JPH05221613A - Thin-film forming apparatus for mist material coating by compression spraying method - Google Patents

Thin-film forming apparatus for mist material coating by compression spraying method

Info

Publication number
JPH05221613A
JPH05221613A JP2668892A JP2668892A JPH05221613A JP H05221613 A JPH05221613 A JP H05221613A JP 2668892 A JP2668892 A JP 2668892A JP 2668892 A JP2668892 A JP 2668892A JP H05221613 A JPH05221613 A JP H05221613A
Authority
JP
Japan
Prior art keywords
substrate
chamber
deposition
thin film
film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2668892A
Other languages
Japanese (ja)
Inventor
Moriya Abe
守也 阿部
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nitto Koki KK
Original Assignee
Nitto Koki KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nitto Koki KK filed Critical Nitto Koki KK
Priority to JP2668892A priority Critical patent/JPH05221613A/en
Publication of JPH05221613A publication Critical patent/JPH05221613A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To eliminate the troubles of defective coating caused by the falling of a substance attached to the inner wall of the chamber of the apparatus on a substrate and to stabilize the crystal-growth direction of the deposited substance in a depositing apparatus to spray deposition material mist against a substrate. CONSTITUTION:A fixing means 40 is fixed to a chamber 10 and a substrate 50 is fixed to the fixing means 40. The deposition face of the substrate 50 is directed toward the bottom (ground) of the chamber. A deposition material is sprayed upward through a nozzle hole and coated on the surface of the substrate 50. A gas exhaustion means is placed under the substrate-supporting part of the chamber 10 to forcedly exhaust the reaction gas. The deposition of unnecessary pieces harmful for the film-forming on the deposition face of the substrate can be prevented by this structure and the convection of gas in the chamber can be maintained always in a definite state to stabilize the crystal growing direction during the film-forming process and give a coating film having uniform quality.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は特に有機金属化合物の圧
縮スプレー法による噴霧状材料を被覆する薄膜形成装置
に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a thin film forming apparatus for coating an atomized material by a compression spray method of an organometallic compound.

【0002】[0002]

【従来の技術】従来、この種の装置は図1に示す様な構
造であった。図1において、基板に粉塵等が付着しない
様に外カバーとしてのチャンバ(10)が内部装置全体
を覆う様に有り、該チャンバ内部底に台(20)が固着
されており、該台上に基板(50)を載置させた構成の
真下に基板から一定距離離れた所にノズル噴出口が基板
に向く様にノズル(60)を配置し、該ノズルは管(1
30)を経由して、ディポジット材料が蓄えられたタン
ク(110)に連結されており、該タンクに圧縮空気を
送るコンプレッサ(不図示)が連結されている。また該
台には基板の真下にヒータ(30)が設置されている。
2. Description of the Related Art Conventionally, this type of device has a structure as shown in FIG. In FIG. 1, a chamber (10) as an outer cover is provided so as to cover the entire inner device so that dust or the like does not adhere to the substrate, and a table (20) is fixed to the inner bottom of the chamber. A nozzle (60) is arranged directly below the structure where the substrate (50) is placed so that the nozzle ejection port faces the substrate at a certain distance from the substrate.
30) is connected to a tank (110) in which the deposit material is stored, and a compressor (not shown) for sending compressed air is connected to the tank. Further, a heater (30) is installed directly under the substrate on the table.

【0003】ここにおいて、コンプレッサ(不図示)の
圧縮空気によってノズル(60)から噴霧されたディポ
ジット材料の噴霧状物質がヒータで数百度に温められた
基板(50)上に付着し、有機溶剤分が蒸発させられ残
存物として適量膜厚の酸化金属膜がディポジットされ
る。この際噴霧する前に超音波を材料に施し噴霧状態の
分散をより均一化する方法をとることも可能である。ま
た、チャンバ(10)の内部天井にガス排気口が取り付
けられており、該チャンバは密閉されているか、又は側
壁に開口部がある場合にはエアカーテンが施されてお
り、外界の雰囲気から遮断されている。例えばこの種の
装置の従来技術は、「反応性蒸着法」(『応用物理』3
4、NO.7,1965,507) 、「ITO 膜生成法」(特開昭46-786
7)、「薄膜を造る方法と同一法によって得られる薄膜」
(特開昭55-15545) に述べられている。
Here, the atomized substance of the deposit material atomized from the nozzle (60) by the compressed air of the compressor (not shown) adheres to the substrate (50) heated to several hundred degrees by the heater, and the organic solvent component Are evaporated and a metal oxide film with an appropriate thickness is deposited as a residue. At this time, it is also possible to adopt a method in which ultrasonic waves are applied to the material before spraying to make the dispersion of the spray state more uniform. In addition, a gas exhaust port is attached to the inner ceiling of the chamber (10), and the chamber is hermetically sealed, or has an air curtain when the side wall has an opening, so that the chamber is shielded from the outside atmosphere. Has been done. For example, the conventional technology for this type of device is the “reactive vapor deposition method” (“Applied Physics” 3
4, NO.7, 1965, 507), "ITO film formation method" (JP-A-46-786)
7), "Thin film obtained by the same method as that for making thin film"
(Japanese Patent Laid-Open No. 55-15545).

