JPH05196044A - Rolling bearing for semiconductor manufacturing facility - Google Patents

Rolling bearing for semiconductor manufacturing facility

Info

Publication number
JPH05196044A
JPH05196044A JP610992A JP610992A JPH05196044A JP H05196044 A JPH05196044 A JP H05196044A JP 610992 A JP610992 A JP 610992A JP 610992 A JP610992 A JP 610992A JP H05196044 A JPH05196044 A JP H05196044A
Authority
JP
Japan
Prior art keywords
rolling
bearing
semiconductor manufacturing
outer ring
inner ring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP610992A
Other languages
Japanese (ja)
Other versions
JP3021902B2 (en
Inventor
Hiromitsu Kondo
博光 近藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NTN Corp
Original Assignee
NTN Corp
NTN Toyo Bearing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NTN Corp, NTN Toyo Bearing Co Ltd filed Critical NTN Corp
Priority to JP4006109A priority Critical patent/JP3021902B2/en
Publication of JPH05196044A publication Critical patent/JPH05196044A/en
Application granted granted Critical
Publication of JP3021902B2 publication Critical patent/JP3021902B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Rolling Contact Bearings (AREA)

Abstract

PURPOSE:To obtain a rolling bearing for semiconductor manufacturing facilities which can be used under an ambiance which requires not only the basic conditions such as a durability and a low dust generating ambiance, but also a nonmagnetic environment. CONSTITUTION:This bearing is composed of bearing component parts such as an inner ring 1, an outer ring 2, plural rolling elements 3 provided between the inner and the outer rings 1 and 2, and a retainer 4 to hold the rolling elements 3 at an equal circumferential interval. These bearing component parts are formed of non-magnetic materials, by forming the inner ring 1 and the outer ring 2 with an Mn-Cr system austenite steel, the rolling elements 3 with a ceramics (Si3N4), and the retainer 4 with an austenite system stainless steel, for example. Lubricating membranes 1a, 2a, and 3a of a PTFE whose mean molecular weight is less than 5000 are formed on the rolling surfaces of the inner ring 1 and the outer ring 2, and on the surface of the rolling elements 3, respectively.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体製造設備に使用
される固体潤滑転がり軸受に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a solid lubricating rolling bearing used in semiconductor manufacturing equipment.

【0002】[0002]

【従来の技術】半導体製造設備用転がり軸受は、高い清
浄度が要求される密封真空下で運転されるため、その潤
滑には、一般に、二硫化モリブデン等の層状物質、金、
銀、鉛等の軟質金属、PTFE、ポリイミド等の高分子
材料などの固体潤滑剤が用いられている。
2. Description of the Related Art Rolling bearings for semiconductor manufacturing equipment are generally operated under a sealed vacuum which requires high cleanliness. Therefore, for lubrication thereof, layered substances such as molybdenum disulfide, gold,
Solid lubricants such as soft metals such as silver and lead, polymer materials such as PTFE and polyimide are used.

【0003】ところで、近年、半導体製造分野では半導
体の集積度が増すにつれて回路パターンの線幅が微細化
しており、軸受から排出される固体潤滑剤の摩耗粉がパ
ターン上に付着すると種々の弊害を引き起こす可能性が
あることから、固体潤滑剤の特性として、本来の潤滑性
・耐久性の他に、特に低発塵性を要求するようになって
きている。
By the way, in recent years, in the field of semiconductor manufacturing, the line width of circuit patterns has become finer as the degree of integration of semiconductors has increased, and if the abrasion powder of the solid lubricant discharged from the bearing adheres to the pattern, various adverse effects are caused. Because of the possibility of causing it, solid lubricants are required to have particularly low dusting property in addition to the original lubricity and durability.

