JPH0342560A - Method for measuring surface state of film - Google Patents
Method for measuring surface state of filmInfo
- Publication number
- JPH0342560A JPH0342560A JP1178219A JP17821989A JPH0342560A JP H0342560 A JPH0342560 A JP H0342560A JP 1178219 A JP1178219 A JP 1178219A JP 17821989 A JP17821989 A JP 17821989A JP H0342560 A JPH0342560 A JP H0342560A
- Authority
- JP
- Japan
- Prior art keywords
- film
- picture
- photographed
- camera
- running
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims description 10
- 230000003746 surface roughness Effects 0.000 abstract description 7
- 230000000694 effects Effects 0.000 abstract description 4
- 238000005259 measurement Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 239000000047 product Substances 0.000 description 1
- 238000010561 standard procedure Methods 0.000 description 1
- 239000013589 supplement Substances 0.000 description 1
Landscapes
- Closed-Circuit Television Systems (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
Description
【発明の詳細な説明】
（産業利用上の分野）
本発明は、フィルムの面状態測定方法に関し、更に詳し
くは、走行中のフィルムの面状態を迅速かつ正確に測定
できるフィルムの面状Ｓ測定方法に関する。Detailed Description of the Invention (Field of Industrial Application) The present invention relates to a method for measuring the surface condition of a film, and more particularly, to a method for measuring the surface condition of a film that can quickly and accurately measure the surface condition of a film during running. Regarding the method.
（従来の技術）
従来、フィルムの面状態を測定する手段としては第９図
に示す如きオフライン測定器が知られている。この測定
器は、同図に示す如く、検出ラインとブランクラインの
二系列の比較によってサンプルの面状態を測るもので、
光源５０．ミラー５１ａ、５１ｂ 、スリット５２ａ、
５２ｂ、サンプル５３、レンズ５４ａ、５４ｂ、スリッ
トＳ５ａ、ｓｓｂ、検出器５６ａ、５６ｂ、対数変換演
算器５７、アンプ５８１表示部５９によって構成される
。(Prior Art) Conventionally, an off-line measuring device as shown in FIG. 9 has been known as a means for measuring the surface condition of a film. As shown in the figure, this measuring device measures the surface condition of the sample by comparing two lines: the detection line and the blank line.
Light source 50. Mirrors 51a, 51b, slit 52a,
52b, sample 53, lenses 54a and 54b, slits S5a and ssb, detectors 56a and 56b, logarithmic conversion calculator 57, amplifier 581 and display section 59.
（発明が解決しようとする課題）
しかし、従来のオフライン測定器では、サンプルとして
１〜３ｃｍ角のフィルムを切り取ってセットする必要が
あり、測定終了したら別個のサンプルをセットする必要
があるため、′ａ統的に測定することはできなかった。(Problem to be Solved by the Invention) However, with conventional offline measuring instruments, it is necessary to cut out and set a 1 to 3 cm square film as a sample, and it is necessary to set a separate sample after the measurement is completed. It was not possible to measure it systematically.
また小さく切り取ったサンプルについて測定したとして
も実際のフィルムの面状態とは言えず、オフライン測定
器で良好なデータが得られても、実際の製品フィルムに
表面あれや厚みむらが生じていても見のがす恐れがある
という欠点かあった。Furthermore, even if measurements are taken on a small sample, it cannot be said to be the actual surface condition of the film, and even if good data is obtained with an offline measuring device, the actual product film may have surface roughness or thickness unevenness. The drawback was that there was a risk of slipping.
（発明の目的）
本発明の目的は、走行中のフィルムの面状態を迅速かつ
連続的に、しかも正確に測定できるフイルムの面状７７
ｊｊ １４定方法を提供することにある。(Object of the Invention) An object of the present invention is to quickly and continuously measure the surface condition of a film during running, and to accurately measure the surface condition of the film.
The objective is to provide a 14-standard method.
