JPH0373560A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPH0373560A
JPH0373560A JP21029489A JP21029489A JPH0373560A JP H0373560 A JPH0373560 A JP H0373560A JP 21029489 A JP21029489 A JP 21029489A JP 21029489 A JP21029489 A JP 21029489A JP H0373560 A JPH0373560 A JP H0373560A
Authority
JP
Japan
Prior art keywords
semiconductor chip
semiconductor device
stress
sealing resin
resin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP21029489A
Other languages
Japanese (ja)
Inventor
Akihiro Hosoya
明宏 細谷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP21029489A priority Critical patent/JPH0373560A/en
Publication of JPH0373560A publication Critical patent/JPH0373560A/en
Pending legal-status Critical Current

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  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)

Abstract

PURPOSE:To relieve stress to be produced in a semiconductor chip by sealing resin, by mounting a semiconductor chip with specific angle with respect to a plane formed by sealing resin. CONSTITUTION:In a process for mounting a semiconductor chip 1 on the mount section 4 of a lead frame 2, the semiconductor chip 1 is mounted while being rotated by 45 deg.. Since the stress to be produced in the semiconductor chip 1 by sealing resin is born by the entire sides of the semiconductor chip 1, the stress in the semiconductor chip is relieved and a highly reliable semiconductor device can be obtained.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は半導体装置に関し、特に半導体チップを収容す
る樹脂封止型の半導体装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a semiconductor device, and particularly to a resin-sealed semiconductor device that houses a semiconductor chip.

〔従来の技術〕[Conventional technology]

従来、この種の半導体装Iは第3図に示すごとく、平面
上において、樹脂封止された半導体装直外形3が形成す
るX、Y軸と搭載される半導体チップ1のX、Y軸は一
致するような構造となっていた。
Conventionally, in this type of semiconductor device I, as shown in FIG. 3, on a plane, the X and Y axes formed by the resin-sealed semiconductor device 3 and the X and Y axes of the mounted semiconductor chip 1 are It had a similar structure.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

このような樹脂封止型の半導体装置においては、樹脂封
止によって発生する応力は、半導体チップのコーナ一部
に集中し、パッシベーション用保護膜や配線層間に形成
する眉間絶縁膜にクラックを生じさせ、半導体装置の信
頼性を低下させることが判明しており、特に、上述した
従来の半導体装置においては、封止樹脂によるX、Y軸
と半導体チップの辺が構成するX、Y軸が一致している
為、半導体チップのコーナ一部において、封止樹脂によ
る応力の影響を受けやすいという欠点があった。
In such resin-sealed semiconductor devices, the stress generated by the resin encapsulation concentrates on some corners of the semiconductor chip, causing cracks in the passivation protective film and the glabella insulating film formed between the wiring layers. It has been found that this reduces the reliability of semiconductor devices. In particular, in the conventional semiconductor device described above, the X and Y axes formed by the sealing resin do not coincide with the X and Y axes formed by the sides of the semiconductor chip. Therefore, there was a drawback that some corners of the semiconductor chip were easily affected by the stress caused by the sealing resin.

また、従来型の□半導体装置においては、このような応
力を緩和する為、第4図に示すように、半導体チップ1
1のコーナ一部に配置される配線層6において、スリッ
トパターン7を挿入したり45°の切りかきパターン8
を形成していたが、ある程度の効果はあるものの応力を
完全に緩和しきれない欠点があった。
In addition, in conventional □ semiconductor devices, in order to relieve such stress, the semiconductor chip 1 is
1, a slit pattern 7 is inserted or a 45° cut pattern 8 is formed in the wiring layer 6 arranged in a part of the corner
Although it was effective to some extent, it had the drawback that it could not completely relieve stress.

本発明の目的は、半導体チップに発生する応力を緩和し
、信頼性の高い半導体装置を提供することにある。
An object of the present invention is to provide a highly reliable semiconductor device that alleviates stress generated in a semiconductor chip.

1′課題を解決するための手段〕 本発明は、半導体チップを収容する樹脂封止型の半導体
装置において、平面上で封止樹脂が形成する正方形と矩
形とのうちのいずれか一方のXY軸に対して搭載される
前記半導体チップのX。
1'Means for Solving the Problems] The present invention provides a resin-sealed semiconductor device that houses a semiconductor chip, in which the XY axis of either a square or a rectangle formed by the sealing resin on a plane. X of the semiconductor chip mounted on the semiconductor chip.

Y軸が特定の角度をもって回転して搭載されている。It is mounted with the Y axis rotated at a specific angle.

〔実施例〕〔Example〕

次に、本発明の実施例につき図面を参照して説明する。 Next, embodiments of the present invention will be described with reference to the drawings.

第1図は本発明の第「の実施例を示す平面図である。FIG. 1 is a plan view showing a second embodiment of the present invention.