【0004】このような現状に鑑み、本出願人は、転が
り軸受を構成する部品のうち少なくとも転がり摩擦また
は滑り摩擦を生ずる表面に、平均分子量が5000以下
のポリテトラフルオロエチレン(以下、簡単のため、低
分子量PTFEと称す。)からなる潤滑皮膜を形成した
固体潤滑転がり軸受について既に出願している(特願平
3−190150号等)。従来より、転がり軸受の固体
潤滑剤として用いられているPTFEは平均分子量が1
×105 以上、主に、1×106〜1×107のものであ
るが、低分子量PTFEを用いて潤滑皮膜を形成するこ
とにより、潤滑性、耐久性、低発塵性等に優れた潤滑皮
膜を得ることができることを上記出願において示した。
これらの効果は、低分子量PTFEが、従来より固体潤
滑剤として用いられているPTFEに比べて、剪断強度
が著しく小く、また、転着性に優れていることによるも
のであった。
In view of the above situation, the applicant of the present invention has found that polytetrafluoroethylene having an average molecular weight of 5,000 or less (hereinafter, for the sake of simplicity, on the surface of at least rolling friction or sliding friction among the components constituting the rolling bearing). , Which is referred to as low molecular weight PTFE), has already applied for a solid lubricating rolling bearing having a lubricating film formed thereon (Japanese Patent Application No. 3-190150, etc.). Conventionally, PTFE used as a solid lubricant for rolling bearings has an average molecular weight of 1
It is more than × 10 5 , mainly 1 × 10 6 to 1 × 10 7 , but by forming a lubricating film using low molecular weight PTFE, it has excellent lubricity, durability, low dust generation, etc. It has been shown in the above application that a different lubricating coating can be obtained.
These effects were due to the fact that low-molecular-weight PTFE has remarkably small shear strength and excellent transferability as compared with PTFE conventionally used as a solid lubricant.

【0005】[0005]

【発明が解決しようとする課題】近時の半導体集積度の
向上には著しいものがあり、半導体製造分野では回路パ
ターンの線幅をより一層微細化する必要に迫られてい
る。そのため、半導体回路マスク作成において、従来の
縮小投影露出法に代えて電子ビーム描画法等を採用する
傾向にある。図3は電子ビーム描画法の概念図を示す。
電子ビーム描画法は、電子顕微鏡と同じように、高速中
において電子銃のカソードから放射された電子を高電圧
で加速し、さらに電磁場において集束し、偏向電極によ
って走査する方法であるが、焦点面で0.02μm程度
まで集光することができ、0.1〜1μmの微細パター
ンを形成することが可能である。
Recently, there has been a remarkable improvement in the degree of integration of semiconductors, and in the field of semiconductor manufacturing, there is an urgent need to further reduce the line width of circuit patterns. Therefore, in the production of semiconductor circuit masks, there is a tendency to adopt an electron beam drawing method or the like instead of the conventional reduced projection exposure method. FIG. 3 shows a conceptual diagram of the electron beam drawing method.
Like the electron microscope, the electron beam drawing method is a method of accelerating electrons emitted from the cathode of an electron gun at high voltage at high speed, further focusing in an electromagnetic field, and scanning with a deflection electrode. It is possible to collect light up to about 0.02 μm, and it is possible to form a fine pattern of 0.1 to 1 μm.

