JPH04293574A - Method for controlling thickness of coating film on cut plate - Google Patents
Method for controlling thickness of coating film on cut plateInfo
- Publication number
- JPH04293574A JPH04293574A JP8366991A JP8366991A JPH04293574A JP H04293574 A JPH04293574 A JP H04293574A JP 8366991 A JP8366991 A JP 8366991A JP 8366991 A JP8366991 A JP 8366991A JP H04293574 A JPH04293574 A JP H04293574A
- Authority
- JP
- Japan
- Prior art keywords
- film thickness
- cut plate
- signal
- thickness
- coating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000576 coating method Methods 0.000 title claims abstract description 64
- 239000011248 coating agent Substances 0.000 title claims abstract description 61
- 238000000034 method Methods 0.000 title claims description 36
- 238000005259 measurement Methods 0.000 claims description 34
- 238000005375 photometry Methods 0.000 claims description 15
- 238000010422 painting Methods 0.000 claims description 4
- 230000002159 abnormal effect Effects 0.000 abstract description 12
- 238000001035 drying Methods 0.000 abstract description 7
- 230000000873 masking effect Effects 0.000 abstract description 2
- 239000010408 film Substances 0.000 description 147
- 239000003973 paint Substances 0.000 description 20
- 238000010586 diagram Methods 0.000 description 12
- 238000005070 sampling Methods 0.000 description 12
- 238000010521 absorption reaction Methods 0.000 description 7
- 229910001220 stainless steel Inorganic materials 0.000 description 5
- 239000010935 stainless steel Substances 0.000 description 5
- 239000002184 metal Substances 0.000 description 4
- 230000007423 decrease Effects 0.000 description 3
- 238000001514 detection method Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 239000010409 thin film Substances 0.000 description 3
- 229910000831 Steel Inorganic materials 0.000 description 2
- 230000001934 delay Effects 0.000 description 2
- 239000010959 steel Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- BZHJMEDXRYGGRV-UHFFFAOYSA-N Vinyl chloride Chemical compound ClC=C BZHJMEDXRYGGRV-UHFFFAOYSA-N 0.000 description 1
- 238000000862 absorption spectrum Methods 0.000 description 1
- 230000033228 biological regulation Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 239000004566 building material Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000007591 painting process Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 1
- 229920002554 vinyl polymer Polymers 0.000 description 1
Landscapes
- Coating Apparatus (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
Abstract
Description
【０００１】0001
【産業上の利用分野】本発明は、切板の塗装膜厚の制御
方法、特に、所定の長さに切断された金属板等の切板を
所定の速度で塗装するに際し、その塗装膜を一定の厚さ
に制御するに好適な切板の塗装膜厚の制御方法に関する
。[Industrial Application Field] The present invention relates to a method for controlling the coating film thickness of a cut plate, and in particular, when a cut plate such as a metal plate cut to a predetermined length is coated at a predetermined speed, the coating film is controlled. The present invention relates to a method for controlling the coating film thickness of a cut plate, which is suitable for controlling the thickness to a constant value.
【０００２】0002
【従来の技術】金属板を所定の大きさに切断して形成し
た切板の塗装は、例えば実開昭６３−１４４８７８に開
示されているような、切板を搬送しながらカーテンフロ
ーコータで塗装する方法で行うのが一般的である。[Prior Art] A cut plate formed by cutting a metal plate into a predetermined size is coated using a curtain flow coater while conveying the cut plate, as disclosed in Utility Model Application Publication No. 63-144878, for example. It is common to do this using the following method.
【０００３】上記カーテンフローコータによる塗装法は
、歴史が古く、その原理は塗料の粘性を利用した塗装法
で、塗料を一定幅の薄いカーテン状に絶えず上方から落
下させておき、そのカーテン状の塗料を厚さ方向に横切
るように切板をコンベアで通過させて塗装するものであ
る。The coating method using a curtain flow coater has a long history, and its principle is a coating method that utilizes the viscosity of the paint.The coating method uses the viscosity of the paint to constantly fall from above in the form of a thin curtain of a certain width. Paint is applied by passing cut plates on a conveyor across the paint in the thickness direction.
【０００４】このような塗装に用いるカーテンフローコ
ータは、均一な薄膜状のカーテンを連続的に形成させる
ために塗料を流下させる鋼製スリットを有するヘッド部
を備えている。A curtain flow coater used for such painting is equipped with a head portion having a steel slit through which paint flows down in order to continuously form a uniform thin film curtain.
【０００５】上記カーテンフローコータで切板を塗装す
る場合、塗装膜の厚さは、上記スリットの間隔、塗料の
吐出圧力及びコンベア速度を所定の条件に設定すること
によって決定される。従って、塗装膜の厚さの管理は、
所定の厚さになるように上記条件設定を行うと共に、乾
燥した後で塗膜の厚さの計測を行っている。When a cut plate is coated with the curtain flow coater, the thickness of the coating film is determined by setting the slit spacing, paint discharge pressure, and conveyor speed to predetermined conditions. Therefore, the control of the thickness of the paint film is
The above conditions are set so that a predetermined thickness is obtained, and the thickness of the coating film is measured after drying.
【０００６】ところで、スチールメーカーでは、塩化ビ
ニル等のビニル系又はその他の塗料を用いて、上述のカ
ーテンフローコータによってステンレス鋼板等の切板に
塗装を行っているが、この塗装は、スチールメーカーか
ら加工メーカーまでの輸送、あるいは加工メーカー内の
プレス等の製造工程において切板に疵が入ることを防止
することを主な目的としている。[0006] By the way, steel manufacturers use vinyl-based paints such as vinyl chloride or other paints to coat cut plates such as stainless steel plates using the above-mentioned curtain flow coater. The main purpose is to prevent flaws from forming on cut plates during transportation to the processing manufacturer, or during manufacturing processes such as presses within the processing manufacturer.
【０００７】従って、塗装膜の厚さの計測は、例えば４
０μｍ ±５μｍ程度のものであってよく、余り精度が
要求されないため、膜厚測定の塗装膜を乾燥した後のス
テンレス鋼板を、適宜抜き取ってマイクロメータ等の測
定器で行っていた。[0007] Therefore, the thickness of the coating film can be measured by, for example, 4
It may be about 0 μm ±5 μm, and since very high accuracy is not required, the stainless steel plate after the coating film has been dried is appropriately removed for film thickness measurement using a measuring device such as a micrometer.
【０００８】ところが、近年、塗装したステンレス鋼板
（切板）が壁材や屋根材等の建材として使われるように
なり、特に透明着色塗装ステンレス鋼板が要求されるよ
うになっていた。However, in recent years, painted stainless steel plates (cut plates) have come to be used as building materials such as wall materials and roofing materials, and there has been a particular demand for transparent colored coated stainless steel plates.
【０００９】この透明着色塗装ステンレス鋼板の塗料に
は、フッ素樹脂系塗料等が用いられ、その塗装膜は２０
μｍ 程度の厚さとされるが、塗装膜の厚さに１μｍ
程度の偏差（むら）があっても色むらとなって現われ、
商品価値がなくなるため、１枚の切板内での膜厚偏差は
勿論、ロット内でも厳密な膜厚管理が要求される。[0009] Fluororesin-based paint is used as the paint for this transparent colored stainless steel plate, and the coating film is 20%
It is said that the thickness is about 1 μm, but the thickness of the paint film is 1 μm.
Even if there is some degree of deviation (unevenness), it will appear as uneven color,
Since the product has no commercial value, strict film thickness control is required not only to control film thickness deviation within a single cut plate but also within a lot.
