measurement of the X-ray high voltage device 11, for example, when the tube voltage and the tube current of the X-ray tube 13 are monitored, the bleeder output and the neutral point current detection points as shown in FIG. 4 are detected. If test points are provided in advance, measurement can be performed by connecting an oscilloscope probe to each of these points. By outputting the measurement result to the external device of the gantry rotating section 10 by the signal transmitting means 20, the waveform of a desired portion of the circuit can be easily observed.
【００３２】例えば、陽極側管電圧はＴＰ１−ＴＰ０間
にプローブを接続すれば、陰極側中性点電流（管電流）
はＴＰ２−ＴＰ０間にプローブを接続すればモニタする
ことができる。この測定は、オペアンプ等の回路を構成
することにより、陽極−陰極間の測定を行うことも容易
にできる。例えば、図５（ａ）及び図５（ｂ）に示すよ
うな波形が波形モニタ３０により観察された場合につい
て説明する。For example, for the anode side tube voltage, if a probe is connected between TP1 and TP0, the cathode side neutral point current (tube current).
Can be monitored by connecting a probe between TP2 and TP0. This measurement can be easily performed between the anode and the cathode by configuring a circuit such as an operational amplifier. For example, a case where the waveforms shown in FIGS. 5A and 5B are observed by the waveform monitor 30 will be described.
【００３３】ＴＰ０−ＴＰ１間の図５（ａ）の波形が所
望の波形出力とした場合において、ＴＰ０−ＴＰ２間で
図５（ｂ）の波形が波形モニタ３０で観察された場合に
は、その観察結果を表示或いは記録する。そして、必要
な場合には、外部装置、例えば制御部３５から信号をＸ
線制御部４０に出力して、図５（ｂ）の波形の調整を行
う。従って、本発明によれば、架台回転部１０の外部か
ら容易に架台回転部１０に搭載されたＸ線高電圧装置１
１から出力される波形を観察することができ、その波形
が所望の出力波形でない場合には架台回転部１０の外部
から容易にその調整を行うことができる。When the waveform of FIG. 5A between TP0 and TP1 is the desired waveform output, and when the waveform of FIG. 5B is observed between TP0 and TP2 on the waveform monitor 30, the Display or record the observation results. Then, when necessary, an X signal is transmitted from an external device, for example, the control unit 35.
It is output to the line control unit 40 and the waveform shown in FIG. 5B is adjusted. Therefore, according to the present invention, the X-ray high-voltage apparatus 1 easily mounted on the gantry rotating part 10 from the outside of the gantry rotating part 10.
The waveform output from 1 can be observed, and when the waveform is not the desired output waveform, the adjustment can be easily performed from the outside of the gantry rotating unit 10.
【００３４】また、クランプ式電流プローブをオシロス
コープに接続すれば、容易に各部の電流波形をモニタす
ることも可能である。制御波形等も同様に予めテストポ
イントを設けておけば容易に測定可能である。テストポ
イントが無い場合では、オシロスコープのプローブが接
続できたり、電流プローブが挿入できれば同様に接続で
きる。Also, by connecting the clamp type current probe to an oscilloscope, it is possible to easily monitor the current waveform of each part. Similarly, the control waveform and the like can be easily measured by providing test points in advance. If there is no test point, the oscilloscope probe can be connected, or if a current probe can be inserted, it can be connected in the same way.
【００３５】架台停止時（回転しないとき）には、別置
きのオシロスコープでの測定も可能であるが、回転時に
は測定ができないので、スキャン（架台回転部１０が回
転を行いながら曝射を行う）中の管電圧、管電流波形等
のモニタに本発明は非常に有効である。本発明は、上記
実施例に限定されない。When the gantry is stopped (when it does not rotate), it is possible to perform measurement with a separate oscilloscope, but it is not possible to make measurements when it is rotated, so a scan (exposure is performed while the gantry rotating unit 10 rotates). The present invention is very effective for monitoring the inside tube voltage and tube current waveform. The present invention is not limited to the above embodiment.
【００３６】実施例において、信号伝送手段２０として
光伝送手段を挙げたが、光伝送によって信号伝送を行う
場合には、信号の多重化を行うことによって、それほど
のコストアップなしにメンテナンス用の信号ラインを確
保できる。また、信号伝送手段２０として光伝送手段に
限らずスリップリングを用いた場合でも、信号の多重化
により光伝送の場合と同様のことが実現できる。In the embodiment, the optical transmission means is mentioned as the signal transmission means 20, but in the case of performing the signal transmission by the optical transmission, the signals for maintenance can be obtained without increasing the cost by multiplexing the signals. The line can be secured. Further, not only the optical transmission means but also the slip ring as the signal transmission means 20 can realize the same as the case of the optical transmission by multiplexing the signals.