（課題を解決するための手段）
本発明者らは、上記目的を達成すべく、鋭意検討を重ね
た結果、本発明を完成するに至った。(Means for Solving the Problems) In order to achieve the above object, the inventors of the present invention have made extensive studies and have completed the present invention.
即ち１本発明に係るフィルムの面状ＳＡＭ定方法は、走
行中の透明又は半透明フィルムの面状態を測定する方法
において、基準画像を前記走行中の透明又は半透明フィ
ルムを通してカメラで撮影し、該基準画像に対する撮影
画像のひずみを検出することを特徴とする。Namely, 1. The film surface condition SAM determination method according to the present invention is a method for measuring the surface condition of a running transparent or semi-transparent film, in which a reference image is photographed with a camera through the running transparent or semi-transparent film; The present invention is characterized by detecting distortion of the photographed image with respect to the reference image.
以下、本発明について図面に基づき説明する。Hereinafter, the present invention will be explained based on the drawings.
本発明の測定対象となる透明又は半透明フィルム（以下
、巾に透明フィルムという）は、光透過性のものであれ
ばよく、無色フィルムに限定されず着色フィルムであっ
てもよい。The transparent or translucent film (hereinafter simply referred to as a transparent film) to be measured in the present invention may be a light-transmitting film, and is not limited to a colorless film, but may be a colored film.
本発明において透明フィルムは、フィルム製造過程にお
ける走行中に面状態が測定される。In the present invention, the surface condition of the transparent film is measured while it is running during the film manufacturing process.
第１図は、透明フィルム１がロール２，３を通って走行
している状態を示している。FIG. 1 shows a transparent film 1 running through rolls 2 and 3.
本発明か適用されるフィルムの厚みは３０〜１０００
ｇ ｍの範囲にあることか好ましく、またフィルムの搬
送速度は３０〜２００ ｍ／ａｉｍの範囲にあることが
好ましい。The thickness of the film to which the present invention is applied is 30 to 1000.
It is preferable that the film transport speed is in the range of 30 to 200 m/aim.
本発明においてフィルムの面状態の測定位置は特に限定
されず、第１図に示す実施例では、ロール２とロール３
の間で測定している。In the present invention, the measurement position of the surface state of the film is not particularly limited, and in the embodiment shown in FIG.
It is measured between.
同図において、４はカメラであり、例えばＣＣＤカメラ
等の固体撮像素子を用いた各種電子カメラが好ましい。In the figure, 4 is a camera, and various electronic cameras using a solid-state image sensor, such as a CCD camera, are preferable.
５は基準画像部であり、基体上面に基準画像が形成され
ている。基準画像としては、画像の乱れを判定し易いも
のが好ましく、：５３図に示す如き同心円形、第４図に
示す如きバーコード状線形、第５図に示す如きカルラコ
ード状マーク等が挙げられる。Reference numeral 5 denotes a reference image portion, in which a reference image is formed on the upper surface of the base. As the reference image, it is preferable to use one that makes it easy to judge image disturbance, such as concentric circles as shown in Fig. 53, barcode-like linear marks as shown in Fig. 4, and Carla code-like marks as shown in Fig. 5. .
本発明においては基準画像の照度は１０００〜５０００
Ｌｘ （ルクス）の範囲にあることか好ましく、照度を
補充するため照明６が用いられてもよい。In the present invention, the illuminance of the reference image is 1000 to 5000.
It is preferably in the Lx (lux) range, and lighting 6 may be used to supplement the illumination.
カメラ４とフィルム１と基準画像部５の位置関係は、カ
メラ４が基準画像部５を撮影する際に透明フィルムｌの
透過光を映す構成であればよく、第１図及びＷＩＪ２図
に示すようにカメラ４と基準画像部５の間をフィルムｌ
が通過する状態が好ましいが、これに限定されず、ＷＩ
Ｊ７図に示すように、反射鏡７を介在させて反射光を撮
影する構成でもよい、該反射鏡７としては、平面鏡に限
らず、凸面鏡等でもよく、かつ用いる数も１つに限らず
、第８図に示す如く２以上を対設させ、広い範囲のフィ
ルム透過光を撮影できるようにしてもよい。The positional relationship between the camera 4, the film 1, and the reference image section 5 may be such that the light transmitted through the transparent film 1 is reflected when the camera 4 photographs the reference image section 5, as shown in Fig. 1 and WIJ2. between the camera 4 and the reference image section 5.