【００１０】上記のような極めて薄い膜厚（２０±１μ
ｍ ）の測定には、Ｘ線を利用する膜厚測定法（特開昭
６４−４１８１０）が知られている。しかし、このよう
な放射線を利用する膜厚計は、法的規制に従った安全管
理を必要とするため、その取扱いが難しい。そこで、安
全で、且つ取扱いが容易な薄い膜厚を測定する技術とし
て、赤外域の３つの波長を用いる三波長非同時測光方式
の赤外線膜厚計を利用する方法を挙げることができる。[0010] The above-mentioned extremely thin film thickness (20±1μ
A film thickness measurement method using X-rays (Japanese Unexamined Patent Publication No. 41810/1983) is known for measuring m). However, such a film thickness meter that uses radiation requires safety management in accordance with legal regulations, and is therefore difficult to handle. Therefore, as a technique for measuring a thin film thickness that is safe and easy to handle, there is a method using an infrared film thickness meter of a three-wavelength non-simultaneous photometry method that uses three wavelengths in the infrared region.
【００１１】三波長非同時測光方式の赤外線膜厚計とし
ては、例えば、図９に示したように、光源１０から照射
される赤外光を回転フィルタ１２に透過させて特定波長
光を選択し、その特定波長光を、塗装膜Ｃを有する切板
（金属板）Ｓに入射し、切板Ｓの表面で反射した反射光
を検出器１６で受光し、その検出器１６からの検出信号
を信号処理部１８で処理し、所定の演算を行って膜厚を
算出するものがある。For example, as shown in FIG. 9, an infrared film thickness meter using a three-wavelength non-simultaneous photometry method transmits infrared light emitted from a light source 10 through a rotating filter 12 to select light of a specific wavelength. , the specific wavelength light is incident on a cut plate (metal plate) S having a coating film C, the reflected light reflected on the surface of the cut plate S is received by a detector 16, and a detection signal from the detector 16 is received. There is one that processes the signal in the signal processing unit 18 and performs predetermined calculations to calculate the film thickness.
【００１２】上記膜厚計では、３つの波長の選択を、上
記回転フィルタ１２を回転させて光源光の光路に一致さ
せて行っている。従って、各波長における計測は、フィ
ルタを順次切換えて行う非同時操作となる。In the film thickness meter, the three wavelengths are selected by rotating the rotary filter 12 to match the optical path of the light source. Therefore, measurement at each wavelength is a non-simultaneous operation performed by sequentially switching filters.
【００１３】赤外線膜厚計の測定原理は、赤外線を塗装
膜面に照射し、透過させた場合、その塗装膜を構成する
物質固有の特性吸収（Ｃ−Ｈ基又はＯ−Ｈ基等の化学結
合の伸縮振動等による吸収）と厚さに関係した赤外線吸
収スペクトルが得られ、その特性吸収波長における光の
吸収量が物質の厚さに比例することから、透過光量を測
定することによって塗装膜の厚さを求めることができる
というものである。The measurement principle of an infrared film thickness meter is that when infrared rays are irradiated onto the surface of a painted film and transmitted through the film, the characteristic absorption (chemical properties such as C-H groups or O-H groups) inherent to the substances that make up the paint film is detected. An infrared absorption spectrum related to the thickness (absorption due to stretching vibrations of bonds, etc.) and thickness can be obtained, and since the amount of light absorbed at the characteristic absorption wavelength is proportional to the thickness of the material, by measuring the amount of transmitted light, it is possible to It is possible to find the thickness of
【００１４】即ち、透過光量と塗装膜の厚さとの関係は
、波長λにおける塗装吸収係数α（λ）、塗装膜厚ｔ
、塗装膜透過前の光の強度をＩ０ とすると、透過光強
度Ｉ（λ）との間で次式（１）のＬａｍｂｅｒｔ−Ｂｅ
ｅｒの式が成り立つので、透過光強度Ｉ（λ）を測定す
れば、厚さを求めることができる。That is, the relationship between the amount of transmitted light and the thickness of the coating film is determined by the coating absorption coefficient α (λ) at the wavelength λ, the coating film thickness t
, the intensity of the light before passing through the paint film is I0, and the Lambert-Be of the following equation (1) is calculated between the transmitted light intensity I(λ)
Since the formula er holds true, the thickness can be determined by measuring the transmitted light intensity I(λ).
【００１５】
Ｉ（λ）＝Ｉ０ ｅｘｐ ｛−α（λ）ｔ ｝
…（１）I(λ)=I0 exp {−α(λ)t }
...(1)
【００１６】又、三波長を選択使用す
るのは、光源光強度の変動、電気系のドリフト又は外乱
光や空気中の水分、温度の影響等を小さくするためであ
り、図１０に示すように、特性吸収ピーク波長（λ１
）、特性吸収の小さい高波数側の波長（λ２ ）、及び
低波数側の波長（λ３ ）を選択し、特性吸収ピークの
裾（λ２ 、λ３ ）でベースラインを引き、バックグ
ラウンドを差引いた吸収ピーク量から膜厚を求めるもの
である。Moreover, the reason why three wavelengths are selected and used is to reduce the influence of fluctuations in light source light intensity, electrical system drift, disturbance light, moisture in the air, temperature, etc. As shown in FIG. , characteristic absorption peak wavelength (λ1
), the wavelength on the high wavenumber side (λ2) with small characteristic absorption, and the wavelength on the low wavenumber side (λ3) are selected, a baseline is drawn at the tails of the characteristic absorption peak (λ2, λ3), and the background is subtracted. The film thickness is determined from the peak amount.
【００１７】前述したカーテンフローコータで塗装する
場合、通常、塗装膜の厚さ測定は、応答時間を速くする
ために膜厚計を連続運転して行われ、膜厚制御は、検出
した膜厚信号を塗布用コンベア速度にフィードバックし
て行う方法が取られている。When painting with the curtain flow coater described above, the thickness of the paint film is usually measured by continuously operating a film thickness meter in order to speed up the response time, and film thickness control is performed using the detected film thickness. A method is used in which signals are fed back to the coating conveyor speed.
【００１８】[0018]
【発明が解決しようとする課題】しかしながら、前述の
ような赤外線膜厚計を連続運転して計測する方法は、被
塗装物が連続した形状を有しているものには好適である
が、切板は搬送が間欠的に行われるため、上記膜厚計に
よる計測も間欠的になる。[Problems to be Solved by the Invention] However, the method of continuously operating an infrared film thickness meter as described above is suitable for coating objects that have a continuous shape; Since the plate is transported intermittently, measurement using the film thickness meter is also performed intermittently.
【００１９】従って、前述した赤外線膜厚計の三波長非
同時測光方式では、赤外光を透過波長範囲の異なるフィ
ルタで順次切換えることにより、所定の三波長について
金属表面における反射光量から演算により膜厚を求める
ため、間欠的に搬送される切板Ｓの端部では、波長（フ
ィルタ）切換タイミングと切板の搬送タイミングのずれ
により所定の三波長のうちの１又は２の波長の反射光量
が被測定面（塗装膜面）上の値ではない状況が発生する
ことになる。その結果、上述の演算で求める膜厚が実際
の膜厚と一致しない異常な値となることが起こる。Therefore, in the three-wavelength non-simultaneous photometry method of the infrared film thickness meter described above, by sequentially switching the infrared light through filters with different transmission wavelength ranges, the film thickness can be determined by calculation from the amount of light reflected on the metal surface for the three predetermined wavelengths. At the end of the cut plate S, which is intermittently conveyed in order to determine the thickness, the amount of reflected light of one or two of the three predetermined wavelengths is reduced due to the difference between the wavelength (filter) switching timing and the cut plate conveyance timing. A situation will occur where the value is not on the surface to be measured (painted film surface). As a result, the film thickness determined by the above calculation may take an abnormal value that does not match the actual film thickness.
