JPH0566418A - Active matrix type liquid crystal display device - Google Patents

Active matrix type liquid crystal display device

Info

Publication number
JPH0566418A
JPH0566418A JP22784791A JP22784791A JPH0566418A JP H0566418 A JPH0566418 A JP H0566418A JP 22784791 A JP22784791 A JP 22784791A JP 22784791 A JP22784791 A JP 22784791A JP H0566418 A JPH0566418 A JP H0566418A
Authority
JP
Japan
Prior art keywords
tft
liquid crystal
electrode
pixel
display device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP22784791A
Other languages
Japanese (ja)
Inventor
Masuyuki Ota
益幸 太田
Makoto Tsumura
津村  誠
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP22784791A priority Critical patent/JPH0566418A/en
Publication of JPH0566418A publication Critical patent/JPH0566418A/en
Pending legal-status Critical Current

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  • Liquid Crystal (AREA)
  • Thin Film Transistor (AREA)

Abstract

PURPOSE:To obtain the picture element constitution of the liquid crystal display device which enables the remedy of a display defect so that even if a thin film transistor (TFT) element becomes defective, a display similar to that of other normal picture elements can be obtained. CONSTITUTION:This liquid crystal display device consists of a substrate 1 where a picture element part 6 is arranged, an opposite electrode 2, a liquid crystal layer sandwiched between the substrate 1 and opposite electrode 2, a scanning-side driving circuit 3, a signal-side driving circuit 4, and an external control circuit 5. A TFT 9 and a TFT 9a which is made redundant are provided at the intersection of a scanning line 7 and a signal line 8. Further, a holding capacitance 11 and a redundant holding capacitance 11a which are connected to the scanning line 7a and picture element electrode 10 in the precedent stage are provided. If there is the defective TFT, on the other hand, the drain electrode of the TFT is disconnected from the signal line 8 and while the source electrode also disconnect the defective TFT from a picture element electrode 10, the holding capacitance 11a which is made redundant is disconnected from the picture element electrode. Consequently, the balance of W/L and the holding capacitances can be kept and the display similar to that of other picture elements including no defective TFT is obtained.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、液晶を駆動するための
薄膜トランジスタ素子と容量素子を各画素に配設したア
クティブマトリクス型液晶表示装置に関するものであ
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an active matrix type liquid crystal display device in which a thin film transistor element for driving a liquid crystal and a capacitive element are arranged in each pixel.

【0002】[0002]

【従来の技術】従来から知られている薄膜トランジスタ
素子(以下、TFTと称する。)用いたアクティブマト
リクス型液晶表示装置は、各画素において、ただ1つの
TFTで液晶を駆動していたが、欠陥TFTができる
と、その画素の表示が正常に行われず、点欠陥およびラ
イン欠陥と呼ばれる表示欠陥として現われる。液晶ディ
スプレイの画面が大きくなるとともに、画素数が増大
し、こうした表示欠陥が増えてくる。この表示欠陥によ
る歩留りの低下を防ぐ対策として冗長構成がある。その
1つとして、1画素に2つのTFTを設ける方法があ
る。欠陥TFTが発生した場合、欠陥TFTを画素から
電気的に切り離すことによって、表示には欠陥は生じな
いようにして歩留り向上を図っている。このような技術
としては、例えば、竹田守他8名、論文「冗長構成を採
用した12.5 型アクティブ・マトリクス方式カラー液
晶ディスプレイ」:日経エレクトロニクス、No.41
0、p.193−210(1986,12,15)また
は岡本昌也他3名、「やむなく使う冗長構成,検査・修
正不要な技術から採用」:フラットパネル・ディスプレ
イ '91、p.105(1990,11,26)等に記
載されている。その一例を図9に示す。
2. Description of the Related Art An active matrix type liquid crystal display device using a conventionally known thin film transistor element (hereinafter referred to as a TFT) drives a liquid crystal with only one TFT in each pixel. If this occurs, the display of the pixel is not normally performed and appears as display defects called point defects and line defects. As the screen of a liquid crystal display becomes larger, the number of pixels increases, and such display defects increase. There is a redundant configuration as a measure for preventing the reduction in yield due to this display defect. As one of them, there is a method of providing two TFTs in one pixel. When a defective TFT is generated, the defective TFT is electrically separated from the pixel so that the display does not have a defect and the yield is improved. Examples of such a technology include, for example, Mamoru Takeda and 8 others, "12.5 type active matrix color liquid crystal display with redundant configuration", Nikkei Electronics, No.41.
0, p.193-210 (1986, 12, 15) or Masaya Okamoto et al., "Adopted from a redundant configuration that is unavoidably used and a technique that does not require inspection or modification": Flat Panel Display '91, p. 105 (1990, 11, 26) and the like. An example thereof is shown in FIG.

