JPH05172877A - Measuring device for resistance value and capacitance value - Google Patents
Measuring device for resistance value and capacitance valueInfo
- Publication number
- JPH05172877A JPH05172877A JP34146391A JP34146391A JPH05172877A JP H05172877 A JPH05172877 A JP H05172877A JP 34146391 A JP34146391 A JP 34146391A JP 34146391 A JP34146391 A JP 34146391A JP H05172877 A JPH05172877 A JP H05172877A
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- unknown
- voltage
- resistance
- comparator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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- Measurement Of Resistance Or Impedance (AREA)
Abstract
Description
【０００１】[0001]
【産業上の利用分野】本発明は、抵抗またはコンデンサ
の受動部品の抵抗値または容量値を測定する装置に関
し、特に充放電特性を利用して、抵抗値および容量値を
得るようにした装置に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a device for measuring a resistance value or a capacitance value of a passive component of a resistor or a capacitor, and more particularly to a device for obtaining a resistance value and a capacitance value by utilizing charge / discharge characteristics. It is a thing.
【０００２】[0002]
【従来の技術】従来のインピーダンス測定装置として
は、図３に示すような交流ブリッジを構成し、平衡状態
（Ｉd＝０）時の３つのインピーダンスＺ1〜Ｚ3から、
未知インピーダンスＺxを次式より求める方式であっ
た。 Ｚx＝Ｚ1・Ｚ3／Ｚ2 2. Description of the Related Art As a conventional impedance measuring device, an AC bridge as shown in FIG. 3 is constructed, and three impedances Z 1 to Z 3 in a balanced state (I d = 0)
The unknown impedance Z x was obtained by the following equation. Z x = Z 1 · Z 3 / Z 2
【０００３】しかしながら、上記従来技術に示す方式で
は、未知インピーダンスＺxを求めるために、３つのイ
ンピーダンスＺ1〜Ｚ3が必要であり、かつ平衡状態とす
るためのインピーダンスの調整が必要となるという課題
があった。However, in the method shown in the above-mentioned prior art, three impedances Z 1 to Z 3 are required to obtain the unknown impedance Z x , and it is necessary to adjust the impedance for achieving the equilibrium state. There were challenges.
【０００４】[0004]
【発明が解決しようとする課題】本発明は、上記従来技
術の課題を踏まえて成されたものであり、被測定素子を
含めた２素子だけで、その充放電時間を測定することに
より、簡単に被測定素子の抵抗値または容量値を求める
ことができる抵抗値・容量値の測定装置を提供すること
を目的としたものである。SUMMARY OF THE INVENTION The present invention has been made in view of the above-mentioned problems of the prior art, and it is easy to measure the charging / discharging time of only two elements including the element to be measured. Another object of the present invention is to provide a resistance value / capacitance value measuring apparatus capable of obtaining the resistance value or capacitance value of the device under test.
【０００５】[0005]
【課題を解決するための手段】上記課題を解決するため
の本発明の構成は、未知抵抗Ｒxと既知容量コンデンサ
Ｃ、若しくは未知容量コンデンサＣxと既知抵抗Ｒから
なる積分回路または微分回路と、この積分回路または微
分回路の入力端にアナログスイッチを介して接続された
電圧源ＶEと、前記積分回路または微分回路の出力端と
比較入力電圧ＶE／２がその入力端に接続された比較器
と、この比較器の出力が入力され、前記アナログスイッ
チのスイッチ切り換え制御および前記積分回路または微
分回路の充放電電圧がＶE／２になるまでの時間を測定
するために接続されたカウンタのゲートなどを制御する
制御回路と、前記カウンタで測定された充放電電圧がＶ
E／２になるまでの時間から前記未知抵抗Ｒxまたは未知
容量コンデンサＣxを求める演算回路とを備えた構成と
したことを特徴とするものである。The constitution of the present invention for solving the above-mentioned problems is to provide an integrating circuit or a differentiating circuit composed of an unknown resistor R x and a known capacitor C, or an unknown capacitor C x and a known resistor R. , A voltage source V E connected to the input end of the integration circuit or the differentiation circuit via an analog switch, and an output end of the integration circuit or the differentiation circuit and a comparison input voltage V E / 2 are connected to the input end thereof. A comparator and a counter connected to the output of the comparator to measure the time until the switch switching control of the analog switch and the charge / discharge voltage of the integrating circuit or the differentiating circuit become V E / 2. The control circuit for controlling the gate of the device and the charge / discharge voltage measured by the counter are V
It is characterized in that it has a configuration including an arithmetic circuit for obtaining the unknown resistance R x or the unknown capacitance capacitor C x from the time until it becomes E / 2.