【００２０】即ち、回転フィルタ１２で、波長λ１ 、
λ２ 、λ３を選択し、各赤外光を順次切板Ｓの塗装膜
面に照射し、その反射光強度Ｉ１ 、Ｉ２ 、Ｉ３ を
測定し、これら光強度Ｉ１ 、Ｉ２ 、Ｉ３ に基づい
て膜厚を演算する場合、波長λ１ から測定を順次開始
できれば問題はないが、図７に（Ａ）、（Ｂ）で示した
ように、波長λ２や、波長λ３ から測定を開始する場
合には、本来の演算ができないため、図８に示したよう
に、切板Ｓの先端部における塗装膜の厚さが異常な値と
して算出されることになる。なお、図７は、各波長の測
定ビーム径を、測定順に配置した状態を示してある。That is, in the rotating filter 12, the wavelength λ1,
λ2 and λ3 are selected, each infrared light is sequentially irradiated onto the painted film surface of the cut plate S, the reflected light intensities I1, I2, and I3 are measured, and the film thickness is determined based on these light intensities I1, I2, and I3. When calculating , there is no problem if measurements can be started sequentially from wavelength λ1, but as shown in Figure 7 (A) and (B), when starting measurement from wavelength λ2 or wavelength λ3, cannot be calculated, the thickness of the coating film at the tip of the cut plate S will be calculated as an abnormal value, as shown in FIG. Note that FIG. 7 shows a state in which the measurement beam diameters of each wavelength are arranged in the order of measurement.
【００２１】上記のように塗装膜の厚さが異常な値とな
るのは、切板Ｓの後端部においても同様で、波長λ１
やλ２ の測定が終った段階で後端部が通過してしまう
と、異常な値として算出されることになる。As mentioned above, the thickness of the coating film takes an abnormal value also at the rear end of the cut plate S, and the thickness of the coating film becomes an abnormal value.
If the rear end portion passes by after the measurement of λ2 or λ2 is completed, the calculated value will be abnormal.
【００２２】このような異常な膜厚値に対応する膜厚信
号の、例えば平均値や最高値又は最低値を切板Ｓの塗装
膜の厚さを制御するための制御用信号として用いると、
塗装膜の厚さが目標膜厚から大きく外れるという問題が
あった。[0022] If, for example, the average value, maximum value, or minimum value of the film thickness signal corresponding to such an abnormal film thickness value is used as a control signal for controlling the thickness of the coating film on the cut plate S,
There was a problem in that the thickness of the coating film deviated significantly from the target film thickness.
【００２３】又、間欠的に搬送される切板Ｓの塗装膜の
厚さを連続測定する場合は、膜厚信号も間欠となるため
、該信号を用いて膜厚制御する場合には、該信号を識別
する必要が生じる。その識別には、切板Ｓのトラッキン
グによる方法が知られているが、この方法ではトラッキ
ングの累積誤差により、ずれが生じるため、制御すべき
膜厚信号以外の信号で制御する事態が生じるという問題
があった。[0023] Furthermore, when the thickness of the coating film on the cut plate S that is transported intermittently is continuously measured, the film thickness signal is also intermittent, so when controlling the film thickness using the signal, it is necessary to The need arises to identify signals. A method using tracking of the cut plate S is known for this identification, but this method causes deviations due to accumulated tracking errors, resulting in a situation where control is performed using a signal other than the film thickness signal that should be controlled. was there.
【００２４】本発明は、前記従来の問題点を解決するべ
くなされたもので、切板を所定の塗装速度で塗装した後
、該切板を搬送しながら三波長非同時測光方式の赤外線
膜厚計で測定するに際し、切板の先端部及び後端部に生
ずる異常膜厚値を検出することを防止し、常に正常な膜
厚値を正確に検出し、該膜厚値に基づいて塗装膜の厚さ
を制御することができる切板の塗装膜厚の制御方法を提
供することを課題とする。The present invention has been made to solve the above-mentioned conventional problems, and after coating a cut plate at a predetermined coating speed, the infrared film thickness is measured using a three-wavelength non-simultaneous photometry method while conveying the cut plate. When measuring with a meter, it prevents the detection of abnormal film thickness values that occur at the tip and rear ends of the cut plate, always accurately detects the normal film thickness value, and determines the coating film based on the film thickness value. An object of the present invention is to provide a method for controlling the coating film thickness of a cut plate by which the thickness of the coating can be controlled.
【００２５】[0025]
【課題を解決するための手段】本発明は、切板を所定の
塗装速度で塗装し、該切板を搬送しながら塗装膜の厚さ
を測定し、その膜厚をフィードバックして上記塗装速度
を調整し、塗装膜の厚さを制御する切板の塗装膜厚の制
御方法であって、上記塗装膜の厚さを二波長以上の非同
時測光方式の赤外線膜厚計で測定すると共に、切板の先
端部と後端部の所定範囲に亘って、赤外線膜厚計から出
力される測定信号にマスクをかけ、上記先端部のマスク
解除後に、出力される測定信号が閾値以上になった時点
から所定時間経過した後の測定信号を制御用の膜厚信号
とすることにより、前記課題を達成したものである。[Means for Solving the Problems] The present invention coats a cut plate at a predetermined coating speed, measures the thickness of the coating film while conveying the cut plate, and feeds back the film thickness to apply the coating at the above coating speed. A method for controlling the coating film thickness of a cut plate by adjusting the thickness of the coating film, the method comprising: measuring the thickness of the coating film with an infrared film thickness meter using a non-simultaneous photometry method with two or more wavelengths; The measurement signal output from the infrared film thickness meter is masked over a predetermined range at the tip and rear ends of the cutting plate, and after the mask is released from the tip, the output measurement signal exceeds the threshold value. The above-mentioned problem has been achieved by using a measurement signal after a predetermined period of time has elapsed from the point in time as a film thickness signal for control.
【００２６】[0026]
【作用】本発明においては、三波長非同時測光方式の赤
外線膜厚計を用いて切板上の塗装膜の厚さを測定すると
き、異常な膜厚信号となる恐れのある該切板の端部にお
ける測定信号にマスクをかけ、マスク解除後に出力され
る測定信号に、閾値処理を施して信号の立上りを待ち、
その後、所定の時間経過した時点でサンプリングした測
定信号を塗装膜厚の制御用の膜厚信号としたので、間欠
的に搬送され、塗装される切板の膜厚制御を正確に行う
ことが可能となる。[Operation] In the present invention, when measuring the thickness of a coating film on a cut plate using an infrared film thickness meter using a three-wavelength non-simultaneous photometry method, it is possible to measure the thickness of the coating film on the cut plate, which may result in an abnormal film thickness signal. Mask the measurement signal at the end, apply threshold processing to the measurement signal output after unmasking, wait for the signal to rise,
After that, the measurement signal sampled after a predetermined time has passed is used as the film thickness signal for controlling the coating film thickness, so it is possible to accurately control the film thickness of the cut plate that is intermittently conveyed and painted. becomes.
【００２７】[0027]
【実施例】以下、図面を参照して、本発明の実施例を詳
細に説明する。Embodiments Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.