【0003】図9は、従来の冗長化を行ったアクティブ
マトリクス型液晶表示装置の概略図である。マトリクス
状に並んだ画素部6aから成る基板1aと、画素電極1
0fに対向して電極を形成した基板2と、これら2つの
基板1a、2の間に封入された液晶層と、外部コントロ
ール回路5と、外部コントロール回路5に接続された走
査側駆動回路3と信号側駆動回路4から構成されてい
る。外部コントロール回路5にしたがって、走査側駆動
回路3から走査線7に走査信号が出力され、また、信号
側駆動回路4から信号線8に映像信号が出力され、各画
素6aに走査信号と映像信号を送ることによって、液晶
層に映像信号を伝達し、映像信号にしたがったパターン
を表示する。図10に、従来の冗長化を行った画素部6
aの詳細な構成を示す。走査線7と信号線8の交点にT
FT9が設けられており、冗長化されたもう1つのTF
T9aが同様に接続されている。1つの画素に、2つの
TFTを設けることによって、一方が欠陥TFTになって
も、その欠陥TFTのドレイン電極とソース電極を、そ
れぞれ信号線8と画素電極10fからレーザーを用いて
切り離せば、残りの正常なTFTで液晶を駆動でき、表
示欠陥を救済できる。また、液晶に印加された電圧は、
液晶層の容量だけでは、TFTのオフ電流や液晶をなが
れる電流による減衰が大きい。この減衰を防ぐために、
電圧を保持するための容量素子11i(以下、保持容量
と称する。)が、液晶容量と並列に接続されている。通
常は、保持容量は液晶容量よりも十分大きく、負荷のほ
とんどが、保持容量の大きさで決まる。保持容量11i
のもう一方の電極は、前段のゲート線7aまたはパネル
外部への引出線に接続されている。
FIG. 9 is a schematic view of a conventional active matrix type liquid crystal display device having redundancy. The substrate 1a including the pixel portions 6a arranged in a matrix, and the pixel electrode 1
A substrate 2 having electrodes formed opposite to 0f, a liquid crystal layer enclosed between these two substrates 1a and 2, an external control circuit 5, and a scanning side drive circuit 3 connected to the external control circuit 5. It is composed of the signal side drive circuit 4. According to the external control circuit 5, the scanning side drive circuit 3 outputs a scanning signal to the scanning line 7, the signal side drive circuit 4 outputs a video signal to the signal line 8, and the scanning signal and the video signal to each pixel 6a. To transmit a video signal to the liquid crystal layer and display a pattern according to the video signal. FIG. 10 shows a pixel unit 6 which has been conventionally made redundant.
The detailed structure of a is shown. T at the intersection of scanning line 7 and signal line 8
FT9 is provided, and another redundant TF is provided.
T9a is similarly connected. Two for each pixel
Even if one of the defective TFTs is provided by providing the TFT, if the drain electrode and the source electrode of the defective TFT are separated from the signal line 8 and the pixel electrode 10f using a laser, the remaining normal TFTs can generate liquid crystal. It can be driven and display defects can be relieved. The voltage applied to the liquid crystal is
Only the capacitance of the liquid crystal layer causes large attenuation due to the off current of the TFT and the current flowing through the liquid crystal. To prevent this decay,
A capacitive element 11i (hereinafter, referred to as a storage capacitor) for holding a voltage is connected in parallel with the liquid crystal capacitor. Usually, the storage capacity is sufficiently larger than the liquid crystal capacity, and most of the load is determined by the size of the storage capacity. Storage capacity 11i
The other electrode is connected to the gate line 7a in the previous stage or a lead line to the outside of the panel.