【0006】ところで、電子ビーム描画法の一つの特徴
は、マスク近傍の装置あるいは部材の材質が非磁性でな
ければならないということである。これは、マスク近傍
に磁性体があると、偏向器の電磁場の影響で磁性体に残
留磁気が発生し、この残留磁気が電子ビームの解像度等
に悪影響を及ぼすからである。また、磁性体には、加工
ひずみ、熱ひずみ、さらに、回転や滑りを伴う場合には
その際に発生する静電気等によっても残留磁気が生じ
る。したがって、電子ビーム描画法を採用する場合、マ
スク近傍の移動テーブル、搬送装置などを非磁性材で構
成することは必須であり、この点から、これら装置に組
み込まれる軸受にも非磁性が当然に要求されることにな
る。勿論、この場合にも、軸受の低発塵性が厳格に要求
されることには変わりない。
By the way, one of the characteristics of the electron beam drawing method is that the material of the device or member near the mask must be non-magnetic. This is because if there is a magnetic substance in the vicinity of the mask, remanence is generated in the magnetic substance due to the influence of the electromagnetic field of the deflector, and this residual magnetism adversely affects the resolution of the electron beam. In addition, remanence is generated in the magnetic body due to processing strain, thermal strain, and static electricity generated at the time of rotation or slippage. Therefore, when adopting the electron beam drawing method, it is indispensable that the moving table near the mask, the transfer device, and the like are made of a non-magnetic material. From this point, the bearings incorporated in these devices are naturally non-magnetic. Will be required. In this case, of course, the low dust generation of the bearing is still strictly required.

【0007】そこで、本発明の目的は、耐久性、低発塵
性等の基本的特性に加え、さらに非磁性が要求される環
境下で使用することのできる半導体製造設備用転がり軸
受を提供することある。
Therefore, an object of the present invention is to provide a rolling bearing for semiconductor manufacturing equipment which can be used in an environment where basic properties such as durability and low dust generation are required, and further non-magnetism is required. There are things.

【0008】[0008]

【課題を解決するための手段】本発明の半導体製造設備
用転がり軸受は、半導体製造設備に用いられる転がり軸
受であって、この軸受を構成する内輪、外輪、転動体、
および保持器を非磁性材で形成し、かつ、この軸受の転
がり摩擦または滑り摩擦を生ずる構成部品のうち、少な
くとも転動体の表面に平均分子量が5000以下のポリ
テトラフルオロエチレンからなる潤滑皮膜を形成したこ
とを特徴とする。
A rolling bearing for semiconductor manufacturing equipment according to the present invention is a rolling bearing used in semiconductor manufacturing equipment, and includes an inner ring, an outer ring, rolling elements, and
And a cage made of a non-magnetic material, and a lubricating film made of polytetrafluoroethylene having an average molecular weight of 5000 or less is formed on at least the surface of the rolling element among the components that cause rolling friction or sliding friction of the bearing. It is characterized by having done.

【0009】そして、非磁性材として、Mn−Cr系オ
ーステナイト鋼、オーステナイト系ステンレス鋼、高分
子材を用いるようにした。Mn−Cr系オーステナイト
鋼としては、例えば、10〜20%Mn、3〜20%C
rを含有する鋼がある。これに、オーステナイト相の安
定化を目的として、0〜5%Ni、0〜0.25%Nが
添加されることがある。また、オーステナイト系ステン
レス鋼としては、SUS304が一般的である。
As the non-magnetic material, Mn--Cr type austenitic steel, austenitic stainless steel, and polymer material are used. As the Mn-Cr austenitic steel, for example, 10 to 20% Mn and 3 to 20% C
There is steel containing r. To this, 0-5% Ni and 0-0.25% N may be added for the purpose of stabilizing an austenite phase. SUS304 is generally used as the austenitic stainless steel.

【0010】[0010]

【作用】低分子量PTFEを用いて潤滑皮膜を形成する
ことにより、潤滑性、耐久性、低発塵性に優れた潤滑皮
膜を得ることができる。また、軸受部品を非磁性材で形
成することにより、軸受部に残留磁気が発生しなくな
る。
By forming a lubricating film using low molecular weight PTFE, it is possible to obtain a lubricating film excellent in lubricity, durability and low dust generation. Further, by forming the bearing component with a non-magnetic material, residual magnetism does not occur in the bearing portion.

【0011】[0011]

【実施例】以下、本発明の実施例について説明する。EXAMPLES Examples of the present invention will be described below.