【００２８】図１は、本発明に係る一実施例の切板の塗
装膜厚の制御方法に適用する塗装膜厚の制御装置を示す
概略構成図で、図２は、上記塗装膜厚の制御装置におけ
るマスク回路の作用を示す説明図である。FIG. 1 is a schematic configuration diagram showing a coating film thickness control device applied to a coating film thickness control method of a cut plate according to an embodiment of the present invention, and FIG. FIG. 3 is an explanatory diagram showing the function of a mask circuit in the device.
【００２９】本実施例の制御装置は、切板Ｓを図中右方
向に搬送するコンベア２０Ａ〜２０Ｄを備えており、こ
れら各コンベア２０Ａ〜２０Ｄには駆動用モータ２２Ａ
〜２２Ｄがそれぞれ設置されている。The control device of this embodiment is equipped with conveyors 20A to 20D that convey the cut plate S in the right direction in the figure, and each of these conveyors 20A to 20D is equipped with a drive motor 22A.
~22D are installed respectively.
【００３０】コンベア２０Ａとコンベア２０Ｂとの間に
は、カーテンフローコータ２４が配設され、該カーテン
フローコータ２４からは所定の幅、厚さ、吐出圧で塗料
がカーテン状に流下されるようになっている。A curtain flow coater 24 is disposed between the conveyors 20A and 20B, and paint is flowed down from the curtain flow coater 24 in a curtain shape with a predetermined width, thickness, and discharge pressure. It has become.
【００３１】又、上記コンベア２０Ｃの長さ方向には、
乾燥炉２６が配設され、該乾燥炉２６内を切板Ｓを搬送
することが可能となっている。[0031] Also, in the length direction of the conveyor 20C,
A drying oven 26 is provided, and the cut plate S can be transported inside the drying oven 26.
【００３２】又、コンベア２０Ｃとコンベア２０Ｄの近
接部上方には、切板Ｓの先端検出器２８が設置されてお
り、該先端検出器２８からは検出信号がマスク回路３０
に入力可能になっている。Further, a tip detector 28 of the cut plate S is installed above the adjacent portion of the conveyor 20C and the conveyor 20D, and a detection signal is sent from the tip detector 28 to the mask circuit 30.
can be entered.
【００３３】又、コンベア２０Ｄの後端ロールにはパル
ス発生器３２が接続され、該パルス発生器３２からも、
上記マスク回路３０にパルス信号が入力されるようにな
っており、又、上記先端検出器２８から所定距離離れた
位置の上記コンベア２０Ｄの上方には、赤外線膜厚計が
設置されている。Further, a pulse generator 32 is connected to the rear end roll of the conveyor 20D, and from the pulse generator 32,
A pulse signal is input to the mask circuit 30, and an infrared film thickness meter is installed above the conveyor 20D at a predetermined distance from the tip detector 28.
【００３４】上記マスク回路３０及び赤外線膜厚計３４
は、スイッチ３６に接続されており、該スイッチ３６に
よりいずれか一方の電気的導通を選択できるようになっ
ている。The mask circuit 30 and the infrared film thickness meter 34
are connected to a switch 36, and electrical continuity of either one can be selected by the switch 36.
【００３５】上記スイッチ３６は、入力信号を閾値と比
較するための比較器３８、第１サンプリングのデータを
格納する第１データ保持器４０及び、第２サンプリング
のデータを格納する第２データ保持器４２に接続され、
且つこれら比較器３８と第１データ保持器４０及び第２
データ保持器４２とはタイマ（遅延回路）４４を介して
接続され、データ入力の時間調整が可能となっている。The switch 36 includes a comparator 38 for comparing the input signal with a threshold value, a first data holder 40 for storing the first sampling data, and a second data holder for storing the second sampling data. connected to 42,
In addition, these comparators 38, the first data holder 40, and the second
It is connected to the data holder 42 via a timer (delay circuit) 44, allowing time adjustment of data input.
【００３６】上記第１データ保持器４０、第２データ保
持器４２は、いずれも、比較器４６と平均器４８とに接
続され、且つ第１データ保持器４０と平均器４８は、ス
イッチ５０を介して前記モータ２２Ａ及び２２Ｂを制御
するモータ制御器５２に接続され、更に、スイッチ５０
は上記比較器４６により第１データ保持器４０側か平均
器４８側かに切換えられるようになっている。The first data holder 40 and the second data holder 42 are both connected to a comparator 46 and an averager 48, and the first data holder 40 and the averager 48 are connected to a switch 50. A switch 50 is connected to a motor controller 52 for controlling the motors 22A and 22B via a switch 50.
can be switched between the first data holder 40 side and the averager 48 side by the comparator 46.
【００３７】そして、上記比較器４６において、第１デ
ータ保持器４０及び第２データ保持器４２それぞれに入
力され、保持されている第１データ（膜厚信号）及び第
２データを比較し、第１データと第２データの差が所定
範囲以内なら、スイッチ５０を介して第１データをモー
タ制御器５２へ入力可能となっており、又、差が該範囲
以外ならば、第１データ及び第２データを上記平均器４
８で平均したデータをスイッチ５０を切換えて、上記モ
ータ制御器５２へ入力可能となっている。Then, the comparator 46 compares the first data (film thickness signal) and the second data input and held in the first data holder 40 and the second data holder 42, respectively, and If the difference between the first data and the second data is within a predetermined range, the first data can be input to the motor controller 52 via the switch 50, and if the difference is outside the range, the first data and the second data can be input to the motor controller 52 via the switch 50. 2 data to the above averager 4
8 can be input to the motor controller 52 by switching a switch 50.
【００３８】本実施例においては、前記赤外線膜厚計３
４が、前述の図９に示した三波長非同時測光方式の赤外
線膜厚計であり、該赤外線膜厚計３４によって膜厚を測
定する際は、切板Ｓの先端部と後端部の所定範囲に亘っ
て、該赤外線膜厚計３４から出力される測定信号にマス
ク回路３０によりマスクがかけられるようになっている
。In this embodiment, the infrared film thickness meter 3
4 is the infrared film thickness meter using the three-wavelength non-simultaneous photometry method shown in FIG. A mask circuit 30 masks the measurement signal output from the infrared film thickness meter 34 over a predetermined range.
【００３９】即ち、図２に示すように、コンベア２０Ｃ
により、塗装膜が乾燥された長さｌの切板Ｓが搬送され
てくると、先端検出器２８により切板Ｓの先端が検出さ
れ、該切板Ｓについて先端部及び後端部に、それぞれマ
スク範囲 ｌ１ 及び ｌ２ が設定される。That is, as shown in FIG.
When a cut plate S having a length l on which the coating film has been dried is conveyed, the tip of the cut plate S is detected by the tip detector 28, and the tip and rear ends of the cut plate S are respectively detected. Mask ranges l1 and l2 are set.
【００４０】このマスク範囲（長さ）は、次式（２）で
算出される。なお、マスク範囲の決め方については、後
に詳述する。This mask range (length) is calculated using the following equation (2). Note that the method of determining the mask range will be described in detail later.
【００４１】
ｌ１ ＝ ｌ２ ＝（端部の最大応答時間）×（
切板搬送速度）＋α …（２）
（ここで、αは０以上の定数）l1 = l2 = (maximum response time at the end) x (
Cut plate conveyance speed) + α … (2)
(Here, α is a constant greater than or equal to 0)
【００４２】上記マスク
範囲 ｌ１ 及び ｌ２ の設定は、赤外線膜厚計３４
から出力される膜厚信号（測定信号）を、マスク回路３
０でスイッチ３６を切換えることにより行われる。The above mask ranges l1 and l2 are set using the infrared film thickness meter 34.