【００３７】更に、信号伝送手段２０は、上記の光伝送
或いはスリップリングに限らず、電波、光の空間伝送等
を用いても良い。また、信号伝送手段２０に、例えば、
ＲＳ−２３２Ｃ、ＧＰ−ＩＢ等を用いることにより、測
定器１２の制御は勿論、波形転送も可能である。また、
ＲＳ−２３２Ｃ、ＧＰ−ＩＢの信号に限定されず、場合
によっては、アナログ信号を直接に伝送するか、或い
は、Ａ／Ｄ変換した後に伝送しても良い。Further, the signal transmission means 20 is not limited to the above-mentioned optical transmission or slip ring, but may use radio waves, spatial transmission of light, or the like. In addition, in the signal transmission means 20, for example,
By using RS-232C, GP-IB or the like, not only the control of the measuring device 12 but also the waveform transfer is possible. Also,
The signal is not limited to the RS-232C and GP-IB signals, and depending on the case, an analog signal may be directly transmitted or may be A / D converted and then transmitted.
【００３８】信号伝送手段２０によって伝送される転送
データは、上記のようにデータとして保管することも勿
論可能である。転送データは、架台回転部１０の外部機
器（例えば、コンソール、計算機等）により正常データ
と異常データ等の比較にも活用できる。The transfer data transmitted by the signal transmitting means 20 can of course be stored as data as described above. The transferred data can also be used for comparison between normal data and abnormal data by an external device (eg, console, computer, etc.) of the gantry rotating unit 10.
【００３９】測定器１２（オシロスコープ等）は、メン
テナンス時のみ回転架台部に搭載して接続しても良い
し、常時回転架台部に実装されていても良い。測定器１
２の種類は、オシロスコープは勿論、テスタ、電圧計、
電流計、管電圧計、管電流計、線量計等いずれであって
も良いし、市販の測定器に限らず、測定機能を有するも
のであれば、装置内部に組み込まれたものでも良いし、
装置の一部であっても良い。また、複数の測定器を同時
に用いても良いし、切り換えて、もしくは、載せ替えて
測定を行っても良い。その他、本発明の要旨を変更しな
い範囲で種々変形して実施できるのは勿論である。The measuring device 12 (oscilloscope or the like) may be mounted on the rotary mount part for connection only during maintenance, or may be always mounted on the rotary mount part. Measuring instrument 1
The two types are oscilloscope, tester, voltmeter,
It may be any of an ammeter, a tube voltmeter, a tube ammeter, a dosimeter, etc., and it is not limited to a commercially available measuring instrument, and any instrument having a measuring function may be incorporated in the apparatus,
It may be part of the device. Also, a plurality of measuring devices may be used at the same time, or the measurement may be performed by switching or remounting. Of course, various modifications can be made without departing from the scope of the present invention.
【００４０】[0040]
【発明の効果】本発明によれば次のような効果が得られ
る。According to the present invention, the following effects can be obtained.
【００４１】Ｘ線断層像撮影装置の架台回転部と架台回
転部の外部、例えば固定部との間にメンテナンス用信号
の波形信号及び制御信号等を伝達する手段を備えたの
で、架台回転部に搭載されたＸ線高電圧装置、特にＸ線
高電圧装置を構成する部品の波形測定が容易になり、メ
ンテナンス、保守点検を実用的に行うことができる。更
に、前記Ｘ線高電圧装置を構成する部品の波形測定が容
易であるので、故障原因の把握が容易になり、メンテナ
ンス、保守点検の時間が短くなる。また、メンテナン
ス、保守点検が容易になるので、装置の信頼性が向上す
る。Since the means for transmitting the waveform signal of the maintenance signal and the control signal are provided between the gantry rotating part of the X-ray tomographic imaging apparatus and the outside of the gantry rotating part, for example, the fixed part, the gantry rotating part is provided. It becomes easy to measure the waveform of the mounted X-ray high-voltage device, especially the components that form the X-ray high-voltage device, and maintenance and maintenance can be practically performed. Furthermore, since it is easy to measure the waveforms of the components that make up the X-ray high-voltage device, the cause of failure can be easily grasped, and the time required for maintenance and maintenance can be shortened. Further, since the maintenance and the inspection are facilitated, the reliability of the device is improved.
【図１】本発明のＸ線ＣＴスキャナの一実施例を示す概
略構成図。FIG. 1 is a schematic configuration diagram showing an embodiment of an X-ray CT scanner of the present invention.
【図２】図１の架台回転部に測定器等が搭載された場合
の例を示す図。FIG. 2 is a diagram showing an example in which a measuring device or the like is mounted on the gantry rotating part of FIG.
【図３】本発明による測定の流れを示す図。FIG. 3 is a diagram showing a flow of measurement according to the present invention.
【図４】本発明により信号を取り出す場合の信号の取り
出し位置を示す図。FIG. 4 is a diagram showing a signal extraction position when a signal is extracted according to the present invention.
【図５】図４の回路から取り出した信号の波形例を示す
図。5 is a diagram showing an example of a waveform of a signal extracted from the circuit of FIG.