【０００６】[0006]
【作用】本発明によれば、比較器の比較固定入力をステ
ップ入力電圧値の１／２にしたため、Ｚ−Ｔ変換部は微
分構成または積分構成の何れでも良く、その構成に意識
しないで、未知の抵抗値または容量値が一対の抵抗とコ
ンデンサで求められる。According to the present invention, since the comparison fixed input of the comparator is set to 1/2 of the step input voltage value, the Z-T conversion section may have either a differential configuration or an integral configuration, and regardless of the configuration, An unknown resistance value or capacitance value is obtained with a pair of resistance and capacitor.
【０００７】[0007]
【実施例】以下、本発明を図面に基づいて説明する。図
１は本発明の抵抗値・容量値の測定装置の一実施例を示
す構成図である。図１において、１は電圧ＶEを発生す
る電圧源、２は後段にステップ入力を加えるためのアナ
ログスイッチ、３は未知容量コンデンサＣxと既知抵抗
Ｒからなる積分回路、４は電圧ＶE／２を発生する電圧
源、５は積分回路３の出力である積分電圧ｖ0と電圧源
４が発生する電圧ＶE／２を比較し、ｖ0≧ＶE／２で出
力が反転する比較器、６は比較器５の一定出力期間（積
分電圧ｖ0が電圧源４が発生する電圧ＶE／２に到達する
までの時間）をカウントして求めるカウンタ７とアナロ
グスイッチ２の開閉を制御する制御回路、７は前述のカ
ウンタ、８はカウンタ７を駆動するクロック、９はカウ
ンタ７の出力を演算して未知容量Ｃxを算出する演算回
路であり、図ではマイクロプロセッサを用いている。DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described below with reference to the drawings. FIG. 1 is a block diagram showing an embodiment of a resistance value / capacitance value measuring apparatus of the present invention. In FIG. 1, 1 is a voltage source for generating a voltage V E , 2 is an analog switch for applying a step input to a subsequent stage, 3 is an integrating circuit including an unknown capacitance capacitor C x and a known resistor R, and 4 is a voltage V E / The voltage source 5 for generating 2 compares the integrated voltage v 0 which is the output of the integrating circuit 3 with the voltage V E / 2 generated by the voltage source 4, and the comparator whose output is inverted when v 0 ≧ V E / 2 , 6 control the opening / closing of the counter 7 and the analog switch 2 which are obtained by counting the constant output period of the comparator 5 (the time until the integrated voltage v 0 reaches the voltage V E / 2 generated by the voltage source 4). The control circuit, 7 is the above-mentioned counter, 8 is a clock for driving the counter 7, and 9 is an arithmetic circuit for calculating the output of the counter 7 to calculate the unknown capacitance C x . In the figure, a microprocessor is used.
【０００８】このような構成において、上記装置の動作
を説明する前に、本発明の測定原理を説明する。図２
（イ）は抵抗（Ｒ）とコンデンサ（Ｃ）で構成した微分
回路である。この微分回路において、或る時刻でスイッ
チ（ｓ1）を閉じると、抵抗（Ｒ）とコンデンサ（Ｃ）
の接続部の電位（ｖ1）は、ｔ時間後に ｖ1＝Ｖ1・ｅ-t/CR となる。一方、図２（ロ）には、同じ抵抗（Ｒ）とコン
デンサ（Ｃ）で構成した積分回路を示してある。同様
に、この積分回路において、或る時刻でスイッチ
（ｓ2）を閉じると、抵抗（Ｒ）とコンデンサ（Ｃ）の
接続部の電位（ｖ2）は、ｔ時間後に ｖ2＝Ｖ2・（１−ｅ-t/CR） となる。したがって、ｖ1＝ｖ2の時、次式が成立する。 Ｖ1・ｅ-t/CR＝Ｖ2・（１−ｅ-t/CR） また、ステップ電圧Ｖ1，Ｖ2が同じ電圧Ｖであれば、上
記式は、 Ｖ1＝Ｖ2＝Ｖ ∴ ｅ-t/CR＝１−ｅ-t/CR となり、この式から、 ｔ＝−ＣＲ・ｌｎ（１／２） が得られる。この式を前記式に代入することによ
り、上記式から、 ｖ1＝Ｖ／２ を得る。つまり、微分回路と積分回路の抵抗（Ｒ）とコ
ンデンサ（Ｃ）の定数およびステップ入力電圧が同じで
あれば、それぞれの出力は、入力電圧の１／２の値の時
に、上記式で表される時間になる。言い換えれば、微
分回路構成または積分回路構成の何れであろうと、ステ
ップ入力電圧の１／２までの充放電時間が判れば、上記
式からＣＲを求めることができる。この関係を図２
（ハ）に示す。Before explaining the operation of the above-mentioned apparatus in such a structure, the measuring principle of the present invention will be described. Figure 2
(A) is a differentiating circuit composed of a resistor (R) and a capacitor (C). In this differentiating circuit, when the switch (s 1 ) is closed at a certain time, the resistor (R) and the capacitor (C)
