JPH0619262B2 - Method of measuring smoothness of coated surface - Google Patents
Method of measuring smoothness of coated surfaceInfo
- Publication number
- JPH0619262B2 JPH0619262B2 JP61161935A JP16193586A JPH0619262B2 JP H0619262 B2 JPH0619262 B2 JP H0619262B2 JP 61161935 A JP61161935 A JP 61161935A JP 16193586 A JP16193586 A JP 16193586A JP H0619262 B2 JPH0619262 B2 JP H0619262B2
- Authority
- JP
- Japan
- Prior art keywords
- coated surface
- image
- data
- smoothness
- vertical stripe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、自動車のボデー等の塗面へ格子を通して光照
射し、その格子像を基に塗面の平滑性を測定する塗面の
平滑性測定方法に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Industrial field of application] The present invention irradiates a coated surface of an automobile body or the like with light through a lattice, and measures the smoothness of the coated surface based on the lattice image. The present invention relates to a sex measuring method.
従来、このような格子像を測定する場合、フォトダイオ
ードが直線状に配列されたリニヤイメージセンサを用
い、そのアナログ出力信号のセンサに沿った光強度分布
から塗面の平滑性を評価していた。したがって、人の視
覚に頼るもので、また面的な評価も難しいために高精度
の測定はできなかった。さらに、塗面の平滑性の情報を
２次元で写真記録することもできなかった。Conventionally, when measuring such a lattice image, a linear image sensor in which photodiodes are linearly arranged is used, and the smoothness of the coated surface is evaluated from the light intensity distribution of the analog output signal along the sensor. . Therefore, it is impossible to perform highly accurate measurement because it depends on human vision and it is difficult to make a face-to-face evaluation. Furthermore, information on the smoothness of the coated surface could not be recorded in a two-dimensional manner.
よって、本発明は２次元面をより高精度に評価可能にす
る冒頭に述べた類の塗面の平滑性測定方法を提供するこ
とを目的とする。Therefore, an object of the present invention is to provide a method for measuring the smoothness of a coated surface of the kind described at the beginning that enables a two-dimensional surface to be evaluated with higher accuracy.
本発明は、この目的を達成するために、塗面を縦縞格子
（第２図ａ）を通して光照射し、塗面の凹凸で反射角の
変動した反射光を２次元イメージセンサで撮像し、その
マトリックス状画素の画像信号（第２図ｂ）を第１図に
示す手順により統計処理した。In order to achieve this object, the present invention irradiates a coated surface with light through a vertical stripe grating (Fig. 2a), images reflected light whose reflection angle varies due to unevenness of the coated surface with a two-dimensional image sensor, and The image signals of the matrix-like pixels (Fig. 2b) were statistically processed by the procedure shown in Fig. 1.
即ち、各画像信号を複数階調の輝度レベルに弁別し、そ
の平均値を基に設定された基準レベルを上廻るか下廻る
かにより、各画像信号を２値化し、マトリックス状画素
に対応するアドレスを有するメモリに各画素の２値化デ
ータをストアする。この状態で、縦縞格子画像はボケの
ない明確な画像にできる（第２図ｃ）。メモリを縦縞格
子と直交するアドレス方向に読出し走査することにより
２値化データのいずれか一方のデータの連続する間隔、
例えば第２図ｃの格子間の間隔Ｄ１、Ｄ２、Ｄ３、…を
アドレス数として演算する。このようにして得られた所
定範囲の塗面にわたり変動する可能性のある間隔データ
の分布を統計的に処理して塗面品質を判定する（第２図
ｄ）。That is, each image signal is discriminated into luminance levels of a plurality of gradations, and each image signal is binarized to correspond to a matrix-like pixel depending on whether it exceeds or falls below a reference level set based on the average value. Binary data of each pixel is stored in a memory having an address. In this state, the vertical stripe lattice image can be a clear image without blurring (Fig. 2c). By reading and scanning the memory in the address direction orthogonal to the vertical stripe lattice, either one of the binarized data has a continuous interval,
For example, the intervals D 1 , D 2 , D 3 , ... Between the lattices in FIG. 2C are calculated as the number of addresses. The quality of the coating surface is determined by statistically processing the distribution of the interval data obtained in this way, which may fluctuate over a predetermined range of the coating surface (FIG. 2d).