The film thickness signal (measurement signal) output from the mask circuit 3
This is done by switching the switch 36 at 0.
【００４３】上記マスク回路３０は、シーケンサを備え
ており、又、切板Ｓの長さｌ 及び搬送速度のデータが
入力され、保有されるようになっている。このマスク回
路３０において、先端検出器２８から赤外線膜厚計３４
のビームセンター迄の距離Ｌ１及びマスク範囲 ｌ１
及び ｌ２ から、切板Ｓのトラッキング長さＬ２ （
＝Ｌ１ ＋ ｌ１ ）及びＬ３ （＝Ｌ１ ＋ ｌ−
ｌ２ ）を求め、これをマスク回路３０にカウンタ設定
する。The mask circuit 30 is equipped with a sequencer, and data on the length l of the cut plate S and the conveyance speed are inputted and stored therein. In this mask circuit 30, from the tip detector 28 to the infrared film thickness meter 34,
Distance L1 to the beam center and mask range l1
and l2, the tracking length L2 of the cut plate S (
= L1 + l1 ) and L3 (=L1 + l-
l2) is determined and set as a counter in the mask circuit 30.
【００４４】間欠的に搬送されてくる切板Ｓの先端を先
端検出器２８により検出したときから、搬送速度に応じ
てパルス幅の変るパルス発生器３２により、切板Ｓの位
置をトラッキングする。[0044] From the time when the tip of the cut plate S that is intermittently conveyed is detected by the tip detector 28, the position of the cut plate S is tracked by the pulse generator 32 whose pulse width changes according to the conveyance speed.
【００４５】上記膜厚計３４のビームセンターから切板
Ｓの先端が ｌ１ だけ進んだとき、即ち図２の位置か
らＬ１ だけ進んだときに、スイッチ３６を該膜厚計３
４側へ切換えて測定した膜厚信号が入力されるようにし
、その後、切板Ｓが図２の位置からＬ３ だけ移動した
ときにスイッチ３６を切換えて、膜厚信号の入力を停止
する。When the tip of the cutting plate S advances by l1 from the beam center of the film thickness gauge 34, that is, when it advances by L1 from the position shown in FIG.
4 side so that the measured film thickness signal is input, and then, when the cutting plate S moves by L3 from the position shown in FIG. 2, the switch 36 is switched to stop inputting the film thickness signal.
【００４６】このように、上記切板Ｓの先端部及び後端
部における膜厚測定信号にマスクを掛けることができ、
マスク解除後の ｌ１ 、 ｌ２ を除く切板Ｓについ
て膜厚計３４が出力する膜厚信号のみをスイッチ３６を
介して演算部５４に入力可能となっている。In this way, the film thickness measurement signals at the leading and trailing ends of the cut plate S can be masked,
Only the film thickness signal output by the film thickness meter 34 for the cut plates S excluding l1 and l2 after mask release can be input to the calculation unit 54 via the switch 36.
【００４７】前記マスク範囲（ ｌ１ 、 ｌ２ ）は
、前述の如く、前記（２）式により算出されるが、該マ
スク範囲の決め方の一例を、次に具体的に説明する。The mask range (l1, l2) is calculated by the equation (2) as described above, and an example of how to determine the mask range will be specifically explained below.
【００４８】移動している切板Ｓの膜厚を測定する場合
、切板Ｓの端部の応答時間は、（１）測定ビーム径と切
板Ｓの移送速度による遅れ、（２）赤外線膜厚計３４の
時定数による遅れ、（３）回転フィルタの回転タイミン
グによる遅れ、（４）データ平均処理点数による遅れ、
及び（５）アナログ出力のサンプリングタイミングによ
る遅れ、等により決定される。以下、上記（１）〜（５
）について具体例をもって説明する。When measuring the film thickness of a moving cut plate S, the response time at the end of the cut plate S is (1) a delay due to the measurement beam diameter and the transport speed of the cut plate S, (2) an infrared film Delay due to the time constant of the thickness gauge 34, (3) Delay due to the rotation timing of the rotary filter, (4) Delay due to the number of data average processing points,
and (5) delay due to analog output sampling timing. Below, the above (1) to (5)
) will be explained using a specific example.
【００４９】（１）測定ビーム径と切板Ｓの移動速度に
よる遅れ
図３に示すように、搬送中の切板Ｓに赤外線膜厚計３４
の測定ビームがかかり始めてから（Ｂ１ の状態）、１
００％かかるまで（Ｂ２ の状態）に要する時間は、切
板Ｓの搬送速度をＶ（ｍ ／分）、測定ビーム径Ａ（ｍ
ｍ）とすると、所定の応答信号出力となるまでの時間、
即ち立上りの遅れは６０Ａ／Ｖ（ミリ秒）となる。例え
ば、切板Ｓの搬送方向の測定ビーム径が１０ｍｍで、搬
送速度が１５ｍ ／分のときは、４０ミリ秒の遅れとし
て現われる。(1) Delay due to measurement beam diameter and moving speed of the cutting plate S As shown in FIG. 3, the infrared film thickness meter 34
After the measurement beam starts to shine (state B1), 1
00% (state B2), the conveyance speed of the cut plate S is V (m/min), the measurement beam diameter A (m/min), and the measurement beam diameter A (m
m), the time until the predetermined response signal is output,
That is, the delay in rising is 60 A/V (milliseconds). For example, when the measurement beam diameter in the conveyance direction of the cut plate S is 10 mm and the conveyance speed is 15 m 2 /min, a delay of 40 milliseconds appears.
【００５０】（２）赤外線膜厚計の時定数による遅れ図
４に示すような信号の取込みタイミングで各波長（λ１
、λ２ 、λ３ ）の信号強度が零付近（ベルトコン
ベア面）から、切板Ｓの信号強度の９９．９９％に達す
るまでに必要な時間は次式（３）で求められる。
−τ・ｌｎ（１−０．９９９９） …（３）
今、赤外線膜厚計の時定数が０．５ミリ秒であるとすれ
ば、上記（３）式より、必要な時間は４．６ミリ秒とな
る。又、回転フィルタによる１波長の信号取込み時間が
約１．４ミリ秒であるとすると、上記の信号強度に達す
るまでには回転フィルタを４回転させることが必要とな
り、該回転フィルタの１回転に要する時間が３３ミリ秒
とすると、１３２ミリ秒の応答遅れが生ずることになる
。(2) Delay due to the time constant of the infrared film thickness meter Each wavelength (λ1
, λ2, λ3) from near zero (belt conveyor surface) to reach 99.99% of the signal strength of the cut plate S can be determined by the following equation (3). -τ・ln(1-0.9999)...(3)
Now, assuming that the time constant of the infrared film thickness meter is 0.5 milliseconds, the required time is 4.6 milliseconds from the above equation (3). Also, assuming that the signal acquisition time for one wavelength by the rotating filter is approximately 1.4 milliseconds, it is necessary to rotate the rotating filter four times to reach the above signal strength, and one rotation of the rotating filter requires approximately 1.4 milliseconds. If the required time is 33 milliseconds, a response delay of 132 milliseconds will occur.
【００５１】（３）回転フィルタの回転タイミングによ
る遅れ
図４において、回転フィルタの回転タイミングが合わな
いために、例えば波長λ１ の途中から切板Ｓに測定ビ
ームがかかり始めた場合は、回転干渉フィルタが更に１
回転した後にデータが確定することになるため、この場
合は最大３３ミリ秒の応答遅れが生ずることになる。(3) Delay due to the rotation timing of the rotating filter In FIG. 4, if the rotation timing of the rotating filter does not match and the measurement beam starts to hit the cutting plate S from the middle of the wavelength λ1, the rotating interference filter is further 1
Since the data is determined after rotation, a response delay of up to 33 milliseconds will occur in this case.
