JPH05152091A - Characteristic x-ray generating device - Google Patents

Characteristic x-ray generating device

Info

Publication number
JPH05152091A
JPH05152091A JP31602691A JP31602691A JPH05152091A JP H05152091 A JPH05152091 A JP H05152091A JP 31602691 A JP31602691 A JP 31602691A JP 31602691 A JP31602691 A JP 31602691A JP H05152091 A JPH05152091 A JP H05152091A
Authority
JP
Japan
Prior art keywords
target
rays
characteristic
ray
substances
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP31602691A
Other languages
Japanese (ja)
Inventor
Takashi Konishi
隆 小西
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Heavy Industries Ltd
Original Assignee
Mitsubishi Heavy Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Heavy Industries Ltd filed Critical Mitsubishi Heavy Industries Ltd
Priority to JP31602691A priority Critical patent/JPH05152091A/en
Publication of JPH05152091A publication Critical patent/JPH05152091A/en
Withdrawn legal-status Critical Current

Links

Landscapes

  • X-Ray Techniques (AREA)

Abstract

PURPOSE:To eliminate the time and labor required for replacement of a target by embedding several kinds of target substances in the peripheral surface part of a rotary target for generating several kinds of characteristic X-rays so that the substances are regularly arranged. CONSTITUTION:Electrons emitted from a filament 5 is caused to impinge upon a rotary target 6 so as to generate X-rays 14 which is then taken out from an X-ray take-out port 7. In this arrangement, target materials A and B are alternately arranged at the outer peripheral surface of a target part 1, as shown, being embedded therein, and accordingly, only required X-rays may be taken out. Accordingly, a shutter 8 formed therein with circumferentially formed X-ray transmitting holes 13 and provided in the take-out port 7, is rotated in synchronization with the rotation of the target 6 by means of a synchronizing circuit 18 so that a desired one of the substances A, B is selected so as to pass required X-rays alone 15 therethrough. Thereafter, a material 9 to be measured, a goniometer 10, an X-ray detector 11, a recorder 12 are set in order to carry out a desired test.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、化学分析、応力測定等
に使用される特性X線発生装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a characteristic X-ray generator used for chemical analysis, stress measurement and the like.

【0002】[0002]

【従来の技術】真空中で電子を物質に衝突させることに
よりX線を発生させることができる。このとき、発生す
るエネルギーの大部分は熱に変換されるため、電子の衝
突部分である回転ターゲットを冷却することが重要とな
る。この回転ターゲットは、その周面部にターゲット物
質を周状に配列して埋設した円筒形状のものであり、回
転させながら冷却を行なうことで、より強い特性のX線
の発生を可能としている。発生させる特性X線はターゲ
ット物質、例えばCr、Fe、Co、Cu、Mo等によ
って特有の波長を有するものであり、1つの回転ターゲ
ットには1種類のターゲット物質を用いている。したが
って、発生させる特性X線を変更する場合には、使用し
ている回転ターゲットをターゲット物質の異なる他の回
転ターゲットと交換するようにしていた。
2. Description of the Related Art X-rays can be generated by colliding electrons with a substance in a vacuum. At this time, most of the generated energy is converted into heat, so it is important to cool the rotating target, which is the electron collision part. This rotating target has a cylindrical shape in which target materials are arranged in a circumferential shape and embedded in the peripheral surface portion, and cooling is performed while rotating the target material, thereby making it possible to generate X-rays having stronger characteristics. The characteristic X-ray generated has a specific wavelength depending on the target material, for example, Cr, Fe, Co, Cu, Mo, etc., and one kind of target material is used for one rotating target. Therefore, when changing the characteristic X-rays to be generated, the rotating target used is replaced with another rotating target having a different target material.

【0003】[0003]

【発明が解決しようとする課題】特性X線を用いて行な
う試験の多くはX線の回析現象を利用している。この場
合、使用する特性X線と被測定材の結晶格子の面間隔と
の間にはブラッグの回析条件式が成立する必要がある。
このブラッグの回析条件式は、 nλ=2d・sinθ …(1) (但し、n:自然数、λ:特性X線の波長[オングスト
ローム]、d:格子面間隔[オングストローム]、θ:
回析角[度]。)となるもので、そのために被測定材の
種類に応じて特性X線を選定しなければならず、頻繁に
回転ターゲットを交換する必要が生じる。
Many of the tests conducted using characteristic X-rays utilize the diffraction phenomenon of X-rays. In this case, the Bragg diffraction conditional expression must be satisfied between the characteristic X-rays used and the plane spacing of the crystal lattice of the measured material.
The Bragg diffraction condition formula is as follows: nλ = 2d · sin θ (1) (where, n: natural number, λ: wavelength of characteristic X-ray [angstrom], d: lattice spacing [angstrom], θ:
Diffraction angle [degree]. Therefore, the characteristic X-ray must be selected according to the type of the material to be measured, and the rotating target must be frequently replaced.