第３図は、本発明による方法を実施する塗面の平滑性測
定方法を示すもので、１０はバンド１０ａを備えた携帯
用塗面撮像装置である。この装置は、開口１０ｂを備え
た遮光性のケースにより構成され、底面に磁石６を備え
ることにより測定される塗面１に吸着させると共に、開
口１０ｂからの光漏れを防止するためにその周囲には遮
光用弾性体、例えばウレタン７が取付けられている。ケ
ース内の入射側円筒には入射角θを３０゜〜６０゜程度
にするように光源１１と、光むらを解消させる拡散板１
２と、集光レンズ１３と、縦縞格子１４と、投影レンズ
１５とが順に収納されている。反射角度θに対応した撮
像側の筒には、集光レンズ１６が収納されると共に後部
からイメージセンサとしてＣＣＤカメラ１７が装着され
ている。光源１１及びＣＣＤカメラ１７は、スイッチ５
ａが投入されることにより直流電源５から給電される。
縦縞格子１４のピッチはコンマ数ミリ程度であり、これ
が塗面１の数センチ平方の領域に投影され、縦縞格子１
４のピッチは凹凸波長が１〜５mm程度であるゆず肌を測
定できるようにコンマ数ミリ〜数ミリ程度のピッチに拡
大投影される。その反射像は、マトリックス状の縦横が
数ミリ平方で例えば５１２×５１２個の画素を有するＣ
ＣＤカメラ１７に入射する。このＣＣＤカメラには、画
像処理装置としてのマイクロコンピュータ２０と、ブラ
ウン管表示装置２１が付属している。FIG. 3 shows a method for measuring the smoothness of the coated surface for carrying out the method according to the present invention, and 10 is a portable coated surface image pickup device equipped with a band 10a. This device is composed of a light-shielding case having an opening 10b, and a magnet 6 is provided on the bottom surface to adsorb it on the coating surface 1 to be measured and to prevent light leakage from the opening 10b around it. Is attached with a light-shielding elastic body such as urethane 7. The incident side cylinder in the case has a light source 11 so that the incident angle θ is about 30 ° to 60 °, and a diffusion plate 1 for eliminating uneven light.
2, a condenser lens 13, a vertical stripe grating 14, and a projection lens 15 are housed in that order. A condenser lens 16 is housed in a tube on the imaging side corresponding to the reflection angle θ, and a CCD camera 17 as an image sensor is mounted from the rear. The light source 11 and the CCD camera 17 have a switch 5
When a is turned on, power is supplied from the DC power supply 5.
The pitch of the vertical stripe grating 14 is about a few millimeters, which is projected onto a region of a few centimeters square of the coated surface 1 and the vertical stripe grating 1
The pitch of No. 4 is enlarged and projected to a pitch of a few millimeters to a few millimeters of a comma so that a yuzu skin having an uneven wavelength of 1 to 5 mm can be measured. The reflection image is a matrix having a matrix of several millimeters in length and width and having, for example, 512 × 512 pixels.
It is incident on the CD camera 17. A microcomputer 20 as an image processing device and a cathode ray tube display device 21 are attached to the CCD camera.
マイクロコンピュータ２０は、動作手順及びゆず肌レベ
ルを標準偏差を基準にして例えば１０段階にランク付け
するテーブルを格納しているＲＯＭ２０ａと、ＣＣＤカ
メラ１７のマトリックス状画素に対応したアドレスの記
憶領域を２個有し、一方にはＣＣＤカメラ１７の各画素
の画像信号の輝度レベルを６４階調に弁別した画像デー
タをストアし、他方には統計処理された画像データをス
トアするＲＡＭ２０ｂと、これらのメモリと協働して次
ぎのような演算を行うＣＰＵ２０ｃを含んでいる。即
ち、A/D変換してＲＡＭ２０ｂにストアしされた各画素
の６４階調の画像信号レベルを平均演算し、その平均値
ＭＬを算出する。各画素の信号レベルとこの平均値ＭＬ
を比較して各画素の画像信号を黒白レベルの０か又は１
に２値化する。この２値化データをストアしたＲＡＭ２
０ｂを縦縞格子１４と直交方向に対応するアドレス方向
に読出し走査することにより、０（黒）レベルの連続す
るアドレス数をカウントして、間隔データＤ１、Ｄ２、
Ｄ３、…Ｄｎを作成する。次いで、各間隔データの平均
値ＭＤを演算し、この平均値ＭＤに対する間隔データの
標準偏差σ を算出する（ｎ：間隔データの数）。The microcomputer 20 stores a ROM 20a that stores a table that ranks the operating procedure and the skin level in, for example, 10 steps based on the standard deviation, and a storage area of an address corresponding to the matrix-shaped pixels of the CCD camera 17. A RAM 20b for storing image data in which the brightness level of the image signal of each pixel of the CCD camera 17 is discriminated into 64 gradations is stored in one, and a statistically processed image data is stored in the other, and these memories. It includes a CPU 20c that performs the following calculation in cooperation with. That is, the image signal level of 64 gradations of each pixel which is A / D converted and stored in the RAM 20b is averaged, and the average value M L is calculated. The signal level of each pixel and this average value M L
And the image signal of each pixel is compared with 0 or 1 of the black and white level.