【0012】図1は、本発明を深溝玉軸受に適用した実
施例について説明する。この軸受は、内輪1、外輪2、
内・外輪1、2間に介在する複数の転動体3、転動体3
を円周等間隔に保持する保持器4といった軸受構成部品
で構成される。これらの軸受構成部品は非磁性材で形成
されており、例えば、内輪1および外輪2はMn−Cr
系オーステナイト鋼、転動体3はセラミック(Si
34)、保持器4はオーステナイト系ステンレス鋼で形
成される。そして、内・外輪1、2の転走面および転動
体3の表面にはそれぞれ平均分子量が5000以下のP
TFE(低分子量PTFE)の潤滑皮膜1a、2a、3
aが形成されている。これらの潤滑皮膜は、低分子量P
TFE(例えば、日本アチソン製ARC7)を、25c
m離れた位置から皮膜形成面にスプレーして付着させた
もので、この場合の平均皮膜厚さは0.6μm程度であ
った。ただし、同図では皮膜厚さをかなり誇張してあ
る。低分子量PTFEの皮膜コーティング法としては、
上記スプレー法による他、浸漬法等がある。尚、本実施
例では内・外輪1、2の転走面および転動体3の表面に
潤滑皮膜を形成するようにしたが、潤滑皮膜は少なくと
も転動体3の表面に形成すれば良い。また、同図では内
・外輪1、2の外表面全体に潤滑皮膜1a、2aが形成
されているが、嵌合面等の潤滑皮膜が本来不要な部分に
ついては、マスキングによって皮膜処理を施さない、あ
るいは、最終製品となる前に除去するようにすると良
い。さらに、軸受の形式は、同図に示すような深溝玉軸
受に限らず、広く転がり軸受一般に適用することができ
る。
FIG. 1 illustrates an embodiment in which the present invention is applied to a deep groove ball bearing. This bearing has an inner ring 1, an outer ring 2,
A plurality of rolling elements 3, rolling elements 3 interposed between the inner and outer rings 1, 2.
Is constituted by a bearing component such as a cage 4 for holding the bearings at regular intervals. These bearing components are made of a non-magnetic material. For example, the inner ring 1 and the outer ring 2 are made of Mn-Cr.
Austenitic steel, rolling element 3 is made of ceramic (Si
3 N 4 ) and the cage 4 are made of austenitic stainless steel. Then, on the rolling surfaces of the inner and outer races 1 and 2 and on the surfaces of the rolling elements 3, P having an average molecular weight of 5,000 or less, respectively.
TFE (low molecular weight PTFE) lubricating film 1a, 2a, 3
a is formed. These lubricating coatings have a low molecular weight P
TFE (for example, ARC7 made by Nippon Acheson) 25c
It was sprayed and attached to the film-forming surface from a position distant by m, and the average film thickness in this case was about 0.6 μm. However, in the figure, the film thickness is exaggerated considerably. As a film coating method of low molecular weight PTFE,
In addition to the above-mentioned spray method, there is a dipping method. In this embodiment, the lubricating film is formed on the rolling surfaces of the inner and outer races 1, 2 and the surface of the rolling element 3, but the lubricating film may be formed on at least the surface of the rolling element 3. Further, in the figure, the lubricating coatings 1a and 2a are formed on the entire outer surfaces of the inner and outer races 1 and 2, but the portions such as the mating surfaces where the lubricating coating is originally unnecessary are not subjected to coating treatment by masking. Or, it is better to remove it before it becomes the final product. Further, the type of bearing is not limited to the deep groove ball bearing as shown in the figure, but can be widely applied to rolling bearings in general.