１０…架台回転部、１１…Ｘ線高電圧装置、１２…測定
器、１３…Ｘ線管、１５…搭載スペース、１６…伝送用
コネクタ、２０…信号伝送手段、３０…波形モニタ、３
５…制御部、４０…Ｘ線制御部、４１…高圧トランス、
４２…整流器。10 ... Stand rotating part, 11 ... X-ray high voltage device, 12 ... Measuring device, 13 ... X-ray tube, 15 ... Mounting space, 16 ... Transmission connector, 20 ... Signal transmitting means, 30 ... Waveform monitor, 3
5 ... Control unit, 40 ... X-ray control unit, 41 ... High-voltage transformer,
42 ... Rectifier.
Claims (5)
線高電圧装置を構成する部品の少なくとも１つが搭載さ
れたＸ線断層像撮影装置において、前記架台回転部と前
記架台回転部の外部との間にＸ線高電圧装置の測定信号
の信号伝送手段を備え、前記架台回転部に搭載された前
記Ｘ線高電圧装置と前記架台回転部の外部に配置された
機器との信号伝送を前記信号伝送手段により行うことを
特徴とするＸ線断層像撮影装置。1. A gantry rotating part, wherein the gantry rotating part is X-shaped.
In an X-ray tomographic imaging apparatus equipped with at least one of the components constituting the X-ray high-voltage device, a signal transmission means for a measurement signal of the X-ray high-voltage device between the gantry rotating unit and the outside of the gantry rotating unit. And a signal transmission between the X-ray high-voltage device mounted on the gantry rotating part and a device arranged outside the gantry rotating part is performed by the signal transmitting means. apparatus.
各部の信号を測定する測定器を搭載するスペースを設け
たことを特徴とする請求項１記載のＸ線断層像撮影装
置。2. The X-ray tomographic imaging apparatus according to claim 1, wherein a space for mounting a measuring device for measuring a signal of each part of the X-ray high-voltage device is provided in the gantry rotating part.
各部の信号を測定する測定器を搭載したことを特徴とす
る請求項１記載のＸ線断層像撮影装置。3. The X-ray tomographic imaging apparatus according to claim 1, wherein the gantry rotating unit is equipped with a measuring device for measuring a signal of each unit of the X-ray high-voltage apparatus.
学系機器、検出器及びデータ収集システムの少なくとも
１つの電気機器が搭載されたＸ線断層像撮影装置におい
て、前記架台回転部に搭載された前記電気機器の各部の
信号を測定する測定器を搭載するスペースを設けたこと
を特徴とするＸ線断層像撮影装置。4. An X-ray tomographic imaging apparatus having a gantry rotating part, wherein at least one electric device of an optical system device, a detector and a data acquisition system is mounted on the gantry rotating part. An X-ray tomographic imaging apparatus having a space for mounting a measuring device for measuring a signal of each part of the mounted electric device.
信号を測定する測定器を搭載したことを特徴とする請求
項４記載のＸ線断層像撮影装置。5. The X-ray tomographic imaging apparatus according to claim 4, wherein the gantry rotating part is equipped with a measuring device for measuring signals of each part of the electric device.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4181140A JPH0622950A (en) | 1992-07-08 | 1992-07-08 | X-ray tomograph |
| US08/087,055 US5434900A (en) | 1992-07-08 | 1993-07-07 | Computed tomography apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4181140A JPH0622950A (en) | 1992-07-08 | 1992-07-08 | X-ray tomograph |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0622950A true JPH0622950A (en) | 1994-02-01 |
Family
ID=16095592
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4181140A Pending JPH0622950A (en) | 1992-07-08 | 1992-07-08 | X-ray tomograph |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0622950A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002034967A (en) * | 2000-07-21 | 2002-02-05 | Hitachi Medical Corp | X-ray ct apparatus |
| WO2003092336A1 (en) * | 2002-04-24 | 2003-11-06 | Hamamatsu Photonics K.K. | X-ray tube operating state acquiring device, x-ray tube operating sate acquiring system, and x-ray tube operating state acquiring method |
| KR20200119327A (en) | 2018-03-23 | 2020-10-19 | 닛폰세이테츠 가부시키가이샤 | Induction heating method of metal strip and induction heating equipment |
-
1992
- 1992-07-08 JP JP4181140A patent/JPH0622950A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002034967A (en) * | 2000-07-21 | 2002-02-05 | Hitachi Medical Corp | X-ray ct apparatus |
| WO2003092336A1 (en) * | 2002-04-24 | 2003-11-06 | Hamamatsu Photonics K.K. | X-ray tube operating state acquiring device, x-ray tube operating sate acquiring system, and x-ray tube operating state acquiring method |
| KR20200119327A (en) | 2018-03-23 | 2020-10-19 | 닛폰세이테츠 가부시키가이샤 | Induction heating method of metal strip and induction heating equipment |
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