It is preferable that WI passes through, but is not limited to this.
As shown in Figure J7, a configuration may be used in which a reflecting mirror 7 is interposed to photograph the reflected light.The reflecting mirror 7 is not limited to a plane mirror, but may also be a convex mirror, and the number used is not limited to one. As shown in FIG. 8, two or more may be arranged opposite each other so that a wide range of light transmitted through the film can be photographed.
フィルムｌの面とカメラ４の角度は特に限定されないが
、第２図に示すように傾斜αを設けることが好ましい。Although the angle between the surface of the film l and the camera 4 is not particularly limited, it is preferable to provide an inclination α as shown in FIG.
傾斜を設けた場合にはフィルムの表面あれや厚みむらに
よるレンズ効果を利用できるので好ましい。It is preferable to provide an inclination because the lens effect due to surface roughness and thickness unevenness of the film can be utilized.
傾斜αは本発明の目的を達成する上では０〜７５度の範
囲にある事か好ましい。In order to achieve the object of the present invention, the slope α is preferably in the range of 0 to 75 degrees.
フィルム１面とカメラ４の距離は特に限定されないが、
第１図及び第２図に示す実施例の場合、フィルム１面と
基準画像部５の距ｍｌは約１ｍ程度が好ましい。Although the distance between the film 1 side and the camera 4 is not particularly limited,
In the case of the embodiment shown in FIGS. 1 and 2, the distance ml between the film 1 surface and the reference image area 5 is preferably about 1 m.
基準画像部５を撮影する場合、走行フィルム横方向全面
を介して撮影することが好ましい、走行過程でフィルム
の横方向全面についてひずみの有無を測定できるからで
ある。When photographing the reference image portion 5, it is preferable to photograph the entire surface of the running film in the lateral direction, because it is possible to measure the presence or absence of strain on the entire surface of the film in the lateral direction during the running process.
またカメラ４の撮影方向を変化できるようにしくいわゆ
る首振機構）、これに応じて基準画像５の面、ないし位
置も変化するようにすることも好ましい。It is also preferable to be able to change the photographing direction of the camera 4 (a so-called oscillation mechanism) and to change the plane or position of the reference image 5 accordingly.
（作用）
基準画像を第６図（Ａ）として、この画像をフィルムｌ
を介してカメラ４で撮影する。この画像は画像処理部７
に送られ、ＣＲＴデイスプレー８に表示される。８ａは
基準画像表示部、８ｂは撮影画像表示部である。基準画
像表示部８ａには、第６図（Ａ）の状態の画面か表示さ
れる。(Function) Using the reference image as shown in Fig. 6 (A), this image is transferred to the film l.
A photograph is taken with camera 4 through the camera. This image is image processing unit 7
and displayed on the CRT display 8. 8a is a reference image display section, and 8b is a photographed image display section. A screen in the state shown in FIG. 6(A) is displayed on the reference image display section 8a.
もし、フィルムの表面あれや厚みにむらがあれば、本発
明の測定によって撮影画像表示部８ｂには例えば第６図
（Ｂ）の画面か表示される。この第６図（Ｂ）に示され
る画像はひずみのある画像であり、フィルムに表面あれ
や厚みむらがあることを示している。即ち、フィルム厚
みが均一であれば、面状態はガラス面の様になり、画像
にひずみを生じることはないが、フィルムに表面あれや
厚みむらがあると、その厚い部分でレンズ効果を呈し、
光は屈折し、基準画像かひずむことになるのである。第
７図や第８図に示す実施例の場合。If there is any irregularity in the surface or thickness of the film, the screen shown in FIG. 6(B), for example, will be displayed on the photographed image display section 8b by the measurement according to the present invention. The image shown in FIG. 6(B) is a distorted image, indicating that the film has surface roughness and thickness unevenness. In other words, if the film thickness is uniform, the surface condition will be like a glass surface and there will be no distortion in the image, but if the film has surface roughness or uneven thickness, the thick part will exhibit a lens effect.
