JPH061691A - Vapor crystal growth device - Google Patents

Vapor crystal growth device

Info

Publication number
JPH061691A
JPH061691A JP19158192A JP19158192A JPH061691A JP H061691 A JPH061691 A JP H061691A JP 19158192 A JP19158192 A JP 19158192A JP 19158192 A JP19158192 A JP 19158192A JP H061691 A JPH061691 A JP H061691A
Authority
JP
Japan
Prior art keywords
reaction tube
reaction
crystal growth
vapor phase
wafer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19158192A
Other languages
Japanese (ja)
Inventor
Kenichi Ono
健一 小野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP19158192A priority Critical patent/JPH061691A/en
Publication of JPH061691A publication Critical patent/JPH061691A/en
Pending legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)
  • Recrystallisation Techniques (AREA)

Abstract

PURPOSE:To reduce a reaction product depositing on the outer wall of a reaction tube on the downstream side and to easily remove the deposit in the MOCVD device. CONSTITUTION:A heater 7 is provided outside a reaction tube 1 on the downstream side to heat the outer wall, and a pipe 5 (thin pipe) easy to detach and in which a cooling agent 6 is circulated is furnished in the reaction tube 1 on the downstream side of a wafer 3. Consequently, a reaction product 10 is collected in the pipe 5 and is easily removed from the reaction tube 1.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明は気相結晶成長装置に関
し、特に管内の堆積物の除去が簡便な気相結晶成長装置
に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a vapor phase crystal growth apparatus, and more particularly to a vapor phase crystal growth apparatus in which deposits in a tube can be easily removed.

【0002】[0002]

【従来の技術】図4は、例えば従来の縦型炉と呼ばれる
反応管を有する有機金属気相結晶成長(Metal Organic
Chemical Vapor Deposition ;MOCVD)装置の、反
応管周りの断面図である。
2. Description of the Related Art FIG. 4 shows, for example, a metal organic vapor phase crystal growth (Metal Organic) having a reaction tube called a conventional vertical furnace.
FIG. 2 is a cross-sectional view of a reaction tube of a Chemical Vapor Deposition (MOCVD) device.

【0003】図において、1は反応管、4は反応管1内
に配置され、その上にインジウムリン基板等の被処理ウ
ェハ3を搭載するためのウェハ支持体である。また2
は、トリメチルインジウム,トリメチルガリウム,ホス
フィン,アルシンといった反応ガスであり、反応管1の
上方から導入されるようになっている。10は管内の下
流側に堆積した反応生成物である。また、11は排気系
配管である。
In the figure, 1 is a reaction tube, and 4 is a wafer support which is arranged in the reaction tube 1 and on which a wafer to be processed 3 such as an indium phosphide substrate is mounted. Again 2
Is a reaction gas such as trimethylindium, trimethylgallium, phosphine, and arsine, and is introduced from above the reaction tube 1. 10 is a reaction product deposited on the downstream side in the pipe. Reference numeral 11 is an exhaust system pipe.

【0004】次に結晶成長時の動作について説明する。
反応管1内へ送り込まれた反応ガス2は、ウェハ支持台
4の抵抗加熱等により加熱されたウェハ3上で分解し、
ウェハ3上に所定の組成比を有する結晶を成長する。こ
のとき加熱分解されたがウェハ3上に結晶成長しなかっ
た反応ガス2の残りは反応管1下流の外壁近くで冷やさ
れてそこに多く析出し、堆積した反応生成物10とな
る。
Next, the operation during crystal growth will be described.
The reaction gas 2 sent into the reaction tube 1 is decomposed on the wafer 3 heated by resistance heating of the wafer support base 4 or the like,
A crystal having a predetermined composition ratio is grown on the wafer 3. At this time, the rest of the reaction gas 2 which has been decomposed by heating but has not grown crystals on the wafer 3 is cooled near the outer wall of the downstream side of the reaction tube 1 and a large amount of the reaction gas 2 is deposited there to become the deposited reaction product 10.