【0004】[0004]

【発明が解決しようとする課題】しかし、上記のような
保持容量が1つしかないような画素構成では、欠陥TFT
の一方を切り離すと、駆動能力が半減するにもかかわら
ず、負荷を変えることができないので、液晶に十分な電
圧が供給できなくなり、2つのTFTが正常な他の画素
との間に輝度の違いが現われる。特に大画面や高精細な
ディスプレイでは、走査線数が増大し、1行の選択時間
が短くなり、映像信号電圧の画素電極への書き込みが厳
しくなり、また、ちらつきを防止するために液晶の交流
駆動周波数を高くすると、同様に書き込みが厳しくなる
ため、この輝度の差は、さらに顕著に現われ、点欠陥と
呼ばれる表示欠陥に結び付く。また駆動能力を示すパラ
メータであるTFTサイズ(以下、W/Lと称する。)
を大きくすると、TFTのオフ電流が増大し、電圧が十
分保持できなくなってくるので、正常な画素の輝度に影
響し、救済した画素と輝度差は同様に現われる。このよ
うに、駆動条件が厳しくなると、TFTサイズW/Lと
保持容量には、バランスが存在するため、上記のような
保持容量が1つしかないような画素構成では、表示欠陥
は完全に救済できなくなる。
However, in the pixel configuration having only one storage capacitor as described above, a defective TFT is required.
If one of them is cut off, the load cannot be changed even though the driving capacity is halved, so that a sufficient voltage cannot be supplied to the liquid crystal and the difference in brightness between the other two pixels where the two TFTs are normal. Appears. Particularly in a large screen or a high-definition display, the number of scanning lines increases, the selection time for one row is shortened, the writing of the video signal voltage to the pixel electrode becomes difficult, and the alternating current of the liquid crystal is used to prevent flicker. When the driving frequency is increased, the writing becomes more severe as well, so that the difference in luminance appears more conspicuously and leads to a display defect called a point defect. Further, the TFT size (hereinafter referred to as W / L) which is a parameter indicating the driving ability.
When is increased, the off-state current of the TFT is increased and the voltage cannot be sufficiently held, so that the luminance of the normal pixel is affected and the luminance difference between the rescued pixel and the restored pixel appears in the same manner. As described above, when the driving condition becomes strict, the TFT size W / L and the storage capacitor have a balance. Therefore, in the pixel configuration having only one storage capacitor as described above, the display defect is completely relieved. become unable.

【0005】このことから、本発明の目的は、TFTに
欠陥が生じても、他の正常な画素と同等の表示を得られ
る様に、表示欠陥を救済できるアクティブマトリクス型
液晶表示装置の画素構成を提供することにある。
Therefore, an object of the present invention is to provide a pixel structure of an active matrix type liquid crystal display device capable of relieving a display defect so that a display equivalent to that of other normal pixels can be obtained even if a defect occurs in a TFT. To provide.

【0006】[0006]

【課題を解決するための手段】上記問題を解決するため
に、本発明の特徴は、一方の基板上に、複数本の走査線
と、走査線に直交した複数本の信号線と、走査線と信号
線の交点に、走査線にゲート電極を接続し、信号線にド
レイン電極を接続した薄膜トランジスタ素子と、薄膜ト
ランジスタ素子のソース電極に接続された画素電極と、
画素電極と接続された容量素子を具備し、他方の基板上
には、画素電極と対向する対向電極を形成し、上記一方
の基板と上記他方の基板の間に挟持した液晶層を有する
アクティブマトリクス型液晶表示装置において、薄膜ト
ランジスタ素子を各画素ごとに複数個設け、保持容量を
薄膜トランジスタ素子数に対応するように複数個設けた
ことにある。
In order to solve the above problems, a feature of the present invention is that a plurality of scanning lines, a plurality of signal lines orthogonal to the scanning lines, and a scanning line are provided on one substrate. A thin film transistor element in which a gate electrode is connected to a scanning line and a drain electrode is connected to a signal line, and a pixel electrode connected to a source electrode of the thin film transistor element,
An active matrix having a capacitive element connected to a pixel electrode, a counter electrode facing the pixel electrode formed on the other substrate, and having a liquid crystal layer sandwiched between the one substrate and the other substrate. In the liquid crystal display device of the type, a plurality of thin film transistor elements are provided for each pixel, and a plurality of storage capacitors are provided so as to correspond to the number of thin film transistor elements.