Binarize to. RAM2 that stores this binary data
By reading and scanning 0b in the address direction corresponding to the direction orthogonal to the vertical stripe lattice 14, the number of consecutive addresses of 0 (black) level is counted, and the interval data D 1 , D 2 ,
Create D 3 , ... D n . Next, the average value M D of each interval data is calculated, and the standard deviation σ of the interval data with respect to this average value M D. Is calculated (n: number of interval data).
この演算結果をＲＯＭ２０ａに格納されたテーブルと参
照し、ゆず肌レベルを判定して表示器２２において対応
する数値１〜１０で表示させる。ブラウン管表示装置２
１は、ＲＡＭ２０ｂにストアされているＣＣＤカメラ１
７の出力画像信号又は２値化された画像信号をキーボー
ド２３の操作により選択的に表示する。その外、このキ
ーボードは動作の始動或は必要な場合ブラウン管表示装
置２１のワーキングエリア２１ａを設定してその領域を
マイクロコンピュータ２０へ指示する等を行う。The calculation result is referred to the table stored in the ROM 20a to determine the orange level, and the display 22 displays the corresponding numerical values 1 to 10. CRT display 2
1 is a CCD camera 1 stored in the RAM 20b
The output image signal of No. 7 or the binarized image signal is selectively displayed by operating the keyboard 23. In addition, the keyboard starts operation or sets a working area 21a of the cathode ray tube display device 21 when necessary, and instructs the microcomputer 20 to the working area 21a.
このように構成された塗面の平滑性測定装置の動作を第
４図及び第５図を参照して説明する。The operation of the coating surface smoothness measuring apparatus thus configured will be described with reference to FIGS. 4 and 5.
縦縞格子１４のゆず肌粗面を有する塗面１における反射
像は、縦縞像の幅をその波長に応じて種々に変動させて
ＣＣＤカメラ１７へ入射する。キーボード２３の操作に
よりマイクロコンピュータ２０を始動させ、塗面１の輝
度の変動する５１２×５１２個の画素の画像信号を逐次
A/D変換器２０ｄによりディジタル化し、輝度レベルデ
ータとしてＲＡＭ２０ｂの対応するアドレスにストアす
る。そしてブラウン管表示装置２１に表示させて、測定
範囲に応じてワーキングエリア２１ａを設定する。次い
で、このエリアの各輝度レベルデータを平均して平均値
ＭＬを算出し、前述の２値化データをＲＡＭ２０ｂにス
トアする。続いて、ＲＡＭ２０ｂを横方向にアドレス走
査し、データ０の連続するアドレスをカウントすること
により第５図に示すように間隔データＤ１、Ｄ２、Ｄ３
…Ｄｎを作成してＲＡＭ２０ｂにストアする。さらに、
これらの間隔データの平均値ＭＤを算出して、前述の式
（１）に従い標準偏差σを算出する。そしてＲＯＭ２０
ａのテーブルと対照させてゆず肌レベルを表示器２２に
数値表示させる。キーボード２３の操作で２値化データ
はD/A変換器２０ｅによりアナログ化されてブラウン管
表示装置２１において輪郭の明確なゆず肌像として表示
させ得、これを写真記録することもできる。The reflected image on the coating surface 1 having the rough textured surface of the vertical stripe grating 14 is incident on the CCD camera 17 with the width of the vertical stripe image being variously changed according to its wavelength. The microcomputer 20 is started by operating the keyboard 23, and the image signals of 512 × 512 pixels in which the brightness of the coated surface 1 fluctuates are sequentially obtained.
It is digitized by the A / D converter 20d and stored as the brightness level data in the corresponding address of the RAM 20b. Then, it is displayed on the cathode ray tube display device 21, and the working area 21a is set according to the measurement range. Next, each brightness level data in this area is averaged to calculate an average value M L , and the above-mentioned binarized data is stored in the RAM 20b. Subsequently, the RAM 20b is horizontally scanned to count the consecutive addresses of data 0, and as shown in FIG. 5, the interval data D 1 , D 2 , and D 3 are counted.
... store in RAM20b to create a D n. further,
It calculates an average value M D of the interval data, calculates a standard deviation σ according to equation (1) above. And ROM20
The yuzu skin level is numerically displayed on the display 22 in contrast with the table of a. By operating the keyboard 23, the binarized data can be analogized by the D / A converter 20e and can be displayed on the CRT display 21 as a clear skin image with clear contours, which can also be photographed.
尚、前述の実施例において、間隔データは格子像中心点
間のピッチ等にすることもできる。In the above-mentioned embodiment, the interval data may be the pitch between the lattice image center points.