【0005】[0005]

【発明が解決しようとする課題】従来の気相結晶成長装
置は以上のように構成されており、反応管内に堆積した
付着物の量が増えるにつれ、排気系配管の内径が小さく
なり、ついには配管が詰まってしまうこととなり、この
ため反応管を大気開放して付着物を取り除く補修作業が
必要になる。このため反応管の形状によっては反応管,
排気系配管全てを取り外して洗浄する大作業になり、ま
た除塵機で付着物を取り除く作業を行うと、人体に有害
な飛沫が空中に飛散したり、リン系の付着物の場合には
除塵作業中に発火する危険があるといった問題点があっ
た。
The conventional vapor phase crystal growth apparatus is constructed as described above, and as the amount of deposits deposited in the reaction tube increases, the inner diameter of the exhaust system pipe becomes smaller, and finally, The piping will be clogged, which requires repair work to open the reaction tube to the atmosphere and remove deposits. Therefore, depending on the shape of the reaction tube,
It becomes a big work to remove all the exhaust system piping and clean it, and if the dust remover is used to remove the adhered substances, splashes harmful to the human body will be scattered in the air, and if the adhered substances are phosphorus-based, the dust removing work will be performed. There was a problem that there was a danger of ignition.

【0006】この発明は上記のような問題点を解消する
ためになされたもので、下流側配管への反応生成物の付
着を減らすとともに、付着物の除去作業を簡便化できる
気相結晶成長装置を得ることを目的としている。
The present invention has been made to solve the above-mentioned problems, and a vapor phase crystal growth apparatus capable of reducing the adhesion of reaction products to the downstream side pipe and simplifying the work of removing the adhered materials. The purpose is to get.

【0007】[0007]

【課題を解決するための手段】この発明に係る気相結晶
成長装置は、反応管内の、該反応管内に配置されたウェ
ハよりも下流に、取り外し自在な冷却器を設けたもので
ある。
In the vapor phase crystal growth apparatus according to the present invention, a detachable cooler is provided in the reaction tube downstream of the wafer arranged in the reaction tube.

【0008】[0008]

【作用】この発明においては、ウェハよりも下流に取り
外し自在な冷却器を設けたから、反応生成物は冷却器の
周囲に集まり、反応管内から容易に除去することができ
る。
In the present invention, since the removable cooler is provided downstream of the wafer, the reaction products gather around the cooler and can be easily removed from the reaction tube.

【0009】[0009]

【実施例】以下、この発明の実施例を図について説明す
る。 実施例1.図1(a) は本発明の第1の実施例によるMO
CVD装置の反応管周りの断面図であり、図1(b) はそ
のb−b線での断面図であり、図4と同一符号は同一ま
たは相当部分を示し、5は反応管1内のウェハ3下流側
に配置された冷却管、6は冷却管5内を流れる冷却剤、
7は反応管1外部下流側に巻かれたヒータである。また
上記冷却管5近傍の反応管1の側壁には、冷却管5の取
り出しを行うための開口窓12が設けられ、またその対
向する側壁面には冷却管5を固定するためのジョイント
部13が設けられている。
Embodiments of the present invention will be described below with reference to the drawings. Example 1. FIG. 1A shows an MO according to the first embodiment of the present invention.
1 (b) is a sectional view taken along the line bb in FIG. 1, in which the same reference numerals as those in FIG. 4 denote the same or corresponding parts, and 5 denotes the inside of the reaction tube 1. A cooling pipe arranged on the downstream side of the wafer 3, 6 is a coolant flowing in the cooling pipe 5,
Reference numeral 7 is a heater wound on the downstream side outside the reaction tube 1. Further, an opening window 12 for taking out the cooling pipe 5 is provided on the side wall of the reaction tube 1 near the cooling pipe 5, and a joint portion 13 for fixing the cooling pipe 5 is provided on the opposing side wall surface. Is provided.

【0010】次に結晶成長時の装置の動作について説明
する。反応管1内へ送り込まれた反応ガス2は、ウェハ
支持台4の抵抗加熱等により加熱されたウェハ3上で分
解し、ウェハ3上に所定の組成比を有する結晶を成長す
る。このとき加熱分解されたがウェハ3上に結晶成長し
なかった反応ガス2の残りは反応管1下流の外壁近くで
冷やされてそこに多く析出し、堆積した反応生成物とな
る。
Next, the operation of the apparatus during crystal growth will be described. The reaction gas 2 fed into the reaction tube 1 is decomposed on the wafer 3 heated by resistance heating of the wafer support 4 or the like, and a crystal having a predetermined composition ratio is grown on the wafer 3. At this time, the rest of the reaction gas 2 that has been thermally decomposed but has not grown crystals on the wafer 3 is cooled near the outer wall of the downstream side of the reaction tube 1 and a large amount thereof is deposited there to become a deposited reaction product.