【００５２】（４）データ平均処理点数による遅れ各移
動平均処理点数による遅れが（積算点数−１）×３３ミ
リ秒生ずる。従って、積算４点の場合は、９９ミリ秒の
遅れとなる。ここで、（積算点数−１）とするのは、最
初の１回転分のデータは、前記（２）の項において既に
得られていることによる。(4) Delay due to number of data average processing points A delay due to the number of moving average processing points occurs (accumulated number of points - 1) x 33 milliseconds. Therefore, in the case of four integrated points, there is a delay of 99 milliseconds. Here, the reason why it is set as (accumulated score - 1) is that the data for the first rotation has already been obtained in the above-mentioned section (2).
【００５３】（５）アナログ出力のサンプリングタイミ
ングによる応答遅れ
データ処理部からのアナログ出力は、２０ミリ秒毎のサ
ンプリングでその時間以前に確定した移動平均値を出力
するとすると、最大２０ミリ秒の応答遅れが生ずる。(5) Response delay due to sampling timing of analog output If the analog output from the data processing section is sampled every 20 milliseconds and outputs the moving average value determined before that time, the response time is at most 20 milliseconds. There will be a delay.
【００５４】前述したように、切板Ｓの端部の応答時間
は、上述した（１）〜（５）の遅れにより決定されるが
、これら（１）〜（５）の遅れの合計を、前記（２）式
における端部の最大応答時間とすることができる。As mentioned above, the response time at the end of the cutting plate S is determined by the delays (1) to (5) mentioned above, and the sum of these delays (1) to (5) is It can be taken as the maximum response time at the end in equation (2) above.
【００５５】又、前記赤外線膜厚計３４おいて測定信号
に基づいて膜厚を算出する原理は以下の通りである。The principle of calculating the film thickness based on the measurement signal in the infrared film thickness meter 34 is as follows.
【００５６】前述の図９に示した三波長非同時測光方式
の赤外線膜厚計において、回転フィルタ１２が有するフ
ィルタの３枚を使用し、透過波長λ１ （３４９０ｎｍ
）、λ２（３７２０ｎｍ）、λ３ （２５４３ｎｍ）の
各赤外光を切板Ｓの塗装膜へ順次照射し、それぞれの反
射光の強度Ｉ１ 、Ｉ２ 、Ｉ３ を測定する。In the infrared film thickness meter using the three-wavelength non-simultaneous photometry method shown in FIG.
), λ2 (3720 nm), and λ3 (2543 nm) are sequentially applied to the coating film of the cut plate S, and the intensities I1, I2, and I3 of the respective reflected lights are measured.
【００５７】上記各反射光の強度を用いて、次式（４）
によりＩ′を算出し、該Ｉ′を下式（５）の回帰式に代
入し、塗装膜厚さｔ を算出する。Using the intensity of each of the above reflected lights, the following equation (4)
I' is calculated by, and I' is substituted into the regression equation (5) below to calculate the coating film thickness t.
【００５８】
Ｉ′＝Ｉ１ −〔Ｉ２ −（Ｉ２ −Ｉ３ ）／２
〕 …（４） ｔ ＝Ｃ１ ・Ｉ′＋
Ｃ２
…（５） （ここで、ｔ は膜厚、
Ｃ１ 、Ｃ２ は回帰係数）I′=I1 −[I2 −(I2 −I3 )/2
] …(4) t = C1 ・I′+
C2
...(5) (Here, t is the film thickness,
C1 and C2 are regression coefficients)
【００５９】上記回帰式（
５）は、多数のサンプルについてＩ１ 、Ｉ２ 、Ｉ３
を測定することにより、Ｉ′に関する多くのデータを
集め、予め決定しておく。The above regression equation (
5) is I1, I2, I3 for a large number of samples.
By measuring I', a lot of data regarding I' is collected and determined in advance.
【００６０】上記回帰式（５）による演算は図示しない
演算部で実行され、算出された上記厚さｔ に対応する
膜厚信号が制御部５４へ出力され、該膜厚信号により、
塗装工程における塗装膜の厚さが制御される。The calculation according to the above regression equation (5) is executed by a calculation unit (not shown), and a film thickness signal corresponding to the calculated thickness t is output to the control unit 54, and based on the film thickness signal,
The thickness of the paint film in the painting process is controlled.
【００６１】次に、本実施例の作用を説明する。Next, the operation of this embodiment will be explained.
【００６２】まず、コンベア２０Ａにより所定の速度で
切板Ｓを搬送し、カーテンフローコータ２４が一定の速
度で流下する塗料を通過させて塗装した後、該切板Ｓを
コンベア２０Ｂで搬送し、更にコンベア２０Ｃにより乾
燥炉２６内を搬送しながら、塗装膜を乾燥させる。First, the cut plate S is conveyed at a predetermined speed by the conveyor 20A, and after the curtain flow coater 24 coats the paint by passing the paint flowing down at a constant speed, the cut plate S is conveyed by the conveyor 20B, Furthermore, the coating film is dried while being transported inside the drying oven 26 by the conveyor 20C.
【００６３】上記乾燥炉２６で塗装膜が乾燥された切板
Ｓは、その先端が先端検出器２８により検出されると、
前記図２に示したように、その位置から該切板ＳがＬ２
だけ搬送された時点で、マスク回路３０によりスイッ
チ３６が赤外線膜厚計３４側に切換えられ、膜厚の測定
が開始されると共に、更にＬ３ だけ搬送された時点で
該スイッチ３６を切換え、再び測定信号が出力されない
ようにする。When the tip of the cut plate S whose coating film has been dried in the drying oven 26 is detected by the tip detector 28,
As shown in FIG. 2, the cutting plate S is at L2 from that position.
When L3 has been transported, the switch 36 is switched to the infrared film thickness meter 34 side by the mask circuit 30 to start measuring the film thickness, and when the film has been further transported by L3, the switch 36 is switched to start measuring again. Prevent the signal from being output.
【００６４】この場合、切板Ｓの先端部及び後端部にそ
れぞれ ｌ１ 及び ｌ２ の範囲に亘ってマスクがか
けられたことになるので、赤外線膜厚計３４から出力さ
れる測定信号は図５に示すようになり、前記図８に示し
たように、切板Ｓの先端部及び後端部に生ずる異常な膜
厚信号は除去されることになる。In this case, the leading and trailing ends of the cut plate S are masked over the ranges l1 and l2, respectively, so the measurement signal output from the infrared film thickness meter 34 is as shown in FIG. As shown in FIG. 8, abnormal film thickness signals occurring at the leading and trailing ends of the cutting plate S are removed.
【００６５】本実施例では、上記先端部に範囲 ｌ１
に亘ってかけたマスクを解除した後、赤外線膜厚計３４
から出力される測定信号に基づいて前記（５）式により
算出された膜厚に対応する膜厚信号を比較器３８に入力
し、該膜厚信号に閾値処理を施す。In this embodiment, a range l1 is provided at the tip end.
After removing the mask that had been applied for
A film thickness signal corresponding to the film thickness calculated by equation (5) above based on the measurement signal output from the comparator 38 is inputted to the comparator 38, and the film thickness signal is subjected to threshold processing.
