JPH0549191B2 - - Google Patents
Info
- Publication number
- JPH0549191B2 JPH0549191B2 JP62149999A JP14999987A JPH0549191B2 JP H0549191 B2 JPH0549191 B2 JP H0549191B2 JP 62149999 A JP62149999 A JP 62149999A JP 14999987 A JP14999987 A JP 14999987A JP H0549191 B2 JPH0549191 B2 JP H0549191B2
- Authority
- JP
- Japan
- Prior art keywords
- power supply
- voltage
- audio amplifier
- measuring
- terminal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000000034 method Methods 0.000 claims description 7
- 238000005259 measurement Methods 0.000 description 12
- 239000003990 capacitor Substances 0.000 description 10
- 239000004065 semiconductor Substances 0.000 description 8
- 239000008188 pellet Substances 0.000 description 7
- 238000010586 diagram Methods 0.000 description 5
- 230000002950 deficient Effects 0.000 description 4
- 230000010355 oscillation Effects 0.000 description 3
- 239000000523 sample Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Circuit For Audible Band Transducer (AREA)
- Amplifiers (AREA)
Description
【発明の詳細な説明】
産業上の利用分野
本発明は、音声増幅器の特性測定方法に関する
ものである。DETAILED DESCRIPTION OF THE INVENTION Field of Industrial Application The present invention relates to a method for measuring characteristics of an audio amplifier.
従来の技術
従来の音声増幅器のリツプル除去率（Ripple
Rejection Ratio）を測定する基本回路を第３図
に示す。１は音声増幅器を表わし、入力端子１
ａ、フイードバツク端子１ｂ、接地端子１ｃ、出
力端子１ｄ、電源端子１ｅを備え、接地端子１ｃ
は接地されている。２は一端が入力端子１ａに接
続され他端が接地された入力抵抗を示す。フイー
ドバツク端子１ｂに出力端子１ｃに表れる出力電
圧の一部を帰還入力させることによつて音声増幅
器を負帰還動作させ、利得の安定、周波数特性の
拡大を図ることが出来る。リツプル除去率を測定
する場合フイードバツク端子１ｂをフイードバツ
ク端子接地用コンデンサ３にて交流的に接地して
いる。４は一端が直流カツト用コンデンサ５を介
して出力端子１ｄに接続され他端が接地された負
荷抵抗、６は直流電源、７，８は直列接続された
抵抗で、直流電源６と接地間に接続されている。
９はトランジスタで、そのコレクタは直流電源６
に、エミツタは電源端子１ｅに接続され、ベース
は抵抗７，８の接続点に接続されている。１０は
交流電源１１の交流電圧をトランジスタ９のベー
スに供給するコンデンサで、トランジスタ９のエ
ミツタ即ち電源端子１ｅには直流電源６の直流電
圧に交流電源１１の交流電圧が重畳される。１２
は負荷抵抗４の両端に表れる交流出力電圧を測定
する交流電圧計を示す。Conventional technology The ripple rejection rate (Ripple
Figure 3 shows the basic circuit for measuring the Rejection Ratio. 1 represents an audio amplifier, and input terminal 1
a, a feedback terminal 1b, a grounding terminal 1c, an output terminal 1d, a power terminal 1e, and a grounding terminal 1c.
is grounded. 2 indicates an input resistor whose one end is connected to the input terminal 1a and the other end is grounded. By feeding back a portion of the output voltage appearing at the output terminal 1c to the feedback terminal 1b, the audio amplifier can be operated in a negative feedback manner, thereby stabilizing the gain and expanding the frequency characteristics. When measuring the ripple removal rate, the feedback terminal 1b is grounded in an alternating current manner by a feedback terminal grounding capacitor 3. 4 is a load resistor whose one end is connected to the output terminal 1d via the DC cut capacitor 5 and the other end is grounded, 6 is a DC power supply, and 7 and 8 are resistors connected in series between the DC power supply 6 and the ground. It is connected.