【0011】反応管1へ送り込まれた反応ガス2は、ウ
ェハ支持体4により加熱されたウェハ3上で分解,堆積
するが、未成長分のすでに加熱分解された反応ガス2は
反応管1下流側へと流れる。ここで、従来例において
は、反応管1外壁で冷却され、付着していた生成物は、
配管ヒータ7により反応管1外壁の温度が高く、冷却管
5の周囲において温度が低いために、主に冷却管5の周
囲に付着する(図中10参照)ことになる。そして開口
窓12を開けるとともに、冷却管5をジョイント部13
から取り外し、冷却管5を反応管1内から取り出してこ
れを洗浄するようにする。
The reaction gas 2 sent to the reaction tube 1 is decomposed and deposited on the wafer 3 heated by the wafer support 4, but the reaction gas 2 which has not been grown and has already been decomposed by heating is downstream of the reaction tube 1. Flowing to the side. Here, in the conventional example, the product cooled and attached to the outer wall of the reaction tube 1 is
Since the temperature of the outer wall of the reaction tube 1 is high and the temperature is low around the cooling tube 5 due to the pipe heater 7, it is mainly attached to the periphery of the cooling tube 5 (see 10 in the figure). Then, the opening window 12 is opened, and the cooling pipe 5 is connected to the joint portion 13
Then, the cooling pipe 5 is taken out of the reaction pipe 1 and washed.

【0012】このように本実施例によれば、反応管1内
のウエハ3下流側に冷却管5を設けるとともに、反応管
1外部下流側にヒータ7を設けたから、結晶成長時に加
熱分解されたのち結晶成長に関与しなかった未反応ガス
は温度の低い冷却管5で主に捕集され、反応管1下流の
外壁近くに堆積する反応生成物が少なくなり、また集め
られた反応生成物10は冷却管5を取り外すことにより
容易に反応管1内から除去することができる。また、本
実施例では反応管1外部下流側にヒータ7を設けている
ので、排気系配管11近傍での反応生成物の析出をさら
に低減することができる。
As described above, according to this embodiment, since the cooling pipe 5 is provided on the downstream side of the wafer 3 in the reaction tube 1 and the heater 7 is provided on the downstream side outside the reaction tube 1, it is thermally decomposed during crystal growth. After that, the unreacted gas not involved in the crystal growth is mainly collected by the cooling pipe 5 having a low temperature, the reaction products deposited near the outer wall downstream of the reaction pipe 1 are reduced, and the collected reaction products 10 Can be easily removed from the reaction tube 1 by removing the cooling tube 5. Further, in the present embodiment, since the heater 7 is provided on the downstream side outside the reaction tube 1, precipitation of reaction products in the vicinity of the exhaust system pipe 11 can be further reduced.

【0013】実施例2.図2は本発明の第2の実施例に
よるMOCVD装置であり、図に示すようにこの実施例
では、冷却管8を反応ガス2の流れに対して垂直な面内
で蛇行させるようにしたものである。このようにするこ
とで、上記第1の実施例よりも冷却効果が高まり、反応
生成物の捕集効果をより期待することができる。なお、
この実施例では反応生成物は図示を省略されている。
Example 2. FIG. 2 shows an MOCVD apparatus according to a second embodiment of the present invention. As shown in the drawing, in this embodiment, the cooling pipe 8 is made to meander in a plane perpendicular to the flow of the reaction gas 2. Is. By doing so, the cooling effect is enhanced more than in the first embodiment, and the collection effect of the reaction product can be expected more. In addition,
In this example, the reaction product is not shown.

【0014】実施例3.図3は本発明の第3の実施例に
よるMOCVD装置であり、図に示すようにこの実施例
では、冷却管9を反応ガス2の流れに対して垂直な面内
で蛇行させるとともに、反応ガス2の流れに対して平行
に複数の層をなすように構成したものである。
Example 3. FIG. 3 shows an MOCVD apparatus according to a third embodiment of the present invention. In this embodiment, as shown in the figure, the cooling pipe 9 is made to meander in a plane perpendicular to the flow of the reaction gas 2 and the reaction gas is It is configured such that a plurality of layers are formed in parallel to the two flows.