【0004】[0004]

【発明が解決しようとする問題点】上記の如き従来技術
に於ては、噴霧対象物質が基板以外の部分、例えばチャ
ンバ内壁やノズル等の不必要な部分に付着蓄積し、これ
ら付着物が基板の上に降りかかりディポジット面にピン
ホールや突起部等を生じる要因となり製品の品質を著し
く劣化させ製品歩留まりの低下を招いていた。例えば、
これらの問題点からデバイスにおける透明導電膜(ITO
膜等)製造の際に基板の表面に汚れや塵が付着している
場合、電極形成時に電極の継線や短絡が生じ、また配向
性にムラが発生し、液晶分子がドメインを形成するため
表示における品質低下を招く等の弊害がある。(「液晶
の基礎と応用」P.205 松本正一,角田市良共著,工業調
査会版)
In the prior art as described above, the substance to be sprayed adheres and accumulates on a portion other than the substrate, for example, an unnecessary portion such as the inner wall of the chamber or the nozzle, and these deposits form the substrate. As a result, it becomes a factor of causing pinholes and protrusions on the deposit surface, which significantly deteriorates the product quality and lowers the product yield. For example,
Due to these problems, the transparent conductive film (ITO
(Film etc.) If dirt or dust adheres to the surface of the substrate during manufacturing, wire connection or short circuit of the electrode will occur during electrode formation, and the orientation will be uneven, and liquid crystal molecules will form domains. There is an adverse effect such as deterioration of display quality. ("Fundamentals and Applications of Liquid Crystals" P.205, Shoichi Matsumoto, Ryokyo Tsunoda, Industrial Research Committee version)

【0005】また従来法に於いてはチャンバからの反応
生成物の有機ガス等の排気がチャンバ内部に充満した
後、チャンバ天井部の排気口へ自然に任せたトンネル排
気効果によってなされていたため、チャンバ内に基板上
での蒸着物質の結晶成長に悪影響を与えるような気流が
発生していた。そこで本発明は上記問題点を解決するこ
とによって、製品歩留まりを改善し品質の安定をもたら
す装置を提供することを目的とする。
Further, in the conventional method, since the exhaust gas such as the organic gas of the reaction product from the chamber is filled in the chamber, it is carried out by the tunnel exhaust effect which is naturally left to the exhaust port of the chamber ceiling. An air flow that adversely affects the crystal growth of the vapor deposition material on the substrate was generated therein. Therefore, an object of the present invention is to provide a device that improves the product yield and stabilizes the quality by solving the above problems.

【0006】[0006]

【問題点を解決する為の手段】上記目的を達成する為に
本発明に於いては基板のディポジット面をチャンバ底面
(地上面)と向き合うように設定し、ノズル(60)が
下方(底面の方)から霧状物質を圧縮スプレー法によっ
て噴霧できるように設置した。また、この為基板を暖め
る為のヒータ(30)、支持部材(40)等も上方から
載設させる構成とした。
In order to achieve the above object, in the present invention, the deposit surface of the substrate is set to face the bottom surface (ground surface) of the chamber, and the nozzle (60) is located below (bottom surface). It was installed so that the atomized substance could be sprayed by the compression spray method. For this reason, the heater (30) for warming the substrate, the supporting member (40), and the like are mounted from above.