9 is a transistor whose collector is a DC power supply 6
The emitter is connected to the power supply terminal 1e, and the base is connected to the connection point between the resistors 7 and 8. A capacitor 10 supplies the AC voltage of the AC power source 11 to the base of the transistor 9, and the AC voltage of the AC power source 11 is superimposed on the DC voltage of the DC power source 6 at the emitter of the transistor 9, that is, the power terminal 1e. 12
shows an AC voltmeter that measures the AC output voltage appearing across the load resistor 4.
リツプル除去率Ｒは電源端子１ｅに印加される
電源電圧V11と出力端子１ｄに表れる交流電圧
V12の比で示され、
Ｒ＝20×Log（V11／V12）（dB）で表せるが、
交流電源１１の交流電圧を所定の電圧に設定する
ことにより、交流電圧計１２で直読出来る。 The ripple rejection rate R is the power supply voltage V11 applied to the power supply terminal 1e and the AC voltage appearing at the output terminal 1d.
It is expressed as the ratio of V12, and can be expressed as R = 20 × Log (V11 / V12) (dB),
By setting the AC voltage of the AC power supply 11 to a predetermined voltage, it can be directly read with the AC voltmeter 12.
このリツプル除去率は音声増幅器の直流特性の
一つであり、実際には第４図に示す測定回路で測
定される。 This ripple rejection rate is one of the DC characteristics of the audio amplifier, and is actually measured by the measurement circuit shown in FIG.
図において、第３図と同一符号は同一物を示し
説明を省略する。図中Ｓ１，Ｓ２，Ｓ３，Ｓ４は
切り換えスイツチ、４ａは負荷抵抗４と異なる抵
抗値の第２の負荷抵抗、６ａは直流電源６と同じ
電圧の第２の直流電源、１３，１４は歪率計、１
５は交流信号発生器で、スイツチＳ１は入力端子
１ａを入力抵抗２と交流信号源１５とを切り換
え、スイツチＳ２は負荷抵抗４，４ａを選択的に
出力コンデンサ５を介して出力端子１ｄに接続す
る。またスイツチＳ３は交流電圧計１２、歪率計
１３，１４を選択して負荷抵抗４または負荷抵抗
４ａに接続する。スイツチＳ４は交流が重畳され
た直流電源６と交流が重畳されない直流電源６ａ
を選択し電源端子１ｅに接続する。 In the figure, the same reference numerals as in FIG. 3 indicate the same parts, and the explanation will be omitted. In the figure, S1, S2, S3, and S4 are changeover switches, 4a is a second load resistor with a different resistance value from the load resistor 4, 6a is a second DC power supply with the same voltage as the DC power supply 6, and 13 and 14 are distortion factors. Total, 1
5 is an AC signal generator; switch S1 switches input terminal 1a between input resistor 2 and AC signal source 15; switch S2 selectively connects load resistors 4 and 4a to output terminal 1d via output capacitor 5; do. Further, the switch S3 selects the AC voltmeter 12 and the distortion rate meters 13 and 14 and connects them to the load resistor 4 or the load resistor 4a. Switch S4 includes a DC power supply 6 with alternating current superimposed and a direct current power supply 6a with no alternating current superimposed.
Select and connect to power terminal 1e.
この回路はスイツチＳ１〜Ｓ４の組み合せよ
り、最大出力、利得、周波数特性、歪率、などの
音声増幅器の交流特性が順次測定され、スイツチ
Ｓ１を入力抵抗２に、スイツチS2を負荷抵抗４
に、スイツチＳ３を交流電圧計１２に、スイツチ
Ｓ４を交流電圧が重畳された直流電源６に接続す
ることにより第３図と同じ回路状態としてリツプ
ル除去率が測定される。 In this circuit, AC characteristics of an audio amplifier such as maximum output, gain, frequency characteristics, distortion rate, etc. are sequentially measured from a combination of switches S1 to S4. Switch S1 is used as input resistor 2, and switch S2 is used as load resistor 4.
Next, by connecting switch S3 to AC voltmeter 12 and switch S4 to DC power supply 6 on which AC voltage is superimposed, the ripple rejection rate is measured under the same circuit conditions as in FIG.