The light is refracted and the reference image becomes distorted. In the case of the embodiment shown in FIGS. 7 and 8.
フィルム透過光の１個所でも表面あれや厚みむらがあれ
ば画像がひずむことになる。If there is surface roughness or thickness unevenness in even one part of the film that passes through the film, the image will be distorted.
（発明の効果）
本発明によれば、走行中のフィルムの面状態を迅速かつ
連続的に、しかも正確に測定できる、実用的な、フィル
ム面状態の測定方法を提供することができる。(Effects of the Invention) According to the present invention, it is possible to provide a practical method for measuring the surface condition of a film that can rapidly, continuously, and accurately measure the surface condition of a film during running.
また、この測定方法によって得られた情報をフィルム製
造工程に送り、厚み調整を迅速に行うことができ、均一
な厚みを有するフィルムの製造に大いに貢献する。Furthermore, the information obtained by this measurement method can be sent to the film manufacturing process to quickly adjust the thickness, greatly contributing to the manufacture of films with uniform thickness.
第１図は、本発明の一実施例を示す一部切欠き斜視図、
第２図は、カメラ、フィルム及び基準画像部の配置列を
示す説ＥＩＩＪ図、第３図〜第５図は本発明に好ましく
採用できる基準画像を示す正面図、第６図（Ａ）は基準
画像を示す正面図、第６図（Ｂ）は撮影後の画像を示す
正面図、第７図及び第８図は各々本発明の他の実施例を
示す説明図、第９図は従来例を示す図である。
ｌ：フィルム
２：ロール
３：ロール
４：カメラ
５：基準画像部
６：照明
７：反射鏡FIG. 1 is a partially cutaway perspective view showing an embodiment of the present invention;
FIG. 2 is an explanatory EIIJ diagram showing the arrangement rows of the camera, film, and reference image section, FIGS. 3 to 5 are front views showing reference images that can be preferably adopted in the present invention, and FIG. FIG. 6(B) is a front view showing the image, FIG. 6(B) is a front view showing the image after photography, FIGS. 7 and 8 are explanatory diagrams showing other embodiments of the present invention, and FIG. 9 is a conventional example. FIG. l: Film 2: Roll 3: Roll 4: Camera 5: Reference image section 6: Lighting 7: Reflector
Claims (1)
法において、基準画像を前記走行中の透明又は半透明フ
ィルムを通してカメラで撮影し、該基準画像に対する撮
影画像のひずみを検出することを特徴とするフィルムの
面状態測定方法。A method for measuring the surface condition of a running transparent or semi-transparent film, characterized in that a reference image is photographed with a camera through the running transparent or semi-transparent film, and distortion of the photographed image with respect to the reference image is detected. A method for measuring the surface condition of film.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1178219A JPH0342560A (en) | 1989-07-11 | 1989-07-11 | Method for measuring surface state of film |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1178219A JPH0342560A (en) | 1989-07-11 | 1989-07-11 | Method for measuring surface state of film |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0342560A true JPH0342560A (en) | 1991-02-22 |
Family
ID=16044670
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1178219A Pending JPH0342560A (en) | 1989-07-11 | 1989-07-11 | Method for measuring surface state of film |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0342560A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007211092A (en) * | 2006-02-08 | 2007-08-23 | Sekisui Chem Co Ltd | Method for inspection of transparent film, and transparent film |
-
1989
- 1989-07-11 JP JP1178219A patent/JPH0342560A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007211092A (en) * | 2006-02-08 | 2007-08-23 | Sekisui Chem Co Ltd | Method for inspection of transparent film, and transparent film |
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