The electric potential (v 1 ) of the connection part of V becomes v 1 = V 1 · e −t / CR after t hours. On the other hand, FIG. 2B shows an integrating circuit composed of the same resistor (R) and capacitor (C). Similarly, in this integrator circuit, when the switch (s 2 ) is closed at a certain time, the potential (v 2 ) of the connection portion between the resistor (R) and the capacitor (C) becomes v 2 = V 2 · t after t hours. (1-e- t / CR ). Therefore, when v 1 = v 2 , the following equation holds. V 1 · e −t / CR = V 2 · (1−e −t / CR ). Further, if the step voltages V 1 and V 2 are the same voltage V, the above formula becomes: V 1 = V 2 = V ∴ e −t / CR = 1−e −t / CR , and from this equation, t = −CR · ln (1/2) is obtained. By substituting this equation into the above equation, v 1 = V / 2 is obtained from the above equation. In other words, if the constants of the resistance (R) and the capacitor (C) of the differentiating circuit and the integrating circuit and the step input voltage are the same, the respective outputs are represented by the above formula when the value is 1/2 of the input voltage. It's time to go. In other words, CR can be obtained from the above equation, regardless of whether it is a differential circuit configuration or an integration circuit configuration, if the charge / discharge time up to 1/2 of the step input voltage is known. This relationship is shown in Figure 2.
Shown in (c).
【０００９】このような測定原理を踏まえ、図１装置の
動作を説明する。なお、図１装置では、既知抵抗Ｒと未
知容量コンデンサＣxで積分回路３を構成し、未知の容
量値Ｃxを求める場合の例である。図１において、順
次、動作を説明する。 （１）アナログスイッチ２を閉じる。 （２）既知抵抗Ｒと未知容量コンデンサＣxの接続点の
電位ｖ0は、時刻ｔ時には、 ｖ0＝ＶE（１−ｅ-t/CxR） となる。 （３）比較器５は、積分電圧ｖ0と電圧源４が発生する
電圧ＶE／２を比較し、積分電圧ｖ0がＶE／２以上にな
った時、その出力は反転する。 （４）制御回路６およびカウンタ７で、積分電圧ｖ0が
ＶE／２までの時間Ｔhに比例した計数値を得て、その出
力をマイクロプロセッサ９に送る。 （５）一方、前記式は、 ＶE／２＝ＶE（１−ｅ-Th/CxR） となるから、この式から、未知容量Ｃxは、 Ｃx＝−Ｔh／Ｒ・ｌｎ（１／２） (10) となり、この演算をマイクロプロセッサ９で行い、未知
容量Ｃxが求められる。Based on such a measurement principle, the operation of the apparatus shown in FIG. 1 will be described. In the device of FIG. 1, the known resistor R and the unknown capacitance capacitor C x constitute the integration circuit 3 to obtain an unknown capacitance value C x . The operation will be sequentially described with reference to FIG. (1) Close the analog switch 2. (2) The potential v 0 at the connection point between the known resistor R and the unknown capacitance capacitor C x is v 0 = V E (1-e −t / CxR ) at the time t. (3) The comparator 5 compares the integrated voltage v 0 with the voltage V E / 2 generated by the voltage source 4, and when the integrated voltage v 0 becomes V E / 2 or more, its output is inverted. (4) The control circuit 6 and the counter 7 obtain a count value proportional to the time T h until the integrated voltage v 0 reaches V E / 2, and send its output to the microprocessor 9. (5) On the other hand, since the above equation becomes V E / 2 = V E (1-e −Th / CxR ), from this equation, the unknown capacitance C x is C x = −T h / R · ln ( 1/2) (10), and this calculation is performed by the microprocessor 9 to obtain the unknown capacity C x .