【0007】[0007]

【作用】本発明では基板のディポジット面が地上面に向
いているので、ハウジングの内壁やノズル等からはがれ
落ちた物質等(120)がディポジット面に付着してし
まう不具合を防止することができ、該ディポジット面に
起こり得る不良要因は解消する。また基板下方からの反
応ガス排気によるチャンバ内部の気流が絶えず一定とな
っており結晶構造が安定する。
In the present invention, since the deposit surface of the substrate faces the ground surface, it is possible to prevent the problem that the substance (120) peeled off from the inner wall of the housing or the nozzle adheres to the deposit surface. The cause of defects that may occur on the deposit surface is eliminated. Further, the air flow inside the chamber due to the reaction gas exhaust from below the substrate is constantly constant, and the crystal structure is stabilized.

【0008】[0008]

【実施例】本発明の実施例について図面を参照して説明
すると、図2において全体を覆うチャンバ(10)があ
り、チャンバ内壁上部天井に固定手段(80)が取り付
けられ、ヒータ(30)を内包している支持台(20)
がそれに固着している。該支持台(20)の下面には被
ディポジット基板(50)が取り付けられている。この
際に重力に逆らって基板を落下させないように固定する
方法として固定治具で上方の支持台(20)から固定す
るか背面からエアー等の手段によって吸引させることに
よって、また基板に強磁性体部を設けることによって、
上方から磁石手段によっても固定することができる。被
ディポジット基板面とノズル(60)の噴出口とが向か
い合うようにノズル(60)が、ある一定距離を離れて
存在し、該ノズルは管(130)によって有機金属化合
物等の蓄えられたタンク(110)に連結されており、
タンクは図示しないエアコンプレッサに連結されてい
る。また前記基板(50)の下方のチャンバ底部に有機
ガス等の排気口(70)を設け、又前記排気手段は吸引
ポンプ(不図示)に連結されている。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described with reference to the drawings. In FIG. 2, there is a chamber (10) covering the whole, a fixing means (80) is attached to an upper ceiling of an inner wall of the chamber, and a heater (30) is installed. Enclosed support (20)
Is stuck to it. A deposited substrate (50) is attached to the lower surface of the support table (20). At this time, as a method of fixing the substrate so as not to fall against gravity, the substrate may be fixed from the upper support table (20) with a fixing jig, or may be sucked from the back surface by means of air or the like. By providing a section,
It can also be fixed by magnet means from above. The nozzle (60) is present at a certain distance such that the surface of the substrate to be deposited and the ejection port of the nozzle (60) face each other, and the nozzle (60) stores a tank (100) in which an organometallic compound or the like is stored by a pipe (130). 110),
The tank is connected to an air compressor (not shown). An exhaust port (70) for organic gas or the like is provided at the bottom of the chamber below the substrate (50), and the exhaust means is connected to a suction pump (not shown).

【0009】次に実施例の作用を説明する。基板(5
0)がヒータ(30)によって適度な温度(数百度)に
暖められており、エアコンプレッサ(不図示)により、
タンク(100)から有機金属化合物等がノズル(6
0)を通して基板上に噴霧され、有機分が前記の暖めら
れた基板上で蒸発し、残存した金属が酸素と反応して基
板上に酸化金属皮膜(ITO 薄膜等)を形成する。この際
に酸素含有量はITO 膜等において、光透過率や電気伝導
度を左右する重要なパラメータとなるので図示しない酸
素量制御手段によって外部からコントロールされる。ま
た反応生成物としての有機ガスはチャンバ底部排気手段
から強制排気される。また製造装置としてライン化を図
る時は図2の装置を、図3の様に縦列に配置することに
よって量産化が可能となる。この際チャンバの両端は、
薄膜形成時には両端とも閉じられてクローズドの部屋と
するか、又はエアカーテン等の手段により外部から塵等
や外部気体が内部へ入らない様に構成されている。
Next, the operation of the embodiment will be described. Board (5
0) is heated to an appropriate temperature (hundreds of degrees) by a heater (30), and an air compressor (not shown)
Organometallic compounds, etc.
It is sprayed onto the substrate through 0), the organic components are evaporated on the above-mentioned warmed substrate, and the remaining metal reacts with oxygen to form an oxide metal film (ITO thin film etc.) on the substrate. At this time, the oxygen content is an important parameter that affects the light transmittance and the electrical conductivity in the ITO film and the like, and is therefore controlled from the outside by an oxygen content control means (not shown). Further, the organic gas as a reaction product is forcibly discharged from the chamber bottom exhaust means. Further, when the production apparatus is to be made into a line, the apparatus shown in FIG. 2 can be mass-produced by arranging the apparatuses in a column as shown in FIG. At this time, both ends of the chamber
At the time of forming the thin film, both ends are closed to form a closed room, or dust or external gas is prevented from entering from the outside by means such as an air curtain.