【0004】そして、回転ターゲットの交換に際して
は、装置の真空系を一旦大気状態に戻さなければなら
ず、再度の真空引きが必要で、これが作業上の大きなタ
イムロスとなる。
When the rotary target is replaced, the vacuum system of the apparatus must be once returned to the atmospheric condition, and it is necessary to evacuate again, which causes a great time loss in work.

【0005】本発明は上記のような実情に鑑みてなされ
たもので、その目的とするところは、回転ターゲットを
交換することなしに複数の特性X線を発生させることが
可能な特性X線発生装置を提供することにある。
The present invention has been made in view of the above circumstances, and an object of the present invention is to generate a characteristic X-ray capable of generating a plurality of characteristic X-rays without exchanging a rotary target. To provide a device.

【0006】[0006]

【課題を解決するための手段及び作用】すなわち本発明
は、回転ターゲットの周面部に異なる複数種類のターゲ
ット物質を規則的に配列して埋設するようにしたもの
で、この回転ターゲットを用いることで交換作業等を行
なうことなく、複数の特性X線の発生を可能とし、それ
ら複数の特性X線による同時試験を可能とする。
That is, according to the present invention, a plurality of different types of target materials are regularly arranged and embedded in the peripheral surface of a rotary target. By using this rotary target, It is possible to generate a plurality of characteristic X-rays without performing replacement work, etc., and to simultaneously test with a plurality of these characteristic X-rays.

【0007】また、単一の特性X線のみを得たい場合に
は、X線取出し口に回転ターゲットの回転に同期したシ
ャッタを設け、所望のターゲット物質の配置周期とシャ
ッタの開閉タイミングとを同期させることにより、必要
とする特性X線のみを取出すことができるようにしたも
ので、広範な物質の測定に対しても回転ターゲットの交
換なしに試験することが可能となる。
Further, in order to obtain only a single characteristic X-ray, a shutter synchronized with the rotation of the rotary target is provided at the X-ray extraction port, and the arrangement period of the desired target material and the opening / closing timing of the shutter are synchronized. By doing so, only the required characteristic X-rays can be taken out, and it becomes possible to test a wide range of substances without changing the rotating target.

【0008】[0008]

【実施例】以下図面を参照して本発明の一実施例を説明
する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings.

【0009】図1は主に回転ターゲット周辺の機械構成
を示すもので、図中の1が円柱状のターゲット部、2が
ターゲット部1を回転駆動するベルト、3がターゲット
部1での発熱を冷却するための冷却栓、4がターゲット
部1の周面に規則的に配列して埋設されたターゲット物
質であり、ここでは白抜きで図示するA物質とハッチン
グで示すB物質の2種類の物質を交互に配列するものと
する。
FIG. 1 mainly shows a mechanical structure around a rotary target. In the figure, 1 is a cylindrical target portion, 2 is a belt for rotationally driving the target portion 1, and 3 is heat generated in the target portion 1. A cooling plug 4 for cooling is a target material which is regularly arranged and embedded in the peripheral surface of the target portion 1. Here, two kinds of materials, a material A shown in white and a material B shown by hatching, are used. Shall be arranged alternately.

【0010】図2はこの回転ターゲットから発生される
特性X線を図2(1)のターゲットの回転角に対してA
物質からの特性X線(以下「A−X線」と称する)と、
図2(2)のB物質からの特性X線(以下「B−X線」
と称する)とに分離して示したものである。
FIG. 2 shows characteristic X-rays generated from this rotating target as A with respect to the rotation angle of the target shown in FIG.
Characteristic X-rays from the substance (hereinafter referred to as "AX rays"),
Characteristic X-ray from the substance B in FIG. 2 (2) (hereinafter referred to as “B-X-ray”)
It is shown separately.