発明が解決しようとする問題点
ところで、バイパス用のコンデンサ３や直流カ
ツト用コンデンサ５は、測定する周波数領域で正
確な測定が出来るようにインピーダンスを十分小
さくする必要があり、低周波領域でもインピーダ
ンスを無視出来るように十分大きな容量、例えば
10〜1000μFに設定する必要があつた。Problems to be Solved by the Invention By the way, the impedance of the bypass capacitor 3 and the DC cut capacitor 5 must be sufficiently small so that accurate measurements can be made in the frequency range to be measured. Capacity large enough to be negligible, e.g.
It was necessary to set it to 10-1000μF.
そのため、測定項目によつてスイツチＳ１〜Ｓ
４を切り換えると、これらのコンデンサ３，５に
充電するまで音声増幅器の動作点が確定せず測定
結果が安定しないため、十分安定して測定する必
要があり、待時間が必要で測定時間の短縮が制約
されていた。 Therefore, depending on the measurement item, switches S1 to S
4, the operating point of the audio amplifier will not be determined until these capacitors 3 and 5 are charged, and the measurement results will not be stable. Therefore, it is necessary to measure with sufficient stability, and a waiting time is required, reducing the measurement time. was restricted.
また、半導体装置化された音声増幅器では半導
体ペレツトの状態で特性の良否を判定し、良品の
みを、リードフレームへの取り付け、ワイヤボン
デイング、樹脂外装等の後工程に送り、不良品は
製品化しないことが望ましい。 In addition, in audio amplifiers that are made into semiconductor devices, the quality of the characteristics is determined in the semiconductor pellet state, and only good products are sent to post-processes such as attachment to lead frames, wire bonding, and resin packaging, and defective products are not turned into products. This is desirable.
そのため、半導体ペレツト上の微細な電極に針
状の探針をあて、第４図に示す回路構成で交流特
性を測定して良否判別することも考えられるが、
上記理由で測定時間がかかる上、探針は微細で、
接触抵抗がばらつき易く、発振などの問題も生じ
易いため、半導体ペレツト状態での測定は直流特
性に限られ、交流特性の測定は半導体ペレツトに
各種作業を行い加価値が高められた状態でしか出
来なかつたため、この時点で不良になると非常な
無駄であつた。 Therefore, it is conceivable to place a needle-like probe on a fine electrode on a semiconductor pellet and measure the AC characteristics using the circuit configuration shown in Figure 4 to determine pass/fail.
For the above reasons, it takes time to measure, and the probe is minute.
Because contact resistance tends to vary and problems such as oscillation are likely to occur, measurements in the semiconductor pellet state are limited to DC characteristics, and AC characteristics can only be measured when the semiconductor pellet has been subjected to various operations to increase added value. Therefore, it would have been a huge waste if it were to become defective at this point.
問題点を解決するための手段
本発明は上記問題点を解決するために提案され
たもので、電源に重畳したリツプル成分に対する
音声増幅器の出力に表れるリツプル成分の除去率
を測定するに当たつて、音声増幅器の直流特性を
測定するための直流バイアス状態に設定し、所定
の直流電源電圧を所定の電圧範囲変化させ、この
直流電源電圧の変化に対応して生じる音声増幅器
の直流出力電圧の変化により、等価的にリツプル
除去率を測定することを特徴とする音声増幅器の
特性測定方法を提供する。Means for Solving the Problems The present invention was proposed in order to solve the above problems, and is a method for measuring the removal rate of the ripple component appearing in the output of an audio amplifier with respect to the ripple component superimposed on the power supply. , set to a DC bias state for measuring the DC characteristics of an audio amplifier, change a predetermined DC power supply voltage within a predetermined voltage range, and change the DC output voltage of the audio amplifier that occurs in response to the change in the DC power supply voltage. Accordingly, a method for measuring characteristics of an audio amplifier is provided, which is characterized in that the ripple rejection rate is equivalently measured.