【0013】図2は、上記構成の転がり軸受(軸受Aと
する)と、上記構成において潤滑皮膜1a、2a、3a
を形成していない転がり軸受(軸受Bとする)とについ
て行なった発塵試験の結果を示す。尚、内輪1および外
輪2の形成材料はMn−Cr系オーステナイト鋼のYH
D50(日立金属製)、転動体3の形成材料はセラミッ
ク、保持器4の形成材料はオーステナイト系ステンレス
鋼のSUS304とした。また、試験は、回転数:50
rpm、スラスト荷重:10N、真空度:10-6Tor
r、温度:室温の条件下で行なった。同図に示すよう
に、軸受Aの相対発塵量は、軸受Bのそれに比べて10
分の1以下であった。
FIG. 2 shows the rolling bearing (bearing A) having the above structure and the lubricating coatings 1a, 2a and 3a having the above structure.
The results of a dusting test conducted on a rolling bearing (bearing B) on which no bearing is formed are shown. The material for forming the inner ring 1 and the outer ring 2 is YH of Mn-Cr austenitic steel.
D50 (manufactured by Hitachi Metals), the forming material of the rolling elements 3 was ceramic, and the forming material of the cage 4 was SUS304 of austenitic stainless steel. In addition, the test, rotation speed: 50
rpm, thrust load: 10N, the degree of vacuum: 10- 6 Tor
r, temperature: Performed under the conditions of room temperature. As shown in the figure, the relative dust generation amount of the bearing A is 10 times that of the bearing B.
It was less than one-third.

【0014】内・外輪1、2の形成材料としては、上記
YHD50の他、例えば、C0.60%、Si0.95
%、Mn12.5%、Ni2.4%、Cr10.2%を
主に含むMn−Cr系オーステナイト鋼に、予め窒化処
理をし、その後に浸炭窒化処理をして形成された窒素富
化層による表面硬化層を有する非磁性材(特願平2−2
62268号参照)、セラミック、さらに、軽荷重であ
ればオーステナイト系ステンレス鋼のSUS304等を
用いることができる。
As the material for forming the inner and outer rings 1 and 2, in addition to the above YHD50, for example, C0.60%, Si0.95
%, Mn 12.5%, Ni 2.4%, and Cr 10.2% are mainly contained in the Mn-Cr-based austenitic steel, which is subjected to nitriding treatment in advance and then carbonitriding treatment to form a nitrogen-rich layer. Non-magnetic material with surface hardened layer (Japanese Patent Application No. 2-2
No. 62268), ceramics, and austenitic stainless steel such as SUS304 can be used if the load is light.

【0015】また、保持器4の形成材料としては、SU
S304の他、NTN精密樹脂製ルーロンE等の高分子
材を用いることができる。
As a material for forming the cage 4, SU is used.
In addition to S304, a polymer material such as NTN precision resin Rulon E can be used.

【0016】[0016]

【発明の効果】以上説明したように、本発明によれば、
軸受構成部品を非磁性材で形成すると共に、転がり摩擦
または滑り摩擦を生じる軸受構成部品のうち少なくとも
転動体の表面に平均分子量が5000以下のPTFEか
らなる潤滑皮膜を形成するようにしたので、耐久性、低
発塵性に優れ、しかも非磁性を有する転がり軸受を提供
することができる。
As described above, according to the present invention,
The bearing components are made of non-magnetic material, and a lubricating film made of PTFE with an average molecular weight of 5000 or less is formed on at least the surface of the rolling elements of the bearing components that cause rolling friction or sliding friction. It is possible to provide a rolling bearing having excellent magnetic properties and low dust generation and having non-magnetism.

【0017】したがって、本発明の転がり軸受を、特
に、電子ビーム描画装置の周辺機器・装置に用いること
によって、軸受部からの発塵、残留磁気による半導体品
質への悪影響がなくなり、半導体製造分野における半導
体集積度の向上に寄与することができる。
Therefore, by using the rolling bearing of the present invention especially in the peripheral equipment of electron beam drawing apparatus, the adverse effect on the semiconductor quality due to dust generation from the bearing portion and residual magnetism is eliminated, and in the field of semiconductor manufacturing. This can contribute to the improvement of the degree of semiconductor integration.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施例に係わる深溝玉軸受を示す断面
図である。
FIG. 1 is a sectional view showing a deep groove ball bearing according to an embodiment of the present invention.