【００６６】即ち、図６Ａに示すように、比較器３８に
入力された膜厚信号が、予定の膜厚の、例えば８０％以
上になるまで待ち、その後、例えば０．８秒の時間遅れ
の後に第１サンプリング（λ１ 、λ２ 、λ３ の順
位で行う反射透過光の強度測定）を開始し、更に０．８
秒経過した後に同様に第２サンプリングを開始し、第１
及び第２のサンプリングで得られた膜厚信号（データ）
を、それぞれ第１データ保持器４０及び第２データ保持
器４２に入力し、格納する。That is, as shown in FIG. 6A, wait until the film thickness signal input to the comparator 38 reaches, for example, 80% or more of the expected film thickness, and then perform a test with a time delay of, for example, 0.8 seconds. After that, the first sampling (intensity measurement of reflected and transmitted light performed in the order of λ1, λ2, λ3) was started, and further 0.8
After seconds have elapsed, the second sampling is started in the same way, and the first
and film thickness signal (data) obtained in the second sampling
are input to the first data holder 40 and the second data holder 42, respectively, and stored.
【００６７】この第１データ保持器４０及び第２データ
保持器４２に対するデータの入力の調整は、タイマ４４
によって行う。Adjustment of data input to the first data holder 40 and the second data holder 42 is performed using a timer 44.
done by.
【００６８】上記の如く、第１データ保持器４０、第２
データ保持器４２に格納された膜厚信号は、比較器４６
で比較され、例えば、第２サンプリング時の膜厚値が第
１サンプリング時の場合より減少し、その減少幅が１０
％以下であれば、第１データ保持器４０から第１サンプ
リング時のデータ（第１膜厚信号）をスイッチ５０を介
してモータ制御器５２へ入力し、該モータ制御器５２に
よりコンベア２０Ａ及び２０Ｂの駆動モータ２２Ａ及び
２２Ｂの回転を制御し、切板Ｓがカーテンフローコータ
２４の下を通過する速度を加減することにより、該切板
Ｓ上に塗布される塗装膜の厚さを制御する。As described above, the first data holder 40, the second
The film thickness signal stored in the data holder 42 is transmitted to the comparator 46
For example, the film thickness value at the second sampling decreases from that at the first sampling, and the width of the decrease is 10
% or less, the data at the first sampling (first film thickness signal) is input from the first data holder 40 to the motor controller 52 via the switch 50, and the motor controller 52 controls the conveyors 20A and 20B. The thickness of the coating film applied to the cut plate S is controlled by controlling the rotation of the drive motors 22A and 22B and adjusting the speed at which the cut plate S passes under the curtain flow coater 24.
【００６９】一方、上記減少幅が１０％を超えている場
合は、第１及び第２の各膜厚信号を平均器４８において
平均し、その平均膜厚信号を、切換えたスイッチ５０を
介して同様にモータ制御器５２へ入力し、モータ２２Ａ
、２２Ｂの回転を制御する。上記スイッチ５０の切換え
操作は、比較器４６からの入力信号により行われる。On the other hand, if the above-mentioned decrease width exceeds 10%, the first and second film thickness signals are averaged in the averager 48, and the average film thickness signal is transmitted through the switched switch 50. Similarly, input to the motor controller 52 and motor 22A
, 22B. The switching operation of the switch 50 is performed by an input signal from the comparator 46.
【００７０】なお、図６（Ｂ）に示すように、切板Ｓの
搬送方向の長さが短く、第２サンプリングができない場
合は、第１データ保持器４０に第１サンプリング時のデ
ータのみを格納し、該第１膜厚信号により、上記制御を
行う。As shown in FIG. 6(B), if the length of the cut plate S in the transport direction is short and the second sampling cannot be performed, only the data at the first sampling is stored in the first data holder 40. The above control is performed based on the first film thickness signal.
【００７１】以上詳述した如く、本実施例によれば、三
波長非同時測光方式の赤外線膜厚計を用いて、搬送され
る切板Ｓの塗装膜厚を測定するに際し、該切板Ｓの先端
部及び後端部に所定範囲に亘って上記赤外線膜厚計３４
から出力される測定信号にマスクをかけることにより、
上記切板Ｓの先端部及び後端部に生じる異常膜厚信号を
排除することができるので、膜厚信号の精度を向上する
ことができ、更に、この膜厚信号を用いて塗装時のコン
ベア速度（塗装速度）を制御することができるので、極
めて高精度に塗装膜の厚さを制御することが可能となる
。As described in detail above, according to this embodiment, when measuring the coating film thickness of the cut plate S to be transported using the infrared film thickness meter of the three-wavelength non-simultaneous photometry method, the cut plate S The infrared film thickness gauge 34
By masking the measurement signal output from the
Since it is possible to eliminate abnormal film thickness signals that occur at the leading and rear ends of the cut plate S, the accuracy of the film thickness signal can be improved. Since the speed (painting speed) can be controlled, it becomes possible to control the thickness of the coating film with extremely high precision.
【００７２】以上、本発明を具体的に説明したが、本発
明は、前記実施例に示したものに限られるものではなく
、その要旨を逸脱しない範囲で種々変更可能である。Although the present invention has been specifically explained above, the present invention is not limited to what has been shown in the above embodiments, and can be modified in various ways without departing from the gist thereof.
【００７３】例えば、マスク範囲の決め方を具体的に示
したが、マスク範囲の決定の方法は、前記実施例に示し
たものに限定されるものではない。For example, although the method of determining the mask range has been specifically shown, the method of determining the mask range is not limited to the method shown in the above embodiment.
【００７４】又、切板Ｓの塗装膜の厚さを制御する方法
は、コンベアの搬送速度を制御するものに限らず、カー
テンフローコータからの塗料の流下速度を調整してもよ
い。Furthermore, the method of controlling the thickness of the coating film on the cut plate S is not limited to controlling the conveyance speed of the conveyor, but may also adjust the falling speed of the paint from the curtain flow coater.
【００７５】又、使用する赤外域の波長も三波長に限ら
ず、二波長以上であれば特に制限されない。二波長以上
の波長を用いた非同時測光方式の膜厚計で測定する場合
は全て前記三波長非同時測光方式と同様の効果が期待で
きる。Further, the wavelength of the infrared region to be used is not limited to three wavelengths, but is not particularly limited as long as it is two or more wavelengths. When measuring with a film thickness meter using a non-simultaneous photometry method using two or more wavelengths, the same effect as the three-wavelength non-simultaneous photometry method can be expected.
【００７６】[0076]
【発明の効果】以上説明した通り、本発明によれば、切
板を所定の塗装速度で塗装すると共に、該切板を搬送し
ながら二波長以上の非同時測光方式の赤外線膜厚計で測
定し、測定した膜厚に対応する信号をフィードバックし
て塗装膜の厚さを制御するに際し、切板の先端部及び後
端部に起因する異常膜厚信号を除去できるので、常に正
常な膜厚値を正確に検出し、該膜厚値に対応する膜厚信
号に基づいて塗装膜厚を制御することが可能となる。As explained above, according to the present invention, a cut plate is coated at a predetermined coating speed, and while the cut plate is being conveyed, it is measured using an infrared film thickness meter that uses non-simultaneous photometry at two or more wavelengths. However, when controlling the coating film thickness by feeding back signals corresponding to the measured film thickness, it is possible to remove abnormal film thickness signals caused by the leading and trailing ends of the cutting board, so that the film thickness always remains normal. It becomes possible to accurately detect the value and control the coating film thickness based on the film thickness signal corresponding to the film thickness value.
【図１】図１は、本発明の一実施例に適用する塗装膜厚
の制御装置を示す概略構成図である。FIG. 1 is a schematic configuration diagram showing a coating film thickness control device applied to an embodiment of the present invention.