【0011】図3は上記回転ターゲットを用いた特性X
線発生装置全体の構成を示すもので、フィラメント5か
ら飛出した電子を回転ターゲット6に衝突させ、X線を
発生させる。発生したX線14はX線取出し口7から取
出される。このX線取出し口7を通過するX線14は上
記図2(1)に示したA−X線と図2(2)に示したB
−X線とを重畳した状態となっているため、X線取出し
口7に図4に示すようなX線通過孔13を円周状に形成
した構造のシャッタ8を設け、このシャッタ8の回転と
回転ターゲット6の回転とをそれぞれの回転駆動部1
6,17間に同期回路18を配設することで同期させ、
必要なX線15のみを通過させる。
FIG. 3 shows a characteristic X using the rotary target.
This shows the configuration of the entire ray generator, in which electrons ejected from the filament 5 collide with the rotating target 6 to generate X-rays. The generated X-rays 14 are extracted from the X-ray extraction port 7. The X-ray 14 passing through the X-ray extraction port 7 is the A-X line shown in FIG. 2 (1) and the B line shown in FIG. 2 (2).
Since the X-ray and the X-ray are superposed, a shutter 8 having a structure in which an X-ray passage hole 13 as shown in FIG. And the rotation of the rotary target 6 are respectively controlled by the rotary drive unit 1
By arranging the synchronization circuit 18 between 6 and 17,
Only the necessary X-rays 15 are passed.

【0012】この通過X線15を用いて、例えば図中に
9の被測定材、10のゴニオメータ、11のX線検出
器、12の記録計をセットすることで、目的に応じた試
験を行なうことができる。
Using this passing X-ray 15, for example, by setting 9 materials to be measured, 10 goniometers, 11 X-ray detectors, and 12 recorders in the figure, a test according to the purpose is carried out. be able to.

【0013】なお、上記X線取出し口7のシャッタ8を
取り外すことにより、同時に複数の特性X線を発生させ
て試験を行なうこともできる。この場合、特性X線はそ
の種類によって物質への侵入深さが異なるため、同時に
得られる複数の特性X線のデータを比較することによ
り、被測定材9の深さ方向の情報が得られることとな
る。
By removing the shutter 8 of the X-ray extraction port 7, a plurality of characteristic X-rays can be simultaneously generated and a test can be conducted. In this case, since the characteristic X-rays have different penetration depths into the substance depending on their types, it is possible to obtain information in the depth direction of the material 9 to be measured by comparing data of a plurality of characteristic X-rays obtained at the same time. Becomes

【0014】[0014]

【発明の効果】以上詳記した如く本発明によれば、回転
ターゲットの周面部に異なる複数種類のターゲット物質
を規則的に配列して埋設するようにしたので、この回転
ターゲットを用いることで交換作業等を行なうことな
く、複数の特性X線の発生を可能とし、それら複数の特
性X線による同時試験を可能とする一方、単一の特性X
線のみを得たい場合には、X線取出し口に回転ターゲッ
トの回転に同期したシャッタを設け、所望のターゲット
物質の配置周期とシャッタの開閉タイミングとを同期さ
せることにより、必要とする特性X線のみを取出すこと
もできるため、広範な物質の測定に対しても回転ターゲ
ットの交換なしに試験することも可能な特性X線発生装
置を提供することができる。
As described above in detail, according to the present invention, a plurality of different kinds of target materials are regularly arranged and embedded in the peripheral surface of the rotary target. A plurality of characteristic X-rays can be generated without performing any work, and simultaneous testing with a plurality of these characteristic X-rays is possible, while a single characteristic X-ray
To obtain only the X-rays, a shutter synchronized with the rotation of the rotating target is provided at the X-ray extraction port, and the desired characteristic X-rays are obtained by synchronizing the arrangement period of the desired target material and the opening / closing timing of the shutter. Since it is possible to extract only a wide range of substances, it is possible to provide a characteristic X-ray generator that can be tested for a wide range of substances without changing the rotating target.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例に係る回転ターゲット部の構
成を示す斜視図。
FIG. 1 is a perspective view showing a configuration of a rotary target unit according to an embodiment of the present invention.

【図2】図1のターゲット物質より発生される2種類の
特性X線の状態を示す図。
FIG. 2 is a diagram showing the states of two types of characteristic X-rays generated from the target material of FIG.

【図3】図1の回転ターゲット部を用いた特性X線発生
装置全体の構成を示す図。
FIG. 3 is a diagram showing the overall configuration of a characteristic X-ray generator using the rotary target unit shown in FIG.

【図4】図3のシャッタの構造を示す図。FIG. 4 is a view showing the structure of the shutter shown in FIG.