【0007】[0007]

【作用】保持容量をTFT数に対応するように複数個設
け、切り離した欠陥TFT数に応じて、画素電極に接続
している保持容量を切り離すことによって、W/Lと保
持容量のバランスが保てるので、他の正常な画素と同等
の表示を得られる様に、表示欠陥を救済できる。
By providing a plurality of storage capacitors corresponding to the number of TFTs and disconnecting the storage capacitors connected to the pixel electrodes according to the number of defective TFTs that have been separated, the balance between W / L and the storage capacitors can be maintained. Therefore, display defects can be relieved so that a display equivalent to that of other normal pixels can be obtained.

【0008】[0008]

【実施例】以下、発明の実施例を図面を用いて説明す
る。
Embodiments of the present invention will be described below with reference to the drawings.

【0009】実施例1 図1に本発明のアクティブマトリクス型液晶表示装置を
示す。マトリクス状に並んだ画素部6から成る基板1と
画素電極10に対向して電極を形成した基板2と、これ
ら2つの基板1,2の間に封入された液晶層と、外部コ
ントロール回路5と、外部コントロール回路5に接続さ
れた走査側駆動回路3と信号側駆動回路4から構成され
ている。図2に、本発明の特徴を表す画素部6の詳細な
構成を示す。走査線7と信号線8の交点に、TFT9と
冗長化されたTFT9aが設けられている。図3にその
TFT部分の拡大図を示す。このTFTは、逆スタガ構
造をしているが、1例であり、TFTの構造にはこだわ
らない。ドレイン電極15,15aは、信号線8に接続
されており、ソース電極16,16aは、画素電極10
に接続されている。ゲート電極17は、走査線7と接続
されており、走査線7から走査信号がゲート電極17に
伝わったとき、信号線8に送られてきた映像信号の電位
が、ドレイン電極15,15aから、半導体活性層1
8,18aを介して、ソース電極16,16aに伝わ
り、画素電極10に供給される。また、前段の走査線7
aと画素電極10に接続された保持容量11と本発明の
特徴である冗長化した保持容量11aが設けられてい
る。図3に図2のラインAでの断面図を示す。保持容量
11は、前段の走査線7aに接続された電極21と画素
電極10の間に、絶縁体14を挾持して構成される。ま
た、冗長化した保持容量11aは、前段の走査線7aに接
続された電極21と、画素電極10の一部を分割し形成
した電極10aの間に、絶縁体14を挾持して構成され
る。絶縁体14には、TFTのゲート絶縁膜、電極21
を陽極酸化して得られる絶縁膜およびそれらを積層した
もの等が用いられる。冗長化された保持容量11aを構
成する電極10aには、透過型の液晶表示装置の場合は、
画素電極10であるインジウム−チン−オキサイド(以
下、ITOと称する。)を、ホトリソグラフィーで加工
する際に画素電極10と分離形成したITOを用いる。
冗長化された保持容量11aを構成する電極10aは、
接続線12により画素電極10と接続される。接続線1
2は、信号線8,ドレイン電極15,15aおよびソー
ス電極16,16aをホトリソグラフィー加工する際
に、同時にパターン形成する。接続線12,ドレイン電
極15,15aおよびソース電極16,16aには、レ
ーザー照射によって切断できる、クロム,タンタル,ア
ルミニウム等の金属を用いる。
Embodiment 1 FIG. 1 shows an active matrix type liquid crystal display device of the present invention. A substrate 1 including pixel portions 6 arranged in a matrix, a substrate 2 having electrodes formed to face the pixel electrodes 10, a liquid crystal layer enclosed between these two substrates 1 and 2, and an external control circuit 5. , A scan side drive circuit 3 and a signal side drive circuit 4 connected to an external control circuit 5. FIG. 2 shows a detailed configuration of the pixel portion 6 which is characteristic of the present invention. A TFT 9 a redundant with the TFT 9 is provided at the intersection of the scanning line 7 and the signal line 8. FIG. 3 shows an enlarged view of the TFT portion. This TFT has an inverted stagger structure, but this is an example, and the structure of the TFT is not limited. The drain electrodes 15 and 15a are connected to the signal line 8, and the source electrodes 16 and 16a are connected to the pixel electrode 10.
It is connected to the. The gate electrode 17 is connected to the scanning line 7, and when the scanning signal is transmitted from the scanning line 7 to the gate electrode 17, the potential of the video signal sent to the signal line 8 is changed from the drain electrodes 15 and 15a to Semiconductor active layer 1
It is transmitted to the source electrodes 16 and 16 a via 8 and 18 a and is supplied to the pixel electrode 10. In addition, the scanning line 7 in the previous stage
The storage capacitor 11 connected to a and the pixel electrode 10 and the redundant storage capacitor 11a, which is a feature of the present invention, are provided. FIG. 3 shows a sectional view taken along line A in FIG. The storage capacitor 11 is formed by sandwiching an insulator 14 between the pixel electrode 10 and the electrode 21 connected to the preceding scanning line 7a. The redundant storage capacitor 11a is configured by sandwiching an insulator 14 between the electrode 21 connected to the preceding scanning line 7a and the electrode 10a formed by dividing a part of the pixel electrode 10. .. The insulator 14 includes a TFT gate insulating film and an electrode 21.
An insulating film obtained by anodic oxidation of and a layered product thereof are used. In the case of a transmissive liquid crystal display device, the electrodes 10a forming the redundant storage capacitors 11a are
When the indium-tin-oxide (hereinafter referred to as ITO) that is the pixel electrode 10 is processed by photolithography, ITO formed separately from the pixel electrode 10 is used.
The electrode 10a forming the redundant storage capacitor 11a is
The connection line 12 connects the pixel electrode 10. Connection line 1
2 is patterned at the same time when the signal line 8, the drain electrodes 15 and 15a and the source electrodes 16 and 16a are processed by photolithography. The connection line 12, the drain electrodes 15 and 15a, and the source electrodes 16 and 16a are made of a metal such as chromium, tantalum, or aluminum that can be cut by laser irradiation.