作 用
上記構成により、所定の直流電源電圧を所定の
電圧範囲変化させ、この直流電源電圧の変化に対
応して生じる音声増幅器の直流出力電圧の変化に
より、等価的にリツプル除去率を測定することが
出来る。Effect With the above configuration, the ripple rejection ratio can be equivalently measured by changing the predetermined DC power supply voltage within a predetermined voltage range and by the change in the DC output voltage of the audio amplifier that occurs in response to the change in the DC power supply voltage. I can do it.
実施例
以下に本発明の実施例を第１図に示す回路図と
第２図に示す電圧波形図から説明する。図におい
て、１は音声増幅器で、半導体ペレツト状態のも
のを含む。１ａは入力端子、１ｂはフイードバツ
ク端子、１ｃは接地端子、１ｄは出力端子、１ｅ
は電源端子を示す。２は入力抵抗で、一端が入力
端子１ａに接続され他端が接地されている。４は
負荷抵抗で一端が出力端子１ｄに直接接続されて
いる。６は直流電源で、手操作または自動で直流
電圧を所定の電圧範囲で時間的に連続または段階
的に変化させることが出来る。１６は帰還信号の
入力端子であるフイードバツク端子１ｂを、１７
は出力端子１ｄをそれぞれ交流的に接地するバイ
パスコンデンサで、それぞれ0.001〜0.1μFの小容
量ではあるが数百ＫHz以上の高周波領域では十分
低いインピーダンスに設定され、音声増幅器１の
発振を防止する。１８は直流電圧計を示す。Embodiment An embodiment of the present invention will be described below with reference to the circuit diagram shown in FIG. 1 and the voltage waveform diagram shown in FIG. In the figure, 1 is an audio amplifier, including one in the form of a semiconductor pellet. 1a is an input terminal, 1b is a feedback terminal, 1c is a ground terminal, 1d is an output terminal, 1e
indicates the power terminal. 2 is an input resistor, one end of which is connected to the input terminal 1a and the other end of which is grounded. 4 is a load resistor, one end of which is directly connected to the output terminal 1d. Reference numeral 6 denotes a DC power supply, which allows the DC voltage to be changed continuously or stepwise over time within a predetermined voltage range, either manually or automatically. 16 is the feedback terminal 1b which is the input terminal for the feedback signal; 17 is the feedback terminal 1b.
are bypass capacitors that ground the output terminals 1d in an alternating current manner, and each has a small capacitance of 0.001 to 0.1 μF, but is set to a sufficiently low impedance in a high frequency region of several hundred KHz or more to prevent oscillation of the audio amplifier 1. 18 indicates a DC voltmeter.
以下に本発明による測定方法を説明する。まず
直流電源６の電圧を電圧V1から時間的に正弦波
状に変化させ最大電圧V2にする。各電源電圧
V1、V2に対する直流電圧計１８の値をV11、
V22とすると、電源電圧の電圧電位差VXはV2−
V1、出力電圧の電位差VYはV22−V11となり、
リツプル除去率Ｒは、
Ｒ＝20×Log（VX／VY）（dB）
となる。 The measuring method according to the present invention will be explained below. First, the voltage of the DC power supply 6 is changed sinusoidally from voltage V1 over time to reach the maximum voltage V2. Each power supply voltage
The value of DC voltmeter 18 for V1 and V2 is V11,
Assuming V22, the voltage potential difference VX of the power supply voltage is V2−
The potential difference VY between V1 and output voltage is V22−V11,
The ripple rejection rate R is R=20×Log(VX/VY)(dB).
このリツプル除去率Ｒは、第４図測定回路のよ
うに測定項目に応じてスイツチを切り換え設定条
件を変える必要がなく、音声増幅器の直流特性を
測定する際に他の測定項目と連続して測定でき、
バイパス用コンデンサの容量が交流特性測定に比
し十分小さいため、電源電圧の投入から出力電圧
が安定して測定可能となるまでの時間が数ｍＳ程
度と大幅に短縮できる。 This ripple rejection rate R can be measured continuously with other measurement items when measuring the DC characteristics of an audio amplifier, without the need to change the setting conditions by changing the switch according to the measurement item as in the measurement circuit shown in Figure 4. I can,
Since the capacitance of the bypass capacitor is sufficiently small compared to AC characteristic measurement, the time from turning on the power supply voltage until the output voltage becomes stable and measurable can be significantly shortened to about several milliseconds.