【符号の説明】[Explanation of symbols]

1…ターゲット部、2…ベルト、3…冷却栓、4…ター
ゲット物質、5…フィラメント、6…回転ターゲット、
7…X線取出し口、8…シャッタ、被測定材、10…ゴ
ニオメータ、11…X線検出器、12…記録計、13…
X線通過孔、14…X線、15…通過X線、16,17
…回転駆動部、18…同期回路。
1 ... Target part, 2 ... Belt, 3 ... Cooling plug, 4 ... Target material, 5 ... Filament, 6 ... Rotating target,
7 ... X-ray extraction port, 8 ... Shutter, material to be measured, 10 ... Goniometer, 11 ... X-ray detector, 12 ... Recorder, 13 ...
X-ray passing hole, 14 ... X-ray, 15 ... Passing X-ray, 16, 17
… Rotation drive, 18… Synchronous circuit.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 周面部に複数種類のターゲット物質を規
則配列して埋設した回転ターゲットを備えたことを特徴
とする特性X線発生装置。
1. A characteristic X-ray generator comprising a rotating target in which a plurality of kinds of target materials are regularly arranged and embedded in a peripheral surface portion.
JP31602691A 1991-11-29 1991-11-29 Characteristic x-ray generating device Withdrawn JPH05152091A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP31602691A JPH05152091A (en) 1991-11-29 1991-11-29 Characteristic x-ray generating device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP31602691A JPH05152091A (en) 1991-11-29 1991-11-29 Characteristic x-ray generating device

Publications (1)

Publication Number Publication Date
JPH05152091A true JPH05152091A (en) 1993-06-18

Family

ID=18072426

Family Applications (1)

Application Number Title Priority Date Filing Date
JP31602691A Withdrawn JPH05152091A (en) 1991-11-29 1991-11-29 Characteristic x-ray generating device

Country Status (1)

Country Link
JP (1) JPH05152091A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007073297A (en) * 2005-09-06 2007-03-22 Toshiba Corp Anode target, and rotary anode x-ray tube device
KR101023713B1 (en) * 2009-06-16 2011-03-25 한국전기연구원 Dual X-ray generator capable of selecting one of transmission mode and reflection mode
KR101042033B1 (en) * 2009-06-08 2011-06-16 재단법인 한국원자력의학원 Multi-channel target exchange apparatus
DE102011078357A1 (en) 2010-06-29 2011-12-29 Rigaku Corp. Apparatus for X-ray analysis with classified wavelengths

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007073297A (en) * 2005-09-06 2007-03-22 Toshiba Corp Anode target, and rotary anode x-ray tube device
JP4744992B2 (en) * 2005-09-06 2011-08-10 株式会社東芝 Rotating anode X-ray tube device
KR101042033B1 (en) * 2009-06-08 2011-06-16 재단법인 한국원자력의학원 Multi-channel target exchange apparatus
KR101023713B1 (en) * 2009-06-16 2011-03-25 한국전기연구원 Dual X-ray generator capable of selecting one of transmission mode and reflection mode
DE102011078357A1 (en) 2010-06-29 2011-12-29 Rigaku Corp. Apparatus for X-ray analysis with classified wavelengths
US8300767B1 (en) 2010-06-29 2012-10-30 Rigaku Corporation Wavelength-classifying type X-ray diffraction device
US8699665B2 (en) 2010-06-29 2014-04-15 Rigaku Corporation Wavelength-classifying type X-ray diffraction device

Similar Documents

Publication Publication Date Title
US6442233B1 (en) Coherent x-ray scatter inspection system with sidescatter and energy-resolved detection
US3986026A (en) Apparatus for proton radiography
US6122344A (en) X-ray inspection system
US7362842B2 (en) Cylindrical neutron generator
JP3706110B2 (en) X-ray analyzer and X-ray analysis method
JP2008501463A (en) Coherent scattering computed tomography apparatus and method
JP2001269331A (en) Computer tomograph for determining pulse movement- amount moving spectrum in inspection region
JPH05157709A (en) Apparatus for measuring pulse transmitting spectrum of x-ray quantum
US5588034A (en) Apparatus and method for inspecting a crystal
US3833810A (en) Method of x-ray diffraction topography of monocrystals and apparatus for effecting same
EP1400983B1 (en) Collimation system for dual slice electron beam tomography scanner
US2837655A (en) X-ray fluorescent analysis apparatus
JPH05152091A (en) Characteristic x-ray generating device
US4223219A (en) Method of and apparatus for producing texture topograms
JP2003121392A (en) Radiation detector
WO1999066317A1 (en) Coherent scattering for material identification
US20130208859A1 (en) Sample analysis
Snyder X‐Ray Diffraction
US2532810A (en) X-ray diffraction apparatus for use with radioactive materials
US20050105684A1 (en) Virtual two-dimensional detector
US2750512A (en) X-ray spectrograph
JPH06273357A (en) Crystal defect evaluation equipment
WO2001044792A2 (en) Apparatus for fast detection of x-rays
Singh et al. Identification of levels above 6-isomeric state in 66 Cu
JP2525791B2 (en) Reflection electron energy-loss fine structure measurement method

Legal Events

Date Code Title Description
A300 Withdrawal of application because of no request for examination

Free format text: JAPANESE INTERMEDIATE CODE: A300

Effective date: 19990204