【0010】今、TFT9が欠陥TFTである場合、切
断領域19にレーザーを照射し、TFT9のドレイン電
極15を信号線8から切り離す。また同時に、ソース電
極16も、切断領域20にレーザーを照射して、画素電
極10から切り離す。こうすることによって、欠陥TF
T9は電気的に画素から切り離される。残りの正常なT
FT9aにより液晶が駆動されるので、正常は表示に行
える。逆にTFT9a が欠陥TFTである場合、上記の様
に、切断領域19a,20aレーザーを照射し、ドレイ
ン電極15a,ソース電極16aを、それぞれ信号線
8,画素電極10から切り離す。2つのTFTが同時に
欠陥になる確立は、1つのTFTが欠陥になる確率に比
べて非常に小さいが、それでも発生する表示欠陥を救済
するために、3つ以上のTFTを設けてもよい。また、
欠陥TFTを切り離すと同時に、切断領域13にレーザ
ーを照射し、接続線12を切断し、冗長化された保持容
量11aを画素電極10から切り離す。TFTの数が3
個以上の場合は、保持容量の数も同数だけ設け、欠陥T
FTの数だけ、保持容量も画素電極から切り離す。こう
することによって、TFTサイズW/Lが半減しても、
保持容量も半減させることができ、W/Lと保持容量の
バランスを保つことができる。したがって、欠陥TFT
のない他の画素と同様な表示が得られる。また、保持容
量は、等しく分割する必要はなく、欠陥TFTが存在し
ても、W/Lと保持容量のバランスを保てるようにでき
れば良い。
If the TFT 9 is a defective TFT, the cutting region 19 is irradiated with a laser to disconnect the drain electrode 15 of the TFT 9 from the signal line 8. At the same time, the source electrode 16 is also cut off from the pixel electrode 10 by irradiating the cutting region 20 with a laser. By doing this, the defect TF
T9 is electrically disconnected from the pixel. The rest of the normal T
Since the liquid crystal is driven by the FT 9a, normal display can be performed. On the contrary, when the TFT 9a is a defective TFT, the drain regions 15a and 20a are irradiated with the laser to separate the drain electrode 15a and the source electrode 16a from the signal line 8 and the pixel electrode 10, respectively, as described above. The probability that two TFTs will be defective at the same time is much smaller than the probability that one TFT will be defective, but three or more TFTs may be provided in order to remedy display defects that still occur. Also,
At the same time as the defective TFT is cut off, the cutting area 13 is irradiated with laser to cut the connection line 12 and the redundant storage capacitor 11 a is cut off from the pixel electrode 10. The number of TFTs is 3
In the case of more than one, the same number of storage capacitors are provided and the defect T
The storage capacitors are separated from the pixel electrodes by the number of FTs. By doing this, even if the TFT size W / L is halved,
The storage capacity can also be halved, and the balance between W / L and the storage capacity can be maintained. Therefore, defective TFT
A display similar to that of the other pixels having no pixel is obtained. Further, it is not necessary to divide the storage capacitor equally, as long as the balance between W / L and the storage capacitor can be maintained even if there is a defective TFT.