【００１０】次に、上記実施例で、積分回路構成のＲと
Ｃxを逆にして、微分回路構成の場合を考えると、前記
式は、 ＶE／２＝ＶE・ｅ-Th/CxR (11) となり、未知容量Ｃxは前記(10)式と同一な式となる。
つまり、微分回路構成でも、積分回路構成でも、ｖ0が
ＶE／２までの時間Ｔhを計数し、(10)式で演算すれば、
未知容量Ｃxを求められる。[0010] Next, in the above embodiment, the R and C x of the integration circuit constituted by the reverse, considering the case of a differential circuit configuration, the formula, V E / 2 = V E · e -Th / CxR (11), and the unknown capacitance C x is the same as the equation (10).
That is, in both the differentiating circuit configuration and the integrating circuit configuration, if the time T h until v 0 is V E / 2 is counted and calculated by the equation (10),
The unknown capacity C x can be obtained.
【００１１】また、上記実施例では、コンデンサＣを未
知の容量Ｃxとしたが、コンデンサＣが既知で抵抗Ｒが
未知の抵抗Ｒxの場合には、微分回路構成でも、積分回
路構成であっても、未知の抵抗値Ｒxは、同様に次式か
ら求めることができる。 Ｒx＝−Ｔh／Ｃ・ｌｎ（１／２） (12)In the above embodiment, the capacitor C has an unknown capacitance C x . However, when the capacitor C is a known resistor R and the resistor R is an unknown resistor R x , the differentiating circuit configuration or the integrating circuit configuration is used. However, the unknown resistance value R x can be similarly obtained from the following equation. R x = -T h / C · ln (1/2) (12)
【００１２】なお、比較器の固定入力電圧は、ＶE／２
でなくても、未知定数を求めることはできる。これは、
前記または式のｖ1，ｖ2が、比較器の固定入力電圧
となるからである。ただし、この場合、ＣＲの構成は、
積分回路なのか、微分回路なのかが固定で判明していな
ければならない。The fixed input voltage of the comparator is V E / 2
Even if it is not, the unknown constant can be obtained. this is,
This is because v 1 and v 2 in the above or the equation become fixed input voltages of the comparator. However, in this case, the CR configuration is
It must be fixedly known whether it is an integrator circuit or a differentiator circuit.
【００１３】[0013]
【発明の効果】以上、実施例と共に具体的に説明したよ
うに、本発明によれば、比較器の比較固定入力をステッ
プ入力電圧値の１／２にしたために、Ｚ−Ｔ変換部は、
微分構成または積分構成の何れでも良く、その構成に意
識しないで未知の抵抗値および容量値が抵抗とコンデン
サ一対の簡単な構成で求められる。また、外来雑音をＺ
−Ｔ変換部を適切な構成にすることによって、減少させ
ることもでき、正確な測定が可能となるなどの効果を有
する抵抗値，容量値の測定装置を実現できる。As described above in detail with reference to the embodiments, according to the present invention, since the comparison fixed input of the comparator is set to 1/2 of the step input voltage value, the Z-T conversion section is
Either a differential configuration or an integral configuration may be used, and unknown resistance values and capacitance values can be obtained with a simple configuration of a pair of a resistor and a capacitor without paying attention to the configuration. In addition, the external noise Z
By appropriately configuring the −T conversion unit, it is possible to reduce the amount of resistance, and it is possible to realize a resistance value / capacitance value measuring device having effects such as accurate measurement.
【図１】本発明の抵抗値・容量値の測定装置の一実施例
を示す構成図である。FIG. 1 is a configuration diagram showing an embodiment of a resistance value / capacitance value measuring apparatus of the present invention.
【図２】図１装置の測定原理を説明するための図であ
る。FIG. 2 is a diagram for explaining the measurement principle of the apparatus shown in FIG.
【図３】従来のインピーダンス測定装置の一例を示す図
である。FIG. 3 is a diagram showing an example of a conventional impedance measuring device.