【0015】なお、上記実施例では、反応管1として縦
型のものを示したが、横型,バレル型、その他どのよう
な反応管形状を持つ装置であっても同様の効果を奏す
る。また、MOCVD装置のみでなく、クロライバVP
E等、他の気相結晶成長装置であってもよい。また上記
冷却管5,8,9の材質は、ステンレス等、洗浄しやす
いもので管内を汚さないものであればどのようなもので
もよいが、石英管等にすると酸処理等を容易に行うこと
ができる。
In the above embodiment, the vertical type reaction tube 1 is shown, but the same effect can be obtained with any type of reaction tube shape such as a horizontal type or a barrel type. Also, not only MOCVD equipment but also Chloriba VP
Other vapor phase crystal growth apparatus such as E may be used. The cooling pipes 5, 8 and 9 may be made of any material, such as stainless steel, which is easy to wash and does not stain the inside of the pipe, but a quartz pipe or the like facilitates acid treatment. You can

【0016】また、上記冷却管5,8,9の表面にフィ
ン等を設ける等の加工を施し、その表面積を増大するよ
うにしてもよい。また、上記各実施例では反応管1に開
口窓12を設けて冷却管5,8,9を取り出すようにし
たが、冷却管の取り出し機構はこれに限られるものでは
なく、容易に冷却管を取り出すことができれば他の機構
を用いてもよい。さらに、上記各実施例では反応管1の
外部下流側にヒータ7を設けるようにしたが、ヒータは
必ずしも設ける必要はない。
Further, the surface of the cooling pipes 5, 8 and 9 may be processed by providing fins or the like to increase the surface area thereof. Further, in each of the above embodiments, the opening window 12 is provided in the reaction tube 1 to take out the cooling pipes 5, 8 and 9. However, the cooling pipe take-out mechanism is not limited to this, and the cooling pipe can be easily taken out. Other mechanisms may be used as long as they can be taken out. Further, in each of the above-mentioned embodiments, the heater 7 is provided on the downstream side outside the reaction tube 1, but the heater is not necessarily provided.

【0017】[0017]

【発明の効果】以上のように、この発明に係る気相結晶
成長装置によれば、反応管内の、ウェハよりも下流側に
取り外し自在な冷却器を設けて反応生成物を集塵するよ
うにしたので、反応生成物を容易に反応管内から除去す
ることができ、装置の保守が容易になるという効果があ
る。
As described above, according to the vapor phase crystal growth apparatus of the present invention, a removable cooler is provided on the downstream side of the wafer in the reaction tube to collect the reaction products. Therefore, the reaction product can be easily removed from the reaction tube, and the maintenance of the apparatus can be facilitated.

【図面の簡単な説明】[Brief description of drawings]

【図1】この発明の第1の実施例による気相結晶成長装
置の反応管周りを示す断面図である。
FIG. 1 is a sectional view showing the periphery of a reaction tube of a vapor phase crystal growth apparatus according to a first embodiment of the present invention.

【図2】この発明の第2の実施例による気相結晶成長装
置の反応管周りを示す断面図である。
FIG. 2 is a cross-sectional view showing the periphery of a reaction tube of a vapor phase crystal growth apparatus according to a second embodiment of the present invention.

【図3】この発明の第3の実施例による気相結晶成長装
置の反応管周りを示す断面図である。
FIG. 3 is a sectional view showing the periphery of a reaction tube of a vapor phase crystal growth apparatus according to a third embodiment of the present invention.

【図4】従来の気相結晶成長装置の反応管周りの断面図
である。
FIG. 4 is a cross-sectional view around a reaction tube of a conventional vapor phase crystal growth apparatus.