【0011】実施例2 図5に、本発明の画素部の構成の第2の実施例を示す。
前記第1の実施例において、冗長化された保持容量11
aの電極10aには、信号線8,ドレイン電極15,1
5aおよびソース電極16,16aをホトリソグラフィ
ー加工する際に同時にパターン形成した電極101を用
いても良い。この時、接続線12は必要なく、冗長化さ
れた保持容量11bの電極101と一体化してパターン
形成する。TFT9,9aのどちらか一方が欠陥の場合
には、切断領域13aをレーザー照射により、保持容量
11bと画素電極10を切り離す。
Embodiment 2 FIG. 5 shows a second embodiment of the configuration of the pixel portion of the present invention.
In the first embodiment, the redundant storage capacitor 11 is provided.
The electrode 10a of a has a signal line 8, drain electrodes 15 and 1
5a and the source electrodes 16 and 16a may be patterned at the same time when the photolithography process is performed. At this time, the connection line 12 is not necessary, and the electrode 101 of the redundant storage capacitor 11b is integrated and patterned. When either one of the TFTs 9 and 9a is defective, the cutting capacitor 13b is separated from the pixel electrode 10 by irradiating the cutting region 13a with laser.

【0012】本実施例では前記第1の実施例と同様な効
果が得られる。
In this embodiment, the same effect as that of the first embodiment can be obtained.

【0013】実施例3 図6に本発明の画素部の構成の第3の実施例を示す。保
持容量11cの信号線8側の電極102を、画素電極1
0bと切り離して形成し、前記第1の実施例の様に、接
続線12aで画素電極10bに接続する。冗長化した保
持容量11dの電極103および接続線12bも同様に
形成する。また前記第2の実施例のように、電極10
2,103、および接続線12a,12bは、信号線
8,ドレイン電極15,15aおよびソース電極16,
16aを、ホトリソグラフィー加工する際に、一体化し
てパターン形成しても良い。TFT9,9aのどちらか
一方が欠陥の場合には、切断領域13b,13cのどち
らか一方をレーザー照射し、画素電極10bにより切り
離す。
Embodiment 3 FIG. 6 shows a third embodiment of the configuration of the pixel portion of the present invention. The electrode 102 on the signal line 8 side of the storage capacitor 11c is connected to the pixel electrode 1
It is formed separately from 0b and is connected to the pixel electrode 10b by the connection line 12a as in the first embodiment. The redundant electrodes 103 of the storage capacitors 11d and the connection lines 12b are also formed in the same manner. Further, as in the second embodiment, the electrode 10
2, 103, and the connection lines 12a and 12b, the signal line 8, the drain electrodes 15 and 15a and the source electrode 16,
16a may be integrated and patterned when photolithography is performed. When either one of the TFTs 9 and 9a is defective, one of the cutting regions 13b and 13c is irradiated with a laser and separated by the pixel electrode 10b.

【0014】本実施例では前記第1の実施例と同様な効
果に加え、保持容量11cまたは冗長化した保持容量1
1dの一方が欠陥になったときも、欠陥保持容量を切り
離せる。さらに、欠陥保持容量を切り離すと同時に、T
FTの一方を切り離せば、W/Lと保持容量のバランス
が保てるようにでき、他の正常な画素との輝度差がなく
なる。
In this embodiment, in addition to the same effect as the first embodiment, the storage capacitor 11c or the redundant storage capacitor 1 is provided.
The defect storage capacitor can be separated even when one of the 1d becomes defective. Furthermore, at the same time that the defect holding capacity is cut off, T
By separating one of the FTs, it is possible to maintain the balance between the W / L and the storage capacitance, and there is no difference in brightness from other normal pixels.