以上、本発明によれば、広い範囲の塗面の平滑性、即ち
ゆず肌状態の高精度の定量評価が可能になる。ゆず肌状
態に対応する２値化の鮮明な格子状画像の写真記録での
評価も可能になる。画像信号の輝度レベルの平均値を基
に設定した基準レベルを基準にして２値化したデータを
処理することにより、周囲の明るさの変動に起因する画
像信号レベルの変動を回避して、絶えず高精度に測定で
きる。As described above, according to the present invention, it is possible to perform a highly accurate quantitative evaluation of the smoothness of the coated surface in a wide range, that is, the condition of the yuzu skin. It is also possible to evaluate a binarized clear grid-like image corresponding to the yuzu-skin condition by photographic recording. By processing the binarized data based on the reference level set based on the average value of the brightness level of the image signal, the fluctuation of the image signal level due to the fluctuation of the ambient brightness is avoided, and the data is constantly processed. Can measure with high accuracy.
第１図は本発明の方法を説明するためのフローチャー
ト、第２図は本発明の作用を説明する図、第３図は本発
明による方法を実施するための装置を示す構造図及び付
属回路図、第４図は同実施例の動作を説明するフローチ
ャート並びに第５図は同実施例の演算動作を説明する図
である。 １……塗面、１１……光源、１４……縦縞格子、１７…
…ＣＣＤカメラ。FIG. 1 is a flow chart for explaining the method of the present invention, FIG. 2 is a diagram for explaining the operation of the present invention, and FIG. 3 is a structural diagram and an accompanying circuit diagram showing an apparatus for carrying out the method of the present invention. FIG. 4 is a flow chart for explaining the operation of the same embodiment, and FIG. 5 is a view for explaining the arithmetic operation of the same embodiment. 1 ... Painted surface, 11 ... Light source, 14 ... Vertical stripe grid, 17 ...
... CCD camera.
Claims (1)
イメージセンサで撮像し、 このイメージセンサのマトリックス状画素の各画像信号
を複数階調の輝度レベルに弁別し、 前記各画像信号の前記輝度レベルの平均値を基に設定さ
れた基準レベルを上廻るか下廻るかにより、前記各画像
信号を２値化し、 この２値化データを前記マトリックス状画素に対応する
アドレスを有するメモリにストアし、 このメモリを前記縦縞格子と直交方向に対応するアドレ
ス方向に読出し走査することにより前記２値化データの
いずれか一方の値の連続する間隔を前記アドレスの数と
して算出し、 前記所定範囲にわたり変動する可能性のある前記間隔デ
ータの分布を統計的に処理して前記塗面の平滑性を判定
することを特徴とする塗面の平滑性測定方法。1. A coating surface is illuminated with light through a vertical stripe grating, and the reflected light of the illuminated illuminated surface of the coating surface is imaged by a two-dimensional image sensor, and each image signal of matrix pixels of the image sensor is imaged. Discriminating into brightness levels of a plurality of gradations, each of the image signals is binarized depending on whether it is above or below a reference level set based on the average value of the brightness levels of each of the image signals. The binarized data is stored in a memory having an address corresponding to the matrix pixel, and the memory is read out and scanned in an address direction corresponding to a direction orthogonal to the vertical stripe lattice so that one of the values of the binarized data is stored. A continuous interval is calculated as the number of the addresses, and the distribution of the interval data that may fluctuate over the predetermined range is statistically processed to determine the smoothness of the coated surface. Smoothness measuring method of the coated surface, characterized in Rukoto.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61161935A JPH0619262B2 (en) | 1986-07-11 | 1986-07-11 | Method of measuring smoothness of coated surface |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61161935A JPH0619262B2 (en) | 1986-07-11 | 1986-07-11 | Method of measuring smoothness of coated surface |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6318210A JPS6318210A (en) | 1988-01-26 |
| JPH0619262B2 true JPH0619262B2 (en) | 1994-03-16 |
Family
ID=15744834
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61161935A Expired - Lifetime JPH0619262B2 (en) | 1986-07-11 | 1986-07-11 | Method of measuring smoothness of coated surface |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0619262B2 (en) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2521729B2 (en) * | 1986-10-16 | 1996-08-07 | 株式会社東海理化電機製作所 | Flatness measuring device |
| JP2581133B2 (en) * | 1988-02-18 | 1997-02-12 | トヨタ自動車株式会社 | Automatic inspection system for coating smoothness |
| JP2508176B2 (en) * | 1988-02-22 | 1996-06-19 | トヨタ自動車株式会社 | Automatic surface smoothness inspection device |
| US5078496A (en) * | 1990-08-14 | 1992-01-07 | Autospect, Inc. | Machine vision surface characterization system |
| JP6699263B2 (en) * | 2016-03-17 | 2020-05-27 | 株式会社リコー | Inspection equipment |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60183808U (en) * | 1985-04-16 | 1985-12-06 | 三菱電機株式会社 | surface inspection equipment |
-
1986
- 1986-07-11 JP JP61161935A patent/JPH0619262B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6318210A (en) | 1988-01-26 |
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