【0010】上述した一実施例によって、圧縮空気スプ
レー法による液晶デバイスに使用される透明電極として
の薄膜(ITO 薄膜等)を生成することができる。なお本
発明の基板面の下方から被覆する薄膜形成方法は、ディ
ポジットする材料がディポジット前に霧状に噴霧され、
装置がディポジットする対象を最低限、上下左右のチャ
ンバ壁で取り囲み、ディポジットと同時にディポジット
材料である霧状物質がチャンバ内に分散し、装置のあら
ゆる内部部分に該物質が付着し得る種々の薄膜生成方法
に適用でき、種々の装置の構造について変更が可能であ
る。
According to the above-described embodiment, it is possible to form a thin film (ITO thin film or the like) as a transparent electrode used for a liquid crystal device by a compressed air spray method. Incidentally, the thin film forming method of coating from below the substrate surface of the present invention, the material to be deposited is atomized before depositing,
The target of deposition of the device is surrounded by the chamber walls on the top, bottom, left and right, and at the same time as the deposit, the atomized substance that is the deposit material is dispersed in the chamber, and various thin films can be deposited on the inner part of the device. It can be applied to the method and the structure of various devices can be modified.

【0011】[0011]

【発明の効果】以上説明したように本発明によれば基板
上にディポジットされる面がチャンバの底部(地上面)
に向いているのでチャンバ内壁やノズル等に付着した金
属酸化物等がディポジット面に落下する様な不具合が生
じることなく、常に高品質の薄膜を生成することができ
る。あわせて基板の裏側の地域に回り込む霧状の有機金
属化合物は従来技術に比して大幅に少なくなり、よって
チャンバ内部上部付着量、つまり基板に対して有害とな
る可能性の高い付着量も同時に少なくなることによって
チャンバ内部の付着物除去のための掃除の頻度も大幅に
減少し、装置の連続運転の長時間化も可能となり生産量
向上につながるので工業的意義も大きい。また他方で発
生するガスの排気を基板の下方から常に一定方向の排気
にすることによってディポジットされる結晶成長の安定
化がもたらされ、製品の品質が一定に保たれる。
As described above, according to the present invention, the surface deposited on the substrate is the bottom of the chamber (ground plane).
Therefore, it is possible to always produce a high quality thin film without causing such a problem that metal oxide adhered to the inner wall of the chamber, the nozzle and the like drop onto the deposit surface. At the same time, the amount of atomized organometallic compound that wraps around the area on the back side of the substrate is significantly smaller than that of the conventional technology, and therefore the amount deposited on the upper part of the chamber, that is, the amount that is likely to be harmful to the substrate, is also reduced. By reducing the amount, the frequency of cleaning for removing the deposits inside the chamber is significantly reduced, the continuous operation of the apparatus can be extended, and the production amount can be improved, which is of great industrial significance. On the other hand, the exhaust of the gas generated on the other hand is always exhausted from below the substrate in a fixed direction, so that the crystal growth deposited is stabilized and the quality of the product is kept constant.

【図面の簡単な説明】[Brief description of drawings]

【図1】圧縮スプレー法による薄膜生成装置の従来の一
実施例
FIG. 1 is a conventional example of a thin film forming apparatus using a compression spray method.

【図2】本発明に係る圧縮スプレー法による薄膜生成装
置の一実施例
FIG. 2 is an example of a thin film forming apparatus by a compression spray method according to the present invention.

【図3】本発明に係る薄膜生成装置のライン化された製
造装置の一実施例
FIG. 3 is an example of a lined manufacturing apparatus of a thin film forming apparatus according to the present invention.