【0015】実施例4 図7に本発明の画素部の構成の第4の実施例を示す。保
持容量11eおよび冗長化された保持容量11fを形成
する走査線と同層の電極21は、パネル外部への引き出
し線22に接続しても良い。TFT9,9aのどちらか
一方が欠陥の場合には、切断領域13dをレーザー照射
により、接続線12dを切断し、画素電極10cと冗長
化した保持容量11fを切り離す。
Fourth Embodiment FIG. 7 shows a fourth embodiment of the configuration of the pixel portion of the present invention. The electrode 21 in the same layer as the scanning line forming the storage capacitor 11e and the redundant storage capacitor 11f may be connected to a lead line 22 to the outside of the panel. When either one of the TFTs 9 and 9a is defective, the connection line 12d is cut by irradiating the cutting region 13d with a laser to separate the pixel electrode 10c and the redundant storage capacitor 11f.

【0016】本実施例では前記第1の実施例と同様な効
果が得られる。
In this embodiment, the same effect as that of the first embodiment can be obtained.

【0017】実施例5 図8に本発明の画素部の構成の第5の実施例を示す。前
記第1の実施例における保持容量11および冗長化され
た保持容量11aを形成する走査線と同層の電極21
を、レーザー照射により2つに分離できるように、2つ
の電極21a,21bとして設ける。TFT9,9aの
どちらか一方が欠陥の場合には、切断領域13e,13
fのどちらか一方をレーザー照射により切り離す。
Embodiment 5 FIG. 8 shows a fifth embodiment of the configuration of the pixel portion of the present invention. The electrode 21 in the same layer as the scanning line forming the storage capacitor 11 and the redundant storage capacitor 11a in the first embodiment.
Are provided as two electrodes 21a and 21b so that they can be separated into two by laser irradiation. If either one of the TFTs 9 and 9a is defective, the cutting regions 13e and 13
Either one of f is cut off by laser irradiation.

【0018】本実施例では前記第1の実施例と同様な効
果に加え、前記第3の実施例と同様な効果も得られる。
In this embodiment, in addition to the same effects as the first embodiment, the same effects as the third embodiment can be obtained.

【0019】図1における保持容量11および冗長化し
た保持容量11aは、前記の実施例の構成の組合せによ
って考えられる。
The storage capacitor 11 and the redundant storage capacitor 11a in FIG. 1 can be considered by a combination of the configurations of the above embodiments.

【0020】[0020]

【発明の効果】以上詳述したように、本発明によれば、
欠陥TFTおよび欠陥保持容量による表示欠陥の救済が
できると同時に、W/Lと保持容量のバランスが保てる
ので、他の正常な画素と同等の表示を得られる様に、表
示欠陥が救済できる。
As described in detail above, according to the present invention,
The display defect can be remedied by the defective TFT and the defect holding capacitance, and at the same time, the balance between W / L and the holding capacitance can be maintained, so that the display defect can be relieved so that a display equivalent to that of other normal pixels can be obtained.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明のアクティブマトリクス型液晶表示装置
の概略図である。
FIG. 1 is a schematic view of an active matrix type liquid crystal display device of the present invention.

【図2】本発明の画素部の構成の第1実施例を示す図で
ある。
FIG. 2 is a diagram showing a first embodiment of the configuration of the pixel portion of the present invention.

【図3】TFT部分の拡大図である。FIG. 3 is an enlarged view of a TFT portion.

【図4】本発明の保持容量の断面図である。FIG. 4 is a sectional view of a storage capacitor of the present invention.

【図5】本発明の画素部の構成の第1実施例を示す図で
ある。
FIG. 5 is a diagram showing a first embodiment of the configuration of the pixel portion of the present invention.

【図6】本発明の画素部の構成の第2実施例を示す図で
ある。
FIG. 6 is a diagram showing a second embodiment of the configuration of the pixel portion of the present invention.

【図7】本発明の画素部の構成の第3実施例を示す図で
ある。
FIG. 7 is a diagram showing a third embodiment of the configuration of the pixel portion of the present invention.

【図8】本発明の画素部の構成の第4実施例を示す図で
ある。
FIG. 8 is a diagram showing a fourth embodiment of the configuration of the pixel portion of the present invention.

【図9】従来のアクティブマトリクス型液晶表示装置の
概略図である。
FIG. 9 is a schematic view of a conventional active matrix type liquid crystal display device.

【図10】従来の画素部の構成である。FIG. 10 is a configuration of a conventional pixel portion.