図において、1は半導体チップ、2はリードフレーム、
3は樹脂封止された半導体装置外形、5は半導体装置の
外部端子を示す。
In the figure, 1 is a semiconductor chip, 2 is a lead frame,
Reference numeral 3 indicates the outer shape of a resin-sealed semiconductor device, and reference numeral 5 indicates an external terminal of the semiconductor device.

本発明の実施にあたっては、特に、新しい技術は必要と
せす従来技術をもって達成しうるちのであり、本実施例
においては、第1図に示すように、半導体チップ1をリ
ードフレーム2のマウント部4にマウントする工程にお
いて、半導体チップ1を45°回転させてマウントする
In carrying out the present invention, in particular, new technology can be achieved using conventional technology, and in this embodiment, as shown in FIG. In the mounting process, the semiconductor chip 1 is rotated by 45 degrees and mounted.

以後、通常の樹脂封止型半導体装置の組立工程を経て、
本実施例は完了する。
After that, after going through the normal assembly process of resin-sealed semiconductor devices,
This example is complete.

第1図よりも明らかなごとく、封止樹脂によって半導体
チップ1に発生する応力は、半導体チップ1の辺全体で
受けることになり、半導体チップ1のコーナ一部の配線
層に45°の切りかきを形成するよりも応力を一層緩和
することができる。
As is clear from FIG. 1, the stress generated in the semiconductor chip 1 by the sealing resin is received by the entire side of the semiconductor chip 1, and a 45° cut is made in the wiring layer at a part of the corner of the semiconductor chip 1. The stress can be further alleviated than by forming a .

第2図は本発明の第2の実施例を示す平面図である。FIG. 2 is a plan view showing a second embodiment of the invention.

第2の実施例は、第2図に示すように、第1の実施例と
同様に構成されたものであるが、組立性を向上させる為
、マウント部14を45°回転させた専用のリードフレ
ーム】2を用いたものである。
As shown in FIG. 2, the second embodiment has the same structure as the first embodiment, but in order to improve assembly ease, a dedicated lead is used with the mount section 14 rotated by 45 degrees. Frame] 2 is used.

第2の実施例も第1の実施例と同じ効果が得られる。The second embodiment also provides the same effects as the first embodiment.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明は、樹脂封止型の半導体装置
において、封止する樹脂が平面上で形成するX、Y軸に
対して搭載される半導体チップのX、Y軸を特定の角度
をもって回転することにより、封止樹脂によって半導体
チップに発生する応力を緩和し、半導体装置の信頼性を
向上させることができる効果がある。
As explained above, the present invention provides a resin-sealed semiconductor device in which the encapsulating resin aligns the X and Y axes of a mounted semiconductor chip at specific angles with respect to the X and Y axes formed on a plane. The rotation has the effect of alleviating the stress generated in the semiconductor chip by the sealing resin and improving the reliability of the semiconductor device.

端子、6・・・配線層、7・・・スリットパターン、8
・・・切りかきパターン、9・・・ポンディングパッド
Terminal, 6... Wiring layer, 7... Slit pattern, 8
...Cut pattern, 9...Ponding pad.

Claims (1)

【特許請求の範囲】[Claims] 半導体チップを収容する樹脂封止型の半導体装置におい
て、平面上で封止樹脂が形成する正方形と矩形とのうち
のいずれか一方のX、Y軸に対して搭載される前記半導
体チップのX、Y軸が特定の角度をもって回転して搭載
されていることを特徴とする半導体装置。
In a resin-sealed semiconductor device that accommodates a semiconductor chip, A semiconductor device characterized in that the Y-axis is mounted with rotation at a specific angle.
JP21029489A 1989-08-14 1989-08-14 Semiconductor device Pending JPH0373560A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21029489A JPH0373560A (en) 1989-08-14 1989-08-14 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21029489A JPH0373560A (en) 1989-08-14 1989-08-14 Semiconductor device

Publications (1)

Publication Number Publication Date
JPH0373560A true JPH0373560A (en) 1991-03-28

Family

ID=16587017

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21029489A Pending JPH0373560A (en) 1989-08-14 1989-08-14 Semiconductor device

Country Status (1)

Country Link
JP (1) JPH0373560A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5550402A (en) * 1992-11-27 1996-08-27 Esec Sempac S.A. Electronic module of extra-thin construction
CN101944522A (en) * 2009-07-03 2011-01-12 瑞萨电子株式会社 The electronic unit of lead frame and use lead frame

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5550402A (en) * 1992-11-27 1996-08-27 Esec Sempac S.A. Electronic module of extra-thin construction
CN101944522A (en) * 2009-07-03 2011-01-12 瑞萨电子株式会社 The electronic unit of lead frame and use lead frame

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