【符号の説明】[Explanation of symbols]

1 反応管 2 反応ガス 3 ウェハ 5 冷却管 6 冷却剤 7 ヒータ 8 冷却管 9 冷却管 10 反応生成物 11 排気系配管 12 開口窓 13 ジョイント部 DESCRIPTION OF SYMBOLS 1 Reaction tube 2 Reaction gas 3 Wafer 5 Cooling tube 6 Coolant 7 Heater 8 Cooling tube 9 Cooling tube 10 Reaction product 11 Exhaust system piping 12 Open window 13 Joint part

─────────────────────────────────────────────────────
─────────────────────────────────────────────────── ───

【手続補正書】[Procedure amendment]

【提出日】平成4年9月9日[Submission date] September 9, 1992

【手続補正1】[Procedure Amendment 1]

【補正対象書類名】明細書[Document name to be amended] Statement

【補正対象項目名】0010[Correction target item name] 0010

【補正方法】変更[Correction method] Change

【補正内容】[Correction content]

【0010】次に結晶成長時の装置の動作について説明
る。
[0010] Next described <br/> operation of the apparatus at the time of crystal growth.

【手続補正2】[Procedure Amendment 2]

【補正対象書類名】明細書[Document name to be amended] Statement

【補正対象項目名】0012[Correction target item name] 0012

【補正方法】変更[Correction method] Change

【補正内容】[Correction content]

【0012】このように本実施例によれば、反応管1内
のウエハ3下流側に冷却管5を設けるとともに、反応管
1外部下流側にヒータ7を設けたから、結晶成長時に加
熱分解されたのち結晶成長に関与しなかった未反応ガス
は温度の低い冷却管5で主に捕集され、反応管1下流の
外壁近くに堆積する反応生成物が少なくなり、また集め
られた反応生成物10は冷却管5を取り外すことにより
容易に反応管1内から除去することができる。
As described above, according to this embodiment, since the cooling pipe 5 is provided on the downstream side of the wafer 3 in the reaction tube 1 and the heater 7 is provided on the downstream side outside the reaction tube 1, it is thermally decomposed during crystal growth. After that, the unreacted gas not involved in the crystal growth is mainly collected by the cooling pipe 5 having a low temperature, the reaction products deposited near the outer wall downstream of the reaction pipe 1 are reduced, and the collected reaction products 10 the Ru can be easily removed from the reaction tube 1 by removing the cooling pipe 5.

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 反応室内に導入された反応ガスを加熱分
解してウェハ上に結晶成長を行う気相結晶成長装置にお
いて、 上記反応管内に配置されたウェハよりも下流側の反応管
内に、該反応管より取り外し自在な冷却器を設けたこと
を特徴とする気相結晶成長装置。
1. A vapor phase crystal growth apparatus for thermally decomposing a reaction gas introduced into a reaction chamber to grow a crystal on a wafer, wherein the reaction tube in the reaction tube located downstream of the wafer is disposed in the reaction tube. A vapor phase crystal growth apparatus, which is provided with a cooler detachable from a reaction tube.
【請求項2】 請求項1記載の気相結晶成長装置におい
て、 上記冷却器は、上記反応ガスの流れに対して垂直な方向
の面内において蛇行して配置された冷却パイプであるこ
とを特徴とする気相結晶成長装置。
2. The vapor phase crystal growth apparatus according to claim 1, wherein the cooler is a cooling pipe arranged in a meandering manner in a plane perpendicular to the flow of the reaction gas. Vapor phase crystal growth apparatus.
【請求項3】 請求項1記載の気相結晶成長装置におい
て、 上記冷却器は、上記反応ガスの流れに対して平行な方向
に複数の層をなすように配置された冷却パイプであるこ
とを特徴とする気相結晶成長装置。
3. The vapor phase crystal growth apparatus according to claim 1, wherein the cooler is a cooling pipe arranged so as to form a plurality of layers in a direction parallel to the flow of the reaction gas. Characteristic vapor phase crystal growth equipment.
JP19158192A 1992-06-24 1992-06-24 Vapor crystal growth device Pending JPH061691A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19158192A JPH061691A (en) 1992-06-24 1992-06-24 Vapor crystal growth device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19158192A JPH061691A (en) 1992-06-24 1992-06-24 Vapor crystal growth device

Publications (1)

Publication Number Publication Date
JPH061691A true JPH061691A (en) 1994-01-11

Family

ID=16277036

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19158192A Pending JPH061691A (en) 1992-06-24 1992-06-24 Vapor crystal growth device

Country Status (1)

Country Link
JP (1) JPH061691A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014034831A1 (en) 2012-09-03 2014-03-06 株式会社未来企画 Window structure body

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014034831A1 (en) 2012-09-03 2014-03-06 株式会社未来企画 Window structure body

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