また、出力端子１ｄに大容量のコンデンサを接
続する必要がないため、探針に大きな充電電流が
流れる虞もなく、接触抵抗にばらつきがあつても
発振などの問題が起こり難いため半導体ペレツト
の状態での良否判別が可能で、より付加価値の小
さい状態で不良品を除去することもできる。 In addition, since there is no need to connect a large capacity capacitor to the output terminal 1d, there is no risk of large charging current flowing to the probe, and problems such as oscillation are unlikely to occur even if there are variations in contact resistance, so the state of the semiconductor pellet is It is possible to determine whether the product is good or bad, and it is also possible to remove defective products with less added value.
発明の効果
以上のように、本発明によれば交流特性の一項
目として測定されていたリツプル除去率を直流特
性測定項目の一部として測定可能となり、測定時
間を大幅に短縮できる。Effects of the Invention As described above, according to the present invention, the ripple rejection rate, which has been measured as one item of AC characteristics, can be measured as part of the DC characteristics measurement items, and the measurement time can be significantly shortened.
また、半導体ペレツト状態での良否判別が可能
となり、より付加価値の小さい状態で不良品を除
去することもできる。 Furthermore, it is possible to determine the quality of semiconductor pellets, and it is also possible to remove defective products with less added value.
第１図は本発明の実施例を示すリツプル除去率
の測定方法を説明する回路図、第２図は第１図に
示す音声増幅器に印加される電源電圧の波形図、
第３図は従来のリツプル除去率測定回路、第４図
は音声増幅器の交流特性を測定する回路図を示
す。
１……音声増幅器、６……電源。
FIG. 1 is a circuit diagram illustrating a method for measuring ripple rejection ratio showing an embodiment of the present invention, FIG. 2 is a waveform diagram of the power supply voltage applied to the audio amplifier shown in FIG. 1,
FIG. 3 shows a conventional ripple rejection rate measuring circuit, and FIG. 4 shows a circuit diagram for measuring the AC characteristics of an audio amplifier. 1...Audio amplifier, 6...Power supply.
Claims (1)
幅器の出力に表れるリツプル成分の除去率を測定
するに当たつて、音声増幅器の直流特性を測定す
るための直流バイアス状態に設定し、所定の直流
電源電圧を所定の電圧範囲変化させ、この直流電
源電圧の変化に対応して生じる音声増幅器の直流
出力電圧の変化により、等価的にリツプル除去率
を測定することを特徴とする音声増幅器の特性測
定方法。1. When measuring the removal rate of the ripple component appearing in the output of the audio amplifier with respect to the ripple component superimposed on the power supply, set the audio amplifier to a DC bias state for measuring the DC characteristics, and apply a predetermined DC power supply voltage. A method for measuring characteristics of an audio amplifier, comprising changing a predetermined voltage range and equivalently measuring a ripple rejection rate based on a change in the DC output voltage of the audio amplifier that occurs in response to the change in the DC power supply voltage.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62149999A JPS63313079A (en) | 1987-06-16 | 1987-06-16 | Method for measuring characteristic of audio amplifier |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62149999A JPS63313079A (en) | 1987-06-16 | 1987-06-16 | Method for measuring characteristic of audio amplifier |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63313079A JPS63313079A (en) | 1988-12-21 |
| JPH0549191B2 true JPH0549191B2 (en) | 1993-07-23 |
Family
ID=15487255
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62149999A Granted JPS63313079A (en) | 1987-06-16 | 1987-06-16 | Method for measuring characteristic of audio amplifier |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63313079A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100231649B1 (en) * | 1996-08-03 | 1999-11-15 | 윤종용 | A test board having a capacitor charging circuit and a test method using the test board |
-
1987
- 1987-06-16 JP JP62149999A patent/JPS63313079A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS63313079A (en) | 1988-12-21 |
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