【符号の説明】[Explanation of symbols]

10 チャンバ 60 ノズル 40、80 固定手段 70 排気手段 10 chamber 60 nozzle 40, 80 fixing means 70 exhausting means

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 有機金属化合物を温められた基板上にノ
ズルを介して金属酸化物として薄膜形成する装置におい
て、 基板の薄膜形成面を地上面に向く様に固定するための固
定手段を設け、ノズルを薄膜形成面に噴出口が向くよう
に設置し、被覆時にチャンバ内に発生するガスを一定排
気するための排気手段を設けることを特徴とする装置。
1. A device for forming a thin film of an organometallic compound as a metal oxide on a heated substrate through a nozzle, wherein a fixing means is provided for fixing the thin film formation surface of the substrate to the ground plane. An apparatus characterized in that a nozzle is installed on a thin film forming surface so that an ejection port faces, and an exhaust means for exhausting a gas generated in a chamber during coating is constantly provided.
JP2668892A 1992-02-13 1992-02-13 Thin-film forming apparatus for mist material coating by compression spraying method Pending JPH05221613A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2668892A JPH05221613A (en) 1992-02-13 1992-02-13 Thin-film forming apparatus for mist material coating by compression spraying method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2668892A JPH05221613A (en) 1992-02-13 1992-02-13 Thin-film forming apparatus for mist material coating by compression spraying method

Publications (1)

Publication Number Publication Date
JPH05221613A true JPH05221613A (en) 1993-08-31

Family

ID=12200339

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2668892A Pending JPH05221613A (en) 1992-02-13 1992-02-13 Thin-film forming apparatus for mist material coating by compression spraying method

Country Status (1)

Country Link
JP (1) JPH05221613A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4893105A (en) * 1987-06-30 1990-01-09 Tdk Corporation Transformer with tapered core

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0280303A (en) * 1987-06-04 1990-03-20 Tonen Corp Process and apparatus for forming thin superconducting film
JPH03103305A (en) * 1989-09-13 1991-04-30 Oki Electric Ind Co Ltd Production of oxide superconductor and apparatus therefor
JPH03197306A (en) * 1989-12-26 1991-08-28 Sumitomo Electric Ind Ltd Equipment for producing oxide superconducting thin film and method therefor
JPH03218906A (en) * 1990-01-23 1991-09-26 Fujitsu Ltd Method and device for forming oxide superconducting thin film

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0280303A (en) * 1987-06-04 1990-03-20 Tonen Corp Process and apparatus for forming thin superconducting film
JPH03103305A (en) * 1989-09-13 1991-04-30 Oki Electric Ind Co Ltd Production of oxide superconductor and apparatus therefor
JPH03197306A (en) * 1989-12-26 1991-08-28 Sumitomo Electric Ind Ltd Equipment for producing oxide superconducting thin film and method therefor
JPH03218906A (en) * 1990-01-23 1991-09-26 Fujitsu Ltd Method and device for forming oxide superconducting thin film

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4893105A (en) * 1987-06-30 1990-01-09 Tdk Corporation Transformer with tapered core

Similar Documents

Publication Publication Date Title
US5614252A (en) Method of fabricating barium strontium titanate
US5759923A (en) Method and apparatus for fabricating silicon dioxide and silicon glass layers in integrated circuits
US5962085A (en) Misted precursor deposition apparatus and method with improved mist and mist flow
US5540772A (en) Misted deposition apparatus for fabricating an integrated circuit
KR20010103563A (en) Misted precursor deposition apparatus and method with improved mist and mist flow
KR101409617B1 (en) Sputtering device
US20070234959A1 (en) Evaporation apparatus, evaporation method, method of manufacturing electro-optical device, and film-forming apparatus
US20090283401A1 (en) Method for manufacturing liquid crystal device
EP0319347A2 (en) Vacuum depositing apparatus
US5965219A (en) Misted deposition method with applied UV radiation
JPH05221613A (en) Thin-film forming apparatus for mist material coating by compression spraying method
JP2000328229A (en) Vacuum deposition device
JP2000513500A (en) Method and apparatus for depositing material using primers
JPH06279998A (en) Dry coating method for inside surface of cylinder
CN215668181U (en) Environment deposition reaction equipment
KR102609982B1 (en) Method for preprocessing vibrating crystals for measuring deposition rate, deposition rate measurement device, evaporation source and deposition apparatus
JP2860505B2 (en) Material deposition equipment
JP5195100B2 (en) Sputtering apparatus and liquid crystal device manufacturing apparatus
JPS592004B2 (en) Manufacturing method of electrode substrate for display
JP2003293129A (en) Sputtering system
JPS643338B2 (en)
JPH06140335A (en) Film growth device
CN115449753A (en) Environment deposition reaction equipment
JPS60126823A (en) Plasma vapor growth apparatus
JP2002146525A (en) Sputter deposition system

Legal Events

Date Code Title Description
A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 19941214