【符号の説明】[Explanation of symbols]

1…TFTアレイ基板、2…対向電極、3…走査側信号
回路、4…信号側駆動回路、5…外部コントロール回
路、6…画素部、7…走査線、8…信号線、9…TF
T、9a…冗長化したTFT、10…画素電極、11…
保持容量、11a…冗長化した保持容量。
DESCRIPTION OF SYMBOLS 1 ... TFT array substrate, 2 ... counter electrode, 3 ... scanning side signal circuit, 4 ... signal side drive circuit, 5 ... external control circuit, 6 ... pixel part, 7 ... scanning line, 8 ... signal line, 9 ... TF
T, 9a ... Redundant TFT, 10 ... Pixel electrode, 11 ...
Storage capacity, 11a ... Redundant storage capacity.

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】一方の基板には、複数本の走査線と、前記
走査線に直交した複数本の信号線と、前記走査線と前記
信号線の交点に、前記走査線にゲート電極を接続し、前
記信号線にドレイン電極を接続した薄膜トランジスタ素
子と、前記薄膜トランジスタ素子のソース電極に接続さ
れた画素電極と、画素電極と接続された容量素子を具備
し、他方の基板には、前記画素電極と対向する対向電極
を形成し、前記一方の基板と前記他方の基板の間に挟持
した液晶層を有するアクティブマトリクス型液晶表示装
置において、 前記薄膜トランジスタ素子を各画素ごとに複数個設け、
前記容量素子を前記薄膜トランジスタ素子数に対応する
ように複数個設けたことを特徴とするアクティブマトリ
クス型液晶表示装置。
1. A plurality of scanning lines, a plurality of signal lines orthogonal to the scanning lines, and a gate electrode connected to the scanning lines at an intersection of the scanning lines and the signal lines on one substrate. A thin film transistor element having a drain electrode connected to the signal line, a pixel electrode connected to the source electrode of the thin film transistor element, and a capacitor element connected to the pixel electrode, and the other substrate having the pixel electrode In an active matrix type liquid crystal display device having a liquid crystal layer sandwiched between the one substrate and the other substrate, a plurality of thin film transistor elements are provided for each pixel.
An active matrix type liquid crystal display device, wherein a plurality of the capacitive elements are provided so as to correspond to the number of the thin film transistor elements.
【請求項2】請求項1記載のアクティブマトリクス型液
晶表示装置において、欠陥薄膜トランジスタ素子のドレ
イン電極を信号線から切り離し、ソース電極を画素電極
から切り離すと同時に、保持容量を画素電極から切り離
すことを特徴とする表示欠陥救済方法。
2. The active matrix liquid crystal display device according to claim 1, wherein the drain electrode of the defective thin film transistor element is separated from the signal line, the source electrode is separated from the pixel electrode, and at the same time, the storage capacitor is separated from the pixel electrode. And a display defect remedy method.
JP22784791A 1991-09-09 1991-09-09 Active matrix type liquid crystal display device Pending JPH0566418A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22784791A JPH0566418A (en) 1991-09-09 1991-09-09 Active matrix type liquid crystal display device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22784791A JPH0566418A (en) 1991-09-09 1991-09-09 Active matrix type liquid crystal display device

Publications (1)

Publication Number Publication Date
JPH0566418A true JPH0566418A (en) 1993-03-19

Family

ID=16867309

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22784791A Pending JPH0566418A (en) 1991-09-09 1991-09-09 Active matrix type liquid crystal display device

Country Status (1)

Country Link
JP (1) JPH0566418A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5926156A (en) * 1994-12-28 1999-07-20 Sharp Kabushiki Kaisha Matrix type image display using backup circuitry
JP2005284255A (en) * 2004-03-30 2005-10-13 Lg Philips Lcd Co Ltd Liquid crystal display element
DE19758242B4 (en) * 1996-12-30 2006-04-20 Boe-Hydis Technology Co., Ltd. Pixel array structure and liquid crystal display device using the same structure and method of driving the device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5926156A (en) * 1994-12-28 1999-07-20 Sharp Kabushiki Kaisha Matrix type image display using backup circuitry
DE19758242B4 (en) * 1996-12-30 2006-04-20 Boe-Hydis Technology Co., Ltd. Pixel array structure and liquid crystal display device using the same structure and method of driving the device
JP2005284255A (en) * 2004-03-30 2005-10-13 Lg Philips Lcd Co Ltd Liquid crystal display element

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