【図２】図２は、マスク回路の作用を示す概略説明図で
ある。FIG. 2 is a schematic explanatory diagram showing the operation of a mask circuit.
【図３】図３は、測定ビーム径と切板の移動速度による
遅れを説明するための概略説明図である。FIG. 3 is a schematic explanatory diagram for explaining the delay due to the measurement beam diameter and the moving speed of the cutting plate.
【図４】図４は、赤外線膜厚計の時定数による遅れを説
明するための概略説明図である。FIG. 4 is a schematic explanatory diagram for explaining a delay due to a time constant of an infrared film thickness meter.
【図５】図５は、実施例の作用を示す概略説明図である
。FIG. 5 is a schematic explanatory diagram showing the operation of the embodiment.
【図６】図６は、同じく実施例の作用を示す概略説明図
である。FIG. 6 is a schematic explanatory diagram showing the operation of the embodiment.
【図７】図７は、従来の問題点を示す説明図である。FIG. 7 is an explanatory diagram showing conventional problems.
【図８】図８は、同じく従来の問題点を示す説明図であ
る。FIG. 8 is an explanatory diagram similarly showing the conventional problem.
【図９】図９は、三波長非同時測光方式の赤外線膜厚計
を示す概略構成図である。FIG. 9 is a schematic configuration diagram showing an infrared film thickness meter using a three-wavelength non-simultaneous photometry method.
【図１０】図１０は、三波長非同時測光方式の赤外線膜
厚計の原理を示す説明図である。FIG. 10 is an explanatory diagram showing the principle of an infrared film thickness meter using a three-wavelength non-simultaneous photometry method.
１０…光源、 １２…回転フィルタ、 １６…検出器、 １８…信号処理部、 ２０Ａ〜２０Ｄ…コンベア、 ２２Ａ〜２２Ｄ…モータ、 ２４…カーテンフローコータ、 ２６…乾燥炉、 ２８…先端検出器、 ３０…マスク回路、 ３２…パルス発生器、 ３４…赤外線膜厚計、 ３６、５０…スイッチ、 ３８、４６…比較器、 ４０…第１データ保持器、 ４２…第２データ保持器、 ４４…タイマ（遅延回路）、 ４８…平均器、 ５２…モータ制御器、 ５４…制御部。 10...Light source, 12...rotating filter, 16...detector, 18...signal processing section, 20A~20D...conveyor, 22A to 22D...Motor, 24...Curtain flow coater, 26...Drying oven, 28...Tip detector, 30...mask circuit, 32...Pulse generator, 34...Infrared film thickness meter, 36, 50...switch, 38, 46... comparator, 40...first data holder, 42...Second data holder, 44...Timer (delay circuit), 48...average device, 52...Motor controller, 54...Control unit.
Claims (1)
搬送しながら塗装膜の厚さを測定し、その膜厚をフィー
ドバックして上記塗装速度を調整し、塗装膜の厚さを制
御する切板の塗装膜厚の制御方法であって、上記塗装膜
の厚さを二波長以上の非同時測光方式の赤外線膜厚計で
測定すると共に、切板の先端部と後端部の所定範囲に亘
って、赤外線膜厚計から出力される測定信号にマスクを
かけ、上記先端部のマスク解除後に、出力される測定信
号が閾値以上になった時点から所定時間経過した後の測
定信号を制御用の膜厚信号とすることを特徴とする切板
の塗装膜厚の制御方法。[Claim 1] Painting a cut board at a predetermined coating speed, measuring the thickness of the coating film while transporting the cut board, feeding back the film thickness to adjust the coating speed, and controlling the thickness of the coating film. A method for controlling the thickness of a coating film on a cut plate, in which the thickness of the coating film is measured with an infrared film thickness meter using a non-simultaneous photometry method with two or more wavelengths, and Mask the measurement signal output from the infrared film thickness meter over a predetermined range of the tip, and after a predetermined period of time has elapsed from the time when the output measurement signal exceeds the threshold after the mask is released from the tip. A method for controlling coating film thickness on a cutting board, characterized in that a measurement signal is used as a film thickness signal for control.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3083669A JP3069868B2 (en) | 1991-03-22 | 1991-03-22 | Control method of coating thickness of cut plate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3083669A JP3069868B2 (en) | 1991-03-22 | 1991-03-22 | Control method of coating thickness of cut plate |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH04293574A true JPH04293574A (en) | 1992-10-19 |
| JP3069868B2 JP3069868B2 (en) | 2000-07-24 |
Family
ID=13808883
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3083669A Expired - Fee Related JP3069868B2 (en) | 1991-03-22 | 1991-03-22 | Control method of coating thickness of cut plate |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3069868B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001046934A (en) * | 1999-08-06 | 2001-02-20 | Sony Precision Technology Inc | Coater |
-
1991
- 1991-03-22 JP JP3083669A patent/JP3069868B2/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001046934A (en) * | 1999-08-06 | 2001-02-20 | Sony Precision Technology Inc | Coater |
Also Published As
| Publication number | Publication date |
|---|---|
| JP3069868B2 (en) | 2000-07-24 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| AU2010251867B2 (en) | Methods and instruments for measurement of paint sample characteristics | |
| US3819948A (en) | Method and apparatus for controlling the quantity of oil coated on continuously moving material | |
| JPS5535214A (en) | Method and device for film-thickness measurement making use of infrared-ray interference | |
| JPS58115306A (en) | Continuous measuring apparatus of thickness of coated film | |
| JPH04293574A (en) | Method for controlling thickness of coating film on cut plate | |
| JP6716589B2 (en) | Process monitoring for UV curing | |
| KR20160009651A (en) | Method for producing a foil or a film | |
| JPH04233405A (en) | Method and apparatus for measuring thickness of paint film | |
| ITBO930486A1 (en) | METHOD AND EQUIPMENT FOR DETECTION OF THE DENSITY OF A FLOW OF FIBROUS MATERIAL IN A CIGARETTE MACHINE | |
| JPH02116705A (en) | Measuring apparatus of thickness of coating film on coated plate material | |
| FI98748B (en) | Coating device for spreading coating paint onto the surface of a paper web | |
| JPH10296151A (en) | Device and method for controlling coating | |
| JP3205007B2 (en) | How to detect misalignment and defective shape of conveyed objects | |
| JP5118611B2 (en) | Non-contact measurement method for substrate and coating defect inspection method | |
| JP3508452B2 (en) | Method and apparatus for measuring oil coating amount on metal material surface | |
| US4422766A (en) | Method of and device for reducing apparatus response time during the testing for moisture content in moving spaced plastic sheets | |
| JPH05209819A (en) | Measuring method of surface energy | |
| JP3331169B2 (en) | Measurement method of oil amount on steel sheet surface | |
| CA1113175A (en) | Drier control process for powdered milk | |
| JPH08304036A (en) | Method and apparatus for inspection of coating irregularity in coating film | |
| JPS63242376A (en) | Method for controlling thickness of coating film | |
| JPH11241912A (en) | Film thickness measuring method | |
| JPH11244776A (en) | Method for controlling coating film thickness of belt-shaped body | |
| JPS61217037A (en) | Method for drying flexible web | |
| JPS5754802A (en) | Measuring method for coated film thickness and device thereof |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| S531 | Written request for registration of change of domicile |
Free format text: JAPANESE INTERMEDIATE CODE: R313531 |
|
| S533 | Written request for registration of change of name |
Free format text: JAPANESE INTERMEDIATE CODE: R313533 |
|
| R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |
|
| LAPS | Cancellation because of no payment of annual fees |