１ 電圧源（発生電圧ＶE） ２ アナログスイッチ ３ 積分回路（既知抵抗Ｒ、未知容量コンデンサＣx） ４ 電圧源（発生電圧ＶE／２） ５ 比較器 ６ 制御回路 ７ カウンタ ８ クロック ９ マイクロプロセッサ（演算回路）1 voltage source (generated voltage V E ) 2 analog switch 3 integration circuit (known resistance R, unknown capacitance capacitor C x ) 4 voltage source (generated voltage V E / 2) 5 comparator 6 control circuit 7 counter 8 clock 9 microprocessor (Arithmetic circuit)
Claims (1)
若しくは未知容量コンデンサＣxと既知抵抗Ｒからなる
積分回路または微分回路と、 この積分回路または微分回路の入力端にアナログスイッ
チを介して接続された電圧源ＶEと、 前記積分回路または微分回路の出力端と比較入力電圧Ｖ
E／２がその入力端に接続された比較器と、 この比較器の出力が入力され、前記アナログスイッチの
スイッチ切り換え制御および前記積分回路または微分回
路の充放電電圧がＶE／２になるまでの時間を測定する
ために接続されたカウンタのゲートなどを制御する制御
回路と、 前記カウンタで測定された充放電電圧がＶE／２になる
までの時間から前記未知抵抗Ｒxまたは未知容量コンデ
ンサＣxを求める演算回路とを備えた構成としたことを
特徴とする抵抗値・容量値の測定装置。1. An unknown resistance R x and a known capacitance capacitor C,
Alternatively, an integrating circuit or a differentiating circuit including an unknown capacitance capacitor C x and a known resistor R, a voltage source V E connected to an input end of the integrating circuit or the differentiating circuit via an analog switch, and the integrating circuit or the differentiating circuit. Output terminal and comparison input voltage V
E / 2 is connected to the input terminal of the comparator, and the output of this comparator is input until the switching control of the analog switch and the charging / discharging voltage of the integration circuit or the differentiation circuit become V E / 2. A control circuit for controlling the gate of a counter connected to measure the time, and the unknown resistance R x or the unknown capacitance capacitor from the time until the charge / discharge voltage measured by the counter becomes V E / 2. A resistance value / capacitance value measuring device having a configuration including an arithmetic circuit for obtaining C x .
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP34146391A JPH05172877A (en) | 1991-12-24 | 1991-12-24 | Measuring device for resistance value and capacitance value |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP34146391A JPH05172877A (en) | 1991-12-24 | 1991-12-24 | Measuring device for resistance value and capacitance value |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH05172877A true JPH05172877A (en) | 1993-07-13 |
Family
ID=18346264
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP34146391A Pending JPH05172877A (en) | 1991-12-24 | 1991-12-24 | Measuring device for resistance value and capacitance value |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH05172877A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10206365A (en) * | 1997-01-17 | 1998-08-07 | Nippon Intec Kk | Electric conductivity measuring control circuit for electrolytic water |
| JP2012137341A (en) * | 2010-12-24 | 2012-07-19 | Toshiba Corp | Electronic apparatus and capacitance detection method for capacitor in electronic apparatus |
| CN105021973A (en) * | 2015-03-11 | 2015-11-04 | 葛洲坝易普力股份有限公司 | Digital display type capacitor discharger and detection method |
| CN105510723A (en) * | 2016-01-28 | 2016-04-20 | 武汉理工大学 | Large capacitance capacity and internal resistance measuring device and measuring method thereof |
| JP2016070696A (en) * | 2014-09-26 | 2016-05-09 | Ｎｅｃネットワーク・センサ株式会社 | Detection circuit for detecting resistance value in prescribed range |
-
1991
- 1991-12-24 JP JP34146391A patent/JPH05172877A/en active Pending
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10206365A (en) * | 1997-01-17 | 1998-08-07 | Nippon Intec Kk | Electric conductivity measuring control circuit for electrolytic water |
| JP2012137341A (en) * | 2010-12-24 | 2012-07-19 | Toshiba Corp | Electronic apparatus and capacitance detection method for capacitor in electronic apparatus |
| US9097747B2 (en) | 2010-12-24 | 2015-08-04 | Kabushiki Kaisha Toshiba | Electronic device, and capacitor capacitance detection method applied to the same |
| US9882410B2 (en) | 2010-12-24 | 2018-01-30 | Toshiba Memory Corporation | Electronic device, and capacitor capacitance detection method applied to the same |
| JP2016070696A (en) * | 2014-09-26 | 2016-05-09 | Ｎｅｃネットワーク・センサ株式会社 | Detection circuit for detecting resistance value in prescribed range |
| CN105021973A (en) * | 2015-03-11 | 2015-11-04 | 葛洲坝易普力股份有限公司 | Digital display type capacitor discharger and detection method |
| CN105510723A (en) * | 2016-01-28 | 2016-04-20 | 武汉理工大学 | Large capacitance capacity and internal resistance measuring device and measuring method thereof |
| CN105510723B (en) * | 2016-01-28 | 2018-06-22 | 武汉理工大学 | The capacity and internal resistance measurement device and its measuring method of a kind of bulky capacitor |
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