【図2】発塵試験の結果を示す図である。FIG. 2 is a diagram showing a result of a dusting test.

【図3】電子ビーム描画法の概念図である。FIG. 3 is a conceptual diagram of an electron beam drawing method.

【符号の説明】[Explanation of symbols]

1 内輪 1a 潤滑皮膜 2 外輪 2a 潤滑皮膜 3 転動体 3a 潤滑皮膜 4 保持器 1 Inner ring 1a Lubrication film 2 Outer ring 2a Lubrication film 3 Rolling element 3a Lubrication film 4 Cage

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 半導体製造設備に用いられる転がり軸受
であって、この軸受を構成する内輪、外輪、転動体、お
よび保持器を非磁性材で形成し、かつ、この軸受の転が
り摩擦または滑り摩擦を生ずる軸受構成部品のうち、少
なくとも転動体の表面に平均分子量が5000以下のポ
リテトラフルオロエチレンからなる潤滑皮膜を形成した
ことを特徴とする半導体製造設備用転がり軸受。
1. A rolling bearing used in semiconductor manufacturing equipment, wherein an inner ring, an outer ring, a rolling element, and a cage constituting the bearing are made of a non-magnetic material, and the rolling friction or sliding friction of the bearing. A rolling bearing for semiconductor manufacturing equipment, wherein a lubricating film made of polytetrafluoroethylene having an average molecular weight of 5000 or less is formed on at least the surface of the rolling element among the bearing components that cause the above.
【請求項2】 内輪と外輪とをMn−Cr系オーステナ
イト鋼で形成し、転動体をセラミックで形成した請求項
1の半導体製造設備用転がり軸受。
2. The rolling bearing for semiconductor manufacturing equipment according to claim 1, wherein the inner ring and the outer ring are made of Mn—Cr-based austenitic steel, and the rolling elements are made of ceramics.
【請求項3】 内輪と外輪とをMn−Cr系オーステナ
イト鋼で形成し、転動体をセラミックで形成し、保持器
をオーステナイト系ステンレス鋼で形成した請求項1の
半導体製造設備用転がり軸受。
3. The rolling bearing for a semiconductor manufacturing facility according to claim 1, wherein the inner ring and the outer ring are formed of Mn—Cr-based austenitic steel, the rolling elements are formed of ceramic, and the cage is formed of austenitic stainless steel.
【請求項4】 内輪と外輪とをMn−Cr系オーステナ
イト鋼で形成し、転動体をセラミックで形成し、保持器
を高分子材で形成した請求項1の半導体製造設備用転が
り軸受。
4. The rolling bearing for semiconductor manufacturing equipment according to claim 1, wherein the inner ring and the outer ring are made of Mn—Cr-based austenitic steel, the rolling elements are made of ceramics, and the cage is made of a polymer material.
【請求項5】 内輪と外輪と保持器とをオーステナイト
系ステンレス鋼で形成し、転動体をセラミックで形成し
た請求項1の半導体製造設備用転がり軸受。
5. The rolling bearing for semiconductor manufacturing equipment according to claim 1, wherein the inner ring, the outer ring and the cage are formed of austenitic stainless steel and the rolling elements are formed of ceramic.
JP4006109A 1992-01-17 1992-01-17 Rolling bearings for semiconductor manufacturing equipment Expired - Fee Related JP3021902B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4006109A JP3021902B2 (en) 1992-01-17 1992-01-17 Rolling bearings for semiconductor manufacturing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4006109A JP3021902B2 (en) 1992-01-17 1992-01-17 Rolling bearings for semiconductor manufacturing equipment

Publications (2)

Publication Number Publication Date
JPH05196044A true JPH05196044A (en) 1993-08-06
JP3021902B2 JP3021902B2 (en) 2000-03-15

Family

ID=11629336

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
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